JP4142040B2 - 高分子基コンデンサー超音波エネルギー転換器の製造方法 - Google Patents
高分子基コンデンサー超音波エネルギー転換器の製造方法 Download PDFInfo
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- JP4142040B2 JP4142040B2 JP2005322598A JP2005322598A JP4142040B2 JP 4142040 B2 JP4142040 B2 JP 4142040B2 JP 2005322598 A JP2005322598 A JP 2005322598A JP 2005322598 A JP2005322598 A JP 2005322598A JP 4142040 B2 JP4142040 B2 JP 4142040B2
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01Q—SCANNING-PROBE TECHNIQUES OR APPARATUS; APPLICATIONS OF SCANNING-PROBE TECHNIQUES, e.g. SCANNING PROBE MICROSCOPY [SPM]
- G01Q70/00—General aspects of SPM probes, their manufacture or their related instrumentation, insofar as they are not specially adapted to a single SPM technique covered by group G01Q60/00
- G01Q70/16—Probe manufacture
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B81—MICROSTRUCTURAL TECHNOLOGY
- B81B—MICROSTRUCTURAL DEVICES OR SYSTEMS, e.g. MICROMECHANICAL DEVICES
- B81B7/00—Microstructural systems; Auxiliary parts of microstructural devices or systems
- B81B7/0009—Structural features, others than packages, for protecting a device against environmental influences
- B81B7/0012—Protection against reverse engineering, unauthorised use, use in unintended manner, wrong insertion or pin assignment
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B06—GENERATING OR TRANSMITTING MECHANICAL VIBRATIONS IN GENERAL
- B06B—METHODS OR APPARATUS FOR GENERATING OR TRANSMITTING MECHANICAL VIBRATIONS OF INFRASONIC, SONIC, OR ULTRASONIC FREQUENCY, e.g. FOR PERFORMING MECHANICAL WORK IN GENERAL
- B06B1/00—Methods or apparatus for generating mechanical vibrations of infrasonic, sonic, or ultrasonic frequency
- B06B1/02—Methods or apparatus for generating mechanical vibrations of infrasonic, sonic, or ultrasonic frequency making use of electrical energy
- B06B1/0292—Electrostatic transducers, e.g. electret-type
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B81—MICROSTRUCTURAL TECHNOLOGY
- B81C—PROCESSES OR APPARATUS SPECIALLY ADAPTED FOR THE MANUFACTURE OR TREATMENT OF MICROSTRUCTURAL DEVICES OR SYSTEMS
- B81C1/00—Manufacture or treatment of devices or systems in or on a substrate
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01Q—SCANNING-PROBE TECHNIQUES OR APPARATUS; APPLICATIONS OF SCANNING-PROBE TECHNIQUES, e.g. SCANNING PROBE MICROSCOPY [SPM]
- G01Q90/00—Scanning-probe techniques or apparatus not otherwise provided for
-
- H—ELECTRICITY
- H04—ELECTRIC COMMUNICATION TECHNIQUE
- H04R—LOUDSPEAKERS, MICROPHONES, GRAMOPHONE PICK-UPS OR LIKE ACOUSTIC ELECTROMECHANICAL TRANSDUCERS; DEAF-AID SETS; PUBLIC ADDRESS SYSTEMS
- H04R19/00—Electrostatic transducers
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B81—MICROSTRUCTURAL TECHNOLOGY
- B81C—PROCESSES OR APPARATUS SPECIALLY ADAPTED FOR THE MANUFACTURE OR TREATMENT OF MICROSTRUCTURAL DEVICES OR SYSTEMS
- B81C2201/00—Manufacture or treatment of microstructural devices or systems
- B81C2201/01—Manufacture or treatment of microstructural devices or systems in or on a substrate
- B81C2201/0101—Shaping material; Structuring the bulk substrate or layers on the substrate; Film patterning
- B81C2201/0102—Surface micromachining
- B81C2201/0105—Sacrificial layer
- B81C2201/0108—Sacrificial polymer, ashing of organics
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- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10T—TECHNICAL SUBJECTS COVERED BY FORMER US CLASSIFICATION
- Y10T29/00—Metal working
- Y10T29/43—Electric condenser making
- Y10T29/435—Solid dielectric type
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- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10T—TECHNICAL SUBJECTS COVERED BY FORMER US CLASSIFICATION
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- Y10T29/49—Method of mechanical manufacture
- Y10T29/49002—Electrical device making
- Y10T29/49005—Acoustic transducer
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10T—TECHNICAL SUBJECTS COVERED BY FORMER US CLASSIFICATION
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- Y10T29/49—Method of mechanical manufacture
- Y10T29/49002—Electrical device making
- Y10T29/4902—Electromagnet, transformer or inductor
- Y10T29/4908—Acoustic transducer
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10T—TECHNICAL SUBJECTS COVERED BY FORMER US CLASSIFICATION
- Y10T29/00—Metal working
- Y10T29/49—Method of mechanical manufacture
- Y10T29/49002—Electrical device making
- Y10T29/49117—Conductor or circuit manufacturing
- Y10T29/49169—Assembling electrical component directly to terminal or elongated conductor
- Y10T29/49171—Assembling electrical component directly to terminal or elongated conductor with encapsulating
- Y10T29/49172—Assembling electrical component directly to terminal or elongated conductor with encapsulating by molding of insulating material
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10T—TECHNICAL SUBJECTS COVERED BY FORMER US CLASSIFICATION
- Y10T29/00—Metal working
- Y10T29/49—Method of mechanical manufacture
- Y10T29/49002—Electrical device making
- Y10T29/49117—Conductor or circuit manufacturing
- Y10T29/49194—Assembling elongated conductors, e.g., splicing, etc.
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- Mechanical Engineering (AREA)
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- Microelectronics & Electronic Packaging (AREA)
- Toxicology (AREA)
- General Physics & Mathematics (AREA)
- Nuclear Medicine, Radiotherapy & Molecular Imaging (AREA)
- Radiology & Medical Imaging (AREA)
- Computer Hardware Design (AREA)
- Manufacturing & Machinery (AREA)
- Signal Processing (AREA)
- Acoustics & Sound (AREA)
- Transducers For Ultrasonic Waves (AREA)
- Ultra Sonic Daignosis Equipment (AREA)
- Micromachines (AREA)
- Electrostatic, Electromagnetic, Magneto- Strictive, And Variable-Resistance Transducers (AREA)
Description
(a) 基板を提供し、
(b) 基板の上に材料を塗って第一導体を作り、
(c) 基板に一層の犠牲層を塗り第一導体を包み、
(d) 犠牲層をエッチングし第一導体と接触する室を作り、
(e) 第一高分子基材料を基板に塗って完全に室を含め、
(f) 第一高分子基材料の上で第二導体部を作り出し、
(g) 第一高分子基材料の上で室に達する通穴を開ける、また
(h) この穴をつかって室をエッチングして室をはっきりと取り除く。
もっといい方法は段階(b1)でまた次のやり方を使ってする(b2) 第一導体部をエッチングし必要な部分だけ残す。
もっといい方法は高分子基コンデンサー超音波エネルギー転換器の製造方法に下の段階を含める(i)第二高分子基材料で完全に第二導体部を包む。
もっといい方法は高分子基コンデンサー超音波エネルギー転換器の製造方法に下の段階を含める(i)第二高分子基材料で完全に第二導体部を包み通穴まで埋める。
もっといい方法は第一導体部が金属で作る。
もっといい方法は第一導体部の作れる金属がスパッタリングで基板につける。
もっといい方法は第二導体部が金属で作る。
もっといい方法はf)段階で第二導体部の作れる金属がスパッタリングで第一高分子基材料につける。
もっといい方法は犠牲層も金属で作る。
もっといい方法は第一高分子基材料が微科学会社(MCC)から出産されたSU-8フォト-レジスト剤を使う。
(a) 基板を提供し、
(b) 基板の上に材料を塗って第一導体を作り、
(c) 第一高分子基材料で基板を塗り、第一導体を包み、
(d) 第一高分子基材料をエッチングし開放エリアを作り、
(e) 開放エリアで犠牲層を作り、
(f) 犠牲層を第二高分子基材料で塗り、全部の犠牲層を包み、
(g) 第二高分子基材料で犠牲層に達する通穴を開け、
(h) 第二高分子基材料で第二導体部を作り、
(I) 第三高分子基材料で第二導体部を包む、また
(j) 通穴で室をエッチングし完全に取り除くことを特徴とする、高分子基コンデンサー超音波エネルギー転換器の製造方法としている。
請求項2の発明は、請求項1記載の高分子基コンデンサー超音波エネルギー転換器の製造方法において、第一導体、第二導体部と犠牲層などがみんな金属であることを特徴とする、高分子基コンデンサー超音波エネルギー転換器の製造方法としている。
図2で導体部12はエッチングされ、必要な形に作られる。
次は図3のように犠牲層14が基板10に塗られて第一導体部12を包む。
次に図4のように犠牲層14をエッチングし第一導体部12に連結する室16だけ残す。
図5に示すのは基板10に高分子基材料18をぬり、室16を完全に包むのである。
図6に示すのは高分子基材料18でもう一つ導体部20を形成するのである。
図7に示すのは高分子基材料18で室16に達する通穴22を開け、本実施例の中では二つの通穴を開けるが、実際はひとつでも複数の穴でも開けるとは自由である。つぎに図8に示すのは通穴22を経由し室16をウエットエッチングにより全部の室を取り除くのである。
この段階まで本発明の高分子基コンデンサー超音波エネルギー転換器は大体完成になる。もちろん、図9のように導体部12と20がほこりと水分と錆びを防ぐためにまたもう一つ高分子基材料24で導体部20を完全につつみ、通穴22まで埋めることができる。
図11に示すように導体部12で室16を作る。
次に図12のように導体部12で高分子基材料18を塗り、完全に室16を包む。
それから図13示すように高分子基材料18でもう一つ導体部20を作る。
図14に示すように高分子基材料18の上で室16までの通穴22をあける。
本実施例は二つ通穴を開け、もちろん一つ或いは複数の穴を開けるのも自由である。次に図15に示すのは通孔22で室16をウットエッチングし室16を全部取り除くのである。
また、前述第一実施例のように導体部12と20はほこりと水分と錆びを防ぐため、さらに高分子基材料26でしっかり導体部20を包むことができる。図16に示すのは適切な高分子基材料26の選択により該高分子基材料26で導体部20を塗ると高分子基材料26の横の粘着力は垂直の重力より強いので高分子基材料26が垂れない。よって通穴22は埋まらない。
図18に示すのは導体部42を高分子基材料44で塗り完全に導体部42を包むのである。
図19に示すのは高分子基材料44をエッチングし、開放エリア46aと46bを形成するのである。
また図20に示すように、開放エリア46aと46bで犠牲層48a、48bを形成するのである。
図21に示すようにフォト-レジスト50ですべての分子基材料44と犠牲層48a、48bをぬりつつむ。
フォト-レジスト50をとり、図22に示すようにただ犠牲層48a、48bの上にある部分のフォト-レジスト50を残す。
図23に示すのは犠牲層48bを厚くし続けるのである。
それから図24のように全部のフォト-レジスト50を取り除き、高分子基材料44で犠牲層48a、48bをぬ り完全に犠牲層48a、48bを包むのである。
図25に示すのは高分子基材料44において、それぞれ犠牲層48aと犠牲層48bに到達する通穴52a、52bを設けるのである。
図26に示すように高分子基材料44において、犠牲層48a、48bに相応する導体部54aと導体部54bを形成する。
次は図27に示すように高分子基材料44で導体部54a、54bを包む。
最後は図28に示すように通穴52aと52bを経って犠牲層48a、48bをエッチングし、完全に犠牲層48a、48bを取り除く。
以上の段階が終わって、室の隙の厚み(発射素子と受信素子として)が異なる高分子基コンデンサー超音波エネルギー転換器を得ることができる。
12 導体部
14 犠牲層
16 室
18 高分子基材料
20 導体部
22 通穴
24 高分子基材料
26 高分子基材料
30 背部ゴム層
32 圧電材料層
34 相性層
36 材質層
40 基板
42 導体部
44 高分子基材料
46a 開放エリア
46b 開放エリア
48a 犠牲層
48b 犠牲層
50 フォト-レジスト
52a 通穴
52b 通穴
54a 導体部
54b 導体部
Claims (2)
- 一種の高分子基コンデンサー超音波転換器の製造方法は以下のステップのように、
(a) 基板を提供し、
(b) 基板の上に材料を塗って第一導体を作り、
(c) 第一高分子基材料で基板を塗り、第一導体を包み、
(d) 第一高分子基材料をエッチングし開放エリアを作り、
(e) 開放エリアで犠牲層を作り、
(f) 犠牲層を第二高分子基材料で塗り、全部の犠牲層を包み、
(g) 第二高分子基材料で犠牲層に達する通穴を開け、
(h) 第二高分子基材料で第二導体部を作り、
(I) 第三高分子基材料で第二導体部を包む、また
(j) 通穴で室をエッチングし完全に取り除くことを特徴とする、高分子基コンデンサー超音波エネルギー転換器の製造方法。 - 請求項1記載の高分子基コンデンサー超音波エネルギー転換器の製造方法において、第一導体、第二導体部と犠牲層などがみんな金属であることを特徴とする、高分子基コンデンサー超音波エネルギー転換器の製造方法。
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
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TW094120108A TWI260940B (en) | 2005-06-17 | 2005-06-17 | Method for producing polymeric capacitive ultrasonic transducer |
Publications (2)
Publication Number | Publication Date |
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JP2006352823A JP2006352823A (ja) | 2006-12-28 |
JP4142040B2 true JP4142040B2 (ja) | 2008-08-27 |
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JP2005322598A Expired - Fee Related JP4142040B2 (ja) | 2005-06-17 | 2005-11-07 | 高分子基コンデンサー超音波エネルギー転換器の製造方法 |
Country Status (7)
Country | Link |
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US (2) | US7673375B2 (ja) |
JP (1) | JP4142040B2 (ja) |
KR (1) | KR100634994B1 (ja) |
DE (1) | DE102005051604A1 (ja) |
FR (1) | FR2887242A1 (ja) |
GB (1) | GB2427321B (ja) |
TW (1) | TWI260940B (ja) |
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Publication number | Priority date | Publication date | Assignee | Title |
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TWI268183B (en) | 2005-10-28 | 2006-12-11 | Ind Tech Res Inst | Capacitive ultrasonic transducer and method of fabricating the same |
WO2007115283A2 (en) * | 2006-04-04 | 2007-10-11 | Kolo Technologies, Inc. | Modulation in micromachined ultrasonic transducers |
US7721397B2 (en) * | 2007-02-07 | 2010-05-25 | Industrial Technology Research Institute | Method for fabricating capacitive ultrasonic transducers |
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- 2005-08-29 US US11/212,611 patent/US7673375B2/en active Active
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- 2005-10-13 FR FR0510463A patent/FR2887242A1/fr not_active Withdrawn
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TWI260940B (en) | 2006-08-21 |
TW200701817A (en) | 2007-01-01 |
FR2887242A1 (fr) | 2006-12-22 |
JP2006352823A (ja) | 2006-12-28 |
US20090126183A1 (en) | 2009-05-21 |
GB2427321B (en) | 2007-05-16 |
GB2427321A (en) | 2006-12-20 |
GB0519271D0 (en) | 2005-10-26 |
KR100634994B1 (ko) | 2006-10-16 |
US20070013266A1 (en) | 2007-01-18 |
US7673375B2 (en) | 2010-03-09 |
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