JP4045442B2 - Calibration method of rotation center axis in X-ray CT apparatus and X-ray CT apparatus - Google Patents

Calibration method of rotation center axis in X-ray CT apparatus and X-ray CT apparatus Download PDF

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JP4045442B2
JP4045442B2 JP2003364222A JP2003364222A JP4045442B2 JP 4045442 B2 JP4045442 B2 JP 4045442B2 JP 2003364222 A JP2003364222 A JP 2003364222A JP 2003364222 A JP2003364222 A JP 2003364222A JP 4045442 B2 JP4045442 B2 JP 4045442B2
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修平 大西
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本発明は、産業用のX線CT装置における回転中心軸の較正方法と、その方法を実施するのに適したX線CT装置に関する。   The present invention relates to a rotation center axis calibration method in an industrial X-ray CT apparatus and an X-ray CT apparatus suitable for carrying out the method.

X線CT装置においては、一般に、図9にその構成例を模式的に示すように、X線源91とX線検出器92の間に、試料Wを搭載して回転を与えるための回転テーブル93を配置し、その回転テーブル93を回転させながら試料WにX線を照射し、所定の回転角度ごとに取り込んだ試料WのX線透過情報を用いて、回転テーブル93の回転中心軸Rに直交する平面に沿った試料の断層像を再構成する。   In the X-ray CT apparatus, generally, as schematically shown in FIG. 9, a rotation table for mounting the sample W between the X-ray source 91 and the X-ray detector 92 to give rotation. 93, the sample W is irradiated with X-rays while rotating the rotary table 93, and the X-ray transmission information of the sample W taken at every predetermined rotation angle is used as the rotation center axis R of the rotary table 93. A tomographic image of the sample along the orthogonal plane is reconstructed.

このようなX線CT装置においては、断層像は回転中心軸を中心として構築されるため、試料Wの任意の位置を中心とした断層像を得るためには、試料Wを回転テーブル93上で回転中心軸Rに直交する方向に移動させ得るようにすることが望ましく、そのため、図示のように、回転テーブル93の上にxyテーブル94などの移動機構を設け、このxyテーブル94上に試料Wを載せてX線透過情報を得るようにする構成が採用されることが多い(例えば特許文献1参照)。   In such an X-ray CT apparatus, since the tomographic image is built around the rotation center axis, in order to obtain a tomographic image centered on an arbitrary position of the sample W, the sample W is placed on the rotary table 93. It is desirable to be able to move in a direction orthogonal to the rotation center axis R. Therefore, as shown in the figure, a moving mechanism such as an xy table 94 is provided on the rotary table 93, and the sample W is placed on the xy table 94. Is often employed to obtain X-ray transmission information (see, for example, Patent Document 1).

また、回転テーブル93を設ける代わりに、固定された試料台を配置するとともに、X線源とX線検出器の対を、互いに位置関係を保った状態で試料台を通る回転中心軸の回りに回転させる構成を採るものも知られている。このような構成においても、断層像はX線源とX線検出器の対の回転中心軸を中心として構築されるため、試料台上に上記と同様のxyテーブルなどの移動機構を設けて、回転中心軸に対して試料を移動させ得る構成を採用することが好ましい。   Further, instead of providing the rotary table 93, a fixed sample stage is arranged, and the pair of the X-ray source and the X-ray detector is placed around the rotation center axis passing through the sample stage while maintaining the positional relationship with each other. Some have been known to have a rotating configuration. Even in such a configuration, since the tomographic image is constructed around the rotation center axis of the pair of the X-ray source and the X-ray detector, a moving mechanism such as an xy table similar to the above is provided on the sample table, It is preferable to employ a configuration in which the sample can be moved with respect to the rotation center axis.

そして、以上のようなX線CT装置においては、いずれも、回転テーブル93の回転中心軸RもしくはX線源とX線検出器の対の回転中心軸の、X線検出器92上への投影位置の座標情報を知ることが必須となる。   In any of the X-ray CT apparatuses as described above, the rotation center axis R of the rotary table 93 or the rotation center axis of the pair of the X-ray source and the X-ray detector is projected onto the X-ray detector 92. It is essential to know the coordinate information of the position.

この回転中心軸投影位置情報を得るために、従来、図10に示すように、アクリル樹脂などのX線を透過させやすい材料からなる保持部材95aの内部に、タングステンなどのX線吸収率の高い材料からなるワイヤ95bを設けた構造の回転中心軸較正治具(ファントム)95を用い、この回転中心軸較正治具95を、図9に示した回転テーブル93を有するX線CT装置にあっては、回転テーブル93上に配置されているxyテーブル94などの移動機構の上に回転中心軸較正治具95を載せ、ワイヤ95bが回転テーブル93の回転中心軸Rの近傍で、この回転中心軸Rに沿うように固定して回転を与え、所定の回転角度ごとにX線検出器92からのX線透過情報を用いて、回転中心軸RのX線検出器92上への投影位置座標を算出する。   In order to obtain this rotation center axis projection position information, conventionally, as shown in FIG. 10, a holding member 95a made of a material that easily transmits X-rays such as acrylic resin has a high X-ray absorption rate such as tungsten. A rotation center axis calibration jig (phantom) 95 having a structure provided with a wire 95b made of material is used, and this rotation center axis calibration jig 95 is provided in the X-ray CT apparatus having the rotation table 93 shown in FIG. The rotation center axis calibration jig 95 is placed on a moving mechanism such as an xy table 94 disposed on the rotation table 93, and the rotation axis of the wire 95b is in the vicinity of the rotation center axis R of the rotation table 93. The projection position coordinates of the rotation center axis R on the X-ray detector 92 are obtained by using X-ray transmission information from the X-ray detector 92 for each predetermined rotation angle. calculate

X線源とX線検出器の対を回転させる構成のX線CT装置においても、試料台上のxyテーブルなどの移動機構の上に上記と同等の回転中心軸較正治具を載せた状態で、X線源とX線検出器の対を回転させ、所定の回転角度ごとに取り込んだX線透過情報を用いて、回転中心軸のX線検出器上への投影位置座標を算出する。
特開2002−310943号公報
Even in an X-ray CT apparatus configured to rotate a pair of an X-ray source and an X-ray detector, a rotation center axis calibration jig equivalent to the above is placed on a moving mechanism such as an xy table on a sample table. Then, the pair of the X-ray source and the X-ray detector is rotated, and the projection position coordinates of the rotation center axis on the X-ray detector are calculated using the X-ray transmission information taken at every predetermined rotation angle.
JP 2002-310943 A

ところで、以上のように回転テーブルや試料台上にxyテーブルなどの試料の移動機構を備えたX線CT装置において、移動機構上に回転中心軸較正治具を載せてX線透過情報を得て、その回転中心軸投影位置を求める場合、移動機構のバックラッシュをはじめとする各種誤差が必ずといっていいほど発生し、その較正結果に悪影響を及ぼすという問題がある。   By the way, in the X-ray CT apparatus having the sample moving mechanism such as the xy table on the rotary table or the sample table as described above, the rotation center axis calibration jig is placed on the moving mechanism to obtain the X-ray transmission information. When calculating the rotation center axis projection position, various errors such as backlash of the moving mechanism are surely generated, and there is a problem that the calibration result is adversely affected.

本発明は、回転テーブルもしくは試料台上にxyテーブルなどの試料の移動機構を備えたX線CT装置において、回転中心軸較正治具を用いた回転中心軸の較正をより正確に行うことのできる方法並びに装置を提供することを課題としている。   INDUSTRIAL APPLICABILITY In the X-ray CT apparatus having a sample moving mechanism such as an xy table on a rotary table or a sample stage, the rotation center axis can be more accurately calibrated using a rotation center axis calibration jig. It is an object to provide a method and an apparatus.

上記の課題を解決するため、本発明のX線CT装置における回転中心軸較正方法は、互いに対向配置されたX線源とX線検出器の間に試料ステージを配置し、X線源とX線検出器の対もしくは試料ステージを所定の回転中心軸の回りに回転させつつ、試料にX線を照射して所定の回転角度ごとに採取したX線透過情報を用いて、上記回転中心軸に直交する平面に沿った試料の断層像を再構成するとともに、上記試料ステージ上には、試料を移動もしくは傾動させるための少なくとも1軸の試料移動機構を備えたテーブルが載せられ、そのテーブル上に試料を搭載するように構成されてなるX線CT装置において、上記回転中心軸の投影位置の座標を求める方法であって、X線吸収率の高いワイヤをX線吸収率の低い保持部材で直線状に保持してなる較正治具を用い、その較正治具の保持部材を上記試料ステージに対して固定し、かつ、ワイヤが上記回転中心軸の近傍で当該回転中心軸に沿うように位置させた状態で、X線源とX線検出器の対もしくは試料ステージを回転させつつX線を照射し、所定の角度ごとの較正治具のX線透過情報を採取し、その採取したX線透過情報から上記回転中心軸の投影位置の座標を演算することによって特徴づけられる(請求項1)。   In order to solve the above-described problem, the rotation center axis calibration method in the X-ray CT apparatus according to the present invention includes a sample stage disposed between an X-ray source and an X-ray detector that are arranged to face each other, and While rotating a pair of line detectors or a sample stage around a predetermined rotation center axis, using the X-ray transmission information collected at every predetermined rotation angle by irradiating the sample with X-rays, A table having a sample moving mechanism for at least one axis for moving or tilting the sample is placed on the sample stage, and a tomographic image of the sample along an orthogonal plane is reconstructed. In an X-ray CT apparatus configured to mount a sample, a method for obtaining coordinates of a projection position of the rotation center axis, wherein a wire having a high X-ray absorption rate is straightened by a holding member having a low X-ray absorption rate Hold in shape In a state where the holding member of the calibration jig is fixed to the sample stage and the wire is positioned so as to be along the rotation center axis in the vicinity of the rotation center axis. X-ray irradiation is performed while rotating a pair of a radiation source and an X-ray detector or a sample stage, and X-ray transmission information of a calibration jig for each predetermined angle is collected, and the rotation center is obtained from the collected X-ray transmission information. It is characterized by calculating the coordinates of the projected position of the axis (claim 1).

また、上記した課題を解決するため、本発明のX線CT装置は、互いに対向配置されたX線源およびX線検出器と、これらの間に配置された回転テーブルと、その回転テーブルの上に配置され、試料を搭載して移動もしくは傾動させるための少なくとも1軸の試料移動機構を備えた試料テーブルと、その試料テーブル上に試料を搭載して上記回転テーブルを回転させつつX線を照射して、所定の回転角度ごとに採取したX線透過情報を用いて、上記回転中心軸に直交する平面に沿った試料の断層像を再構成する断層像再構成演算手段を備えたX線CT装置において、上記回転テーブルに、X線吸収率の高い材質からなるワイヤとそのワイヤを直線状に保持するX線吸収率の低い材質からなる保持部材で構成された回転中心軸較正治具の保持部材を、上記ワイヤが上記回転中心軸の近傍において当該回転中心軸に沿うように着脱自在もしくは退避自在に装着するための較正治具装着機構が設けられていることによって特徴づけられる(請求項2)。   In order to solve the above-described problems, an X-ray CT apparatus according to the present invention includes an X-ray source and an X-ray detector arranged to face each other, a rotary table arranged therebetween, and an upper surface of the rotary table. And a sample table equipped with a sample moving mechanism for mounting or moving or tilting the sample, and irradiating X-rays while the sample is mounted on the sample table and the rotary table is rotated. An X-ray CT provided with a tomogram reconstruction calculation means for reconstructing a tomogram of the sample along a plane orthogonal to the rotation center axis using the X-ray transmission information collected at every predetermined rotation angle. In the apparatus, the rotary table holds a rotation center axis calibration jig composed of a wire made of a material having a high X-ray absorption rate and a holding member made of a material having a low X-ray absorption rate that holds the wire linearly. Part Is provided with a calibration jig mounting mechanism for detachably or removably mounting the wire along the rotation center axis in the vicinity of the rotation center axis (Claim 2). .

更に、同じ目的を達成する本発明の他のX線CT装置は、互いに対向配置されたX線源およびX線検出器と、そのX線源とX線検出器との対を所定の回転中心軸の回りに回転させる回転機構と、上記X線源とX線検出器の間に配置された試料台と、その試料台上に配置され、試料を搭載して移動もしくは傾動させるための少なくとも1軸の試料移動機構を備えた試料テーブルと、その試料テーブル上に試料を搭載して上記X線源とX線検出器の対を回転させつつX線を照射し、所定の回転角度ごとに採取したX線透過情報を用いて、上記回転中心軸に直交する平面に沿った試料の断層像を再構成する断層像再構成手段を備えたX線CT装置において、上記試料台に、X線吸収率の高い材質からなるワイヤとそのワイヤを直線状に保持するX線吸収率の低い材質からなる保持部材で構成された回転中心軸較正治具の保持部材を、上記ワイヤが上記回転中心軸の近傍において当該回転中心軸に沿うように着脱自在もしくは退避自在に装着するための較正治具装着機構が設けられていることによって特徴づけられる(請求項3)。   Furthermore, another X-ray CT apparatus of the present invention that achieves the same object is provided with an X-ray source and an X-ray detector arranged opposite to each other and a pair of the X-ray source and the X-ray detector at a predetermined center of rotation. A rotating mechanism that rotates about an axis; a sample stage disposed between the X-ray source and the X-ray detector; and at least one for placing or moving or tilting the sample disposed on the sample stage. A sample table equipped with an axis sample moving mechanism, and a sample mounted on the sample table, irradiated with X-rays while rotating the pair of the X-ray source and the X-ray detector, and sampled at every predetermined rotation angle In the X-ray CT apparatus provided with tomographic image reconstruction means for reconstructing a tomographic image of a sample along a plane orthogonal to the rotation center axis using the X-ray transmission information obtained, X-ray absorption is performed on the sample stage. A wire made of a high-rate material and an X-ray that holds the wire in a straight line A holding member of a rotation center axis calibration jig composed of a holding member made of a low-yield material is detachably or removably mounted so that the wire follows the rotation center axis in the vicinity of the rotation center axis. This is characterized in that a calibration jig mounting mechanism is provided.

本発明方法によれば、回転機構を備えた試料ステージ(回転テーブル)の上にxyテーブルなどの試料移動機構を備えたX線CT装置、あるいは、X線源とX線検出器の対を回転させ、かつ、固定された試料台上にxyテーブルなどの試料移動機構を備えたX線CT装置のいずれにおいても、回転軸較正治具を、試料移動機構上に載せずに直接的に回転テーブルあるいは試料台上に固定し、ワイヤを回転中心軸の近傍において当該回転中心軸に沿うように配置した状態でX線を照射し、試料ステージ(回転テーブル)もしくはX線源とX線検出器の対を回転中心軸の回りに回転させ、所定の角度ごとに取り込んだX線透過情報を用いて回転中心軸の投影位置座標を求めるので、較正治具の位置は試料移動機構に依存せずに回転テーブルないしは試料台に依存することになり、xyテーブルなどの試料移動機構のバックラッシュ等の影響を受けることなく、正確に回転中心軸の投影位置を求めることができる。   According to the method of the present invention, an X-ray CT apparatus having a sample moving mechanism such as an xy table on a sample stage (rotating table) having a rotating mechanism, or a pair of an X-ray source and an X-ray detector is rotated. In any X-ray CT apparatus provided with a sample moving mechanism such as an xy table on a fixed sample table, the rotary table is directly mounted on the rotating table without placing the rotating axis calibration jig on the sample moving mechanism. Alternatively, it is fixed on the sample stage, irradiated with X-rays in a state where the wire is arranged along the rotation center axis in the vicinity of the rotation center axis, and the sample stage (rotation table) or X-ray source and X-ray detector The projection position coordinates of the rotation center axis are obtained using the X-ray transmission information acquired at every predetermined angle by rotating the pair around the rotation center axis, so that the position of the calibration jig does not depend on the sample moving mechanism. No rotating table Will depend on the sample stage, without being affected by backlash or the like of the sample moving mechanism such as a xy table, it is possible to determine the projection position of precisely the rotation center axis.

また、請求項2に係る発明のX線CT装置によると、回転テーブル上にxyテーブルなどの試料移動機構を備えた装置において、回転テーブルに、ワイヤが保持部材で保持されてなる回転中心軸較正治具を、そのワイヤが回転中心軸の近傍において当該回転中心軸に沿うように着脱自在もしくは退避自在に装着するための較正治具装着機構を備えているので、回転中心軸の較正時には回転テーブルに対して直接的に回転中心軸較正治具を固定することができ、試料移動機構のバックラッシュ等の影響を受けることなく正確な較正が可能となるとともに、試料のX線透過情報を採取するに当たっては、較正治具を取り外しもしくは退避させることによって、試料のX線透過情報に影響を与えることを防止することができる。   According to the X-ray CT apparatus of the second aspect of the present invention, in an apparatus provided with a sample moving mechanism such as an xy table on a rotary table, a rotation center axis comparison in which a wire is held by a holding member on the rotary table. A calibration jig mounting mechanism is provided for mounting the correct jig so that the wire is detachable or retractable so that the wire follows the rotation center axis in the vicinity of the rotation center axis. The rotation center axis calibration jig can be fixed directly to the sample, enabling accurate calibration without being affected by the backlash of the sample moving mechanism and collecting X-ray transmission information of the sample. In this case, it is possible to prevent the X-ray transmission information of the sample from being affected by removing or retracting the calibration jig.

更に、請求項3に係る発明のX線CT装置によると、X線源とX線検出器の対を回転させるとともに、その間に設けられた試料台上にxyテーブルなどの試料移動機構を備えたX線CT装置において、試料台に、上記と同等の回転中心軸較正治具を、そのワイヤが回転中心軸の近傍において当該回転中心軸に沿うように着脱自在もしくは退避自在に装着するための較正治具装着機構を備えているので、回転中心軸の較正時には試料台に対して直接的に回転中心軸較正治具を固定することができ、上記と同様に、試料移動機構のバックラッシュ等の影響を受けることなく正確な較正が可能であり、かつ、試料のX線透過情報を採取するに当たっては、較正治具の取り外しもしくは退避により試料のX線透過情報に影響を与えることを防止することができる。   Furthermore, according to the X-ray CT apparatus of the invention according to claim 3, the pair of the X-ray source and the X-ray detector is rotated, and a sample moving mechanism such as an xy table is provided on the sample table provided therebetween. In an X-ray CT apparatus, a rotation center axis calibration jig equivalent to the above is attached to a sample stage so that the wire is detachable or retractable along the rotation center axis in the vicinity of the rotation center axis. Since the correct jig mounting mechanism is provided, the rotation center axis calibration jig can be fixed directly to the sample stage when the rotation center axis is calibrated. Accurate calibration is possible without being affected, and when collecting X-ray transmission information of the sample, it is possible to prevent the X-ray transmission information of the sample from being affected by removing or retracting the calibration jig. Can.

以下、図面を参照しつつ本発明の実施の形態について説明する。
図1は回転テーブルにより試料を回転させるタイプのX線CT装置に本発明を適用した実施の形態の要部構成である、回転テーブルの近傍の斜視図であり、図2はその正面図(A)並びに要部拡大断面図(B)である。
Hereinafter, embodiments of the present invention will be described with reference to the drawings.
FIG. 1 is a perspective view of the vicinity of a rotary table, which is a configuration of the main part of an embodiment in which the present invention is applied to an X-ray CT apparatus of a type in which a sample is rotated by a rotary table, and FIG. And an enlarged sectional view (B) of the main part.

この例において、X線源とX線検出器は図9に示した従来のX線CT装置と同様に、例えば図1における水平方向左方にX線源が、回転テーブル1を挟んでその反対側にX線検出器が配置されているのであるが、この点は従来装置と変わらないので、図面の煩雑化を避けるために、X線源並びにX線検出器については省略している。   In this example, the X-ray source and the X-ray detector are the same as the conventional X-ray CT apparatus shown in FIG. 9, for example, the X-ray source on the left in the horizontal direction in FIG. The X-ray detector is arranged on the side, but this point is not different from the conventional apparatus, and therefore the X-ray source and the X-ray detector are omitted in order to avoid complication of the drawing.

この例における特徴は、試料に鉛直軸(z軸)に沿った回転中心軸Rの回りに回転を与えるための回転テーブル1と、その回転テーブル1上に載せられて試料を水平面(xy平面)上で移動させるための試料移動機構としてのxyテーブル2を備えたX線CT装置において、回転テーブル1の上にアタッチメント3が固着されており、そのアタッチメント3の上にxyテーブル2が載せられているとともに、このアタッチメント3には較正治具装着部31が設けられている。   The feature of this example is that the sample is placed on the rotary table 1 for rotating the sample around the rotation center axis R along the vertical axis (z axis), and the sample is placed on a horizontal plane (xy plane). In an X-ray CT apparatus provided with an xy table 2 as a sample moving mechanism for moving above, an attachment 3 is fixed on the rotary table 1, and the xy table 2 is placed on the attachment 3. In addition, the attachment 3 is provided with a calibration jig mounting portion 31.

すなわち、アタッチメント3は、平板状部材32の一端に略円柱状の較正治具装着部31を一体に形成したものであって、xyテーブル2は平板状部材32の上に配置されている。   That is, the attachment 3 is formed by integrally forming a substantially cylindrical calibration jig mounting portion 31 at one end of a flat plate member 32, and the xy table 2 is disposed on the flat plate member 32.

較正治具4は、前記した従来のものと同等のアクリル等のX線吸収率の低い材質からなる保持部材41によってタングステン等のX線吸収率の高い材質からなるワイヤ42を真直に保持した構造を有し、この較正治具4は、その一端が持ち出し部材5に固着されており、この持ち出し部材5が較正治具装着部31に対して着脱自在に装着できるようになっている。   The calibration jig 4 has a structure in which a wire 42 made of a material having a high X-ray absorption rate, such as tungsten, is held straight by a holding member 41 made of a material having a low X-ray absorption rate, such as acrylic, equivalent to the conventional one described above. One end of the calibration jig 4 is fixed to the take-out member 5, and the take-out member 5 can be detachably attached to the calibration jig attachment portion 31.

較正治具着脱部31は、図2(B)に示すように、円柱部材の頂部に例えば2段の円柱状の凸部31aを形成した構造を有し、持ち出し部材5には、較正治具4を固着した側と反対側の端部近傍の表裏にそれぞれ2段の凹部5a,5bが形成されており、凹部5aおよび5bは、それぞれ凸部31aに対して密に嵌合する寸法とされ、これらの凸部31aと凹部5aまたは5bによって、いわゆるインロウ構造を形成して高い位置決め精度のもとに持ち出し部材5を較正治具装着部31に着脱できるようになっている。   As shown in FIG. 2B, the calibration jig attaching / detaching portion 31 has a structure in which, for example, a two-stage cylindrical convex portion 31a is formed on the top of the cylindrical member. Two steps of recesses 5a and 5b are formed on the front and back in the vicinity of the end opposite to the side to which 4 is fixed, and the recesses 5a and 5b are dimensioned to fit closely to the protrusion 31a. These convex portions 31a and concave portions 5a or 5b form a so-called in-row structure so that the take-out member 5 can be attached to and detached from the calibration jig mounting portion 31 with high positioning accuracy.

図1および図2(A)は、持ち出し部材5の一方の凹部5aを較正治具装着部31の凸部31aに装着した状態を示し、この状態では、較正治具4並びに持ち出し部材5はxyテーブル2に接触せず、かつ、較正治具4のワイヤ42がxyテーブル2の上方において回転テーブル1の回転中心軸Rの近傍で当該回転中心軸Rに沿った状態となる。   FIG. 1 and FIG. 2 (A) show a state where one concave portion 5a of the take-out member 5 is attached to the convex portion 31a of the calibration jig attachment portion 31, and in this state, the calibration jig 4 and the take-out member 5 are xy. The wire 42 of the calibration jig 4 is not in contact with the table 2 and is in a state along the rotation center axis R in the vicinity of the rotation center axis R of the turntable 1 above the xy table 2.

回転中心軸の較正作業、つまり回転テーブル1の回転中心軸RのX線検出器上への投影位置の座標を求める作業においては、図1ないしは図2に示す状態で較正治具4に対してX線を照射しつつ、回転テーブル1を所定の角度ずつ回転させ、各回転角度ごとに較正治具4のX線透過情報を取り込む。その各回転角度のX線透過情報から、ワイヤ42の位置を読み取り、公知のアルゴリズム、例えばX線検出器上における水平方向への振れの中心位置の座標を算出して回転中心軸の投影位置座標を求める。   In the calibration operation of the rotation center axis, that is, the operation of obtaining the coordinates of the projection position of the rotation center axis R of the rotary table 1 on the X-ray detector, the calibration jig 4 is in the state shown in FIG. 1 or FIG. While irradiating X-rays, the turntable 1 is rotated by a predetermined angle, and X-ray transmission information of the calibration jig 4 is captured at each rotation angle. From the X-ray transmission information of each rotation angle, the position of the wire 42 is read, and the coordinates of the center position of the shake in the horizontal direction on the X-ray detector are calculated to calculate the projection position coordinates of the rotation center axis. Ask for.

実際の試料のX線透過情報を採取する場合には、図1,図2に示す状態から較正治具4を持ち出し部材5ごと較正治具装着部31から取り外し、図3に斜視図を示すように、反対側の凹部5bを較正治具装着部32の凸部32aに嵌め込む。これにより、較正治具4はxyテーブル2の上方から外れ、回転テーブル1の側方において鉛直下方に向いた状態となり、X線源とX線検出器の間の空間から退避した状態となり、従ってxyテーブル2の上に試料Wを載せてX線を照射したとき、X線検出器には試料Wを透過したX線のみが入射することになる。   When collecting X-ray transmission information of an actual sample, the calibration jig 4 is removed from the calibration jig mounting portion 31 together with the take-out member 5 from the state shown in FIGS. 1 and 2, and a perspective view is shown in FIG. Then, the opposite concave portion 5 b is fitted into the convex portion 32 a of the calibration jig mounting portion 32. As a result, the calibration jig 4 is removed from the upper side of the xy table 2 and is directed vertically downward on the side of the rotary table 1, and is in a state of being retracted from the space between the X-ray source and the X-ray detector. When the sample W is placed on the xy table 2 and irradiated with X-rays, only the X-rays transmitted through the sample W are incident on the X-ray detector.

以上の実施の形態において特に注目すべき点は、較正治具4がxyテーブル2とは無関係に、実質的に回転テーブル1に対して位置決め固定された状態となる点であり、これにより、xyテーブル2のバックラッシュ等の影響を受けることなく、較正時におけるワイヤ42のX線透過像は常に正しく回転テーブル1の回転中心軸Rとの位置関係を表すことになり、回転中心軸Rの投影位置を高精度に求めることができる。   What should be particularly noted in the above embodiment is that the calibration jig 4 is substantially positioned and fixed with respect to the rotary table 1 regardless of the xy table 2, and thus, xy. The X-ray transmission image of the wire 42 at the time of calibration always correctly represents the positional relationship with the rotation center axis R of the rotary table 1 without being affected by the backlash of the table 2, and the projection of the rotation center axis R. The position can be obtained with high accuracy.

ここで、以上の実施の形態においては、較正治具4を固着した持ち出し部材5の表裏に凹部5a,5bを設けて、そのいずれかを較正治具装着部31の凸部31aに嵌め込むことにより、較正治具4の使用状態と退避状態を選択できるように構成したが、持ち出し部材5には較正治具4の使用時に凸部31aに嵌め込む凹部5aのみを形成し、不使用状態においては、図4に示すように持ち出し部材5ごと較正治具4を取り外すように構成することもできる。   Here, in the above embodiment, the recesses 5a and 5b are provided on the front and back of the take-out member 5 to which the calibration jig 4 is fixed, and one of them is fitted into the projection 31a of the calibration jig mounting part 31. Thus, the use state and the retracted state of the calibration jig 4 can be selected. However, the carry-out member 5 is formed only with the concave portion 5a that fits into the convex portion 31a when the calibration jig 4 is used, and in the non-use state. As shown in FIG. 4, the calibration jig 4 can be removed together with the take-out member 5.

また、較正治具4の退避構造として、例えばヒンジ機構等を用いて、xyテーブル2の上方に位置する使用状態と、回転テーブル1の側方で下方に向いた不使用状態(退避状態)を選択できるように構成することもできる。   Further, as the retracting structure of the calibration jig 4, for example, using a hinge mechanism or the like, there are a use state positioned above the xy table 2 and a non-use state (retreat state) facing downward on the side of the rotary table 1. It can also be configured to be selectable.

更に、以上の実施の形態においては、回転テーブル1の上に試料移動機構としてxyテーブル2を配置した例を示したが、本発明はこれに限定されることなく、任意の移動機構を採用することができる。すなわち、回転テーブル1上での移動機構としての自由度は、互いに直交するx,y,z方向への並進と、x,y軸回りの回転の5軸であり、これらの5軸のうちの任意の1軸もしくは複数軸への移動機構を回転テーブル2上に搭載したX線CT装置に本発明を適用することができる。図5に水平軸回りの回転機構を備えた試料移動機構6を回転テーブル1の上に搭載した例を示し、(A)は較正時、(B)は試料WのX線透過情報の採取時を示している。この例においても、較正治具装着部31、較正治具4並びに持ち出し部材5はは前記した実施の形態と同等のものを用いることができる。ただし、これらの較正治具4の着脱ないしは退避の機構については、試料移動機構との関連において、以下の点に留意して決定すべきである。   Furthermore, in the above embodiment, the example in which the xy table 2 is arranged as the sample moving mechanism on the rotary table 1 has been shown, but the present invention is not limited to this, and an arbitrary moving mechanism is adopted. be able to. That is, the degree of freedom as a moving mechanism on the rotary table 1 is five axes of translation in the x, y, and z directions orthogonal to each other and rotation around the x, y axes. The present invention can be applied to an X-ray CT apparatus in which a mechanism for moving to any one axis or a plurality of axes is mounted on the rotary table 2. FIG. 5 shows an example in which a sample moving mechanism 6 having a rotating mechanism around a horizontal axis is mounted on the rotary table 1, (A) is during calibration, and (B) is when collecting X-ray transmission information of the sample W. Is shown. Also in this example, the calibration jig mounting portion 31, the calibration jig 4 and the take-out member 5 can be the same as those in the above-described embodiment. However, the mechanism for attaching / detaching or retracting the calibration jig 4 should be determined in consideration of the following points in relation to the sample moving mechanism.

すなわち、較正治具4のワイヤ42は較正時において、試料Wの撮像時に試料Wが置かれる位置に配置され、較正治具4の退避ないしは着脱機構は、その較正時においてX線源とX線検出器の間でワイヤ42のX線透視像に対して影響を及ぼす影を作る位置に存在せず(ただし、カーボンやある種の樹脂等のX線吸収率の極めて小さい構造物であれば差し支えない)、かつ、試料Wの撮像時には較正治具4とその着脱または退避機構が試料WのX線透過情報に影響を与えず、また、試料移動機構6の動作を妨げない位置ないしは構成としなければならない。   That is, the wire 42 of the calibration jig 4 is arranged at the position where the sample W is placed when the sample W is imaged during calibration, and the retracting or attaching / detaching mechanism of the calibration jig 4 is used for the X-ray source and the X-ray during the calibration. It does not exist in a position that creates a shadow that affects the X-ray fluoroscopic image of the wire 42 between the detectors (provided that it is a structure having an extremely low X-ray absorption rate such as carbon or some resin). And the calibration jig 4 and its attachment / detachment / retraction mechanism do not affect the X-ray transmission information of the sample W and do not disturb the operation of the sample movement mechanism 6 when imaging the sample W. I must.

また、以上の各実施の形態においては、較正治具4を、持ち出し部材5等によって回転テーブル1上のxyテーブル2ないしは試料移動機構6の外側を迂回させて、ワイヤ42が回転中心軸Rの近傍に位置するようにした例を示したが、xyテーブル2等の試料移動機構の内側に較正治具4を着脱自在に装着することもできる。図6にその例を示す。この図において(A)は較正時、(B)は試料Wの撮像時の状態を示している。   Further, in each of the above embodiments, the calibration jig 4 is detoured outside the xy table 2 or the sample moving mechanism 6 on the rotary table 1 by the take-out member 5 or the like, and the wire 42 has the rotation center axis R. Although the example is shown in the vicinity, the calibration jig 4 can be detachably mounted inside the sample moving mechanism such as the xy table 2. An example is shown in FIG. In this figure, (A) shows a state during calibration, and (B) shows a state during imaging of the sample W.

この例においては、回転テーブル1の上に較正治具4を着脱自在ないしは退避自在に装着するためのアタッチメント7を固定するとともに、このアタッチメント7の上に試料移動機構8を配置し、その試料移動機構8には較正治具4を貫通させるための貫通孔8aを形成している。較正時には、(A)に示すように、貫通孔8aを貫通させて較正治具4の下端部をアタッチメント7に取り付ける。これにより、較正治具4は試料移動機構8に無関係に回転テーブル1に対して位置決めされた状態となる。また、試料Wの撮像時には、(B)に示すように、較正治具4をアタッチメント7から取り外す。これにより、較正治具4は試料Wの撮像に邪魔にならないようにすることができる。なお、貫通孔8aを溝として、較正治具4の不使用時にはヒンジ機構等によってその溝内に収容して試料移動機構8の試料搭載面よりも下方に倒すようにしてもよい。   In this example, an attachment 7 for detachably mounting the calibration jig 4 on the rotary table 1 is fixed, and a sample moving mechanism 8 is disposed on the attachment 7 to move the sample. The mechanism 8 is formed with a through hole 8a for allowing the calibration jig 4 to pass therethrough. At the time of calibration, the lower end portion of the calibration jig 4 is attached to the attachment 7 through the through hole 8a as shown in FIG. As a result, the calibration jig 4 is positioned with respect to the rotary table 1 regardless of the sample moving mechanism 8. Further, when imaging the sample W, the calibration jig 4 is detached from the attachment 7 as shown in FIG. Thereby, the calibration jig | tool 4 can be made not to interfere with the imaging of the sample W. The through hole 8a may be used as a groove, and when the calibration jig 4 is not used, it may be accommodated in the groove by a hinge mechanism or the like and tilted downward from the sample mounting surface of the sample moving mechanism 8.

以上の各実施の形態は、X線源とX線検出器とを、これらを結ぶ線が回転中心軸Rに対して直交するように配置したX線CT装置に本発明を適用した例を示したが、X線源とX線検出器とを結ぶ線が回転中心軸に対して直交しない、いわゆる傾斜型のX線CT装置にも本発明を等しく適用することができる。図7にその例を模式的に示す。   Each of the above embodiments shows an example in which the present invention is applied to an X-ray CT apparatus in which an X-ray source and an X-ray detector are arranged so that a line connecting them is orthogonal to the rotation center axis R. However, the present invention can be equally applied to a so-called inclined X-ray CT apparatus in which the line connecting the X-ray source and the X-ray detector is not orthogonal to the rotation center axis. An example is schematically shown in FIG.

この図7の例においては、回転テーブル(機構)11の上面側を装置フレーム等に支持するとともに、その下面にアタッチメント13を固定し、そのアタッチメント13を介してxy移動機構12を取り付けている。xy移動機構12には、吊り下げ部材121を介して試料テーブル122を吊り下げ、この試料テーブル122の上に試料を搭載するように構成している。X線源14は試料テーブル122の斜め下方に配置され、そのX線源14に対向するように試料テーブル122の斜め上方にX線検出器15が配置されている。 アタッチメント13には、図1の例と同等の較正治具装着部131を一体的に形成し、その較正治具装着部131に対して、同じく図1の例と同等の持ち出し部材5の一端を例えばねじ等を用いて落下しないように固着し、その持ち出し部材5には先の各例と同等の較正治具4を固定して、持ち出し部材5の装着状態において較正治具4のワイヤ42が回転テーブル11の回転中心軸Rの近傍において当該回転中心軸Rに沿うように構成している。   In the example of FIG. 7, the upper surface side of the rotary table (mechanism) 11 is supported by an apparatus frame or the like, the attachment 13 is fixed to the lower surface thereof, and the xy moving mechanism 12 is attached via the attachment 13. The xy moving mechanism 12 is configured such that a sample table 122 is suspended via a suspension member 121 and a sample is mounted on the sample table 122. The X-ray source 14 is disposed obliquely below the sample table 122, and the X-ray detector 15 is disposed obliquely above the sample table 122 so as to face the X-ray source 14. A calibration jig mounting portion 131 equivalent to the example of FIG. 1 is integrally formed on the attachment 13, and one end of the take-out member 5 similarly to the example of FIG. 1 is attached to the calibration jig mounting portion 131. For example, it fixes so that it may not fall using a screw etc., the calibration jig | tool 4 equivalent to each previous example is fixed to the taking-out member 5, and the wire 42 of the calibration jig | tool 4 is in the mounting state of the taking-out member 5. In the vicinity of the rotation center axis R of the turntable 11, the rotation table 11 is configured to follow the rotation center axis R.

以上の構成においても、較正治具4はxy移動機構12に無関係に回転テーブル11に対して直接的に位置決め固定されることになり、その状態で回転テーブル11を回転させて較正治具4のX線透過情報を採取することにより、xy移動機構12のバックラッシュ等の影響を受けることなく、正確に回転中心軸Rの投影位置座標を求めることができる。また、試料の撮像に際しては較正治具4を持ち出し部材5とともに取り外し、あるいは退避させることにより、これらがX線源14とX線検出器15の間に位置して試料のX線透過情報に影響を与えることがない。   Also in the above configuration, the calibration jig 4 is directly positioned and fixed with respect to the rotary table 11 regardless of the xy moving mechanism 12, and the rotary table 11 is rotated in this state to By collecting the X-ray transmission information, the projection position coordinates of the rotation center axis R can be accurately obtained without being affected by the backlash or the like of the xy movement mechanism 12. Further, when the sample is imaged, the calibration jig 4 is removed or retracted together with the take-out member 5 so that these are positioned between the X-ray source 14 and the X-ray detector 15 and affect the X-ray transmission information of the sample. Never give.

更に、以上の各実施の形態は、試料を搭載したテーブルを回転させる構成のX線CT装置に本発明を適用した例を示したが、試料を回転させずに、X線源とX線検出器の対を試料の回りに回転させるタイプのX線CT装置にも本発明を等しく適用することができる。その例を図8に模式的に示す。   Furthermore, in each of the above embodiments, an example in which the present invention is applied to an X-ray CT apparatus configured to rotate a table on which a sample is mounted has been described. However, an X-ray source and X-ray detection can be performed without rotating the sample. The present invention is equally applicable to an X-ray CT apparatus of the type that rotates a pair of instruments around a sample. An example of this is schematically shown in FIG.

この図8の例では、X線源21とX線検出器22が共通の支持部材23に支持され、その内側に、上面が基準面を形成する試料台24が配置され、その試料台24の上にxyテーブルなどの試料Wを移動させるための試料移動機構25が配置されている。そして、支持部材23が回転機構(図示せず)によって回転中心軸Rの回りに回転し、これにより、X線源21とX線検出器22の対が試料Wの回りに回転する。   In the example of FIG. 8, the X-ray source 21 and the X-ray detector 22 are supported by a common support member 23, and a sample stage 24 whose upper surface forms a reference plane is disposed inside the X-ray source 21 and the X-ray detector 22. A sample moving mechanism 25 for moving the sample W such as an xy table is arranged on the top. Then, the support member 23 is rotated around the rotation center axis R by a rotation mechanism (not shown), whereby the pair of the X-ray source 21 and the X-ray detector 22 is rotated around the sample W.

試料台24には、図1に示したものと同等の一端に較正治具装着部261が一体に形成されたアタッチメント26が固着されており、試料移動機構25はこのアタッチメント26の上に配置されている。そして、このアタッチメント26の較正治具装着部261に、先の各例と同等の較正治具4が着脱自在もしくは退避自在に装着され、その装着状態において、ワイヤ42が回転中心軸Rの近傍において当該回転中心軸Rに沿うように位置するようになっている。   An attachment 26 in which a calibration jig mounting portion 261 is integrally formed is fixed to one end equivalent to that shown in FIG. 1 on the sample stage 24, and the sample moving mechanism 25 is disposed on the attachment 26. ing. Then, the calibration jig 4 equivalent to each of the previous examples is detachably or removably mounted on the calibration jig mounting portion 261 of the attachment 26, and in the mounted state, the wire 42 is in the vicinity of the rotation center axis R. It is located along the rotation center axis R.

この例においても、較正治具4は試料移動機構25とは無関係に直接的に試料台23の上に位置決めされることになり、X線源21とX線検出器22の対を回転させながら較正治具4のX線透過情報を採取することによって、試料移動機構25のバックラッシュ等の影響を受けることなく、正確に回転中心軸Rの投影位置座標を求めることができる。また、試料の撮像時には較正治具4を取り外し、あるいは退避させることによって、較正治具4が撮像の邪魔になることがない。   Also in this example, the calibration jig 4 is positioned directly on the sample stage 23 regardless of the sample moving mechanism 25, and the pair of the X-ray source 21 and the X-ray detector 22 is rotated. By collecting the X-ray transmission information of the calibration jig 4, the projection position coordinates of the rotation center axis R can be accurately obtained without being affected by the backlash of the sample moving mechanism 25. In addition, the calibration jig 4 does not interfere with the imaging by removing or retracting the calibration jig 4 during imaging of the sample.

なお、以上の各実施の形態においては、回転テーブルないしは試料台にてアタッチメントを固定し、そのアタッチメントを介して較正治具を着脱自在もしくは退避自在に装着した例を示したが、回転テーブルもしくは試料台自体に較正治具の装着部を形成すれば、必ずしもアタッチメントは必要ではないことは勿論である。   In each of the above embodiments, an example is shown in which the attachment is fixed on the rotary table or the sample stage, and the calibration jig is detachably or removably attached via the attachment. Of course, the attachment is not necessarily required if the mounting portion for the calibration jig is formed on the table itself.

回転テーブルにより試料を回転させるタイプのX線CT装置に本発明を適用した実施の形態の要部構成を示す斜視図である。It is a perspective view which shows the principal part structure of embodiment which applied this invention to the type of X-ray CT apparatus which rotates a sample with a turntable. 図2の正面図(A)およびその要部拡大断面図(B)である。It is the front view (A) of FIG. 2, and the principal part expanded sectional view (B). 図1,図2に示す実施の形態における試料Wの撮像状態を示す斜視図である。It is a perspective view which shows the imaging state of the sample W in embodiment shown in FIG. 1, FIG. 本発明の他の実施の形態の要部構成を示す斜視図である。It is a perspective view which shows the principal part structure of other embodiment of this invention. 本発明の更に他の実施の形態の要部構成を示す斜視図で、(A)は較正治具の使用状態(較正時の状態)、(B)は同じく較正治具の不使用状態(試料の撮像状態)を示す図である。It is a perspective view which shows the principal part structure of other embodiment of this invention, (A) is the use condition (state at the time of calibration) of a calibration jig, (B) is the non-use state (sample) of a calibration jig. FIG. 本発明の更にまた他の実施の形態の要部構成を示す斜視図で、(A)は較正治具の使用状態(較正時の状態)、(B)は同じく較正治具の不使用状態(試料の撮像状態)を示す図である。It is a perspective view which shows the principal part structure of other embodiment of this invention, (A) is the use condition (state at the time of calibration) of a calibration jig, (B) is the non-use state of a calibration jig ( It is a figure which shows the imaging state of a sample. 本発明を傾斜型のX線CT装置に適用した実施の形態の要部構成図である。It is a principal part block diagram of embodiment which applied this invention to the tilt type X-ray CT apparatus. X線源とX線検出器の対を試料の回りに回転させるタイプのX線CT装置に本発明を適用した実施の形態の要部構成を示す斜視図である。It is a perspective view which shows the principal part structure of embodiment which applied this invention to the type of X-ray CT apparatus which rotates the pair of a X-ray source and a X-ray detector around a sample. 従来のX線CT装置の構成例を示す模式図である。It is a schematic diagram which shows the structural example of the conventional X-ray CT apparatus. 従来のX線CT装置の回転中心軸の投影位置を求める較正方法の例の説明図である。It is explanatory drawing of the example of the calibration method which calculates | requires the projection position of the rotation center axis | shaft of the conventional X-ray CT apparatus.

符号の説明Explanation of symbols

1 回転テーブル
2 xyテーブル
3 アタッチメント
31 較正治具装着部
31a 凸部
4 較正治具
41 保持部材
42 ワイヤ
5 持ち出し部材
W 試料
DESCRIPTION OF SYMBOLS 1 Rotation table 2 xy table 3 Attachment 31 Calibration jig mounting part 31a Convex part 4 Calibration jig 41 Holding member 42 Wire 5 Take-out member W Sample

Claims (3)

互いに対向配置されたX線源とX線検出器の間に試料ステージを配置し、X線源とX線検出器の対もしくは試料ステージを所定の回転中心軸の回りに回転させつつ、試料にX線を照射して所定の回転角度ごとに採取したX線透過情報を用いて、上記回転中心軸に直交する平面に沿った試料の断層像を再構成するとともに、上記試料ステージ上には、試料を移動もしくは傾動させるための少なくとも1軸の駆動機構を備えたテーブルが載せられ、そのテーブル上に試料を搭載するように構成されてなるX線CT装置において、上記回転中心軸の投影位置の座標を求める方法であって、
X線吸収率の高いワイヤをX線吸収率の低い保持部材で直線状に保持してなる較正治具を用い、その較正治具の保持部材を上記試料ステージに対して固定し、かつ、ワイヤが上記回転中心軸の近傍で当該回転中心軸に沿うように位置させた状態で、X線源とX線検出器の対もしくは試料ステージを回転させつつX線を照射し、所定の角度ごとの較正治具のX線透過情報を採取し、その採取したX線透過情報から上記回転中心軸の投影位置の座標を演算することを特徴とするX線CT装置における回転中心軸の較正方法。
A sample stage is arranged between an X-ray source and an X-ray detector that are arranged opposite to each other, and a pair of X-ray source and X-ray detector or a sample stage is rotated around a predetermined rotation center axis while the sample stage is rotated. Reconstructing a tomographic image of the sample along a plane perpendicular to the rotation center axis using X-ray transmission information obtained by irradiating X-rays and collected at every predetermined rotation angle, on the sample stage, In an X-ray CT apparatus in which a table having at least one axis driving mechanism for moving or tilting a sample is mounted and the sample is mounted on the table, the projection position of the rotation center axis is determined. A method for obtaining coordinates,
Using a calibration jig in which a wire having a high X-ray absorption rate is linearly held by a holding member having a low X-ray absorption rate, the holding member of the calibration jig is fixed to the sample stage, and the wire Is irradiated with X-rays while rotating a pair of an X-ray source and an X-ray detector or a sample stage while being positioned in the vicinity of the rotation center axis and along the rotation center axis. A method of calibrating a rotation center axis in an X-ray CT apparatus, wherein X-ray transmission information of a calibration jig is sampled and coordinates of a projection position of the rotation center axis are calculated from the collected X-ray transmission information.
互いに対向配置されたX線源およびX線検出器と、これらの間に配置された回転テーブルと、その回転テーブルの上に配置され、試料を搭載して移動もしくは傾動させるための少なくとも1軸の駆動機構を備えた試料テーブルと、その試料テーブル上に試料を搭載して上記回転テーブルを回転させつつX線を照射して、所定の回転角度ごとに採取したX線透過情報を用いて、上記回転中心軸に直交する平面に沿った試料の断層像を再構成する断層像再構成演算手段を備えたX線CT装置において、
上記回転テーブルに、X線吸収率の高い材質からなるワイヤとそのワイヤを直線状に保持するX線吸収率の低い材質からなる保持部材で構成された回転中心軸較正治具の保持部材を、上記ワイヤが上記回転中心軸の近傍において当該回転中心軸に沿うように着脱自在もしくは退避自在に装着するための較正治具装着機構が設けられていることを特徴とするX線CT装置。
An X-ray source and an X-ray detector arranged opposite to each other, a rotary table arranged therebetween, and at least one axis arranged on the rotary table for mounting or moving or tilting the sample Using the X-ray transmission information collected at every predetermined rotation angle by irradiating X-rays while rotating the rotary table with the sample mounted on the sample table with the sample table mounted thereon, In an X-ray CT apparatus provided with a tomogram reconstruction calculation means for reconstructing a tomogram of a sample along a plane orthogonal to the rotation center axis,
A holding member of a rotation center axis calibration jig composed of a wire made of a material having a high X-ray absorption rate and a holding member made of a material having a low X-ray absorption rate that holds the wire in a straight line on the rotary table, An X-ray CT apparatus comprising a calibration jig mounting mechanism for mounting the wire in a detachable or retractable manner along the rotation center axis in the vicinity of the rotation center axis.
互いに対向配置されたX線源およびX線検出器と、そのX線源とX線検出器との対を所定の回転中心軸の回りに回転させる回転機構と、上記X線源とX線検出器の間に配置された試料台と、その試料台上に配置され、試料を搭載して移動もしくは傾動させるための少なくとも1軸の駆動機構を備えた試料テーブルと、その試料テーブル上に試料を搭載して上記X線源とX線検出器の対を回転させつつX線を照射し、所定の回転角度ごとに採取したX線透過情報を用いて、上記回転中心軸に直交する平面に沿った試料の断層像を再構成する断層像再構成手段を備えたX線CT装置において、
上記試料台に、X線吸収率の高い材質からなるワイヤとそのワイヤを直線状に保持するX線吸収率の低い材質からなる保持部材で構成された回転中心軸較正治具の保持部材を、上記ワイヤが上記回転中心軸の近傍において当該回転中心軸に沿うように着脱自在もしくは退避自在に装着するための較正治具装着機構が設けられていることを特徴とするX線CT装置。
An X-ray source and an X-ray detector arranged opposite to each other, a rotation mechanism for rotating a pair of the X-ray source and the X-ray detector around a predetermined rotation center axis, and the X-ray source and the X-ray detection A sample table arranged between the vessels, a sample table arranged on the sample table and equipped with at least one axis drive mechanism for mounting or moving or tilting the sample, and a sample on the sample table Mounted and irradiated with X-rays while rotating the pair of the X-ray source and the X-ray detector, and using the X-ray transmission information collected at every predetermined rotation angle, along a plane orthogonal to the rotation center axis In an X-ray CT apparatus provided with a tomographic image reconstruction means for reconstructing a tomographic image of a sample,
A holding member of a rotation center axis calibration jig composed of a wire made of a material having a high X-ray absorption rate and a holding member made of a material having a low X-ray absorption rate that holds the wire linearly on the sample stage, An X-ray CT apparatus comprising a calibration jig mounting mechanism for mounting the wire in a detachable or retractable manner along the rotation center axis in the vicinity of the rotation center axis.
JP2003364222A 2003-10-24 2003-10-24 Calibration method of rotation center axis in X-ray CT apparatus and X-ray CT apparatus Expired - Lifetime JP4045442B2 (en)

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