JP4033750B2 - Sensitivity calibration method and sensitivity calibration apparatus for X-ray foreign substance inspection apparatus - Google Patents

Sensitivity calibration method and sensitivity calibration apparatus for X-ray foreign substance inspection apparatus Download PDF

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JP4033750B2
JP4033750B2 JP2002293146A JP2002293146A JP4033750B2 JP 4033750 B2 JP4033750 B2 JP 4033750B2 JP 2002293146 A JP2002293146 A JP 2002293146A JP 2002293146 A JP2002293146 A JP 2002293146A JP 4033750 B2 JP4033750 B2 JP 4033750B2
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foreign
ray
foreign substance
inspection apparatus
sample
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JP2004125715A (en
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勝三 川西
光一 沖田
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Yamato Scale Co Ltd
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Yamato Scale Co Ltd
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    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/02Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material
    • G01N23/06Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and measuring the absorption
    • G01N23/083Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and measuring the absorption the radiation being X-rays
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00Investigating materials by wave or particle radiation
    • G01N2223/30Accessories, mechanical or electrical features
    • G01N2223/303Accessories, mechanical or electrical features calibrating, standardising
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00Investigating materials by wave or particle radiation
    • G01N2223/60Specific applications or type of materials
    • G01N2223/643Specific applications or type of materials object on conveyor
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00Investigating materials by wave or particle radiation
    • G01N2223/60Specific applications or type of materials
    • G01N2223/652Specific applications or type of materials impurities, foreign matter, trace amounts

Description

【0001】
【発明の属する技術分野】
本発明は、透過X線の検出によって被検査物に含まれる異物の検出を行うX線異物検査装置の感度校正装置に関する。
【0002】
【従来の技術】
従来から、食品や医薬品に含まれる異物(金属、石、ガラス、合成樹脂、骨、ゴム等)の検出に、X線異物検査装置が用いられている。また、前記X線異物検査装置は、被検査物にX線が照射され、その透過X線の画像デ−タに基づいて、前記被検査物に含まれる異物の検出を行うものである。また、前記X線異物検査装置はラインセンサを備えることによって、搬送装置上の被検査物の透過像を検出することができ、前記被検査物に含まれる異物が検出されれば、搬送装置上から排除することを行っている。
【0003】
従来のX線異物検査装置は、例えば搬送装置上の被検査物を透過したX線をラインセンサによって撮像し、前記撮像によって得られる画像デ−タに基づいて、しきい値との比較判定処理を行うことで異物検出を行っている。また、被検査物の異物検査に対して、事前に感度校正を行っている。前記感度校正の方法として、異物試料を混入した被検査物を、前記X線異物検査装置に通してX線異物検査装置の感度校正を手動で行う方法がある。また、異物試料を用いた手動の方法として、複数の異物試料を混入させた複数の被検査物を用意して、前記複数の被検査物毎に該被検査物をX線異物検査装置に通して、その都度、感度校正を行っている。また、前記X線異物検査装置では、使用中においてX線照射量の変動、その他により、異物検出感度の変動が生じることがある。そこで、使用状態の途中においても、異物試料を混入した被検査物をX線異物検査装置に通して、その感度校正を行っている。
【0004】
【発明が解決しようとする課題】
前述したように、従来のX線異物検査装置では、異物試料を用いて感度校正を手動で行う場合に、使用前と使用途中において、異物試料毎に異物試料を被検査物に混入したものをX線異物検査装置に通して、その都度、感度校正を行う必要があるので、校正作業に手間がかかるとともに、時間を必要とし、効率的な校正作業が行えないという問題点がある。
【0005】
そこで、本発明は、このような従来技術の問題点を解決し、異物試料を用いたX線異物検査装置の感度校正作業を効率的に行うことができる校正装置を提供することを目的とする。
【0006】
【課題を解決するための手段】
透過X線によって、被検査物に含まれる異物の検出を行うX線異物検査装置において、前記X線異物検査装置の異物検出部に対して、異物試料を保持して通過させる移動手段を備え、前記異物試料に対してX線を照射し、その透過X線像の画像デ−タに基づいて出力される異物検出信号により、前記X線異物検査装置の感度校正を行うとともに、前記異物試料の移動手段は、駆動装置と、該駆動装置に連結される回動軸と、該回動軸に設けられる支持ア−ムとを備え、前記支持ア−ムは、異物検出用センサ上を回動するようにしたことを特徴とするものである。(請求項1)。
【0007】
これにより、異物試料を保持して移動する移動手段を用いて、行われる異物検査における異物検出結果に基づいて、前記X線異物検査装置の感度校正を行うことができるとともに、簡単な構造の移動手段を用いて異物試料をそれぞれ保持すると共に前記X線異物検査装置の検出部を通過させることができ、前記X線異物検査装置の感度校正を効率的に行うことが可能である。
【0008】
そして、透過X線によって、被検査物に含まれる異物の検出を行うX線異物検査装置において、前記X線異物検査装置の異物検出部に対して、第一の容積を有する異物試料及び第二の容積を有する異物試料を一組として、一体的に備えた異物試料体を保持して通過させる前記異物試料の移動手段を備え、前記第一の容積を有する異物試料及び第二の容積を有する異物試料に対してX線を照射し、その透過X線像の画像デ−タに基づいて出力されるそれぞれの異物検出信号により、前記X線異物検査装置の感度校正を行うとともに、前記異物試料の移動手段は、駆動装置と、該駆動装置に連結される回動軸と、該回動軸に設けられる支持ア−ムとを備え、前記支持ア−ムは、異物検出用センサ上を回動するようにしたことを特徴とするものである。(請求項2)。
【0009】
これによって、さらに2種類の異なる容積を有する一組の異物試料を同時に異物検査し、前記異物試料の異物検出結果に基づいて、前記X線異物検査装置の感度校正を行うことができ、感度校正をより効率的に行うことが可能である。
【0010】
そして、透過X線によって、被検査物に含まれる異物の検出を行うX線異物検査装置において、前記X線異物検査装置の異物検出部に対して、第一の容積を有する異物試料及び第二の容積を有する異物試料を一組として、複数の異物試料による複数の組の異物試料を一体的に備えた異物試料体を保持して通過させる前記異物試料の移動手段を備え、前記複数の組毎に第一の容積を有する異物試料及び第二の容積を有する異物試料に対してX線を照射し、その透過X線像の画像デ−タに基づいて出力されるそれぞれの異物検出信号により前記X線異物検査装置の感度校正を行うとともに、前記異物試料の移動手段は、駆動装置と、該駆動装置に連結される回動軸と、該回動軸に設けられる支持ア−ムとを備え、前記支持ア−ムは、異物検出用センサ上を回動するようにしたことを特徴とするものである。(請求項3)。
【0011】
これによって、2種類の異なる容積を有する異物試料を一組とした複数の異物試料による複数の組の異物試料を同時に異物検査し、前記複数の異物試料の異物検出結果に基づいて、前記X線異物検査装置の感度校正を行うことができ、感度校正をより効率的に行うことが可能である。
【0012】
そして、請求項2または請求項3のいずれかに記載のX線異物検査装置の感度校正装置について、前記第一の容積を有する異物試料は異物として検出され、第二の容積を有する異物試料は異物として検出されないように、前記X線異物検査装置の感度校正を行うことを特徴とする(請求項4)。
【0013】
これにより、前記異なる容積を有する一組の異物試料の内、一方の異物試料が異物検出されず、他方の異物試料が異物検出されるように前記X線異物検査装置の感度校正を行うことができ、感度校正をより簡便で且つ正確に行うことが可能である。
【0016】
また、さらに、請求項1乃至4のいずれかに記載のX線異物検査装置の感度校正装置について、前記異物試料の移動手段の制御手段をさらに備え、前記移動手段に設けられる支持ア−ムの回動の正転時及び逆転時のそれぞれにおいて感度校正がされることを特徴とするものである。(請求項5)。
【0017】
これにより、移動手段の制御手段をさらに備えることで、前記移動手段に設けられる支持ア−ムの回動の正転時及び逆転時のそれぞれにおいて感度校正ができるので、前記X線異物検査装置の感度校正を効率的に行うことが可能である。
【0018】
【発明の実施の形態】
次に、添付図面に基づいて、本発明の実施の形態について本発明をより詳細に説明する。
【0019】
図1は、本発明の感度校正用異物試料の移動手段を用いた感度校正装置を適用することができるX線異物検査装置1の構成図を示す。X線異物検査装置はX線発生部2とX線ラインセンサ4とを搬送コンベア3を挟んで対向して配置し、X線ラインセンサ4は、X線撮像制御部5により被検査物9の撮像を行い、X線画像処理部6は前記撮像した透過X線を画像処理して、透過X線の画像デ−タを生成する。また、画像デ−タは異物検出判定部7に入力され、被検査物に含まれる異物の検出判定を行い、結果が表示部8に表示される。 これによって被検査物中の異物検出の有無と異物の位置を確認することができる。また、駆動装置10は、感度校正用の異物試料を保持して、X線ラインセンサ4上を移動させるもので、その動作は移動手段制御部11によって制御される。
【0020】
図2及び図3は、本発明の第一の実施の形態にかかる異物試料移動手段の外観を概略的に示す図である。図2は上から見た図であり、図3は側面図である。図2及び図3において、3はX線異物検査装置の搬送ベルトであり、その下部に搬送方向と直角の方向にX線ラインセンサ4が配設されている。また、駆動装置10は異物試料を保持して回動駆動するための電動機であり、移動手段固定枠28によって、X線異物検査装置の本体フレ−ム21に取付けられている。前記移動手段固定枠28の上部には電動機10の回転軸と連結された回動軸26の軸受部27が設けられている。また、前記回動軸26には、異物試料22を一体に備えた異物試料体23を支持して回動する支持ア−ム25が取付けられている。さらに、支持ア−ム25には感度校正用の異物試料22を一体に備えた異物試料体23が固定金具24により取付けられている。通常、異物試料体23の支持ア−ム25は搬送装置の側方の位置Aにて搬送ベルト3の搬送方向と平行した状態で停止している。そこで、感度校正時に駆動装置制御部11からの制御信号に基づき、駆動装置である電動機10が駆動される。
【0021】
このとき、前記支持ア−ム25は搬送ベルト3側の方向に略180度回動して、回動軸26に対して位置Aの反対位置Bで停止する。また、前記回動の途中において、支持ア−ム25に取り付けられた異物試料体23に一体的に備えられた異物試料22が、X線ラインセンサ4の上部を移動して通過する。この間、前記異物試料22の移動によって1回の感度校正がされる。また、前記位置Bに停止している支持ア−ム25は、次回の感度校正時に駆動装置制御部11からの制御信号に基づき、駆動装置である電動機10が駆動され、前回校正時とは逆方向に搬送ベルト3の方向に略180度回動して、回動軸26に対して位置Bの反対位置Aで停止する。このように、前記支持ア−ム25の正転による回動及び逆転による回動によって、2回の感度校正を行うことができる。また、支持ア−ム25に取付けられた異物試料体23に備えられる異物試料22の回動時の移動速度は、その周速が略搬送ベルト3の搬送速度に等しくなるように設定することができる。これによって、異物試料の速度を被検査物の異物検査時での搬送速度に近い速度とすることで、より精度良く感度校正ができる。
【0022】
次に図4に異物試料体の他の実施例を示す。前記異物試料体23bには、1組のそれぞれ異なる容積を有する二つの異物試料29a及び30aが備えられている。感度校正時には、前記異物試料の内小さい容積を有する異物試料29aに対しては、異物として検出されなく、大きい容積を有する異物試料30aに対しては異物として検出されるように、感度の調整を行うことができる。さらに、図5に異物試料体の更なる他の実施例を示す。前記異物試料体23cは、それぞれ2種類の異なる容積を有する複数の異物試料の組を一体的に備えた異物試料体であり、前記異物試料とはできるだけ密度の異なる低密度の材質のものが適しており、例えば低密度樹脂を採用することができる。また、前記複数の異物試料による組は異物試料体に、支持ア−ム25の回動軸26の同心円上に列を形成して配設され、前記異物試料体に固定または埋め込まれている。前記異物試料体23cは、それぞれ2種類の異なる容積を有する複数の異物試料の組を一体的に備えた異物試料体であり、異物試料29bと30b、29cと30c及び29dと30dが備えられている。
【0023】
また、29b及び30bは例えば、金属の異物試料による組であり、29bはX線異物検査装置により異物検出されなくてもよい大きさ(φ0.4mm)の球により形成され、30bはX線異物検査装置により異物検出されるべき大きさ(φ0.5mm)の球により形成されている。また、29c及び30cは例えば、石の異物試料による組であり、29cはX線異物検査装置により異物検出されなくてもよい大きさ(φ1mm)の球により形成され、30cはX線異物検査装置により異物検出されるべき大きさ(φ2mm)の球により形成されている。また、29d及び30dは例えば、ガラスの異物試料による組であり、29dはX線異物検査装置により異物検出されなくてもよい大きさ(φ1mm)の球により形成され、30dはX線異物検査装置により異物検出されるべき大きさ(φ2mm)の球により形成されている。また、異物試料としてその他にも、高密度合成樹脂、高密度ゴム、硬骨、貝殻、卵の殻等の異物試料を備えることができる。
【0024】
さらに、前記移動手段を用いて、X線異物検査装置の停止中において、感度校正を行うことができるが、運転中においても搬送装置上を被検査物が搬送され、検出センサ上を通過する合間に、前記駆動装置を制御して前記異物試料体を移動させることで、前記X線ラインセンサ4上を通過させ、検出感度の校正作業が行える。まず、X線異物検査装置1の停止中における検出感度の校正作業について図6のフローチャートに基づいて説明する。駆動装置制御部11の図示しない押し釦スイッチをONすることによってスタート信号が出力され(S1)、前記スタート信号により例えば電動機のような駆動装置10がONして、作動する(S2)。これに伴って、駆動装置の回動軸26に固定された支持アーム25が回動して(S3)、支持アーム25に備えられた異物試料体23が異物検出用センサ上を通過して、この間、異物試料体に備えられた異物試料29,30に対して異物検査が行われる(S4)。
【0025】
さらに前記支持アーム25が所定の位置まで回動して、停止する(S5)。また、S4において異物検査された結果のX線画像がモニターに表示され(S6)、前記X線画像に基づいて異物試料が適切に検出されているかどうかの確認を行い、これによってX線異物検査装置の検出感度の適否を判定する(S7)。この場合、前記異物試料体23の透過X線デ−タに基づく解析画像を見て、前記異物試料体23に備えられた各異物試料の組について、その異物検出の有無と異物の位置を確認して、複数の異物試料の組毎に、検出されなくてもよい試料と、検出されるべき試料に対して、異物検出が正しく行われているかどうかの判定がされる。続いて、S7において検出感度が適正であると判定されれば、これによって検出感度の校正を行う必要がなく、作業が完了する(S9)。また、S7において検出感度が不適正であると判定されれば、X線異物検査装置の異物検出基準(しきい値)の変更を行い(S8)、続いて、前記S8で行った異物検出基準(しきい値)の変更の結果を確認するため、再度S1乃至S7のフローを実行する。このようにして、S7において検出感度の適正判定がされるまでS1乃至S8のフローが繰り返される。
【0026】
次に、X線異物検査装置1の運転中における検出感度の校正作業について、説明する。前記X線異物検査装置1の異物検出部の近傍に備えられた、図示しない被検査物検出用センサからの検出信号に基づき、図6のフローチャートと同様にS1のスタート信号を発生させる。また、前記スタート信号は、運転中の連続して搬送される被検査物の間隙を利用して、前記支持アーム25及び異物試料体23が異物検出センサ(X線ラインセンサー4)上を回動できるように、予めタイミングが設定されている。その後の動作は図6のフローチャートと同様であるが、S6におけるX線画像モニター表示は、画像に基づく判定のために、所定の時間は固定されるようになっている。したがって、この間は連続搬送され、異物検査される被検査物に対するX線画像モニター表示はされない。また、X線異物検査装置の感度調整には、異物検出の異物検出基準値(しきい値)の調整方法等の他、X線照射用の管球の管電圧や管電流による調整方法がある。
【0027】
【発明の効果】
以上のように、本発明によれば、X線異物検査装置において、簡単な構成による移動手段を設けて、前記移動手段の駆動装置を制御することで、一組または複数の2種類の異なる容積を有する異物試料の組を一体的に備える異物試料体を移動させることで、異物検出センサ上を通過させ異物検査した結果に基づいて、前記X線異物検査装置の感度校正を行うことができ、感度校正をより簡便且つ効率的に行うことが可能である。
【図面の簡単な説明】
【図1】 本発明の感度校正装置を適用することができるX線異物検査装置の構成図である。
【図2】 本発明の感度校正用移動手段及び異物試料体の第一の実施例の外観を概略的に示す平面図である。
【図3】 本発明の感度校正用移動手段及び異物試料体の第一の実施例の外観を概略的に示す側面図である。
【図4】 本発明の感度校正用移動手段の異物試料体の他の実施例の外観を概略的に示す図である。
【図5】 本発明の感度校正用移動手段の異物試料体の更なる他の実施例の外観を概略的に示す図である。
【図6】 本発明の感度校正装置を適用することができるX線異物検査装置の動作を示すフローチャートである。
【付号の説明】
1 X線異物検査装置
2 X線発生部
3 搬送コンベア
4 X線ラインセンサ
5 X線撮像制御部
6 X線画像処理部
7 異物検出判定部
8 表示部
9 被検査物
10 駆動手段
11 駆動手段制御部
21 X線異物検査装置本体フレ−ム
22 異物試料
23a 異物試料体
24 異物試料体固定金具
25 支持ア−ム
26 回動軸
27 軸受部
28 移動手段固定枠
29a〜29d 第一の容積を有する異物試料
30a〜30d 第二の容積を有する異物試料
[0001]
BACKGROUND OF THE INVENTION
The present invention relates to a sensitivity calibration apparatus for an X-ray foreign substance inspection apparatus that detects foreign substances contained in an inspection object by detecting transmitted X-rays.
[0002]
[Prior art]
Conventionally, an X-ray foreign substance inspection apparatus has been used for detecting foreign substances (metal, stone, glass, synthetic resin, bone, rubber, etc.) contained in foods and pharmaceuticals. The X-ray foreign substance inspection apparatus irradiates the inspection object with X-rays and detects the foreign substance contained in the inspection object based on the transmitted X-ray image data. In addition, the X-ray foreign substance inspection apparatus includes a line sensor, so that a transmission image of the inspection object on the conveyance apparatus can be detected. If a foreign substance contained in the inspection object is detected, the X-ray foreign substance inspection apparatus Is going to be excluded from.
[0003]
A conventional X-ray foreign substance inspection apparatus, for example, images X-rays transmitted through an object to be inspected on a transport device by a line sensor, and compares and determines a threshold value based on image data obtained by the imaging. The foreign matter is detected by performing In addition, sensitivity calibration is performed in advance for the foreign object inspection of the inspection object. As the sensitivity calibration method, there is a method in which an inspection object mixed with a foreign material sample is passed through the X-ray foreign material inspection device and sensitivity calibration of the X-ray foreign material inspection device is manually performed. As a manual method using a foreign material sample, a plurality of inspection objects mixed with a plurality of foreign material samples are prepared, and the inspection object is passed through an X-ray foreign material inspection apparatus for each of the plurality of inspection objects. Each time, sensitivity calibration is performed. Further, in the X-ray foreign substance inspection apparatus, fluctuations in foreign substance detection sensitivity may occur during use due to fluctuations in the amount of X-ray irradiation and others. Therefore, even during the use state, the inspection object mixed with the foreign material sample is passed through the X-ray foreign material inspection apparatus to calibrate the sensitivity.
[0004]
[Problems to be solved by the invention]
As described above, in a conventional X-ray foreign substance inspection apparatus, when sensitivity calibration is manually performed using a foreign substance sample, a foreign substance sample mixed into the inspection object for each foreign substance sample before and during use. Since it is necessary to calibrate the sensitivity each time it passes through the X-ray foreign substance inspection apparatus, there are problems that it takes time and labor for the calibration work and an efficient calibration work cannot be performed.
[0005]
SUMMARY OF THE INVENTION Accordingly, an object of the present invention is to provide a calibration apparatus that solves such problems of the prior art and can efficiently perform sensitivity calibration work of an X-ray foreign substance inspection apparatus using a foreign substance sample. .
[0006]
[Means for Solving the Problems]
In the X-ray foreign substance inspection apparatus that detects the foreign substance contained in the object to be inspected by transmitted X-rays, the X-ray foreign substance inspection apparatus includes a moving unit that holds and passes the foreign substance sample to the foreign substance detection unit of the X-ray foreign substance inspection apparatus, The X-ray foreign substance inspection apparatus is calibrated with the X-ray X-ray foreign substance inspection signal by irradiating the X-ray with the X-ray image on the X-ray image of the X-ray image. The moving means includes a driving device, a rotating shaft connected to the driving device, and a supporting arm provided on the rotating shaft, and the supporting arm rotates on the foreign matter detection sensor. It is characterized by doing so. (Claim 1).
[0007]
This makes it possible to calibrate the sensitivity of the X-ray foreign matter inspection apparatus based on the foreign matter detection result in the foreign matter inspection performed using the moving means for holding and moving the foreign matter sample, and to move the structure easily. The foreign matter samples can be held using the means and can be passed through the detection unit of the X-ray foreign matter inspection apparatus, and sensitivity calibration of the X-ray foreign matter inspection apparatus can be performed efficiently.
[0008]
And in the X-ray foreign substance inspection apparatus which detects the foreign substance contained in the inspection object by the transmitted X-ray, the foreign substance sample having the first volume and the second with respect to the foreign substance detection part of the X-ray foreign substance inspection apparatus A foreign substance sample having the above volume is provided as a set, and the foreign substance sample moving means for holding and passing the integrally provided foreign substance sample body is provided, and the foreign substance sample having the first volume and the second volume are provided. X-rays are radiated to the foreign material sample, and sensitivity correction of the X-ray foreign material inspection apparatus is performed by each foreign material detection signal output based on the image data of the transmitted X-ray image. The moving means includes a driving device, a rotating shaft connected to the driving device, and a supporting arm provided on the rotating shaft, and the supporting arm rotates on the foreign matter detection sensor. It is characterized by being able to move . (Claim 2).
[0009]
As a result, a set of foreign matter samples having two different volumes can be simultaneously inspected for foreign matter, and the sensitivity calibration of the X-ray foreign matter inspection apparatus can be performed based on the foreign matter detection result of the foreign matter sample. Can be performed more efficiently.
[0010]
And in the X-ray foreign substance inspection apparatus which detects the foreign substance contained in the inspection object by the transmitted X-ray, the foreign substance sample having the first volume and the second with respect to the foreign substance detection part of the X-ray foreign substance inspection apparatus A foreign substance sample having a volume of a plurality of foreign substance samples and a foreign substance sample moving means for holding and passing a foreign substance sample body integrally including a plurality of foreign substance samples of a plurality of foreign substance samples. X-rays are radiated to the foreign material sample having the first volume and the foreign material sample having the second volume every time, and each foreign material detection signal output based on the image data of the transmitted X-ray image is used. While performing sensitivity calibration of the X-ray foreign substance inspection apparatus , the foreign substance moving means includes a driving device, a rotating shaft connected to the driving device, and a support arm provided on the rotating shaft. The support arm includes a foreign object detection sensor. The upper support is characterized in that so as to rotate. (Claim 3).
[0011]
As a result, a plurality of sets of foreign samples made of a plurality of foreign samples having two different types of foreign samples as a set are simultaneously inspected, and the X-ray is detected based on the foreign matter detection results of the plurality of foreign samples. Sensitivity calibration of the foreign substance inspection apparatus can be performed, and sensitivity calibration can be performed more efficiently.
[0012]
And about the sensitivity calibration apparatus of the X-ray foreign material inspection apparatus in any one of Claim 2 or Claim 3, the foreign material sample which has said 1st volume is detected as a foreign material, and the foreign material sample which has a 2nd volume is Sensitivity calibration of the X-ray foreign matter inspection apparatus is performed so that it is not detected as a foreign matter (claim 4).
[0013]
This makes it possible to calibrate the sensitivity of the X-ray foreign matter inspection apparatus so that one foreign matter sample of the pair of foreign matter samples having different volumes is not detected and the other foreign matter sample is detected. It is possible to perform sensitivity calibration more easily and accurately.
[0016]
Furthermore, the sensitivity calibration apparatus for an X-ray foreign substance inspection apparatus according to any one of claims 1 to 4 , further comprising a control means for moving means for moving the foreign material sample, and a support arm provided on the moving means. Sensitivity calibration is performed at each time of forward rotation and reverse rotation . (Claim 5).
[0017]
Thereby, since the control means of the moving means is further provided, the sensitivity can be calibrated at the time of forward rotation and reverse rotation of the support arm provided at the moving means. Sensitivity calibration can be performed efficiently.
[0018]
DETAILED DESCRIPTION OF THE INVENTION
Next, based on an accompanying drawing, the present invention is explained in detail about an embodiment of the present invention.
[0019]
FIG. 1 shows a configuration diagram of an X-ray foreign substance inspection apparatus 1 to which a sensitivity calibration apparatus using the sensitivity calibration foreign substance sample moving means of the present invention can be applied. In the X-ray foreign substance inspection apparatus, the X-ray generation unit 2 and the X-ray line sensor 4 are arranged to face each other with the conveyance conveyor 3 interposed therebetween, and the X-ray line sensor 4 is disposed on the inspection object 9 by the X-ray imaging control unit 5. Imaging is performed, and the X-ray image processing unit 6 performs image processing on the captured transmission X-rays to generate transmission X-ray image data. Further, the image data is input to the foreign object detection determination unit 7 to perform detection determination of the foreign object contained in the inspection object, and the result is displayed on the display unit 8. Thereby, the presence / absence of foreign matter detection in the inspection object and the position of the foreign matter can be confirmed. The driving device 10 holds a foreign material sample for sensitivity calibration and moves it on the X-ray line sensor 4, and its operation is controlled by the moving means control unit 11.
[0020]
2 and 3 are diagrams schematically showing the appearance of the foreign sample moving means according to the first embodiment of the present invention. 2 is a top view, and FIG. 3 is a side view. 2 and 3, reference numeral 3 denotes a transport belt of the X-ray foreign matter inspection apparatus, and an X-ray line sensor 4 is disposed below the transport belt in a direction perpendicular to the transport direction. The driving device 10 is an electric motor for holding and rotating the foreign material sample, and is attached to the main body frame 21 of the X-ray foreign material inspection device by a moving means fixing frame 28. A bearing portion 27 of a rotating shaft 26 connected to the rotating shaft of the electric motor 10 is provided on the moving means fixing frame 28. Further, a support arm 25 is attached to the rotating shaft 26 so as to support and rotate the foreign material sample body 23 integrally provided with the foreign material sample 22. Further, a foreign object sample body 23 integrally provided with a foreign substance sample 22 for sensitivity calibration is attached to the support arm 25 by a fixing bracket 24. Usually, the support arm 25 of the foreign object sample body 23 is stopped in a state parallel to the transport direction of the transport belt 3 at a position A on the side of the transport device. Therefore, based on the control signal from the drive device control unit 11 at the time of sensitivity calibration, the electric motor 10 as the drive device is driven.
[0021]
At this time, the support arm 25 rotates approximately 180 degrees in the direction toward the conveyor belt 3 and stops at a position B opposite to the position A with respect to the rotation shaft 26. Further, in the middle of the rotation, the foreign material sample 22 provided integrally with the foreign material sample body 23 attached to the support arm 25 moves and passes over the X-ray line sensor 4. During this time, sensitivity calibration is performed once by moving the foreign material sample 22. The support arm 25 stopped at the position B is driven by the electric motor 10 as a driving device based on a control signal from the driving device control unit 11 at the next sensitivity calibration, and is opposite to the previous calibration. It rotates about 180 degrees in the direction of the conveyance belt 3 in the direction, and stops at a position A opposite to the position B with respect to the rotation shaft 26. Thus, the sensitivity calibration can be performed twice by rotating the support arm 25 forward and backward. Further, the moving speed of the foreign material sample 22 provided in the foreign material sample body 23 attached to the support arm 25 when rotating can be set so that its peripheral speed is substantially equal to the transport speed of the transport belt 3. it can. Thus, sensitivity calibration can be performed with higher accuracy by setting the speed of the foreign material sample to a speed close to the conveyance speed at the time of foreign object inspection of the inspection object.
[0022]
Next, FIG. 4 shows another embodiment of the foreign material sample body. The foreign object sample body 23b is provided with a set of two foreign object samples 29a and 30a having different volumes. At the time of sensitivity calibration, sensitivity adjustment is performed so that the foreign material sample 29a having a small volume is not detected as a foreign material, and the foreign material sample 30a having a large volume is detected as a foreign material. It can be carried out. Furthermore, the further another Example of a foreign material sample body is shown in FIG. The foreign material sample body 23c is a foreign material sample body integrally including a set of a plurality of foreign material samples each having two different volumes, and is preferably made of a low-density material having a density different from that of the foreign material sample as much as possible. For example, a low density resin can be used. Further, the set of the plurality of foreign material samples is arranged on the foreign material sample in a row on a concentric circle of the rotation shaft 26 of the support arm 25, and is fixed or embedded in the foreign material sample. The foreign material sample body 23c is a foreign material sample body integrally including a plurality of sets of foreign material samples each having two different volumes, and includes foreign material samples 29b and 30b, 29c and 30c, and 29d and 30d. Yes.
[0023]
Further, 29b and 30b are, for example, a set of metal foreign material samples, 29b is formed of a sphere having a size (φ0.4 mm) that does not need to be detected by an X-ray foreign material inspection apparatus, and 30b is an X-ray foreign material. It is formed by a sphere having a size (φ0.5 mm) to be detected by the inspection device. 29c and 30c are, for example, a set of stone foreign matter samples, 29c is formed of a sphere having a size (φ1 mm) that does not require foreign matter detection by the X-ray foreign matter inspection device, and 30c is an X-ray foreign matter inspection device. Is formed by a sphere having a size (φ2 mm) to be detected by the foreign matter. 29d and 30d are, for example, a set of glass foreign matter samples, 29d is formed of a sphere having a size (φ1 mm) that does not require foreign matter detection by the X-ray foreign matter inspection device, and 30d is an X-ray foreign matter inspection device. Is formed by a sphere having a size (φ2 mm) to be detected by the foreign matter. In addition, foreign matter samples such as high-density synthetic resin, high-density rubber, bones, shells, and egg shells can be provided as foreign matter samples.
[0024]
Furthermore, the sensitivity can be calibrated while the X-ray foreign substance inspection apparatus is stopped by using the moving means, but the inspection object is transported on the transport apparatus and passes on the detection sensor even during operation. Further, by moving the foreign object sample body by controlling the driving device, the detection sensitivity can be calibrated by passing the X-ray line sensor 4. First, the calibration work of the detection sensitivity while the X-ray foreign substance inspection apparatus 1 is stopped will be described based on the flowchart of FIG. A start signal is output by turning on a push button switch (not shown) of the drive device controller 11 (S1), and the drive device 10 such as an electric motor is turned on by the start signal to operate (S2). Along with this, the support arm 25 fixed to the rotation shaft 26 of the drive device rotates (S3), and the foreign object sample body 23 provided on the support arm 25 passes over the foreign object detection sensor, During this time, foreign matter inspection is performed on the foreign matter samples 29 and 30 provided in the foreign matter sample body (S4).
[0025]
Further, the support arm 25 rotates to a predetermined position and stops (S5). In addition, the X-ray image obtained as a result of the foreign substance inspection in S4 is displayed on the monitor (S6), and it is confirmed whether or not the foreign substance sample is properly detected based on the X-ray image, thereby detecting the X-ray foreign substance. The suitability of the detection sensitivity of the device is determined (S7). In this case, by looking at the analysis image based on the transmission X-ray data of the foreign material sample body 23, the presence or absence of the foreign material detection and the position of the foreign material are confirmed for each set of foreign material samples provided in the foreign material sample body 23. Then, for each set of a plurality of foreign matter samples, it is determined whether or not foreign matter detection is correctly performed on a sample that may not be detected and a sample that is to be detected. Subsequently, if it is determined in S7 that the detection sensitivity is appropriate, it is not necessary to calibrate the detection sensitivity, and the operation is completed (S9). If it is determined in S7 that the detection sensitivity is inappropriate, the foreign matter detection standard (threshold value) of the X-ray foreign matter inspection apparatus is changed (S8), and then the foreign matter detection standard performed in S8. In order to confirm the result of the change of (threshold value), the flow of S1 to S7 is executed again. In this way, the flow of S1 to S8 is repeated until the appropriate determination of the detection sensitivity is made in S7.
[0026]
Next, the detection sensitivity calibration operation during operation of the X-ray foreign matter inspection apparatus 1 will be described. Based on a detection signal from an inspection object detection sensor (not shown) provided in the vicinity of the foreign matter detection unit of the X-ray foreign matter inspection apparatus 1, a start signal of S1 is generated as in the flowchart of FIG. The start signal uses the gap between the objects to be continuously conveyed during operation, and the support arm 25 and the foreign object sample body 23 rotate on the foreign object detection sensor (X-ray line sensor 4). Timing is set in advance so that it can be done. The subsequent operation is the same as that in the flowchart of FIG. 6, but the X-ray image monitor display in S6 is fixed for a predetermined time for determination based on the image. Therefore, during this time, the X-ray image monitor is not displayed on the inspection object that is continuously conveyed and inspected for foreign matter. In addition, the sensitivity adjustment of the X-ray foreign substance inspection apparatus includes a method for adjusting a foreign substance detection reference value (threshold value) for foreign substance detection, and an adjustment method using a tube voltage and a tube current of an X-ray irradiation tube. .
[0027]
【The invention's effect】
As described above, according to the present invention, in the X-ray foreign substance inspection apparatus, a moving unit having a simple configuration is provided, and the driving unit of the moving unit is controlled, so that one set or a plurality of two different volumes are provided. The X-ray foreign substance inspection apparatus can be calibrated based on the result of the foreign substance inspection by passing the foreign substance sample body integrally including a set of foreign substance samples having Sensitivity calibration can be performed more simply and efficiently.
[Brief description of the drawings]
FIG. 1 is a configuration diagram of an X-ray foreign substance inspection apparatus to which a sensitivity calibration apparatus of the present invention can be applied.
FIG. 2 is a plan view schematically showing the external appearance of a first embodiment of a sensitivity calibration moving means and a foreign object sample body of the present invention.
FIG. 3 is a side view schematically showing the external appearance of the first embodiment of the sensitivity calibration moving means and foreign object sample according to the present invention.
FIG. 4 is a diagram schematically showing the external appearance of another embodiment of the foreign object sample body of the sensitivity calibration moving means of the present invention.
FIG. 5 is a diagram schematically showing the external appearance of still another embodiment of the foreign object sample body of the sensitivity calibration moving means of the present invention.
FIG. 6 is a flowchart showing the operation of an X-ray foreign substance inspection apparatus to which the sensitivity calibration apparatus of the present invention can be applied.
[Explanation of number]
DESCRIPTION OF SYMBOLS 1 X-ray foreign material inspection apparatus 2 X-ray generation part 3 Conveyor 4 X-ray line sensor 5 X-ray imaging control part 6 X-ray image processing part 7 Foreign object detection determination part 8 Display part 9 Test object 10 Drive means 11 Drive means control Part 21 X-ray foreign substance inspection apparatus main body frame 22 Foreign object sample 23a Foreign object sample body 24 Foreign object sample body fixing bracket 25 Support arm 26 Rotating shaft 27 Bearing part 28 Moving means fixing frames 29a to 29d Foreign matter samples 30a-30d Foreign matter sample having a second volume

Claims (5)

透過X線によって、被検査物に含まれる異物の検出を行うX線異物検査装置において、前記X線異物検査装置の異物検出部に対して、異物試料を保持して通過させる移動手段を備え、前記異物試料に対してX線照射し、その透過X線像の画像デ−タに基づいて出力される異物検出信号により、前記X線異物検査装置の感度校正を行うとともに、前記異物試料の移動手段は、駆動装置と、該駆動装置に連結される回動軸と、該回動軸に設けられる支持ア−ムとを備え、前記支持ア−ムは、異物検出用センサ上を回動するようにしたことを特徴とするX線異物検査装置の感度校正装置。In the X-ray foreign substance inspection apparatus that detects the foreign substance contained in the object to be inspected by transmitted X-rays, the X-ray foreign substance inspection apparatus includes a moving unit that holds and passes the foreign substance sample to the foreign substance detection unit of the X-ray foreign substance inspection apparatus, The X-ray foreign substance inspection apparatus is calibrated with the X-ray X-ray foreign substance inspection signal by irradiating the X-ray with the X-ray image on the X-ray image of the X-ray image . The moving means includes a driving device, a rotating shaft connected to the driving device, and a supporting arm provided on the rotating shaft, and the supporting arm rotates on the foreign matter detection sensor. A sensitivity calibration apparatus for an X-ray foreign substance inspection apparatus, characterized in that: 透過X線によって、被検査物に含まれる異物の検出を行うX線異物検査装置において、前記X線異物検査装置の異物検出部に対して、第一の容積を有する異物試料及び第二の容積を有する異物試料を一組として、一体的に備えた異物試料体を保持して通過させる前記異物試料の移動手段を備え、前記第一の容積を有する異物試料及び第二の容積を有する異物試料に対してX線照射し、その透過X線像の画像デ−タに基づいて出力されるそれぞれの異物検出信号により、前記X線異物検査装置の感度校正を行うとともに、前記異物試料の移動手段は、駆動装置と、該駆動装置に連結される回動軸と、該回動軸に設けられる支持ア−ムとを備え、前記支持ア−ムは、異物検出用センサ上を回動するようにしたことを特徴とするX線異物検査装置の感度校正装置。In an X-ray foreign substance inspection apparatus for detecting foreign substances contained in an object to be inspected by transmitted X-rays, a foreign substance sample having a first volume and a second volume with respect to the foreign substance detection part of the X-ray foreign substance inspection apparatus A foreign material sample having a first volume and a foreign material sample having a second volume, and a foreign material sample having a first volume. irradiated with X-rays to the image data of the transmitted X-ray image - by the respective foreign object detection signal is output based on the data, performs sensitivity calibration of the X-ray foreign substance inspection apparatus, the movement of the foreign substance sample The means includes a driving device, a rotating shaft coupled to the driving device, and a supporting arm provided on the rotating shaft, and the supporting arm rotates on the foreign matter detection sensor. X-ray foreign substance inspection apparatus characterized by the the like Sensitivity calibration device. 透過X線によって、被検査物に含まれる異物の検出を行うX線異物検査装置において、前記X線異物検査装置の異物検出部に対して、第一の容積を有する異物試料及び第二の容積を有する異物試料を一組として、複数の異物試料による複数の組の異物試料を一体的に備えた異物試料体を保持して通過させる前記異物試料の移動手段を備え、前記複数の組毎に第一の容積を有する異物試料及び第二の容積を有する異物試料に対してX線照射し、その透過X線像の画像デ−タに基づいて出力されるそれぞれの異物検出信号により前記X線異物検査装置の感度校正を行うとともに、前記異物試料の移動手段は、駆動装置と、該駆動装置に連結される回動軸と、該回動軸に設けられる支持ア−ムとを備え、前記支持ア−ムは、異物検出用センサ上を回動するようにしたことを特徴とするX線異物検査装置の感度校正装置。 In an X-ray foreign substance inspection apparatus for detecting foreign substances contained in an object to be inspected by transmitted X-rays, a foreign substance sample having a first volume and a second volume with respect to the foreign substance detection part of the X-ray foreign substance inspection apparatus A foreign substance sample having a plurality of foreign substance samples, and a foreign substance sample moving means for holding and passing the foreign substance sample body integrally provided with a plurality of foreign substance samples. X-rays are irradiated to the foreign material sample having the first volume and the foreign material sample having the second volume, and the X-rays are detected by the respective foreign material detection signals output based on the image data of the transmitted X-ray image. While calibrating the sensitivity of the line foreign object inspection device, the moving means for moving the foreign material sample includes a driving device, a rotating shaft connected to the driving device, and a support arm provided on the rotating shaft, The support arm is placed on the foreign object detection sensor. Calibration device of the X-ray foreign substance inspection apparatus is characterized in that so as to movement. 前記第一の容積を有する異物試料は異物として検出され、第二の容積を有する異物試料は異物として検出されないように、前記X線異物検査装置の感度校正を行うことを特徴とする請求項2または請求項3のいずれかに記載のX線異物検査装置の感度校正方法。3. The sensitivity calibration of the X-ray foreign matter inspection apparatus is performed so that the foreign matter sample having the first volume is detected as a foreign matter, and the foreign matter sample having the second volume is not detected as a foreign matter. Or the sensitivity calibration method of the X-ray foreign material inspection apparatus in any one of Claim 3. 前記異物試料の移動手段の制御手段をさらに備え、前記移動手段に設けられる支持ア−ムの回動の正転時及び逆転時のそれぞれにおいて感度校正がされることを特徴とする請求項1乃至4のいずれかに記載のX線異物検査装置の感度校正装置。The control device for the moving means of the foreign material sample is further provided, and sensitivity calibration is performed at each time of forward rotation and reverse rotation of a support arm provided on the moving means. 4. The sensitivity calibration apparatus for an X-ray foreign substance inspection apparatus according to any one of 4 above.
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