JP2002168802A - X-ray foreign matter detector - Google Patents

Abstract

PROBLEM TO BE SOLVED: To achieve a detection with a higher accuracy regardless of the shape and the arrangement of foreign matters. SOLUTION: This apparatus is provided with a plurality of X-ray generators 1a and 1b for performing an exposure to X rays in a plane, a plurality of X-ray sensors 2a and 2b formed linearly so as to individually receive X rays from the X-ray generators 1a and 1b and a conveying part 3 making a flat conveying surface 3a for conveying a specimen W between the X-ray generators 1a and 1b and the X-ray sensors 2a and 2b. The X-ray generators 1a and 1b and the X-ray sensors 2a and 2b are so arranged as to make the X rays in a plane orthogonal to each other in the direction A of conveying the specimen W on the conveying surface 3a while turned to be different angles to the conveying surface 3a. Therefore, a plurality of X rays in a plane get the specimen W being conveyed onto the conveying surface 3a exposed thereto from different directions to allow recognition of foreign matters by the X rays from any direction thereby enabling the detection of foreign matters with a higher accuracy regardless of the shape and the arrangement of the foreign matters.

Description

DETAILED DESCRIPTION OF THE INVENTION

[0001]

TECHNICAL FIELD The present invention relates to raw meat, fish,
The present invention relates to an X-ray foreign matter detection device that detects foreign matter in a test object from the amount of X-ray transmitted when X-rays are irradiated to the test object of each type, such as processed foods and pharmaceuticals.

[0002]

2. Description of the Related Art Conventionally, for example, raw meat, fish, processed food,
2. Description of the Related Art An X-ray foreign matter detection device is used to detect foreign matter (metal, bone, glass, stone, synthetic resin material, etc.) in an inspected object (including the surface) of each kind such as a medicine. In this type of X-ray foreign matter detection device, an X-ray generator is mounted on the upper side of the device main body, and an X-ray sensor is mounted on the device main body at a position below the X-ray generator. Thus, the X-rays emitted from the X-ray generator are received by the X-ray sensor. Further, the apparatus main body is provided with a transport unit for passing the inspection object between the irradiated X-rays. The transport section has rollers arranged at positions before and after in the transport direction in the apparatus main body, and a belt is looped between the rollers. One of the rollers is driven by a driving device such as a motor attached to the apparatus main body. The belt is
Circulates by driving the rollers. As a result, the X-ray foreign matter detection device emits X-rays to the inspection object conveyed on the belt, and receives transmitted X-rays transmitted through the inspection object by the X-ray sensor, thereby detecting the X-ray foreign matter. Detects foreign substances contained in.

[0003]

However, in the above-described conventional X-ray foreign substance detecting apparatus, it may be difficult to detect the foreign substance in the inspection object depending on the shape and arrangement of the foreign substance. As described above, it is assumed that X-rays are emitted from the X-ray generator to the X-ray sensor in the vertical direction, and that the foreign matter in the inspection object transported by the transport unit has a thin plate shape. In this case, when X-rays are emitted from the thin plate surface in a horizontal arrangement of the foreign matter, the thin portion cannot be recognized as a foreign matter due to high X-ray transmittance. Further, even if the foreign matters have the same shape, if they are arranged perpendicular to the x-rays to be irradiated, the transmittance of the X-rays becomes low, and the foreign matters can be recognized as foreign matters.
As described above, there is a problem in that despite the presence of foreign matter, the absence of foreign matter is erroneously detected, and the inspection object to be a defective product flows as a non-defective product.

Accordingly, an object of the present invention is to provide an X-ray foreign matter detection device capable of detecting foreign matter regardless of the shape and arrangement thereof.

[0005]

According to a first aspect of the present invention, there is provided an X-ray foreign matter detecting apparatus for irradiating an object to be inspected with X-rays. Accordingly, the inspection object W is determined based on the amount of X-rays transmitted through the inspection object W.
In an X-ray foreign matter detection device that detects the presence or absence of foreign matter in
A plurality of X-ray generators 1a and 1b for irradiating X-rays in a plane;
A plurality of X-ray sensors 2a, 2a, 2,
2b, and a transport unit 3 forming a flat transport surface 3a for transporting the inspection object W between each of the X-ray generators 1a and 1b and each of the X-ray sensors 2a and 2b. The X-ray generators 1a and 1b are arranged so that the planar X-rays are orthogonal to the transport direction A of the inspection object W on the transport surface 3a of the transport unit 3, and , Are arranged so as to have different angles toward the transport surface 3a.

According to a second aspect of the present invention, there is provided an X-ray foreign matter detecting apparatus according to the first aspect, wherein each of the X-ray generators 1a and 1b transports each of the planar X-rays. Part 3
Is arranged so as to intersect with the inspection object W conveyed in the inspection object.

According to a third aspect of the present invention, there is provided an X-ray foreign matter detecting apparatus according to the second aspect, wherein a height of an intersection of each of the X-rays from the transport surface is variable. It is characterized by being.

In the X-ray foreign matter detecting device according to the fourth aspect, X-rays are emitted to the inspection object W, and the amount of X-rays transmitted through the inspection object W with the X-ray irradiation From the inspection object W
In an X-ray foreign matter detection device that detects the presence or absence of foreign matter in
A plurality of X-ray generators 1a and 1b for irradiating X-rays in a plane;
A plurality of X-ray sensors 2a, 2a, 2,
2b, and a transport unit 3 forming a flat transport surface 3a for transporting the inspection object W between each of the X-ray generators 1a, 1b and each of the X-ray sensors 2a, 2b. The X-ray generators 1a and 1b are arranged so that the planar X-rays have different angles with respect to the transport direction A of the inspection object W on the transport surface 3a of the transport unit 3. In addition, they are arranged so as to be parallel to the base line L perpendicular to the transport surface 3a.

According to a fifth aspect of the present invention, there is provided an X-ray foreign matter detection apparatus which irradiates an X-ray to the inspection object W and transmits the X-ray transmitted through the inspection object W with the X-ray irradiation. From the inspection object W
In an X-ray foreign matter detection device that detects the presence or absence of foreign matter in
A plurality of X-ray generators 1a and 1b for irradiating X-rays in a plane;
A plurality of X-ray sensors 2a, 2a, 2,
2b, and a transport unit 3 forming a flat transport surface 3a for transporting the inspection object W between each of the X-ray generators 1a and 1b and each of the X-ray sensors 2a and 2b. The X-ray generators 1a and 1b are arranged so that the planar X-rays have different angles with respect to the transport direction A of the inspection object W on the transport surface 3a of the transport unit 3. In addition, the transfer surface 3a is arranged so as to have a different angle with respect to a vertical base line L.

[0010]

DETAILED DESCRIPTION OF THE PREFERRED EMBODIMENTS Hereinafter, a first embodiment of the present invention will be specifically described with reference to the drawings. FIG. 1 is a front view showing a first embodiment of an X-ray foreign matter detection apparatus according to the present invention, and FIG.
2A is a side view of the X-ray foreign matter detection device, and FIG. 2B is a partial plan view of the X-ray foreign matter detection device.

As shown in FIGS. 1 and 2 (a) and 2 (b), the X-ray foreign matter detecting device mainly comprises an X-ray generating section 1 for generating X-rays, and an X-ray from the X-ray generating section 1. Object to be inspected W between the X-ray detector 2 and the X-ray detector 2 for receiving X-rays
And a transport unit 3 for transporting.

The X-ray generator 1 has a plurality (two in this embodiment) of X-ray generators 1a and 1b. Each of the X-ray generators 1a and 1b includes an X-ray tube 4,
The X-ray tube 4 is covered with a shielding plate to prevent leakage of X-rays.
The shielding plate is formed by internally applying a shielding material such as lead. Each of the X-ray generators 1a and 1b is disposed on an upper portion of a housing 5 forming a main body of the X-ray foreign matter detection device, and emits X-rays downward from the X-ray emission ports 6 and 6, respectively. The X-ray irradiation ports 6 and 6 are provided with focusing slits 7 and 7 as shown in FIG. As a result, the X-rays emitted by the X-ray generators 1a and 1b have a substantially conical shape spreading downward from the X-ray tubes 4 and 4, but the focusing slits 7 and 7 of the X-ray emission ports 6 and 6 are provided.
1 and FIG. 2A, the light is exposed as a planar shape spreading downward. In the X-ray generation unit 1, heat generated when X-rays are generated is radiated by cooling fins (not shown).

The X-ray detector 2 includes a plurality (two in this embodiment) of X-ray sensors 2a and 2b. Each of the X-ray sensors 2a and 2b receives planar X-rays emitted from the X-ray generator 1a by the X-ray sensor 2a at a lower portion of a housing 5 forming a main body of the X-ray foreign matter detection device. The X-ray sensor 2b receives planar X-rays emitted from the X-ray generator 1b.

Although not shown, each of the X-ray sensors 2a and 2b has a plurality of photodiodes arranged in a line,
An array line sensor including a scintillator provided on a photodiode is used. In this type of configuration, when X-rays are emitted to the inspection object W, the X-rays transmitted through the inspection object W are received by the scintillator and converted into light. The light converted by the scintillator is received by the photodiode. Each photodiode converts the received light into an electric signal and outputs the electric signal. Thus, X
The line sensors 2a and 2b are formed in a line shape. Each electric signal from the X-ray sensors 2a and 2b is input to the control means 13.

Each of the X-ray sensors 2a and 2b is housed in a metal box 8. The metal box 8 has a flat upper surface 8.
a is a slit (not shown) for transmitting the planar X-ray.
have. As a result, the planar X-rays emitted from the X-ray generators 1a and 1b are transmitted to the X-ray sensors 2a and 2b arranged in the metal box 8.

The transport unit 3 includes an X-ray generator 1 (X-ray generator 1).
a, 1b) to X-ray detector 2 (X-ray sensors 2a, 2b)
The inspection object W is caused to pass the X-rays emitted toward the inspection object W. As shown in FIG. 1 and FIGS. 2A and 2B,
The transport unit 3 includes a plurality of (four in this embodiment) rollers 9
And an endless transport belt 10 is stretched. Further, the rollers 8 and the conveyor belt 10 constituting the conveyor 3 are attached to the metal box 6 in which the X-ray detector 2 is accommodated. The transport unit 3 rotates one of the rollers 9 by driving a motor unit (not shown), and moves the transport belt 10 stretched between the rollers 9 in one direction (arrow A in FIGS. 1 and 2B). Direction). The transport belt 11 is
Circulates along the upper surface 6a of the metal box 6. Thereby, the inspection object W sent on the transport belt 11 is supported by the upper surface 6a of the metal box 6 as the transport surface 3a, transported in the transport direction (the direction of the arrow A), and the X-ray generator 1 (X Line generator 1a,
It passes between X-rays from 1b) to the X-ray detector 2 (X-ray sensors 2a and 2b).

The X-ray foreign matter detection device according to the first embodiment
The X-ray sensor 2a receives planar X-rays from the X-ray generator 1a, and receives planar X-rays from the X-ray generator 1b.
Receive. Each X-ray generator 1a, 1b and each X-ray
The line sensors 2a and 2b are arranged so that the planar X-rays are orthogonal to the transport direction (the direction of the arrow A) of the inspection object W on the transport surface 3a of the transport unit 3. That is, FIG.
As shown in (b), each of the linear X-ray sensors 2a, 2a
The X-ray generators 1a and 1b emit planar X-rays toward the X-ray sensors 2a and 2b, respectively. Furthermore, each X-ray generator 1a, 1b and each X-ray sensor 2a,
2b is arranged so that the planar X-rays have different angles with respect to the transport surface 3a. That is, as shown in FIG. 1, the X-ray generator 1a and the X-ray sensor 2a radiate a planar X-ray obliquely downward and rightward to the transport surface 3a,
The X-ray generator 1b and the X-ray sensor 2b emit a planar X-ray obliquely downward and leftward to the transport surface 3a. Thus, the inspection object W transported on the transport surface 3a is irradiated with planar X-rays from different directions.

As shown in FIGS. 1 and 2A, the structure of a metal box 8 for accommodating the X-ray detection unit 2 and the transport unit 3 attached to the metal box 8 are arranged in a housing 5. Cover 11 so as to prevent leakage of X-rays. Further, the cover 11 is formed with the rollers 9 on both sides, and an opening 12 which is open to the upper side thereof and through which the inspection object W passes.

In the first embodiment of the X-ray foreign matter detecting device having the above-described configuration, when the inspection object W is carried into the carrying belt 10 of the carrying unit 3 from one of the openings 12, the object W is placed on the carrying surface 3a. During the transport process in the direction of arrow A, the inspection object W is irradiated with planar X-rays from the X-ray generator 1b. X-rays that pass through the inspection object W with the X-ray exposure are detected by the X-ray sensor 2b. Next, when the inspection object W is transported in the direction of arrow A, the inspection object W is irradiated with planar X-rays from the X-ray generator 1a. X-rays that pass through the inspection object W with this irradiation are detected by the X-ray sensor 2a.

In the control means 13, each X-ray sensor 2a, 2
b, it is determined whether or not there is a foreign substance in the inspection object W (including the surface) based on an electric signal corresponding to the amount of transmitted X-rays. A selection signal indicating a good product (there is a foreign substance) is output to the outside.
After being inspected, the inspection object W is carried out of the other opening 12 and is sorted into a non-defective product and a defective product according to a selection signal output from the control unit 13.

Here, the shape and arrangement of the foreign matter on the inspection object W are various and unspecified. In particular, when a thin plate-shaped foreign substance is irradiated with X-rays from the thin plate surface, the transmittance of the X-ray is high and the foreign substance cannot be recognized as a foreign substance. However, in the above-described X-ray foreign matter detection device, the X-ray generator 1a and the X-ray sensor 2a,
The transport surface 3a is controlled by the X-ray generator 1b and the X-ray sensor 2b.
Planar X-rays are emitted from different directions to the inspection object W transported upward.

Therefore, in the above X-ray foreign matter detection device,
Even if it is a thin plate-like foreign material and one of the X-rays has a high transmittance and cannot be recognized, it can be recognized because the other X-ray has a low transmittance. Therefore, highly accurate detection without erroneous detection can be performed.

In the example of the first embodiment shown in FIG. 1, each X-ray intersects before reaching the transport surface 3a. With this configuration, each of the X-ray generators 1a, 1b
And the X-ray sensors 2a and 2b can be arranged close to each other in the transport direction of the inspection object W (direction of arrow A). Thereby, the plurality of X-ray generators 1
X having a, 1b and a plurality of X-ray sensors 2a, 2b
It is possible to reduce the size of the wire foreign matter detection device.

By the way, in the first embodiment, as shown in FIG. 3, each intersecting X-ray is applied to the inspection object W conveyed on the conveyance surface 3a of the conveyance section 3 within the inspection object W. It is possible to intersect. In order for each X-ray to intersect with the inspection object W conveyed on the conveyance surface 3a in the inspection object W, the intersection position of each X-ray is determined by the inspection object conveyed on the conveyance surface 3a. What is necessary is just to set it so that it may be in the range of the height of W.
According to this configuration, each X-ray is simultaneously emitted to the inspection object W transported on the transport surface 3a of the transport unit 3. Therefore, the foreign matter is detected almost simultaneously by the X-ray sensors 2a and 2b, so that it is possible to determine the shape of the foreign matter and the arrangement of the foreign matter on the inspection object W. .

Further, in the configuration shown in FIG.
so that the height of the intersection position of each X-ray from a can be changed,
Each X-ray generator 1a, 1b and each X-ray sensor 2a, 2b
May be configured to be movable. In this case, at least X
X-ray generator 1a and X-ray sensor 2a or X-ray generator 1
It suffices if any pair of b and X-ray sensor 2b is movable. Thereby, it is possible to have versatility that the intersection position of each X-ray can be changed according to the height of the inspection object W.
Furthermore, it is possible to set a crossing position of each X-ray at a desired height position of the inspection object W, and to detect foreign substances at a desired portion of the inspection object W substantially simultaneously.

Further, in a configuration in which X-rays are separately irradiated from a plurality of directions to the inspection object W conveyed on the conveyance surface 3a to detect foreign matter, the foreign matter may have any shape as described above. In order to determine the arrangement in the inspection object W, it is necessary to store the detection results of the respective X-rays and to delay each stored data by the moving time difference of the inspection object W. It is. However, according to the configuration shown in FIG. 3, the foreign matter is detected almost simultaneously, so that the process of delaying each stored data becomes unnecessary.

Further, there is a possibility that the inspection object W being transported by the transport unit 3 moves with respect to the transport surface 3a. In particular, a shape based on a circle tends to roll easily and has this tendency. When the inspection object W moves during the transport as described above, when performing the process of delaying each storage data of the detection result by each X-ray as described above, the foreign matter has any shape and any shape. It is not possible to determine whether the object W is located on the inspection object W with a proper arrangement. However, according to the configuration shown in FIG. 3, the foreign matter is detected almost simultaneously, so that the above determination can be made even if the inspection object W moves during the transportation.

In the X-ray foreign matter detection apparatus according to the first embodiment described above, the planar X-rays are applied to the inspection object W in different directions. Have different angles with respect to the transport surface 3a. As an example, in FIG. 1, each X-ray is configured to be emitted obliquely to the transport surface 3 a, but the present invention is not limited to this. For example, one X-ray may be irradiated to the transport surface 3a in a vertical direction, and the other X-ray may be emitted to the transport surface 3a in an oblique direction.

Hereinafter, a second embodiment of the present invention will be specifically described with reference to the drawings. FIG. 4 is a front view showing a second embodiment of the X-ray foreign matter detector of the present invention, FIG. 5A is a side view of the X-ray foreign matter detector, and FIG. 5B is the X-ray foreign matter detector. 3 is a partial plan view of FIG.

In the second embodiment of the X-ray foreign matter detector,
The configurations of the X-ray generation unit 1, the X-ray detection unit 2, and the transport unit 3 are the same as those of the first embodiment described above, and the X-ray generators 1a and 1b of the X-ray generation unit 1 and the X-ray detection unit 2 Of the X-ray sensors 2a and 2b are different. Therefore, in the second embodiment described below, the arrangement of the X-ray generators 1a and 1b and the X-ray sensors 2a and 2b will be described, and the same or similar parts as those in the first embodiment will be denoted by the same reference numerals. The description will be omitted.

The X-ray foreign matter detector according to the second embodiment is
The X-ray sensor 2a receives planar X-rays from the X-ray generator 1a, and receives planar X-rays from the X-ray generator 1b.
Receive. Each X-ray generator 1a, 1b and each X-ray
The line sensors 2a and 2b are arranged so that plane X-rays have different angles on the transfer surface 3a of the transfer unit 3.
That is, as shown in FIG. 5B, the linear X-ray sensors 2a and 2b are arranged in a substantially C-shape at different angles so as to cross the transport direction (the direction of arrow A). The X-ray generators 1a and 1b emit planar X-rays toward the sensors 2a and 2b. Further, each of the X-ray generators 1a and 1b and each of the X-ray sensors 2a and 2b are arranged so that planar X-rays are parallel to a base line L perpendicular to the transport surface 3a. That is, as shown in FIG. 4, the X-ray generator 1a and the X-ray sensor 2
a, X-ray generator 1b and X-ray sensor 2b
The line is irradiated vertically to the transport surface 3a. This allows
Planar X-rays are emitted from different directions to the inspection object W transported on the transport surface 3a.

In the second embodiment of the X-ray foreign substance detecting device having the above-described configuration, when the inspection object W is carried into the transport belt 10 of the transport section 3 from one of the openings 12, the inspection object W is placed on the transport surface 3a. During the transport process in the direction of arrow A, the inspection object W is irradiated with planar X-rays from the X-ray generator 1a. X-rays that pass through the inspection object W with the X-ray exposure are detected by the X-ray sensor 2a. Next, when the inspection object W is transported in the direction of the arrow A, the inspection object W is irradiated with planar X-rays from the X-ray generator 1b. X-rays that pass through the inspection object W with this irradiation are detected by the X-ray sensor 2b.

In the control means 13, each of the X-ray sensors 2a, 2a
b, it is determined whether there is a foreign substance in the inspection object W (including the surface) based on the electric signal corresponding to the amount of transmitted X-rays, and based on the result of the determination, a non-defective product (no foreign substance) or a non-defective product is determined. A selection signal indicating a good product (there is a foreign substance) is output to the outside.
After being inspected, the inspection object W is carried out of the other opening 12 and is sorted into a non-defective product and a defective product according to a selection signal output from the control unit 13.

Here, the shape and arrangement of the foreign matter on the inspection object W are various and unspecified. In particular, when a thin plate-shaped foreign substance is irradiated with X-rays from the thin plate surface, the transmittance of the X-ray is high and the foreign substance cannot be recognized as a foreign substance. However, in the above-described X-ray foreign matter detection device, the X-ray generator 1a and the X-ray sensor 2a,
The transport surface 3a is controlled by the X-ray generator 1b and the X-ray sensor 2b.
Planar X-rays are emitted from different directions to the inspection object W transported upward.

Therefore, in the above X-ray foreign matter detection device,
Even if it is a thin plate-like foreign material and one of the X-rays has a high transmittance and cannot be recognized, it can be recognized because the other X-ray has a low transmittance. Therefore, highly accurate detection without erroneous detection can be performed.

Hereinafter, a third embodiment of the present invention will be specifically described with reference to the drawings. FIG. 6 is a front view showing a third embodiment of the X-ray foreign matter detection device according to the present invention, FIG. 7 (a) is a side view of the X-ray foreign matter detection device, and FIG. 7 (b) is the X-ray foreign matter detection device. 3 is a partial plan view of FIG.

In the third embodiment of the X-ray foreign matter detector,
The configurations of the X-ray generation unit 1, the X-ray detection unit 2, and the transport unit 3 are the same as those of the first embodiment described above, and the X-ray generators 1a and 1b of the X-ray generation unit 1 and the X-ray detection unit 2 Of the X-ray sensors 2a and 2b are different. Therefore, in the third embodiment described below, the arrangement of the X-ray generators 1a and 1b and the X-ray sensors 2a and 2b will be described, and the same or equivalent parts as those in the first embodiment will be denoted by the same reference numerals. The description will be omitted.

The X-ray foreign matter detector according to the third embodiment is
An X-ray sensor 2a receives planar X-rays from the X-ray generator 1a, and an X-ray sensor 2b receives planar X-rays from the X-ray generator 1b.
Receive. Each X-ray generator 1a, 1b and each X-ray
The line sensors 2a and 2b are arranged so that plane X-rays have different angles on the transfer surface 3a of the transfer unit 3.
That is, as shown in FIG. 7B, the line-shaped X-ray sensors 2a and 2b are arranged in a substantially C-shape at different angles so as to cross the transport direction (the direction of arrow A). The X-ray generators 1a and 1b emit planar X-rays toward the sensors 2a and 2b. Further, each of the X-ray generators 1a and 1b and each of the X-ray sensors 2a and 2b are arranged so that planar X-rays have different angles with respect to a base line L perpendicular to the transport surface 3a. That is, as shown in FIG. 6, the X-ray generator 1a and the X-ray sensor 2a emit planar X-rays obliquely downward to the right onto the transport surface 3a, and the X-ray generator 1b and the X-ray sensor 2a. The line sensor 2b emits a planar X-ray obliquely downward and leftward to the transport surface 3a. Thus, the inspection object W transported on the transport surface 3a is irradiated with planar X-rays from different directions.

In the third embodiment of the X-ray foreign substance detecting device having the above-described configuration, when the inspection object W is carried into the transport belt 10 of the transport section 3 through one of the openings 12, the inspection object W is placed on the transport surface 3a. During the transport process in the direction of arrow A, the inspection object W is irradiated with planar X-rays from the X-ray generator 1b. X-rays that pass through the inspection object W with the X-ray exposure are detected by the X-ray sensor 2b. Next, when the inspection object W is transported in the direction of arrow A, the inspection object W is irradiated with planar X-rays from the X-ray generator 1a. X-rays that pass through the inspection object W with this irradiation are detected by the X-ray sensor 2a.

In the control means 13, each of the X-ray sensors 2a, 2
b, it is determined whether there is a foreign substance in the inspection object W (including the surface) based on the electric signal corresponding to the amount of transmitted X-rays, and based on the result of the determination, a non-defective product (no foreign substance) or a non-defective product is determined. A selection signal indicating a good product (there is a foreign substance) is output to the outside.
After being inspected, the inspection object W is carried out of the other opening 12 and is sorted into a non-defective product and a defective product according to a selection signal output from the control unit 13.

Here, the shape and arrangement of the foreign matter on the inspection object W are various and unspecified. In particular, when a thin plate-shaped foreign object is irradiated with X-rays from the thin plate surface, the transmittance of the X-ray is high and cannot be recognized as the foreign object. However, in the above-described X-ray foreign matter detection device, the X-ray generator 1a and the X-ray sensor 2a,
The transport surface 3a is controlled by the X-ray generator 1b and the X-ray sensor 2b.
Planar X-rays are emitted from different directions to the inspection object W transported upward.

Therefore, in the above X-ray foreign matter detector,
Even if it is a thin plate-like foreign material and one of the X-rays has a high transmittance and cannot be recognized, it can be recognized because the other X-ray has a low transmittance. Therefore, highly accurate detection without erroneous detection can be performed.

[0043]

As described above, the X-ray foreign matter detection device according to the present invention emits a plurality of planar X-rays from different directions to the inspection object conveyed on the conveyance surface. X can be recognized by X-rays from the direction, so that highly accurate foreign object detection can be performed regardless of the shape and arrangement of the foreign objects.

As a configuration for irradiating the inspection object with planar X-rays from different directions, the planar X-rays are made to be orthogonal to the transport direction of the inspection object on the transport surface. Further, a plurality of X-ray generators and X-ray sensors are arranged so as to have different angles toward the transport surface. In this case, each planar X
Foreign matter is detected at almost the same time by intersecting the lines in the object to be inspected. Therefore, it is necessary to determine whether the foreign matter has a shape and an arrangement in the object to be inspected. Can be.

Further, if the X-rays are crossed in the inspection object, the X-rays are separately irradiated from a plurality of directions to the inspection object W to detect foreign matter. The process of delaying the moving time difference of the inspection object W with respect to each storage data of the detection result by each X-ray becomes unnecessary.

Furthermore, if the X-rays are crossed in the inspection object, the X-rays are separately irradiated from a plurality of directions to the inspection object W to detect foreign matter. The above determination can be made even when the inspection object W moves with respect to the transport surface during the transport.

In a configuration in which each X-ray intersects within the inspection object, if the height of the intersection position of each X-ray from the transport surface can be changed, a general-purpose corresponding to the height of the inspection object can be used. In addition, foreign substances can be detected at a desired portion of the inspection object at substantially the same time.

Further, each planar X-ray is made to have a different angle with respect to the transport direction of the object to be inspected on the transport surface, and each X-ray is made parallel to a base line perpendicular to the transport surface. An X-ray generator and each of the X-ray sensors may be provided. Also in this case, a plurality of planar X-rays are emitted from different directions to the object to be inspected conveyed on the conveying surface, and foreign matter can be recognized by the X-rays from any direction. In addition, the detection can be performed regardless of the shape and arrangement of the foreign matter.

Each of the planar X-rays has a different angle with respect to the transport direction of the object to be inspected on the transport surface of the transport section, and has a different angle with respect to the base line perpendicular to the transport surface. Each X-ray generator and each X-ray sensor may be arranged so as to provide the following. Even in this case, a plurality of planar X-rays are emitted from different directions to the object to be inspected conveyed on the conveying surface, and foreign matter can be recognized by the X-rays from any direction. The detection can be performed regardless of the shape and arrangement of the foreign matter.

[Brief description of the drawings]

FIG. 1 is a front view showing a first embodiment of an X-ray foreign matter detection device of the present invention.

FIG. 2A is a side view of the X-ray foreign matter detection device. (B) Partial plan view of the X-ray foreign matter detection device.

FIG. 3 is a front view showing another example of the first embodiment.

FIG. 4 is a front view showing a second embodiment of the X-ray foreign matter detection device of the present invention.

FIG. 5A is a side view of the X-ray foreign matter detection device. (B) Partial plan view of the X-ray foreign matter detection device.

FIG. 6 is a front view showing a third embodiment of the X-ray foreign matter detection device of the present invention.

FIG. 7A is a side view of the X-ray foreign matter detection device. (B) Partial plan view of the X-ray foreign matter detection device.

[Explanation of symbols]

1a, 1b X-ray generator, 2a, 2b X-ray sensor, 3
... Conveying unit, 3a ... Conveying surface, A ... Conveying direction, L ... Base line, W
… Inspection object.

Claims (5)

[Claims] 1. An object to be inspected (W) is irradiated with X-rays.
An X-ray foreign matter detection device that detects the presence or absence of foreign matter in the inspection object based on the amount of X-rays transmitted through the inspection object along with the irradiation of X-rays; X-ray generator (1a, 1b)
A plurality of X-ray sensors (2a, 2b) formed in a line so as to receive X-rays from each of the X-ray generators, respectively.
And a transport section (3) forming a flat transport surface (3a) for transporting the inspection object between each of the X-ray generators and each of the X-ray sensors. A detector for transferring each of the planar X-rays on a transport surface of the transport unit in a transport direction of the inspection object (A)
An X-ray foreign matter detection device, wherein the X-ray detection device is arranged so as to be orthogonal to the image forming apparatus, and is arranged to have a different angle toward the transport surface. 2. The inspection object (W) in which each of the X-ray generators (1a, 1b) conveys each of the planar X-rays by the conveyance section (3). The X-ray foreign matter detection device according to claim 1, wherein the X-ray foreign matter detection device is arranged to cross each other. 3. The X-ray foreign matter detection device according to claim 2, wherein a height of an intersection position of each of the X-rays from the transport surface (3a) is variable. 4. An object to be inspected (W) is irradiated with X-rays.
An X-ray foreign matter detection device that detects the presence or absence of foreign matter in the inspection object based on the amount of X-rays transmitted through the inspection object along with the irradiation of X-rays; X-ray generator (1a, 1b)
A plurality of X-ray sensors (2a, 2b) formed in a line so as to receive X-rays from each of the X-ray generators, respectively.
And a transport section (3) forming a flat transport surface (3a) for transporting the inspection object between each of the X-ray generators and each of the X-ray sensors. The apparatus converts each of the planar X-rays into a transport direction (A) of the inspection object on a transport surface of the transport unit.
An X-ray foreign matter detection device, wherein the X-ray foreign matter detection device is disposed so as to have a different angle with respect to the transfer surface, and is disposed so as to be parallel to the vertical base line (L) on the transfer surface. 5. An inspection object (W) is irradiated with X-rays,
An X-ray foreign matter detection device that detects the presence or absence of foreign matter in the inspection object based on the amount of X-rays transmitted through the inspection object along with the irradiation of X-rays; X-ray generator (1a, 1b)
A plurality of X-ray sensors (2a, 2b) formed in a line so as to receive X-rays from each of the X-ray generators, respectively.
And a transport section (3) forming a flat transport surface (3a) for transporting the inspection object between each of the X-ray generators and each of the X-ray sensors. The apparatus converts each of the planar X-rays into a transport direction (A) of the inspection object on a transport surface of the transport unit.
An X-ray foreign matter detection device, wherein the X-ray foreign matter detection device is arranged so as to have a different angle with respect to a vertical line (L) on the conveyance surface.