JP3908222B2 - ダート蓄積補償機構を有する光沢センサ装置および方法 - Google Patents

ダート蓄積補償機構を有する光沢センサ装置および方法 Download PDF

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Publication number
JP3908222B2
JP3908222B2 JP2003514242A JP2003514242A JP3908222B2 JP 3908222 B2 JP3908222 B2 JP 3908222B2 JP 2003514242 A JP2003514242 A JP 2003514242A JP 2003514242 A JP2003514242 A JP 2003514242A JP 3908222 B2 JP3908222 B2 JP 3908222B2
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Japan
Prior art keywords
gloss
collimator
mirror
window
receive
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
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JP2003514242A
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English (en)
Japanese (ja)
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JP2004536305A (ja
JP2004536305A5 (enExample
Inventor
ベロットサーコヴァスキー，エドワード
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Honeywell International Inc
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Honeywell International Inc
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Publication date
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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/55—Specular reflectivity
    • G01N21/57—Measuring gloss

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  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)
JP2003514242A 2001-07-16 2002-07-16 ダート蓄積補償機構を有する光沢センサ装置および方法 Expired - Fee Related JP3908222B2 (ja)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US09/906,516 US6507403B1 (en) 2001-07-16 2001-07-16 Gloss sensor having dirt buildup compensation apparatus and method
PCT/US2002/022625 WO2003008947A1 (en) 2001-07-16 2002-07-16 Gloss sensor having dirt buildup compensation apparatus and method

Publications (3)

Publication Number Publication Date
JP2004536305A JP2004536305A (ja) 2004-12-02
JP2004536305A5 JP2004536305A5 (enExample) 2005-12-22
JP3908222B2 true JP3908222B2 (ja) 2007-04-25

Family

ID=25422578

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2003514242A Expired - Fee Related JP3908222B2 (ja) 2001-07-16 2002-07-16 ダート蓄積補償機構を有する光沢センサ装置および方法

Country Status (7)

Country Link
US (1) US6507403B1 (enExample)
EP (1) EP1407249B1 (enExample)
JP (1) JP3908222B2 (enExample)
AT (1) ATE360811T1 (enExample)
CA (1) CA2454202C (enExample)
DE (1) DE60219792T2 (enExample)
WO (1) WO2003008947A1 (enExample)

Families Citing this family (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US7423758B1 (en) * 2007-07-27 2008-09-09 Voith Patent Gmbh Gloss sensor for a paper machine
US7619740B2 (en) 2007-10-11 2009-11-17 Honeywell International Inc. Microgloss measurement of paper and board
DE102010017211B4 (de) 2010-06-02 2024-12-19 Vorwerk & Co. Interholding Gmbh Basisstation für ein selbsttätig verfahrbares Bodenreinigungsgerät sowie Verfahren zur Reinigung eines Bodens mittels eines solchen Bodenreinigungsgerätes
CN103983614A (zh) * 2014-05-28 2014-08-13 爱彼思（苏州）自动化科技有限公司 一种检测角度可调的光泽度检测装置

Family Cites Families (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3636361A (en) * 1970-05-28 1972-01-18 Kenneth Bowers Radiation-sensitive glossmeter with means to compensate for environmental contaminants
US4124803A (en) * 1976-12-22 1978-11-07 Kenneth Bowers Surface finish monitor
DE2853458C3 (de) * 1978-09-29 1981-04-02 Gebrüder Bühler AG, 9240 Uzwil Verfahren und Vorrichtung zur Messung der relativen Helligkeit einer Probe
JPH0420845A (ja) * 1990-05-15 1992-01-24 Jujo Paper Co Ltd 光沢むらの測定方法
US6233053B1 (en) * 1997-07-29 2001-05-15 Honeywell International Inc Dual standard gloss sensor
US6134011A (en) * 1997-09-22 2000-10-17 Hdi Instrumentation Optical measurement system using polarized light
JP4166340B2 (ja) * 1997-09-24 2008-10-15 オリンパス株式会社 基板検査装置
US5978441A (en) * 1997-12-01 1999-11-02 Advanced Micro Devices, Inc. Extreme ultraviolet lithography mask blank and manufacturing method therefor
US6380529B1 (en) * 1999-09-29 2002-04-30 Hewlett-Packard Company Position sensing device having a movable photosensing element

Also Published As

Publication number Publication date
JP2004536305A (ja) 2004-12-02
DE60219792D1 (de) 2007-06-06
US6507403B1 (en) 2003-01-14
EP1407249A1 (en) 2004-04-14
DE60219792T2 (de) 2008-01-17
CA2454202C (en) 2011-06-21
CA2454202A1 (en) 2003-01-30
WO2003008947A1 (en) 2003-01-30
EP1407249B1 (en) 2007-04-25
US20030011785A1 (en) 2003-01-16
ATE360811T1 (de) 2007-05-15

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