DE60219792D1 - Glanzsensor mit schmutzkompensationsvorrichtung und -verfahren - Google Patents

Glanzsensor mit schmutzkompensationsvorrichtung und -verfahren

Info

Publication number
DE60219792D1
DE60219792D1 DE60219792T DE60219792T DE60219792D1 DE 60219792 D1 DE60219792 D1 DE 60219792D1 DE 60219792 T DE60219792 T DE 60219792T DE 60219792 T DE60219792 T DE 60219792T DE 60219792 D1 DE60219792 D1 DE 60219792D1
Authority
DE
Germany
Prior art keywords
mirror
gloss
collimator
window
reflection device
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
DE60219792T
Other languages
English (en)
Other versions
DE60219792T2 (de
Inventor
Edward Belotserkovasky
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Honeywell International Inc
Original Assignee
Honeywell International Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Honeywell International Inc filed Critical Honeywell International Inc
Publication of DE60219792D1 publication Critical patent/DE60219792D1/de
Application granted granted Critical
Publication of DE60219792T2 publication Critical patent/DE60219792T2/de
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/55Specular reflectivity
    • G01N21/57Measuring gloss

Landscapes

  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)
DE60219792T 2001-07-16 2002-07-16 Glanzsensor mit schmutzkompensationsvorrichtung und -verfahren Expired - Lifetime DE60219792T2 (de)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
US906516 1978-05-17
US09/906,516 US6507403B1 (en) 2001-07-16 2001-07-16 Gloss sensor having dirt buildup compensation apparatus and method
PCT/US2002/022625 WO2003008947A1 (en) 2001-07-16 2002-07-16 Gloss sensor having dirt buildup compensation apparatus and method

Publications (2)

Publication Number Publication Date
DE60219792D1 true DE60219792D1 (de) 2007-06-06
DE60219792T2 DE60219792T2 (de) 2008-01-17

Family

ID=25422578

Family Applications (1)

Application Number Title Priority Date Filing Date
DE60219792T Expired - Lifetime DE60219792T2 (de) 2001-07-16 2002-07-16 Glanzsensor mit schmutzkompensationsvorrichtung und -verfahren

Country Status (7)

Country Link
US (1) US6507403B1 (de)
EP (1) EP1407249B1 (de)
JP (1) JP3908222B2 (de)
AT (1) ATE360811T1 (de)
CA (1) CA2454202C (de)
DE (1) DE60219792T2 (de)
WO (1) WO2003008947A1 (de)

Families Citing this family (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US7423758B1 (en) * 2007-07-27 2008-09-09 Voith Patent Gmbh Gloss sensor for a paper machine
US7619740B2 (en) 2007-10-11 2009-11-17 Honeywell International Inc. Microgloss measurement of paper and board
DE102010017211A1 (de) 2010-06-02 2011-12-08 Vorwerk & Co. Interholding Gmbh Basisstation für ein selbsttätig verfahrbares Bodenreinigungsgerät sowie Verfahren zur Reinigung eines Bodens mittels eines solchen Bodenreinigungsgerätes
CN103983614A (zh) * 2014-05-28 2014-08-13 爱彼思(苏州)自动化科技有限公司 一种检测角度可调的光泽度检测装置

Family Cites Families (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3636361A (en) * 1970-05-28 1972-01-18 Kenneth Bowers Radiation-sensitive glossmeter with means to compensate for environmental contaminants
US4124803A (en) * 1976-12-22 1978-11-07 Kenneth Bowers Surface finish monitor
DE2853458C3 (de) * 1978-09-29 1981-04-02 Gebrüder Bühler AG, 9240 Uzwil Verfahren und Vorrichtung zur Messung der relativen Helligkeit einer Probe
JPH0420845A (ja) * 1990-05-15 1992-01-24 Jujo Paper Co Ltd 光沢むらの測定方法
US6233053B1 (en) * 1997-07-29 2001-05-15 Honeywell International Inc Dual standard gloss sensor
US6134011A (en) * 1997-09-22 2000-10-17 Hdi Instrumentation Optical measurement system using polarized light
JP4166340B2 (ja) * 1997-09-24 2008-10-15 オリンパス株式会社 基板検査装置
US5978441A (en) * 1997-12-01 1999-11-02 Advanced Micro Devices, Inc. Extreme ultraviolet lithography mask blank and manufacturing method therefor
US6380529B1 (en) * 1999-09-29 2002-04-30 Hewlett-Packard Company Position sensing device having a movable photosensing element

Also Published As

Publication number Publication date
CA2454202C (en) 2011-06-21
US20030011785A1 (en) 2003-01-16
EP1407249B1 (de) 2007-04-25
ATE360811T1 (de) 2007-05-15
JP3908222B2 (ja) 2007-04-25
WO2003008947A1 (en) 2003-01-30
DE60219792T2 (de) 2008-01-17
US6507403B1 (en) 2003-01-14
EP1407249A1 (de) 2004-04-14
CA2454202A1 (en) 2003-01-30
JP2004536305A (ja) 2004-12-02

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Legal Events

Date Code Title Description
8364 No opposition during term of opposition