DE60219792D1 - Glanzsensor mit schmutzkompensationsvorrichtung und -verfahren - Google Patents
Glanzsensor mit schmutzkompensationsvorrichtung und -verfahrenInfo
- Publication number
- DE60219792D1 DE60219792D1 DE60219792T DE60219792T DE60219792D1 DE 60219792 D1 DE60219792 D1 DE 60219792D1 DE 60219792 T DE60219792 T DE 60219792T DE 60219792 T DE60219792 T DE 60219792T DE 60219792 D1 DE60219792 D1 DE 60219792D1
- Authority
- DE
- Germany
- Prior art keywords
- mirror
- gloss
- collimator
- window
- reflection device
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Lifetime
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
- G01N21/55—Specular reflectivity
- G01N21/57—Measuring gloss
Landscapes
- Physics & Mathematics (AREA)
- Health & Medical Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Biochemistry (AREA)
- General Health & Medical Sciences (AREA)
- General Physics & Mathematics (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Investigating Or Analysing Materials By Optical Means (AREA)
Applications Claiming Priority (3)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US906516 | 1978-05-17 | ||
US09/906,516 US6507403B1 (en) | 2001-07-16 | 2001-07-16 | Gloss sensor having dirt buildup compensation apparatus and method |
PCT/US2002/022625 WO2003008947A1 (en) | 2001-07-16 | 2002-07-16 | Gloss sensor having dirt buildup compensation apparatus and method |
Publications (2)
Publication Number | Publication Date |
---|---|
DE60219792D1 true DE60219792D1 (de) | 2007-06-06 |
DE60219792T2 DE60219792T2 (de) | 2008-01-17 |
Family
ID=25422578
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
DE60219792T Expired - Lifetime DE60219792T2 (de) | 2001-07-16 | 2002-07-16 | Glanzsensor mit schmutzkompensationsvorrichtung und -verfahren |
Country Status (7)
Country | Link |
---|---|
US (1) | US6507403B1 (de) |
EP (1) | EP1407249B1 (de) |
JP (1) | JP3908222B2 (de) |
AT (1) | ATE360811T1 (de) |
CA (1) | CA2454202C (de) |
DE (1) | DE60219792T2 (de) |
WO (1) | WO2003008947A1 (de) |
Families Citing this family (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US7423758B1 (en) * | 2007-07-27 | 2008-09-09 | Voith Patent Gmbh | Gloss sensor for a paper machine |
US7619740B2 (en) | 2007-10-11 | 2009-11-17 | Honeywell International Inc. | Microgloss measurement of paper and board |
DE102010017211A1 (de) | 2010-06-02 | 2011-12-08 | Vorwerk & Co. Interholding Gmbh | Basisstation für ein selbsttätig verfahrbares Bodenreinigungsgerät sowie Verfahren zur Reinigung eines Bodens mittels eines solchen Bodenreinigungsgerätes |
CN103983614A (zh) * | 2014-05-28 | 2014-08-13 | 爱彼思(苏州)自动化科技有限公司 | 一种检测角度可调的光泽度检测装置 |
Family Cites Families (9)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US3636361A (en) * | 1970-05-28 | 1972-01-18 | Kenneth Bowers | Radiation-sensitive glossmeter with means to compensate for environmental contaminants |
US4124803A (en) * | 1976-12-22 | 1978-11-07 | Kenneth Bowers | Surface finish monitor |
DE2853458C3 (de) * | 1978-09-29 | 1981-04-02 | Gebrüder Bühler AG, 9240 Uzwil | Verfahren und Vorrichtung zur Messung der relativen Helligkeit einer Probe |
JPH0420845A (ja) * | 1990-05-15 | 1992-01-24 | Jujo Paper Co Ltd | 光沢むらの測定方法 |
US6233053B1 (en) * | 1997-07-29 | 2001-05-15 | Honeywell International Inc | Dual standard gloss sensor |
US6134011A (en) * | 1997-09-22 | 2000-10-17 | Hdi Instrumentation | Optical measurement system using polarized light |
JP4166340B2 (ja) * | 1997-09-24 | 2008-10-15 | オリンパス株式会社 | 基板検査装置 |
US5978441A (en) * | 1997-12-01 | 1999-11-02 | Advanced Micro Devices, Inc. | Extreme ultraviolet lithography mask blank and manufacturing method therefor |
US6380529B1 (en) * | 1999-09-29 | 2002-04-30 | Hewlett-Packard Company | Position sensing device having a movable photosensing element |
-
2001
- 2001-07-16 US US09/906,516 patent/US6507403B1/en not_active Expired - Lifetime
-
2002
- 2002-07-16 WO PCT/US2002/022625 patent/WO2003008947A1/en active IP Right Grant
- 2002-07-16 DE DE60219792T patent/DE60219792T2/de not_active Expired - Lifetime
- 2002-07-16 EP EP02752385A patent/EP1407249B1/de not_active Expired - Lifetime
- 2002-07-16 CA CA2454202A patent/CA2454202C/en not_active Expired - Fee Related
- 2002-07-16 AT AT02752385T patent/ATE360811T1/de not_active IP Right Cessation
- 2002-07-16 JP JP2003514242A patent/JP3908222B2/ja not_active Expired - Fee Related
Also Published As
Publication number | Publication date |
---|---|
CA2454202C (en) | 2011-06-21 |
US20030011785A1 (en) | 2003-01-16 |
EP1407249B1 (de) | 2007-04-25 |
ATE360811T1 (de) | 2007-05-15 |
JP3908222B2 (ja) | 2007-04-25 |
WO2003008947A1 (en) | 2003-01-30 |
DE60219792T2 (de) | 2008-01-17 |
US6507403B1 (en) | 2003-01-14 |
EP1407249A1 (de) | 2004-04-14 |
CA2454202A1 (en) | 2003-01-30 |
JP2004536305A (ja) | 2004-12-02 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
8364 | No opposition during term of opposition |