JP2004536305A5 - - Google Patents

Download PDF

Info

Publication number
JP2004536305A5
JP2004536305A5 JP2003514242A JP2003514242A JP2004536305A5 JP 2004536305 A5 JP2004536305 A5 JP 2004536305A5 JP 2003514242 A JP2003514242 A JP 2003514242A JP 2003514242 A JP2003514242 A JP 2003514242A JP 2004536305 A5 JP2004536305 A5 JP 2004536305A5
Authority
JP
Japan
Prior art keywords
collimator
reflector
mirror
receive
gloss sensor
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP2003514242A
Other languages
English (en)
Japanese (ja)
Other versions
JP2004536305A (ja
JP3908222B2 (ja
Filing date
Publication date
Priority claimed from US09/906,516 external-priority patent/US6507403B1/en
Application filed filed Critical
Publication of JP2004536305A publication Critical patent/JP2004536305A/ja
Publication of JP2004536305A5 publication Critical patent/JP2004536305A5/ja
Application granted granted Critical
Publication of JP3908222B2 publication Critical patent/JP3908222B2/ja
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

JP2003514242A 2001-07-16 2002-07-16 ダート蓄積補償機構を有する光沢センサ装置および方法 Expired - Fee Related JP3908222B2 (ja)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US09/906,516 US6507403B1 (en) 2001-07-16 2001-07-16 Gloss sensor having dirt buildup compensation apparatus and method
PCT/US2002/022625 WO2003008947A1 (en) 2001-07-16 2002-07-16 Gloss sensor having dirt buildup compensation apparatus and method

Publications (3)

Publication Number Publication Date
JP2004536305A JP2004536305A (ja) 2004-12-02
JP2004536305A5 true JP2004536305A5 (enExample) 2005-12-22
JP3908222B2 JP3908222B2 (ja) 2007-04-25

Family

ID=25422578

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2003514242A Expired - Fee Related JP3908222B2 (ja) 2001-07-16 2002-07-16 ダート蓄積補償機構を有する光沢センサ装置および方法

Country Status (7)

Country Link
US (1) US6507403B1 (enExample)
EP (1) EP1407249B1 (enExample)
JP (1) JP3908222B2 (enExample)
AT (1) ATE360811T1 (enExample)
CA (1) CA2454202C (enExample)
DE (1) DE60219792T2 (enExample)
WO (1) WO2003008947A1 (enExample)

Families Citing this family (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US7423758B1 (en) * 2007-07-27 2008-09-09 Voith Patent Gmbh Gloss sensor for a paper machine
US7619740B2 (en) 2007-10-11 2009-11-17 Honeywell International Inc. Microgloss measurement of paper and board
DE102010017211B4 (de) 2010-06-02 2024-12-19 Vorwerk & Co. Interholding Gmbh Basisstation für ein selbsttätig verfahrbares Bodenreinigungsgerät sowie Verfahren zur Reinigung eines Bodens mittels eines solchen Bodenreinigungsgerätes
CN103983614A (zh) * 2014-05-28 2014-08-13 爱彼思（苏州）自动化科技有限公司 一种检测角度可调的光泽度检测装置

Family Cites Families (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3636361A (en) * 1970-05-28 1972-01-18 Kenneth Bowers Radiation-sensitive glossmeter with means to compensate for environmental contaminants
US4124803A (en) * 1976-12-22 1978-11-07 Kenneth Bowers Surface finish monitor
DE2853458C3 (de) * 1978-09-29 1981-04-02 Gebrüder Bühler AG, 9240 Uzwil Verfahren und Vorrichtung zur Messung der relativen Helligkeit einer Probe
JPH0420845A (ja) * 1990-05-15 1992-01-24 Jujo Paper Co Ltd 光沢むらの測定方法
US6233053B1 (en) * 1997-07-29 2001-05-15 Honeywell International Inc Dual standard gloss sensor
US6134011A (en) * 1997-09-22 2000-10-17 Hdi Instrumentation Optical measurement system using polarized light
JP4166340B2 (ja) * 1997-09-24 2008-10-15 オリンパス株式会社 基板検査装置
US5978441A (en) * 1997-12-01 1999-11-02 Advanced Micro Devices, Inc. Extreme ultraviolet lithography mask blank and manufacturing method therefor
US6380529B1 (en) * 1999-09-29 2002-04-30 Hewlett-Packard Company Position sensing device having a movable photosensing element

Similar Documents

Publication Publication Date Title
JP5996636B2 (ja) ガラスユニット内の気体成分濃度を測定するための方法およびデバイス
JP3547772B2 (ja) 対象と基準点間の間隔測定方法および装置
CN102507499B (zh) 采用光热干涉测量大气气溶胶吸收系数的装置
US20080239322A1 (en) Optical absorption gas sensor
CN110632008B (zh) 一种多点反射式光电气体传感器探头及光电气体检测装置
ES2194748T3 (es) Procedimiento y dispositivo destinados para la determinacion de posiciones y de orientaciones espaciales.
JP5976750B2 (ja) 透明基板の表面パターン不良測定装置
CN108061722A (zh) 一种一氧化碳浓度的检测装置及检测方法
CN104597011B (zh) 激发光源漂移校正装置及荧光光谱仪
CN107430033A (zh) 傅里叶变换型分光光度计
JP2004530905A (ja) 干渉計システム、インタフェログラムの記録方法、ならびに目的表面を有する物体の提供および製造方法
JP2010501833A (ja) 検体分析におけるシステム遅延を補償するシステム及び方法
JP2005513775A5 (enExample)
US20130293962A1 (en) Irradiation module for a measuring apparatus
CN110596005A (zh) 一种新型环形平凹面镜光学多通吸收池
ES2261129T3 (es) Procedimiento para la determinacion continua del espesor de capa optico de revestimientos.
DE50115284D1 (de) Optischer sensor zur messung des abstands und der neigung einer fläche
CA2062550A1 (en) Optical distance measuring apparatus
CA2454202A1 (en) Gloss sensor having dirt buildup compensation apparatus and method
CN209485964U (zh) 超高光谱透射比标准量具及能见度测量装置
RU185218U1 (ru) Осветительное устройство установки для измерения оптической плотности образца в отражённом свете
TWI637162B (zh) Radial polarized light surface plasma excitation device
JPH10253528A (ja) 植物体の分光反射率測定方法、及びその装置
CN109060679A (zh) 超高光谱透射比标准量具及能见度测量装置
SU673951A1 (ru) Устройство дл определени прозрачности оптических трасс