JP3869249B2 - 光イメージング装置 - Google Patents

光イメージング装置 Download PDF

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Publication number
JP3869249B2
JP3869249B2 JP2001339787A JP2001339787A JP3869249B2 JP 3869249 B2 JP3869249 B2 JP 3869249B2 JP 2001339787 A JP2001339787 A JP 2001339787A JP 2001339787 A JP2001339787 A JP 2001339787A JP 3869249 B2 JP3869249 B2 JP 3869249B2
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Japan
Prior art keywords
optical
optical path
light
probe
signal
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Expired - Fee Related
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JP2001339787A
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Japanese (ja)
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JP2003139688A5 (enExample
JP2003139688A (ja
Inventor
靖弘 上原
唯史 平田
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Olympus Corp
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Olympus Corp
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Priority to JP2001339787A priority Critical patent/JP3869249B2/ja
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Publication of JP2003139688A5 publication Critical patent/JP2003139688A5/ja
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JP2001339787A 2001-11-05 2001-11-05 光イメージング装置 Expired - Fee Related JP3869249B2 (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP2001339787A JP3869249B2 (ja) 2001-11-05 2001-11-05 光イメージング装置

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Application Number Priority Date Filing Date Title
JP2001339787A JP3869249B2 (ja) 2001-11-05 2001-11-05 光イメージング装置

Publications (3)

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JP2003139688A JP2003139688A (ja) 2003-05-14
JP2003139688A5 JP2003139688A5 (enExample) 2005-07-07
JP3869249B2 true JP3869249B2 (ja) 2007-01-17

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JP2001339787A Expired - Fee Related JP3869249B2 (ja) 2001-11-05 2001-11-05 光イメージング装置

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JP (1) JP3869249B2 (enExample)

Families Citing this family (17)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US7450242B2 (en) 2004-12-10 2008-11-11 Fujifilm Corporation Optical tomography apparatus
JP4837300B2 (ja) * 2005-03-24 2011-12-14 株式会社トプコン 光画像計測装置
DE602006003359D1 (de) 2005-03-25 2008-12-11 Fujifilm Corp Gerät zur optischen Tomographie
JP2006322767A (ja) * 2005-05-18 2006-11-30 Kowa Co 光断層画像化装置
JP4545696B2 (ja) 2005-09-30 2010-09-15 富士フイルム株式会社 光プローブ
JP4640813B2 (ja) 2005-09-30 2011-03-02 富士フイルム株式会社 光プローブおよび光断層画像化装置
JP2007101262A (ja) * 2005-09-30 2007-04-19 Fujifilm Corp 光断層画像化装置
JP2007101250A (ja) 2005-09-30 2007-04-19 Fujifilm Corp 光断層画像化方法
JP2007101249A (ja) 2005-09-30 2007-04-19 Fujifilm Corp 光断層画像化方法および装置
JP2007135947A (ja) 2005-11-21 2007-06-07 Fujifilm Corp 光プローブおよび光断層画像化装置
JP2007275193A (ja) 2006-04-04 2007-10-25 Fujifilm Corp 光プローブおよび光断層画像化装置
JP5001245B2 (ja) * 2008-09-25 2012-08-15 住友大阪セメント株式会社 光強度変調器のバイアス制御装置
WO2010044322A1 (ja) * 2008-10-17 2010-04-22 コニカミノルタオプト株式会社 光断層測定装置
US9610064B2 (en) * 2011-05-31 2017-04-04 Desmond Adler Multimodal imaging system, apparatus, and methods
KR101490665B1 (ko) 2012-05-11 2015-02-05 파나소닉 주식회사 권회 장치, 권회 방법, 검사 장치 및 구조물 제조 방법
JP2016131592A (ja) * 2015-01-16 2016-07-25 テルモ株式会社 光ケーブル及び光画像診断装置
JP6571352B2 (ja) * 2015-03-03 2019-09-04 株式会社ティーワイテクノ 光干渉断層計測装置

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