JP3836426B2 - 照明された試料の波長に依存する特徴的な特性値を光学的に把握するための方法および装置構成 - Google Patents

照明された試料の波長に依存する特徴的な特性値を光学的に把握するための方法および装置構成 Download PDF

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JP3836426B2
JP3836426B2 JP2002506104A JP2002506104A JP3836426B2 JP 3836426 B2 JP3836426 B2 JP 3836426B2 JP 2002506104 A JP2002506104 A JP 2002506104A JP 2002506104 A JP2002506104 A JP 2002506104A JP 3836426 B2 JP3836426 B2 JP 3836426B2
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detection
signal
apparatus configuration
fluorescence
configuration according
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JP2004502173A (ja
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ヴォレシェンスキー ラルフ
メーラー グンター
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カール ツァイス イエナ ゲゼルシャフト ミット ベシュレンクテル ハフツング
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    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B21/00—Microscopes
    • G02B21/0004—Microscopes specially adapted for specific applications
    • G02B21/0016—Technical microscopes, e.g. for inspection or measuring in industrial production processes
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01Q—SCANNING-PROBE TECHNIQUES OR APPARATUS; APPLICATIONS OF SCANNING-PROBE TECHNIQUES, e.g. SCANNING PROBE MICROSCOPY [SPM]
    • G01Q60/00—Particular types of SPM [Scanning Probe Microscopy] or microscopes; Essential components thereof
    • G01Q60/18—SNOM [Scanning Near-Field Optical Microscopy] or apparatus therefor, e.g. SNOM probes
    • G01Q60/20—Fluorescence
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B21/00—Microscopes
    • G02B21/0004—Microscopes specially adapted for specific applications
    • G02B21/002—Scanning microscopes
    • G02B21/0024—Confocal scanning microscopes (CSOMs) or confocal "macroscopes"; Accessories which are not restricted to use with CSOMs, e.g. sample holders
    • G02B21/0052—Optical details of the image generation
    • G02B21/0064—Optical details of the image generation multi-spectral or wavelength-selective arrangements, e.g. wavelength fan-out, chromatic profiling
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B21/00—Microscopes
    • G02B21/0004—Microscopes specially adapted for specific applications
    • G02B21/002—Scanning microscopes
    • G02B21/0024—Confocal scanning microscopes (CSOMs) or confocal "macroscopes"; Accessories which are not restricted to use with CSOMs, e.g. sample holders
    • G02B21/0052—Optical details of the image generation
    • G02B21/0076—Optical details of the image generation arrangements using fluorescence or luminescence
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B21/00—Microscopes
    • G02B21/0004—Microscopes specially adapted for specific applications
    • G02B21/002—Scanning microscopes
    • G02B21/0024—Confocal scanning microscopes (CSOMs) or confocal "macroscopes"; Accessories which are not restricted to use with CSOMs, e.g. sample holders
    • G02B21/008—Details of detection or image processing, including general computer control

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  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Optics & Photonics (AREA)
  • Radiology & Medical Imaging (AREA)
  • General Health & Medical Sciences (AREA)
  • Nuclear Medicine, Radiotherapy & Molecular Imaging (AREA)
  • Health & Medical Sciences (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Engineering & Computer Science (AREA)
  • Computer Vision & Pattern Recognition (AREA)
  • General Engineering & Computer Science (AREA)
  • Investigating, Analyzing Materials By Fluorescence Or Luminescence (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)
  • Microscoopes, Condenser (AREA)
JP2002506104A 2000-06-29 2001-06-22 照明された試料の波長に依存する特徴的な特性値を光学的に把握するための方法および装置構成 Expired - Fee Related JP3836426B2 (ja)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
DE10033180A DE10033180B4 (de) 2000-06-29 2000-06-29 Verfahren zur Detektion von Farbstoffen in der Fluoreszenzmikroskopie
PCT/EP2001/007101 WO2002001222A2 (de) 2000-06-29 2001-06-22 Verfahren und vorrichtung zur detektion von farbstoffen in der fluoreszenzmikroskopie

Related Child Applications (1)

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JP2006032476A Division JP4452850B2 (ja) 2000-06-29 2006-02-09 照明された試料の波長に依存する特徴的な特性値を光学的に把握するための方法および装置構成

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JP2004502173A JP2004502173A (ja) 2004-01-22
JP3836426B2 true JP3836426B2 (ja) 2006-10-25

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JP2002506104A Expired - Fee Related JP3836426B2 (ja) 2000-06-29 2001-06-22 照明された試料の波長に依存する特徴的な特性値を光学的に把握するための方法および装置構成
JP2006032476A Expired - Fee Related JP4452850B2 (ja) 2000-06-29 2006-02-09 照明された試料の波長に依存する特徴的な特性値を光学的に把握するための方法および装置構成

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EP (1) EP1266197A2 (de)
JP (2) JP3836426B2 (de)
DE (1) DE10033180B4 (de)
WO (1) WO2002001222A2 (de)

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DE10222779A1 (de) * 2002-05-16 2004-03-04 Carl Zeiss Jena Gmbh Verfahren und Anordnung zur Untersuchung von Proben
DE10327382A1 (de) * 2003-06-16 2005-01-05 Carl Zeiss Jena Gmbh Verfahren zur Fluoreszenzmikroskopie
DE102005020543A1 (de) 2005-05-03 2006-11-09 Carl Zeiss Jena Gmbh Verfahren und Vorrichtung zur einstellbaren Veränderung von Licht
DE102005058184A1 (de) * 2005-12-01 2007-06-14 Friedrich-Schiller-Universität Jena Verfahren und Anordnung zur Detektion von Fluoreszenz- bzw. Reflexionsspektren beliebig wählbarer Bereiche und Strukturen eines Objektes unter geringer Strahlenbelastung
DE102005058185A1 (de) * 2005-12-01 2007-06-14 Friedrich-Schiller-Universität Jena Verfahren und Anordnung zur Detektion von Fluoreszenz- oder Reflexionsspektren beliebig wählbarer Bereiche und Strukturen eines vom Fremdlicht überlagerten Objekts unter geringer Strahlenbelastung
DE102006034905B4 (de) 2006-07-28 2015-07-30 Carl Zeiss Microscopy Gmbh Anordnung zur Signalverarbeitung am Ausgang eines Mehrkanaldetektors
US7532128B2 (en) * 2006-10-25 2009-05-12 Alverix, Inc. Position sensitive indicator detection
DE102007040238A1 (de) 2007-08-25 2009-03-05 Carl Zeiss Microimaging Gmbh Verfahren zur Laser-Scanning-Mikroskopie und Strahlverteiler
DE102007054602A1 (de) * 2007-11-15 2009-05-28 Deutsches Zentrum für Luft- und Raumfahrt e.V. Verfahren und Messaufbau zum Erfassen der Verteilung mindestens einer Zustandsgröße in einem Messfeld mit verschiedenen Sonden
JP5244633B2 (ja) * 2008-02-04 2013-07-24 オプテックスエフエー株式会社 光量モニタセンサおよびこれを備えた画像処理システム
DE602008005314D1 (de) 2008-10-10 2011-04-14 Zeiss Carl Microimaging Gmbh Verfahren zur Abbildung einer Probe mit einem Mikroskop, Mikroskop und Datenspeicher
US8592781B2 (en) 2008-10-10 2013-11-26 Keio University Method and apparatus for quantitative evaluation of wall zeta-potential, and method and apparatus for quantitative visualization of surface modification pattern
DE102009006728A1 (de) 2009-01-29 2010-08-05 Carl Zeiss Microimaging Gmbh Optische Anordnung im Detektionsstrahlengang eines Laser-Scanning-Mikroskopes
DE102009038028B4 (de) 2009-08-18 2024-06-27 Carl Zeiss Microscopy Gmbh Detektoranordnung mit erhöhter Empfindlichkeit durch Lichtablenkelemente mit einer ebenen Lichteintrittsfläche
DE102009043745A1 (de) 2009-09-30 2011-04-07 Carl Zeiss Microlmaging Gmbh Spektraldetektor mit variabler Filterung durch räumliche Farbtrennung und Laser-Scanning- Mikroskop
DE102011104379B4 (de) 2011-06-18 2021-11-25 Carl Zeiss Microscopy Gmbh Konfokales Rastermikroskop und Verwendung, Steuerverfahren sowie programmierbare Steuereinheit für ein solches Mikroskop
JP5867073B2 (ja) * 2011-12-28 2016-02-24 富士通株式会社 樹脂硬化状態モニタリング装置及び樹脂硬化状態モニタリング方法
DE102012203736A1 (de) 2012-03-09 2013-09-12 Carl Zeiss Microscopy Gmbh Lichtrastermikroskop mit spektraler Detektion
US9201000B2 (en) * 2013-12-27 2015-12-01 Palo Alto Research Center Incorporated Sensor apparatus and method based on wavelength centroid detection
US10317390B2 (en) * 2014-09-08 2019-06-11 University Of Vienna Recording dynamics of cellular processes
WO2019230878A1 (ja) 2018-05-30 2019-12-05 ソニー株式会社 蛍光観察装置及び蛍光観察方法
US20230324662A1 (en) * 2020-08-05 2023-10-12 Leica Microsystems Cms Gmbh Method for adjusting the illumination in a fluorescence microscope, and corresponding fluorescence microscope

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US5309486A (en) * 1992-11-12 1994-05-03 Westinghouse Electric Corp. Non-contact flaw detection for cylindrical nuclear fuel pellets
DE4331570C2 (de) * 1993-08-17 1996-10-24 Hell Stefan Verfahren zum optischen Anregen einer Probe
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Also Published As

Publication number Publication date
EP1266197A2 (de) 2002-12-18
WO2002001222A3 (de) 2002-10-03
WO2002001222A2 (de) 2002-01-03
JP4452850B2 (ja) 2010-04-21
JP2006138875A (ja) 2006-06-01
JP2004502173A (ja) 2004-01-22
DE10033180A1 (de) 2002-05-29
DE10033180B4 (de) 2006-08-31

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