JP3771456B2 - 液晶表示装置及び薄膜トランジスタの製造方法 - Google Patents

液晶表示装置及び薄膜トランジスタの製造方法 Download PDF

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Publication number
JP3771456B2
JP3771456B2 JP2001061090A JP2001061090A JP3771456B2 JP 3771456 B2 JP3771456 B2 JP 3771456B2 JP 2001061090 A JP2001061090 A JP 2001061090A JP 2001061090 A JP2001061090 A JP 2001061090A JP 3771456 B2 JP3771456 B2 JP 3771456B2
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Japan
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semiconductor layer
region
liquid crystal
thin film
film transistor
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Expired - Fee Related
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JP2001061090A
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Japanese (ja)
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JP2002258324A (ja
JP2002258324A5 (enExample
Inventor
秀次 野村
孝洋 落合
隆太郎 桶
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Hitachi Ltd
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Hitachi Ltd
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  • Liquid Crystal (AREA)
  • Devices For Indicating Variable Information By Combining Individual Elements (AREA)
  • Thin Film Transistor (AREA)
JP2001061090A 2001-03-06 2001-03-06 液晶表示装置及び薄膜トランジスタの製造方法 Expired - Fee Related JP3771456B2 (ja)

Priority Applications (1)

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JP2001061090A JP3771456B2 (ja) 2001-03-06 2001-03-06 液晶表示装置及び薄膜トランジスタの製造方法

Applications Claiming Priority (1)

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JP2001061090A JP3771456B2 (ja) 2001-03-06 2001-03-06 液晶表示装置及び薄膜トランジスタの製造方法

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JP2002258324A JP2002258324A (ja) 2002-09-11
JP2002258324A5 JP2002258324A5 (enExample) 2004-08-26
JP3771456B2 true JP3771456B2 (ja) 2006-04-26

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Families Citing this family (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR100905470B1 (ko) * 2002-11-20 2009-07-02 삼성전자주식회사 박막 트랜지스터 어레이 기판
JP2005062802A (ja) * 2003-07-28 2005-03-10 Advanced Display Inc 薄膜トランジスタアレイ基板の製法
JP4299717B2 (ja) 2004-04-14 2009-07-22 Nec液晶テクノロジー株式会社 薄膜トランジスタとその製造方法
JP5266645B2 (ja) * 2007-01-31 2013-08-21 三菱電機株式会社 薄膜トランジスタと該薄膜トランジスタを用いた表示装置
WO2009060922A1 (en) * 2007-11-05 2009-05-14 Semiconductor Energy Laboratory Co., Ltd. Thin film transistor and display device having the thin film transistor
JP5377940B2 (ja) * 2007-12-03 2013-12-25 株式会社半導体エネルギー研究所 半導体装置
TWI500159B (zh) 2008-07-31 2015-09-11 Semiconductor Energy Lab 半導體裝置和其製造方法
KR101667909B1 (ko) 2008-10-24 2016-10-28 가부시키가이샤 한도오따이 에네루기 켄큐쇼 반도체장치의 제조방법
EP2180518B1 (en) 2008-10-24 2018-04-25 Semiconductor Energy Laboratory Co, Ltd. Method for manufacturing semiconductor device
US8741702B2 (en) 2008-10-24 2014-06-03 Semiconductor Energy Laboratory Co., Ltd. Method for manufacturing semiconductor device

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JP2002258324A (ja) 2002-09-11

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