JP3740853B2 - 質量分析計 - Google Patents
質量分析計 Download PDFInfo
- Publication number
- JP3740853B2 JP3740853B2 JP21996598A JP21996598A JP3740853B2 JP 3740853 B2 JP3740853 B2 JP 3740853B2 JP 21996598 A JP21996598 A JP 21996598A JP 21996598 A JP21996598 A JP 21996598A JP 3740853 B2 JP3740853 B2 JP 3740853B2
- Authority
- JP
- Japan
- Prior art keywords
- intensity
- detector
- mass spectrometer
- output signal
- mass
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
Links
Images
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J49/00—Particle spectrometers or separator tubes
- H01J49/02—Details
- H01J49/025—Detectors specially adapted to particle spectrometers
Landscapes
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Other Investigation Or Analysis Of Materials By Electrical Means (AREA)
- Electron Tubes For Measurement (AREA)
Priority Applications (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP21996598A JP3740853B2 (ja) | 1998-08-04 | 1998-08-04 | 質量分析計 |
| US09/361,798 US6265714B1 (en) | 1998-08-04 | 1999-07-27 | Mass spectrometer and method of monitoring degradation of its detector |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP21996598A JP3740853B2 (ja) | 1998-08-04 | 1998-08-04 | 質量分析計 |
Publications (3)
| Publication Number | Publication Date |
|---|---|
| JP2000057990A JP2000057990A (ja) | 2000-02-25 |
| JP2000057990A5 JP2000057990A5 (enExample) | 2005-07-21 |
| JP3740853B2 true JP3740853B2 (ja) | 2006-02-01 |
Family
ID=16743817
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP21996598A Expired - Fee Related JP3740853B2 (ja) | 1998-08-04 | 1998-08-04 | 質量分析計 |
Country Status (2)
| Country | Link |
|---|---|
| US (1) | US6265714B1 (enExample) |
| JP (1) | JP3740853B2 (enExample) |
Families Citing this family (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| EP1073279A4 (en) * | 1999-02-19 | 2006-04-05 | Sony Corp | PICTURE SIGNAL PROCESSOR, PICTURE SIGNAL PROCESSING METHOD, LEARNING DEVICE, LERMETHOID AND RECORDING MEDIUM |
| US7109474B2 (en) * | 2003-06-05 | 2006-09-19 | Thermo Finnigan Llc | Measuring ion number and detector gain |
| US8193484B2 (en) * | 2010-08-03 | 2012-06-05 | Thermo Finnigan LLP | Method and apparatus for automatic estimation of detector gain in a mass spectrometer |
| US12106951B2 (en) | 2019-04-05 | 2024-10-01 | Hitachi High-Tech Corporation | Mass analysis system, and method for determining performance of mass analysis device |
| JP7207266B2 (ja) * | 2019-11-05 | 2023-01-18 | 株式会社島津製作所 | 質量分析装置 |
Family Cites Families (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US5247175A (en) * | 1992-05-27 | 1993-09-21 | Finnigan Corporation | Method and apparatus for the deconvolution of unresolved data |
-
1998
- 1998-08-04 JP JP21996598A patent/JP3740853B2/ja not_active Expired - Fee Related
-
1999
- 1999-07-27 US US09/361,798 patent/US6265714B1/en not_active Expired - Lifetime
Also Published As
| Publication number | Publication date |
|---|---|
| JP2000057990A (ja) | 2000-02-25 |
| US6265714B1 (en) | 2001-07-24 |
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