JP3718971B2 - 質量分析計 - Google Patents

質量分析計 Download PDF

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Publication number
JP3718971B2
JP3718971B2 JP27359297A JP27359297A JP3718971B2 JP 3718971 B2 JP3718971 B2 JP 3718971B2 JP 27359297 A JP27359297 A JP 27359297A JP 27359297 A JP27359297 A JP 27359297A JP 3718971 B2 JP3718971 B2 JP 3718971B2
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JP
Japan
Prior art keywords
path
ionization chamber
ionization
ion source
sample
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
JP27359297A
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English (en)
Japanese (ja)
Other versions
JPH1196963A (ja
JPH1196963A5 (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html
Inventor
弘人 糸井
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Shimadzu Corp
Original Assignee
Shimadzu Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Shimadzu Corp filed Critical Shimadzu Corp
Priority to JP27359297A priority Critical patent/JP3718971B2/ja
Priority to CN98119336A priority patent/CN1110836C/zh
Priority to DE19842689A priority patent/DE19842689A1/de
Priority to US09/154,746 priority patent/US6147346A/en
Publication of JPH1196963A publication Critical patent/JPH1196963A/ja
Publication of JPH1196963A5 publication Critical patent/JPH1196963A5/ja
Application granted granted Critical
Publication of JP3718971B2 publication Critical patent/JP3718971B2/ja
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

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Classifications

    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/02—Details
    • H01J49/10—Ion sources; Ion guns

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  • Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Plasma & Fusion (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Electron Tubes For Measurement (AREA)
  • Other Investigation Or Analysis Of Materials By Electrical Means (AREA)
JP27359297A 1997-09-19 1997-09-19 質量分析計 Expired - Fee Related JP3718971B2 (ja)

Priority Applications (4)

Application Number Priority Date Filing Date Title
JP27359297A JP3718971B2 (ja) 1997-09-19 1997-09-19 質量分析計
CN98119336A CN1110836C (zh) 1997-09-19 1998-09-17 一种质谱仪及其使用方法
DE19842689A DE19842689A1 (de) 1997-09-19 1998-09-17 Massenspektrometer
US09/154,746 US6147346A (en) 1997-09-19 1998-09-17 Mass spectrometer

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP27359297A JP3718971B2 (ja) 1997-09-19 1997-09-19 質量分析計

Publications (3)

Publication Number Publication Date
JPH1196963A JPH1196963A (ja) 1999-04-09
JPH1196963A5 JPH1196963A5 (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html) 2005-04-07
JP3718971B2 true JP3718971B2 (ja) 2005-11-24

Family

ID=17529940

Family Applications (1)

Application Number Title Priority Date Filing Date
JP27359297A Expired - Fee Related JP3718971B2 (ja) 1997-09-19 1997-09-19 質量分析計

Country Status (4)

Country Link
US (1) US6147346A (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html)
JP (1) JP3718971B2 (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html)
CN (1) CN1110836C (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html)
DE (1) DE19842689A1 (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html)

Families Citing this family (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
AU2002950505A0 (en) * 2002-07-31 2002-09-12 Varian Australia Pty Ltd Mass spectrometry apparatus and method
US6842008B2 (en) * 2003-03-11 2005-01-11 Stanley D. Stearns Gas detector with modular detection and discharge source calibration
BRPI0906666A2 (pt) * 2008-01-16 2017-05-16 Syngenta Participations Ag aparelho, sistema e método para análise de massa de uma amostra
CN103163209B (zh) * 2011-12-19 2014-12-10 中国科学院大连化学物理研究所 一种气体样品在线连续监测的质谱方法
FI124792B (fi) * 2013-06-20 2015-01-30 Helsingin Yliopisto Menetelmä ja laite näytekaasuvirtauksen partikkelien ionisoimiseksi
CN106093176B (zh) * 2016-07-27 2019-08-06 南京信息工程大学 一种气态硫酸测量的标定方法及标定装置
CN106546656A (zh) * 2016-10-09 2017-03-29 中国科学院化学研究所 一种化学电离直链烷烃的方法
CN109884156B (zh) * 2017-12-06 2021-07-20 中国科学院大连化学物理研究所 一种快速分析全氟丙烷中多种杂质的检测装置及方法

Family Cites Families (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3555272A (en) * 1968-03-14 1971-01-12 Exxon Research Engineering Co Process for chemical ionization for intended use in mass spectrometry and the like
JPS5387791A (en) * 1977-01-12 1978-08-02 Hitachi Ltd Composite ion source apparatus
US4266127A (en) * 1978-12-01 1981-05-05 Cherng Chang Mass spectrometer for chemical ionization and electron impact ionization operation
US4839143A (en) * 1985-02-15 1989-06-13 Allied-Signal Inc. Selective ionization of gas constituents using electrolytic reactions
CN2195138Y (zh) * 1994-08-24 1995-04-19 东南大学 质谱计的封闭式气体放电离子源

Also Published As

Publication number Publication date
JPH1196963A (ja) 1999-04-09
CN1214528A (zh) 1999-04-21
DE19842689A1 (de) 1999-03-25
US6147346A (en) 2000-11-14
CN1110836C (zh) 2003-06-04

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