JP3709057B2 - 半導体装置 - Google Patents

半導体装置 Download PDF

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Publication number
JP3709057B2
JP3709057B2 JP24250797A JP24250797A JP3709057B2 JP 3709057 B2 JP3709057 B2 JP 3709057B2 JP 24250797 A JP24250797 A JP 24250797A JP 24250797 A JP24250797 A JP 24250797A JP 3709057 B2 JP3709057 B2 JP 3709057B2
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JP
Japan
Prior art keywords
test mode
signal
circuit
semiconductor device
mode
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
JP24250797A
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English (en)
Japanese (ja)
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JPH1186599A (ja
Inventor
秀 大久保
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Ricoh Co Ltd
Original Assignee
Ricoh Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
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Publication date
Application filed by Ricoh Co Ltd filed Critical Ricoh Co Ltd
Priority to JP24250797A priority Critical patent/JP3709057B2/ja
Priority to CN 98119202 priority patent/CN1118072C/zh
Publication of JPH1186599A publication Critical patent/JPH1186599A/ja
Application granted granted Critical
Publication of JP3709057B2 publication Critical patent/JP3709057B2/ja
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

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  • Tests Of Electronic Circuits (AREA)
  • For Increasing The Reliability Of Semiconductor Memories (AREA)
  • Static Random-Access Memory (AREA)
JP24250797A 1997-09-08 1997-09-08 半導体装置 Expired - Fee Related JP3709057B2 (ja)

Priority Applications (2)

Application Number Priority Date Filing Date Title
JP24250797A JP3709057B2 (ja) 1997-09-08 1997-09-08 半導体装置
CN 98119202 CN1118072C (zh) 1997-09-08 1998-09-08 半导体装置

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP24250797A JP3709057B2 (ja) 1997-09-08 1997-09-08 半導体装置

Publications (2)

Publication Number Publication Date
JPH1186599A JPH1186599A (ja) 1999-03-30
JP3709057B2 true JP3709057B2 (ja) 2005-10-19

Family

ID=17090140

Family Applications (1)

Application Number Title Priority Date Filing Date
JP24250797A Expired - Fee Related JP3709057B2 (ja) 1997-09-08 1997-09-08 半導体装置

Country Status (2)

Country Link
JP (1) JP3709057B2 (zh)
CN (1) CN1118072C (zh)

Families Citing this family (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2002288999A (ja) * 2001-03-27 2002-10-04 Fujitsu Ltd 半導体メモリ
JP5888954B2 (ja) * 2011-12-05 2016-03-22 ローム株式会社 電圧検出回路
CN112985649B (zh) * 2021-01-26 2022-09-06 电子科技大学 一种基于柔性分布式电容触觉传感器的力学信息检测系统

Also Published As

Publication number Publication date
JPH1186599A (ja) 1999-03-30
CN1118072C (zh) 2003-08-13
CN1211044A (zh) 1999-03-17

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