JP3279645B2 - 試験物体から取り出された電位降下を所定の入力電圧範囲から所望の出力電圧範囲へ変換するための回路構成 - Google Patents
試験物体から取り出された電位降下を所定の入力電圧範囲から所望の出力電圧範囲へ変換するための回路構成Info
- Publication number
- JP3279645B2 JP3279645B2 JP17527992A JP17527992A JP3279645B2 JP 3279645 B2 JP3279645 B2 JP 3279645B2 JP 17527992 A JP17527992 A JP 17527992A JP 17527992 A JP17527992 A JP 17527992A JP 3279645 B2 JP3279645 B2 JP 3279645B2
- Authority
- JP
- Japan
- Prior art keywords
- transistor
- circuit
- output
- potential drop
- diode
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/327—Testing of circuit interrupters, switches or circuit-breakers
- G01R31/3277—Testing of circuit interrupters, switches or circuit-breakers of low voltage devices, e.g. domestic or industrial devices, such as motor protections, relays, rotation switches
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Amplifiers (AREA)
- Measurement Of Current Or Voltage (AREA)
Applications Claiming Priority (3)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
DE4122029:3 | 1991-07-03 | ||
DE4122029A DE4122029C1 (US20100223739A1-20100909-C00025.png) | 1991-07-03 | 1991-07-03 | |
US07/907,269 US5347174A (en) | 1991-07-03 | 1992-07-01 | Circuit arrangement for converting a voltage drop tapped from a test object from a predetermined input voltage range to a desired output voltage range |
Publications (2)
Publication Number | Publication Date |
---|---|
JPH05232147A JPH05232147A (ja) | 1993-09-07 |
JP3279645B2 true JP3279645B2 (ja) | 2002-04-30 |
Family
ID=25905185
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP17527992A Expired - Fee Related JP3279645B2 (ja) | 1991-07-03 | 1992-07-02 | 試験物体から取り出された電位降下を所定の入力電圧範囲から所望の出力電圧範囲へ変換するための回路構成 |
Country Status (4)
Families Citing this family (14)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US5631941A (en) * | 1993-06-15 | 1997-05-20 | Yozan Inc. | Register circuit |
DE4416711C1 (de) * | 1994-05-11 | 1995-08-03 | Siemens Ag | Schaltungsanordnung zur Erzeugung eines Referenzstroms |
DE4434180A1 (de) * | 1994-09-24 | 1996-03-28 | Teves Gmbh Alfred | Schaltungsanordnung zur Auswertung des Ausgangssignals eines aktiven Sensors |
DE19510055B4 (de) * | 1995-03-20 | 2004-07-08 | Continental Teves Ag & Co. Ohg | Schaltungsanordnung zum Auswerten eines binären, durch Stromschwellenwerte definierten Signals |
DE19534825A1 (de) * | 1995-09-20 | 1997-03-27 | Teves Gmbh Alfred | Schaltungsanordnung zum Auswerten eines binären, durch Stromschwellenwerte definierten Signals |
US6859058B2 (en) | 1999-05-11 | 2005-02-22 | Interuniversitair Microelektronica Centrum (Imec Uzw) | Method and apparatus for testing electronic devices |
US6531885B1 (en) | 1999-05-11 | 2003-03-11 | Interuniversitair Micro-Elektronica Centrum (Imec Vzw) | Method and apparatus for testing supply connections |
US6496028B1 (en) | 1999-05-11 | 2002-12-17 | Interuniversitair Micro-Elektronica Centrum | Method and apparatus for testing electronic devices |
EP1107013B1 (en) * | 1999-09-22 | 2006-06-07 | Interuniversitair Micro-Elektronica Centrum | A method and an apparatus for testing supply connections |
EP1089082A1 (en) * | 1999-09-30 | 2001-04-04 | Interuniversitair Micro-Elektronica Centrum Vzw | A method and apparatus for testing supply connections |
US6232829B1 (en) * | 1999-11-18 | 2001-05-15 | National Semiconductor Corporation | Bandgap voltage reference circuit with an increased difference voltage |
DE102008012058A1 (de) | 2008-02-29 | 2009-09-03 | Henkel Ag & Co. Kgaa | Haarbehandlungsmittel mit Acai-Extrakt |
CN106405397B (zh) * | 2016-08-30 | 2019-03-26 | 贵州贵航汽车零部件股份有限公司华阳电器公司 | 用电压降判定旋转式点火开关失效寿命的方法 |
CN107390058B (zh) * | 2017-07-25 | 2020-08-14 | 广东电网有限责任公司电力科学研究院 | 一种评价隔离开关触头材料带电服役性能的测试方法 |
Family Cites Families (14)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US4088905A (en) * | 1977-02-15 | 1978-05-09 | Precision Monolithics, Inc. | Self-adjusting compatibility circuit for digital to analog converter |
JPS6025743B2 (ja) * | 1977-12-28 | 1985-06-20 | ソニー株式会社 | 電流比較回路 |
JPS57557A (en) * | 1980-05-26 | 1982-01-05 | Toshiba Corp | Voltage comparator |
JPS57135370A (en) * | 1981-02-16 | 1982-08-20 | Matsushita Electric Ind Co Ltd | Level detecting circuit |
EP0139425B1 (en) * | 1983-08-31 | 1989-01-25 | Kabushiki Kaisha Toshiba | A constant current source circuit |
GB2145890B (en) * | 1983-09-01 | 1987-05-20 | Plessey Co Plc | Signal strength detector |
US4553048A (en) * | 1984-02-22 | 1985-11-12 | Motorola, Inc. | Monolithically integrated thermal shut-down circuit including a well regulated current source |
DE3545039A1 (de) * | 1985-12-19 | 1987-07-02 | Sgs Halbleiterbauelemente Gmbh | Spannungsbegrenzungsschaltung |
US4673867A (en) * | 1986-06-30 | 1987-06-16 | Motorola, Inc. | Current mirror circuit and method for providing zero temperature coefficient trimmable current ratios |
JPH0514582Y2 (US20100223739A1-20100909-C00025.png) * | 1986-07-10 | 1993-04-19 | ||
DE3642167A1 (de) * | 1986-12-10 | 1988-06-30 | Philips Patentverwaltung | Stromspiegelschaltung |
DE3744756A1 (de) * | 1987-07-07 | 1989-01-26 | Ifm Electronic Gmbh | Konstantstromgenerator |
JP2511399Y2 (ja) * | 1988-02-29 | 1996-09-25 | シャープ株式会社 | コンパレ―タ回路 |
US4866399A (en) * | 1988-10-24 | 1989-09-12 | Delco Electronics Corporation | Noise immune current mirror |
-
1991
- 1991-07-03 DE DE4122029A patent/DE4122029C1/de not_active Expired - Lifetime
-
1992
- 1992-07-01 US US07/907,269 patent/US5347174A/en not_active Expired - Lifetime
- 1992-07-01 EP EP92111130A patent/EP0525421B1/en not_active Expired - Lifetime
- 1992-07-02 JP JP17527992A patent/JP3279645B2/ja not_active Expired - Fee Related
Also Published As
Publication number | Publication date |
---|---|
EP0525421A2 (en) | 1993-02-03 |
EP0525421B1 (en) | 1996-03-20 |
JPH05232147A (ja) | 1993-09-07 |
DE4122029C1 (US20100223739A1-20100909-C00025.png) | 1992-11-26 |
US5347174A (en) | 1994-09-13 |
EP0525421A3 (en) | 1993-02-10 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
LAPS | Cancellation because of no payment of annual fees |