JP3258889B2 - 散乱式粒度分布測定装置における光軸調整方法 - Google Patents

散乱式粒度分布測定装置における光軸調整方法

Info

Publication number
JP3258889B2
JP3258889B2 JP02193296A JP2193296A JP3258889B2 JP 3258889 B2 JP3258889 B2 JP 3258889B2 JP 02193296 A JP02193296 A JP 02193296A JP 2193296 A JP2193296 A JP 2193296A JP 3258889 B2 JP3258889 B2 JP 3258889B2
Authority
JP
Japan
Prior art keywords
optical axis
light
particle size
size distribution
diffracted light
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
JP02193296A
Other languages
English (en)
Japanese (ja)
Other versions
JPH09189653A (ja
Inventor
達夫 伊串
喜昭 東川
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Horiba Ltd
Original Assignee
Horiba Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Horiba Ltd filed Critical Horiba Ltd
Priority to JP02193296A priority Critical patent/JP3258889B2/ja
Priority to DE1997100379 priority patent/DE19700379B4/de
Publication of JPH09189653A publication Critical patent/JPH09189653A/ja
Application granted granted Critical
Publication of JP3258889B2 publication Critical patent/JP3258889B2/ja
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N15/00—Investigating characteristics of particles; Investigating permeability, pore-volume or surface-area of porous materials
    • G01N15/02—Investigating particle size or size distribution
    • G01N15/0205—Investigating particle size or size distribution by optical means
    • G01N15/0211—Investigating a scatter or diffraction pattern
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/47—Scattering, i.e. diffuse reflection
    • G01N2021/4704—Angular selective
    • G01N2021/4711—Multiangle measurement
    • G01N2021/4716—Using a ring of sensors, or a combination of diaphragm and sensors; Annular sensor

Landscapes

  • Chemical & Material Sciences (AREA)
  • Dispersion Chemistry (AREA)
  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)
JP02193296A 1996-01-11 1996-01-11 散乱式粒度分布測定装置における光軸調整方法 Expired - Fee Related JP3258889B2 (ja)

Priority Applications (2)

Application Number Priority Date Filing Date Title
JP02193296A JP3258889B2 (ja) 1996-01-11 1996-01-11 散乱式粒度分布測定装置における光軸調整方法
DE1997100379 DE19700379B4 (de) 1996-01-11 1997-01-08 Verfahren zur Einstellung der optischen Achse einer Meßvorrichtung zur Messung der Teilchengrößenverteilung mittels des Streueffekts

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP02193296A JP3258889B2 (ja) 1996-01-11 1996-01-11 散乱式粒度分布測定装置における光軸調整方法

Publications (2)

Publication Number Publication Date
JPH09189653A JPH09189653A (ja) 1997-07-22
JP3258889B2 true JP3258889B2 (ja) 2002-02-18

Family

ID=12068833

Family Applications (1)

Application Number Title Priority Date Filing Date
JP02193296A Expired - Fee Related JP3258889B2 (ja) 1996-01-11 1996-01-11 散乱式粒度分布測定装置における光軸調整方法

Country Status (2)

Country Link
JP (1) JP3258889B2 (de)
DE (1) DE19700379B4 (de)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN105527224A (zh) * 2014-09-29 2016-04-27 安东帕有限公司 为对称入射束和散射束几何形状调节样品架的方位，从而补偿与折射率相关的失真

Families Citing this family (11)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE19958729C2 (de) * 1999-12-01 2002-02-28 Fresenius Hemocare Gmbh Verfahren zur Bestimmung einer Partikelkonzentration und Vorrichtung zur Durchführung des Verfahrens
JP4818527B2 (ja) * 2001-04-06 2011-11-16 株式会社堀場製作所 散乱式粒子径分布測定装置
WO2013145905A1 (ja) 2012-03-30 2013-10-03 ソニー株式会社 微小粒子分取装置及び該装置における流体ストリーム最適化方法
CN104204766B (zh) 2012-03-30 2016-08-31 索尼公司 微芯片型光学测量装置及其光学位置调整方法
JP5924077B2 (ja) 2012-03-30 2016-05-25 ソニー株式会社 微小粒子分取装置及び微小粒子分取装置における軌道方向判定方法
EP2950079B1 (de) 2013-01-28 2021-06-16 Sony Corporation Feinpartikelfraktionierungsvorrichtung, feinpartikelfraktionierungsverfahren und programm dafür
CN105659069B (zh) 2013-10-16 2019-11-26 索尼公司 颗粒分取设备、颗粒分取方法与程序
JP6465036B2 (ja) 2014-02-13 2019-02-06 ソニー株式会社 粒子分取装置、粒子分取方法、プログラム及び粒子分取システム
CN104345018B (zh) * 2014-06-04 2019-03-05 秦少平 一种基于探测器阵列的流式颗粒物测量仪
JP6657625B2 (ja) 2014-09-05 2020-03-04 ソニー株式会社 液滴分取装置、液滴分取方法及びプログラム
JP6729597B2 (ja) 2015-10-19 2020-07-22 ソニー株式会社 画像処理装置、微小粒子分取装置及び画像処理方法

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN105527224A (zh) * 2014-09-29 2016-04-27 安东帕有限公司 为对称入射束和散射束几何形状调节样品架的方位，从而补偿与折射率相关的失真
CN105527224B (zh) * 2014-09-29 2019-02-22 安东帕有限公司 一种用于分析样品的设备和方法

Also Published As

Publication number Publication date
JPH09189653A (ja) 1997-07-22
DE19700379A1 (de) 1997-07-24
DE19700379B4 (de) 2004-04-22

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