JP3221184B2 - 故障診断装置および方法 - Google Patents

故障診断装置および方法

Info

Publication number
JP3221184B2
JP3221184B2 JP25546293A JP25546293A JP3221184B2 JP 3221184 B2 JP3221184 B2 JP 3221184B2 JP 25546293 A JP25546293 A JP 25546293A JP 25546293 A JP25546293 A JP 25546293A JP 3221184 B2 JP3221184 B2 JP 3221184B2
Authority
JP
Japan
Prior art keywords
sensor
quantization
pair
abnormality
storage means
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
JP25546293A
Other languages
English (en)
Japanese (ja)
Other versions
JPH07110708A (ja
Inventor
昌宏 鹿山
泰男 諸岡
洋一 杉田
正明 中島
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Hitachi Ltd
Original Assignee
Hitachi Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Hitachi Ltd filed Critical Hitachi Ltd
Priority to JP25546293A priority Critical patent/JP3221184B2/ja
Priority to TW083108967A priority patent/TW275676B/zh
Priority to KR1019940026175A priority patent/KR0172982B1/ko
Priority to US08/322,557 priority patent/US5548597A/en
Priority to DE4436658A priority patent/DE4436658B4/de
Priority to CN94117145A priority patent/CN1047446C/zh
Publication of JPH07110708A publication Critical patent/JPH07110708A/ja
Application granted granted Critical
Publication of JP3221184B2 publication Critical patent/JP3221184B2/ja
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

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Classifications

    • G—PHYSICS
    • G05—CONTROLLING; REGULATING
    • G05B—CONTROL OR REGULATING SYSTEMS IN GENERAL; FUNCTIONAL ELEMENTS OF SUCH SYSTEMS; MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS OR ELEMENTS
    • G05B23/00—Testing or monitoring of control systems or parts thereof
    • G05B23/02—Electric testing or monitoring
    • G—PHYSICS
    • G07—CHECKING-DEVICES
    • G07C—TIME OR ATTENDANCE REGISTERS; REGISTERING OR INDICATING THE WORKING OF MACHINES; GENERATING RANDOM NUMBERS; VOTING OR LOTTERY APPARATUS; ARRANGEMENTS, SYSTEMS OR APPARATUS FOR CHECKING NOT PROVIDED FOR ELSEWHERE
    • G07C3/00—Registering or indicating the condition or the working of machines or other apparatus, other than vehicles
    • G—PHYSICS
    • G05—CONTROLLING; REGULATING
    • G05B—CONTROL OR REGULATING SYSTEMS IN GENERAL; FUNCTIONAL ELEMENTS OF SUCH SYSTEMS; MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS OR ELEMENTS
    • G05B23/00—Testing or monitoring of control systems or parts thereof
    • G05B23/02—Electric testing or monitoring
    • G05B23/0205—Electric testing or monitoring by means of a monitoring system capable of detecting and responding to faults
    • G05B23/0218—Electric testing or monitoring by means of a monitoring system capable of detecting and responding to faults characterised by the fault detection method dealing with either existing or incipient faults
    • G05B23/0224—Process history based detection method, e.g. whereby history implies the availability of large amounts of data
    • G05B23/024—Quantitative history assessment, e.g. mathematical relationships between available data; Functions therefor; Principal component analysis [PCA]; Partial least square [PLS]; Statistical classifiers, e.g. Bayesian networks, linear regression or correlation analysis; Neural networks

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Automation & Control Theory (AREA)
  • Artificial Intelligence (AREA)
  • Evolutionary Computation (AREA)
  • Mathematical Physics (AREA)
  • Testing And Monitoring For Control Systems (AREA)
  • Testing Or Calibration Of Command Recording Devices (AREA)
  • Testing Electric Properties And Detecting Electric Faults (AREA)
JP25546293A 1993-10-13 1993-10-13 故障診断装置および方法 Expired - Lifetime JP3221184B2 (ja)

Priority Applications (6)

Application Number Priority Date Filing Date Title
JP25546293A JP3221184B2 (ja) 1993-10-13 1993-10-13 故障診断装置および方法
TW083108967A TW275676B (oth) 1993-10-13 1994-09-27
KR1019940026175A KR0172982B1 (ko) 1993-10-13 1994-10-13 고장진단장치 및 방법
US08/322,557 US5548597A (en) 1993-10-13 1994-10-13 Failure diagnosis apparatus and a method thereof
DE4436658A DE4436658B4 (de) 1993-10-13 1994-10-13 Vorrichtung und Verfahren zur Störungsuntersuchung
CN94117145A CN1047446C (zh) 1993-10-13 1994-10-13 故障诊断装置及其诊断方法

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP25546293A JP3221184B2 (ja) 1993-10-13 1993-10-13 故障診断装置および方法

Publications (2)

Publication Number Publication Date
JPH07110708A JPH07110708A (ja) 1995-04-25
JP3221184B2 true JP3221184B2 (ja) 2001-10-22

Family

ID=17279105

Family Applications (1)

Application Number Title Priority Date Filing Date
JP25546293A Expired - Lifetime JP3221184B2 (ja) 1993-10-13 1993-10-13 故障診断装置および方法

Country Status (6)

Country Link
US (1) US5548597A (oth)
JP (1) JP3221184B2 (oth)
KR (1) KR0172982B1 (oth)
CN (1) CN1047446C (oth)
DE (1) DE4436658B4 (oth)
TW (1) TW275676B (oth)

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CN108489527B (zh) * 2017-12-25 2020-06-16 渤海造船厂集团有限公司 船用过程参数测量柜功能插件智能校验器

Also Published As

Publication number Publication date
TW275676B (oth) 1996-05-11
JPH07110708A (ja) 1995-04-25
US5548597A (en) 1996-08-20
CN1112249A (zh) 1995-11-22
DE4436658A1 (de) 1995-04-20
KR0172982B1 (ko) 1999-03-30
KR950012269A (ko) 1995-05-16
DE4436658B4 (de) 2004-02-12
CN1047446C (zh) 1999-12-15

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