JP3185858U - 自動光学検出設備 - Google Patents

自動光学検出設備 Download PDF

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Publication number
JP3185858U
JP3185858U JP2013003622U JP2013003622U JP3185858U JP 3185858 U JP3185858 U JP 3185858U JP 2013003622 U JP2013003622 U JP 2013003622U JP 2013003622 U JP2013003622 U JP 2013003622U JP 3185858 U JP3185858 U JP 3185858U
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JP
Japan
Prior art keywords
roller
optical detection
automatic optical
roll
detection equipment
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Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
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JP2013003622U
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English (en)
Japanese (ja)
Inventor
▲黄▼鴻傑
李宜達
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テスト リサーチ， インク．
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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/24—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures
    • G01B11/25—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures by projecting a pattern, e.g. one or more lines, moiré fringes on the object
    • G01B11/2518—Projection by scanning of the object
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L22/00—Testing or measuring during manufacture or treatment; Reliability measurements, i.e. testing of parts without further processing to modify the parts as such; Structural arrangements therefor
    • H01L22/30—Structural arrangements specially adapted for testing or measuring during manufacture or treatment, or specially adapted for reliability measurements
    • H01L22/34—Circuits for electrically characterising or monitoring manufacturing processes, e. g. whole test die, wafers filled with test structures, on-board-devices incorporated on each die, process control monitors or pad structures thereof, devices in scribe line
    • H—ELECTRICITY
    • H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
    • H05K13/00—Apparatus or processes specially adapted for manufacturing or adjusting assemblages of electric components
    • H05K13/08—Monitoring manufacture of assemblages

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  • Engineering & Computer Science (AREA)
  • Manufacturing & Machinery (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Automation & Control Theory (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Chemical & Material Sciences (AREA)
  • Health & Medical Sciences (AREA)
  • Computer Hardware Design (AREA)
  • Computer Vision & Pattern Recognition (AREA)
  • Power Engineering (AREA)
  • Operations Research (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
  • Length Measuring Devices By Optical Means (AREA)
JP2013003622U 2013-05-02 2013-06-26 自動光学検出設備 Expired - Lifetime JP3185858U (ja)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
TW102208122U TWM462365U (zh) 2013-05-02 2013-05-02 自動光學檢測設備
TW102208122 2013-05-02

Publications (1)

Publication Number Publication Date
JP3185858U true JP3185858U (ja) 2013-09-05

Family

ID=49629916

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2013003622U Expired - Lifetime JP3185858U (ja) 2013-05-02 2013-06-26 自動光学検出設備

Country Status (3)

Country Link
JP (1) JP3185858U (zh)
KR (1) KR20140005766U (zh)
TW (1) TWM462365U (zh)

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN104101609A (zh) * 2014-07-03 2014-10-15 宁波摩米创新工场电子科技有限公司 一种电路板视觉检测设备
CN113777114A (zh) * 2021-11-15 2021-12-10 佛山市坦斯盯科技有限公司 一种柔性电路板复检设备
CN115065761A (zh) * 2022-06-13 2022-09-16 中亿启航数码科技(北京)有限公司 一种多镜头扫描装置及其扫描方法

Cited By (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN104101609A (zh) * 2014-07-03 2014-10-15 宁波摩米创新工场电子科技有限公司 一种电路板视觉检测设备
CN104101609B (zh) * 2014-07-03 2016-08-24 宁波摩米创新工场电子科技有限公司 一种电路板视觉检测设备
CN113777114A (zh) * 2021-11-15 2021-12-10 佛山市坦斯盯科技有限公司 一种柔性电路板复检设备
CN113777114B (zh) * 2021-11-15 2022-02-22 佛山市坦斯盯科技有限公司 一种柔性电路板复检设备
CN115065761A (zh) * 2022-06-13 2022-09-16 中亿启航数码科技(北京)有限公司 一种多镜头扫描装置及其扫描方法
CN115065761B (zh) * 2022-06-13 2023-09-12 中亿启航数码科技(北京)有限公司 一种多镜头扫描装置及其扫描方法

Also Published As

Publication number Publication date
TWM462365U (zh) 2013-09-21
KR20140005766U (ko) 2014-11-12

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