JP3185858U - 自動光学検出設備 - Google Patents
自動光学検出設備 Download PDFInfo
- Publication number
- JP3185858U JP3185858U JP2013003622U JP2013003622U JP3185858U JP 3185858 U JP3185858 U JP 3185858U JP 2013003622 U JP2013003622 U JP 2013003622U JP 2013003622 U JP2013003622 U JP 2013003622U JP 3185858 U JP3185858 U JP 3185858U
- Authority
- JP
- Japan
- Prior art keywords
- roller
- optical detection
- automatic optical
- roll
- detection equipment
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Lifetime
Links
Images
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B11/00—Measuring arrangements characterised by the use of optical techniques
- G01B11/24—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures
- G01B11/25—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures by projecting a pattern, e.g. one or more lines, moiré fringes on the object
- G01B11/2518—Projection by scanning of the object
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L22/00—Testing or measuring during manufacture or treatment; Reliability measurements, i.e. testing of parts without further processing to modify the parts as such; Structural arrangements therefor
- H01L22/30—Structural arrangements specially adapted for testing or measuring during manufacture or treatment, or specially adapted for reliability measurements
- H01L22/34—Circuits for electrically characterising or monitoring manufacturing processes, e. g. whole test die, wafers filled with test structures, on-board-devices incorporated on each die, process control monitors or pad structures thereof, devices in scribe line
-
- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
- H05K13/00—Apparatus or processes specially adapted for manufacturing or adjusting assemblages of electric components
- H05K13/08—Monitoring manufacture of assemblages
Landscapes
- Engineering & Computer Science (AREA)
- Manufacturing & Machinery (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Life Sciences & Earth Sciences (AREA)
- Automation & Control Theory (AREA)
- Analytical Chemistry (AREA)
- Biochemistry (AREA)
- General Health & Medical Sciences (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Chemical & Material Sciences (AREA)
- Health & Medical Sciences (AREA)
- Computer Hardware Design (AREA)
- Computer Vision & Pattern Recognition (AREA)
- Power Engineering (AREA)
- Operations Research (AREA)
- Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
- Length Measuring Devices By Optical Means (AREA)
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
TW102208122U TWM462365U (zh) | 2013-05-02 | 2013-05-02 | 自動光學檢測設備 |
TW102208122 | 2013-05-02 |
Publications (1)
Publication Number | Publication Date |
---|---|
JP3185858U true JP3185858U (ja) | 2013-09-05 |
Family
ID=49629916
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP2013003622U Expired - Lifetime JP3185858U (ja) | 2013-05-02 | 2013-06-26 | 自動光学検出設備 |
Country Status (3)
Country | Link |
---|---|
JP (1) | JP3185858U (zh) |
KR (1) | KR20140005766U (zh) |
TW (1) | TWM462365U (zh) |
Cited By (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN104101609A (zh) * | 2014-07-03 | 2014-10-15 | 宁波摩米创新工场电子科技有限公司 | 一种电路板视觉检测设备 |
CN113777114A (zh) * | 2021-11-15 | 2021-12-10 | 佛山市坦斯盯科技有限公司 | 一种柔性电路板复检设备 |
CN115065761A (zh) * | 2022-06-13 | 2022-09-16 | 中亿启航数码科技(北京)有限公司 | 一种多镜头扫描装置及其扫描方法 |
-
2013
- 2013-05-02 TW TW102208122U patent/TWM462365U/zh not_active IP Right Cessation
- 2013-06-26 JP JP2013003622U patent/JP3185858U/ja not_active Expired - Lifetime
- 2013-09-03 KR KR2020130007381U patent/KR20140005766U/ko not_active Application Discontinuation
Cited By (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN104101609A (zh) * | 2014-07-03 | 2014-10-15 | 宁波摩米创新工场电子科技有限公司 | 一种电路板视觉检测设备 |
CN104101609B (zh) * | 2014-07-03 | 2016-08-24 | 宁波摩米创新工场电子科技有限公司 | 一种电路板视觉检测设备 |
CN113777114A (zh) * | 2021-11-15 | 2021-12-10 | 佛山市坦斯盯科技有限公司 | 一种柔性电路板复检设备 |
CN113777114B (zh) * | 2021-11-15 | 2022-02-22 | 佛山市坦斯盯科技有限公司 | 一种柔性电路板复检设备 |
CN115065761A (zh) * | 2022-06-13 | 2022-09-16 | 中亿启航数码科技(北京)有限公司 | 一种多镜头扫描装置及其扫描方法 |
CN115065761B (zh) * | 2022-06-13 | 2023-09-12 | 中亿启航数码科技(北京)有限公司 | 一种多镜头扫描装置及其扫描方法 |
Also Published As
Publication number | Publication date |
---|---|
TWM462365U (zh) | 2013-09-21 |
KR20140005766U (ko) | 2014-11-12 |
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