JP2576353Y2 - Semiconductor substrate automatic processing equipment - Google Patents

Semiconductor substrate automatic processing equipment

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Publication number
JP2576353Y2
JP2576353Y2 JP1992047233U JP4723392U JP2576353Y2 JP 2576353 Y2 JP2576353 Y2 JP 2576353Y2 JP 1992047233 U JP1992047233 U JP 1992047233U JP 4723392 U JP4723392 U JP 4723392U JP 2576353 Y2 JP2576353 Y2 JP 2576353Y2
Authority
JP
Japan
Prior art keywords
substrate
substrate holding
semiconductor substrate
holding means
processing
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
JP1992047233U
Other languages
Japanese (ja)
Other versions
JPH062685U (en
Inventor
篤泰 朝香
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Kaijo Corp
Original Assignee
Kaijo Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Kaijo Corp filed Critical Kaijo Corp
Priority to JP1992047233U priority Critical patent/JP2576353Y2/en
Publication of JPH062685U publication Critical patent/JPH062685U/en
Application granted granted Critical
Publication of JP2576353Y2 publication Critical patent/JP2576353Y2/en
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

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Description

【考案の詳細な説明】[Detailed description of the invention]

【0001】[0001]

【産業上の利用分野】本考案は、シリコンウエハーやガ
ラス基板等の半導体基板を複数枚まとめて処理槽内の処
理液中に浸漬して洗浄処理を施す半導体基板自動処理装
置に関する。
BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to an automatic semiconductor substrate processing apparatus for performing a cleaning process by immersing a plurality of semiconductor substrates such as silicon wafers and glass substrates in a processing solution in a processing bath.

【0002】[0002]

【従来の技術】従来、この種の半導体基板自動処理装置
として、例えば特開平3−54827号公報において開
示されているものがある。
2. Description of the Related Art Conventionally, as this type of semiconductor substrate automatic processing apparatus, there is one disclosed in, for example, Japanese Patent Application Laid-Open No. 3-54827.

【0003】この従来の半導体基板自動処理装置におい
ては、被洗浄物としての半導体基板を箱型の保持具内に
配列して収納し、この収納状態のままにて処理槽内の処
理液に浸漬させて洗浄作業を行っている。なお、洗浄中
は超音波振動子によって超音波振動を与え、その衝撃波
によって半導体基板に付着している汚れを破壊洗浄して
いる。
In this conventional semiconductor substrate automatic processing apparatus, semiconductor substrates as objects to be cleaned are arranged and stored in a box-shaped holder, and immersed in a processing liquid in a processing tank in this stored state. We are doing cleaning work. During the cleaning, ultrasonic vibration is applied by an ultrasonic vibrator, and the shock wave destroys and cleans the dirt attached to the semiconductor substrate.

【0004】そして、半導体基板に対する処理液の流れ
を生ぜしめて洗浄効果を上げるために、処理槽内で保持
具を支える台を揺動形式のスイング台としてこれを揺動
させることが行われている。
Then, in order to generate a flow of the processing liquid to the semiconductor substrate and to enhance a cleaning effect, a table supporting the holder in the processing tank is oscillated as a swing type swing table. .

【0005】かかる従来の装置においては、保持具に付
着していた塵埃により処理液が混濁して半導体基板が汚
染される一方、保持具の占有スペースが大きいために処
理槽の容積をはじめ装置全体の小型化を図ることが困難
であるという欠点がある。
In such a conventional apparatus, the processing liquid becomes turbid due to dust adhering to the holder and the semiconductor substrate is contaminated. On the other hand, since the space occupied by the holder is large, not only the volume of the processing tank but also the entire apparatus is increased. There is a disadvantage that it is difficult to reduce the size.

【0006】[0006]

【考案が解決しようとする課題】そこで、出願人は、上
記の如き保持具を用いることなく半導体基板の洗浄作業
を行う考案について考えた。そして、その場合、下記の
問題を併せて解消すべきであることを考慮した。
SUMMARY OF THE INVENTION Accordingly, the present applicant has considered a device for cleaning a semiconductor substrate without using a holder as described above. Then, in that case, it was considered that the following problems should be solved together.

【0007】前述した従来の装置においては半導体基板
をその中心よりも下方を揺動中心として揺動させている
が、かかる構成では揺動動作を停止させた時点における
各半導体基板のずれ量が大きく、位置決めを高精度に行
うことが困難である。すると、これら各半導体基板を把
持して処理槽内に持ち来したり処理槽外に搬出するため
の自動搬送機構(例えば特開昭57−52138号公報
において開示されている)を設けた場合、該自動搬送機
構が半導体基板を処理槽外に搬出する際に該各半導体基
板を把持し損ねたり、逆に半導体基板を搬入するときに
基板の受け渡しミスが生ずる恐れがある。
In the above-described conventional apparatus, the semiconductor substrate is swung with the swing center below the center of the semiconductor substrate. However, in such a configuration, the amount of displacement of each semiconductor substrate when the swing operation is stopped is large. It is difficult to perform positioning with high accuracy. Then, when an automatic transfer mechanism (for example, disclosed in Japanese Patent Application Laid-Open No. 57-52138) for holding each of these semiconductor substrates and bringing them into the processing tank or carrying them out of the processing tank is provided. When the automatic transport mechanism carries out the semiconductor substrate out of the processing tank, there is a risk that the semiconductor substrate may not be properly gripped or a mistake may occur when the semiconductor substrate is carried in.

【0008】そこで、本考案は、上記した問題を全て解
消した洗浄装置を提供することを目的とする。
Accordingly, an object of the present invention is to provide a cleaning apparatus which has solved all of the above problems.

【0009】[0009]

【課題を解決するための手段】本考案は、処理液を貯留
する処理槽と、前記処理槽内に配置され複数の半導体基
板各々の外周部に係合して受ける受け溝を有する複数の
基板保持部材により主面同士が平行となるように整列保
持する基板保持手段と、前記基板保持手段を前記半導体
基板の主面に略平行な面内において揺動自在に支持する
支持機構と、前記基板保持手段を所定の角度内で揺動さ
せる駆動手段と、前記処理槽内の処理液を超音波により
励振する励振手段とを備え、前記基板保持手段の揺動中
心が前記基板保持手段により保持された前記半導体基板
の中心と略一致してなるものである。また、本考案の前
記駆動手段は、前記基板保持手段を揺動させる揺動角度
を前記揺動中心に対して対称な角度で揺動させてなるも
のである。また、本考案の前記支持機構は、前記処理槽
の外部に上下方向に延在しその下端部で枢支された垂直
アームと、前記垂直アームの自由端部に一端部が取り付
けられた略水平方向に伸びてなる水平アームと、前記水
平アームの他端部に垂下状態に取り付けられ下端部で前
記基板保持手段を支持する支持フレームで構成されてな
り、前記垂直アームの枢支点が前記半導体基板の中心と
略一致してなるものである。また、本考案は、複数の半
導体基板の主面同士が平行で且つ各々が直立した状態で
一定間隔で整列把持する複数の把持アームを相対的に作
動可能な自動搬送機構と、処理液を貯留する処理槽と、
前記処理槽内に配置され前記自動搬送機構により搬送さ
れる複数の半導体基板各々の外周部に係合して受ける受
け溝を有する複数の基板保持部材により主面同士が平行
となるように整列保持する基板保持手段と、前記基板保
持手段を前記半導体基板の主面に略平行な面内において
揺動自在に支持する支持機構と、前記基板保持手段を所
定の角度内で揺動させる駆動手段と、前記処理槽内の処
理液を超音波により励振する励振手段とを備え、前記基
板保持手段の揺動中心が前記基板保持手段により保持さ
れた前記半導体基板の中心と略一致してなるものであ
る。
SUMMARY OF THE INVENTION According to the present invention, there is provided a processing tank for storing a processing liquid, and a plurality of substrates having a receiving groove disposed in the processing tank and engaged with an outer peripheral portion of each of a plurality of semiconductor substrates. Substrate holding means for aligning and holding the main surfaces parallel to each other by a holding member, a support mechanism for swingably supporting the substrate holding means in a plane substantially parallel to the main surface of the semiconductor substrate, and the substrate Driving means for swinging the holding means within a predetermined angle, and exciting means for exciting the processing liquid in the processing bath by ultrasonic waves, wherein the swing center of the substrate holding means is held by the substrate holding means. And substantially coincides with the center of the semiconductor substrate. Further, the driving means of the present invention is such that the swing angle for swinging the substrate holding means is swung at an angle symmetrical with respect to the swing center. Further, the support mechanism of the present invention includes a vertical arm extending vertically in the outside of the processing tank and pivotally supported at a lower end thereof, and a substantially horizontal arm having one end attached to a free end of the vertical arm. A horizontal arm extending in the vertical direction, and a supporting frame that is attached to the other end of the horizontal arm in a hanging state and supports the substrate holding means at the lower end. The pivot point of the vertical arm is the semiconductor substrate. Is substantially the same as the center of In addition, the present invention provides an automatic transfer mechanism capable of relatively operating a plurality of gripping arms that are aligned and gripped at regular intervals in a state where the main surfaces of a plurality of semiconductor substrates are parallel and each is upright, and a processing liquid is stored. Processing tank,
A plurality of substrate holding members having receiving grooves engaged with the outer peripheral portions of the plurality of semiconductor substrates disposed in the processing tank and transferred by the automatic transfer mechanism are aligned and held so that the main surfaces thereof are parallel to each other. Substrate holding means, a support mechanism for swingably supporting the substrate holding means in a plane substantially parallel to the main surface of the semiconductor substrate, and a driving means for swinging the substrate holding means within a predetermined angle. Excitation means for exciting the processing liquid in the processing tank by ultrasonic waves, the center of oscillation of the substrate holding means being substantially coincident with the center of the semiconductor substrate held by the substrate holding means. is there.

【0010】[0010]

【実施例】以下、本考案の実施例としての半導体基板自
動処理装置について添付図面を参照しつつ説明する。
DETAILED DESCRIPTION OF THE PREFERRED EMBODIMENTS An automatic semiconductor substrate processing apparatus as an embodiment of the present invention will be described below with reference to the accompanying drawings.

【0011】図1乃至図3に示すように、本考案に係る
半導体基板自動処理装置は、処理液1が満たされた処理
槽2を備えている。なお、処理槽2の底面は水平面に対
して多少傾斜させてあり、低い側の底部には排液管2a
が連結されている。
As shown in FIGS. 1 to 3, the automatic semiconductor substrate processing apparatus according to the present invention includes a processing tank 2 filled with a processing solution 1. The bottom of the processing tank 2 is slightly inclined with respect to the horizontal plane, and the bottom of the lower side is a drain pipe 2a.
Are connected.

【0012】処理槽2の下部には超音波を発生する超音
波振動子3が設けられている。この超音波振動子3は、
当該半導体基板自動処理装置の筐体内所定位置に配設さ
れた超音波発振器(図示せず)により駆動され、処理液
1を励振させるものである。これら超音波振動子3及び
超音波発振器を、励振手段と総称する。この励振手段を
設けたことにより著しい洗浄効果が得られる。
An ultrasonic vibrator 3 for generating ultrasonic waves is provided below the processing tank 2. This ultrasonic transducer 3
The processing liquid 1 is driven by an ultrasonic oscillator (not shown) disposed at a predetermined position in the housing of the semiconductor substrate automatic processing apparatus. The ultrasonic vibrator 3 and the ultrasonic oscillator are collectively referred to as excitation means. By providing this excitation means, a remarkable cleaning effect can be obtained.

【0013】処理槽2の内部には、複数、この場合3本
の棒状の基板保持部材4、5及び6から成る基板保持手
段7が配置されている。該基板保持手段7は、図2に示
す自動搬送機構8によって処理槽2内に搬入される多
数、例えば50枚の半導体基板9を保持するものであ
る。なお、該自動搬送機構8は、相対的に作動する複数
の把持アーム8aを具備し、該各把持アーム8aによ
り、各半導体基板9をその主面同士が平行であるように
且つ各々が直立した状態にて一定間隔で整列して把持す
る。そして、図示の搬送経路X1 〜X4 に沿って移動
し、該各半導体基板9を処理槽2内に持ち来したり処理
槽2外に搬出することを行う。
A substrate holding means 7 comprising a plurality of, in this case, three rod-shaped substrate holding members 4, 5 and 6, is disposed inside the processing tank 2. The substrate holding means 7 holds a large number, for example, 50 semiconductor substrates 9 carried into the processing tank 2 by the automatic transfer mechanism 8 shown in FIG. The automatic transfer mechanism 8 includes a plurality of gripping arms 8a that operate relatively, and the gripping arms 8a cause the semiconductor substrates 9 to stand upright so that their main surfaces are parallel to each other. It is aligned and held at regular intervals in the state. Then, the semiconductor substrate 9 moves along the transport paths X 1 to X 4 shown in the figure to carry each semiconductor substrate 9 into or out of the processing tank 2.

【0014】上記した基板保持手段7は、自動搬送機構
8により搬入された各半導体基板9を、整列状態を維持
して保持する。
The above-described substrate holding means 7 holds the semiconductor substrates 9 carried in by the automatic transfer mechanism 8 while maintaining the aligned state.

【0015】ここで、基板保持手段7を構成する各基板
保持部材4乃至6について、詳述する。
Here, each of the substrate holding members 4 to 6 constituting the substrate holding means 7 will be described in detail.

【0016】図から明らかなように、3本設けられたこ
れらの基板保持部材4乃至6は、夫々同じ長さにて形成
され、各半導体基板9の整列方向において互いに平行に
延在している。そして、そのうち1本の基板保持部材4
については長尺の矩形板状に形成されており、半導体基
板9の最下端部に係合するように配置されている。ま
た、残る2本の基板保持部材5及び6に関しては円柱状
に、且つ互いに同一形状に形成されており、上記の基板
保持部材4の両側に配置されている。
As is apparent from the drawing, the three substrate holding members 4 to 6 provided are formed to have the same length, and extend in parallel with each other in the direction in which the semiconductor substrates 9 are aligned. . And one of the substrate holding members 4
Is formed in a long rectangular plate shape, and is arranged so as to engage with the lowermost end of the semiconductor substrate 9. The remaining two substrate holding members 5 and 6 are formed in a columnar shape and have the same shape as each other, and are arranged on both sides of the substrate holding member 4.

【0017】図4及び図5に、基板保持部材5の詳細を
示す。図示のように、基板保持部材5には、各々半導体
基板9の外周部に係合してこれらを受ける受け溝5aが
等しいピッチにて長手方向に並設されている。なお、図
4から明らかなように、これら受け溝5aはその断面形
状が例えばV字状となっている。また、図5から明らか
なように、各受け溝5aは、基板保持部材5の一部分を
切り欠いた形態にて形成されており、それらの底面はこ
れに係合する半導体基板9の半径(100m/m)と等
しい曲率半径を有している。
FIGS. 4 and 5 show the details of the substrate holding member 5. FIG. As shown in the drawing, receiving grooves 5a that engage with and receive the outer peripheral portions of the semiconductor substrate 9 are arranged in the substrate holding member 5 at equal pitches in the longitudinal direction. As is apparent from FIG. 4, these receiving grooves 5a have, for example, a V-shaped cross section. As is apparent from FIG. 5, each receiving groove 5a is formed by cutting out a part of the substrate holding member 5, and the bottom surface thereof has a radius (100 m) of the semiconductor substrate 9 which engages with it. / M).

【0018】なお、前述したように、他の2本の基板保
持部材4及び6のうち基板保持部材6に関しては上述し
た基板保持部材5と同形状であり、また、残る矩形板状
の基板保持部材4についても上記の基板保持部材5と同
様の受け溝が形成されているのみであるから、詳細な説
明は省略する。
As described above, the substrate holding member 6 of the other two substrate holding members 4 and 6 has the same shape as the above-described substrate holding member 5, and the remaining rectangular plate-shaped substrate holding member 6 has the same shape. Since the member 4 has only the same receiving groove as that of the substrate holding member 5, the detailed description is omitted.

【0019】次に、上記した各基板保持部材4乃至6か
らなる基板保持手段7を揺動自在に支持する支持機構
と、該基板保持手段7に駆動力を付与して揺動せしめる
駆動手段について説明する。
Next, a support mechanism for swingably supporting the substrate holding means 7 comprising the above-described substrate holding members 4 to 6 and a driving means for applying a driving force to the substrate holding means 7 to swing the substrate holding means 7 will be described. explain.

【0020】図1に示すように、当該半導体基板自動処
理装置は処理槽2を囲むように設けられた本体フレーム
14を有し、該本体フレーム14に対して、ブッシュ1
5及び16を介して2本のシャフト17及び18が同心
的に回転すべく設けられている。なお、両シャフト1
7、18は水平方向に伸長して設けられている。そし
て、これらシャフト17、18の各一端部には略矩形板
状の垂直アーム21及び22が固着されている。該両垂
直アーム21及び22は上下方向において延在して設け
られ、その下端部にてシャフト17、18に取り付けら
れている。
As shown in FIG. 1, the semiconductor substrate automatic processing apparatus has a main body frame 14 provided so as to surround the processing tank 2.
Two shafts 17 and 18 are provided for concentric rotation via 5 and 16. In addition, both shafts 1
Reference numerals 7 and 18 extend in the horizontal direction. Then, substantially rectangular plate-shaped vertical arms 21 and 22 are fixed to one end of each of the shafts 17 and 18. The vertical arms 21 and 22 are provided to extend in the vertical direction, and are attached to the shafts 17 and 18 at lower ends thereof.

【0021】両垂直アーム21及び22の各上端部に
は、水平方向に伸びる水平アーム24及び25が各々の
一端部にてボルト(参照符号は付していない)により締
結されている。そして、該両水平アーム24及び25の
他端部には、L字状に形成された支持フレーム27及び
28が垂下状態にてボルト締めされている。
Horizontal arms 24 and 25 extending in the horizontal direction are fastened to the upper ends of the vertical arms 21 and 22 by bolts (not denoted by reference numerals) at one ends thereof. L-shaped support frames 27 and 28 are bolted to the other ends of the horizontal arms 24 and 25 in a hanging state.

【0022】該両支持フレーム27及び28は処理槽2
の底部に向けて伸長し、前述した基板保持手段7の構成
部材である各基板保持部材4乃至6はこの支持フレーム
27及び28の下端部間に架設されている。
The supporting frames 27 and 28 are provided in the processing tank 2.
Each of the substrate holding members 4 to 6, which is a component of the above-described substrate holding means 7, extends between the lower ends of the support frames 27 and 28.

【0023】上記したブッシュ15、16と、シャフト
17、18と、垂直アーム21、22と、水平アーム2
4、25と、支持アーム27及び28とによって、上記
基板保持手段7を揺動自在に支持する支持機構が構成さ
れている。なお、基板保持手段7は、その保持した各半
導体基板9の主面に平行な面内において揺動するように
なされている。
The above-mentioned bushes 15, 16; shafts 17, 18; vertical arms 21, 22;
The support mechanisms 4 and 25 and the support arms 27 and 28 support the substrate holding means 7 in a swingable manner. The substrate holding means 7 is configured to swing in a plane parallel to the main surface of each semiconductor substrate 9 held.

【0024】なお、上記垂直アーム21、水平アーム2
4及び支持フレーム27並びに垂直アーム22、水平ア
ーム25及び支持フレーム28については、このように
互いに個別の部材とせずに、一体に成形してもよい。
The vertical arm 21 and the horizontal arm 2
4 and the support frame 27, and the vertical arm 22, the horizontal arm 25, and the support frame 28 may be integrally formed instead of individual members.

【0025】上記した基板保持手段7の揺動中心、すな
わち各シャフト17及び18の軸中心が、該基板保持手
段7により保持された各半導体基板9の中心に一致せし
められている。
The swing center of the substrate holding means 7, that is, the axial center of each of the shafts 17 and 18 is matched with the center of each semiconductor substrate 9 held by the substrate holding means 7.

【0026】一方、図1に示すように、上記した揺動部
分の支持軸として作用する両シャフト17及び18の各
他端部には、それそぞれ歯車31及び32が固着されて
いる。これら各歯車31及び32にトルクを付与するト
ルク付与手段については図示を省略したが、該トルク付
与手段はモータ等を含み、両歯車31、32を互いに同
じ回転方向に所定各度だけ正転、逆転できるよう構成さ
れている。このトルク付与手段と、両歯車31及び32
とにより、上記基板保持手段7に対して駆動力を付与し
てこれを揺動せしめる駆動手段が構成されている。
On the other hand, as shown in FIG. 1, gears 31 and 32 are respectively fixed to the other ends of the shafts 17 and 18 acting as support shafts of the swinging portion. The torque applying means for applying a torque to each of the gears 31 and 32 is not shown, but the torque applying means includes a motor and the like, and the two gears 31 and 32 are rotated forward by a predetermined angle in the same rotational direction. It is configured to be able to reverse. This torque applying means and both gears 31 and 32
Thus, a driving means for applying a driving force to the substrate holding means 7 and swinging the driving force is constituted.

【0027】上述したように、当該半導体基板自動処理
装置においては、基板保持手段7の揺動中心が、該基板
保持手段7により保持された半導体基板9の中心に一致
せしめられている。かかる構成においては、基板保持手
段7の揺動動作中及び停止時のいずれにおいても、各半
導体基板9は常に一定位置に保たれ、ずれを生ずること
がない。
As described above, in the semiconductor substrate automatic processing apparatus, the swing center of the substrate holding means 7 is made to coincide with the center of the semiconductor substrate 9 held by the substrate holding means 7. In such a configuration, the semiconductor substrate 9 is always kept at a constant position during the swinging operation of the substrate holding means 7 and at the time of stopping, and no displacement occurs.

【0028】よって、図2に示す自動搬送機構8が該各
半導体基板9を処理槽2の外に搬出しようとする場合に
その把持アーム8aによって該各半導体基板9を確実に
把持することが出来る。また、逆に、自動搬送機構8が
半導体基板9を処理槽2内に搬入して基板保持手段7に
受け渡す際に受け渡しミスを生ずる恐れもない。
Therefore, when the automatic transfer mechanism 8 shown in FIG. 2 attempts to carry out each semiconductor substrate 9 out of the processing tank 2, each semiconductor substrate 9 can be reliably gripped by the gripping arm 8a. . Conversely, when the automatic transport mechanism 8 carries the semiconductor substrate 9 into the processing tank 2 and delivers it to the substrate holding means 7, there is no possibility that a delivery error occurs.

【0029】また、本実施例に係る半導体基板自動処理
装置においては、基板保持手段7によって半導体基板9
に発生する超音波の陰の部分は図2及び図3に示すよう
になる。即ち、図3に示すように、該基板保持手段7が
具備する基板保持部材5がその揺動ストロークの上死点
に位置するときに生じる陰の部分は、図において二点鎖
線にて囲む斜線領域43となり、基板保持部材5が下死
点に位置するときに生じる陰の部分は他の二点鎖線にて
囲む斜線領域44となり、該上死点から下死点までの全
区間にわたって揺動する際に常に生じる陰の部分は、実
線にて囲む斜線領域45となる。なお、他の基板保持部
材4及び6に関しても、図示を省略したが上記と同様に
陰の部分が発生する。
In the automatic semiconductor substrate processing apparatus according to the present embodiment, the semiconductor substrate 9 is
The shaded portion of the ultrasonic wave generated in FIG. That is, as shown in FIG. 3, a shaded portion generated when the substrate holding member 5 of the substrate holding means 7 is located at the top dead center of the swing stroke is indicated by a hatched line surrounded by a two-dot chain line in FIG. The shaded area generated when the substrate holding member 5 is located at the bottom dead center becomes the shaded area 44 surrounded by another two-dot chain line, and swings over the entire section from the top dead center to the bottom dead center. The shaded area that always occurs is a shaded area 45 surrounded by a solid line. Although the other substrate holding members 4 and 6 are not shown in the drawing, shaded portions are generated similarly to the above.

【0030】ここで、上記した本考案に係る半導体基板
自動処理装置の構成及びその効果との比較をなすため、
基板保持手段7の揺動中心を半導体基板9の中心よりも
所定距離だけ下方に移した場合について説明する。
Here, in order to make a comparison with the configuration of the automatic semiconductor substrate processing apparatus according to the present invention and its effects,
A case will be described in which the swing center of the substrate holding means 7 is shifted downward by a predetermined distance from the center of the semiconductor substrate 9.

【0031】図6にその構成を示す。FIG. 6 shows the configuration.

【0032】図示のように、かかる構成においては、基
板保持手段7の揺動動作に伴い半導体基板9も大きく揺
動し、揺動を停止したときに半導体基板9が常に一定位
置で停止するとは限らない。よって、上述した本考案に
係る半導体基板自動処理装置におけるが如き、自動搬送
機構8による基板保持手段7に対する半導体基板9の確
実な脱着動作は期待し得ない。
As shown in the figure, in such a configuration, the semiconductor substrate 9 also swings greatly with the swinging operation of the substrate holding means 7, and when the swinging is stopped, the semiconductor substrate 9 always stops at a fixed position. Not exclusively. Therefore, as in the above-described automatic semiconductor substrate processing apparatus according to the present invention, a reliable operation of attaching and detaching the semiconductor substrate 9 to and from the substrate holding means 7 by the automatic transfer mechanism 8 cannot be expected.

【0033】また、図6に示す構成においては、各半導
体基板9上に、例えば基板保持部材5によって遮られる
ことによる陰の部分(図において実線で囲む斜線領域5
5に対応する。なお、図において、二点鎖線にて囲む斜
線領域53は基板保持部材5が上死点に位置するときに
生じる陰の部分、他の二点鎖線で囲む斜線領域54は当
該基板保持部材5が下死点に位置するときに生じる陰の
部分を表しており、上記実線にて囲む斜線領域55は上
死点から下死点までの全区間にわたって揺動する際に常
に生じる陰の部分を表している)が発生し、このような
陰の部分55に対する洗浄力が低下する。
Further, in the configuration shown in FIG. 6, on each semiconductor substrate 9, for example, a shaded portion (a hatched region 5 surrounded by a solid line in FIG.
Corresponding to 5. In the drawing, a hatched area 53 surrounded by a two-dot chain line is a shaded portion generated when the substrate holding member 5 is located at the top dead center. The shaded area generated at the time of being located at the bottom dead center is shown. The shaded area 55 surrounded by the solid line represents the shaded area that is always generated when swinging over the entire section from the top dead center to the bottom dead center. ) Occurs, and the detergency of such a shadow portion 55 is reduced.

【0034】このような常に生じる陰の部分55の面積
を図3に示した実施例における陰の部分45の面積と比
較すれば明らかなように、揺動角度を互いに同一の揺動
角度θに設定した場合、本考案に係る半導体基板自動処
理装置による陰の部分45の面積は、図6に示した陰の
部分55の面積と比べて大幅に減少することがわかる。
As is clear from the comparison between the area of the shadow portion 55, which always occurs, and the area of the shadow portion 45 in the embodiment shown in FIG. 3, the swing angle is set to the same swing angle θ. When set, the area of the shadow portion 45 by the automatic semiconductor substrate processing apparatus according to the present invention is significantly reduced as compared with the area of the shadow portion 55 shown in FIG.

【0035】[0035]

【考案の効果】以上説明したように、本考案によれば、
各半導体基板を処理槽内の基板保持手段上に直接載置す
る形式である故に従来用いていた箱型の保持具が不要と
なり、処理液に対する塵埃の混濁量が極めて少なく抑え
られると共に、処理槽の容積、延いては装置全体として
の小型化が達成されるという効果がある。また、本発明
による半導体基板自動処理装置においては、上記基板保
持手段の揺動中心が、該基板保持手段上の半導体基板の
中心に略一致せしめられている。従って、半導体基板は
常に一定位置に保たれ、自動搬送機構による該基板保持
手段に対する半導体基板の脱着動作が常に確実に行われ
るという効果がある。
[Effects of the Invention] As described above, according to the present invention,
Since each semiconductor substrate is directly mounted on the substrate holding means in the processing tank, the box-shaped holding tool conventionally used is not required, and the turbidity of dust with respect to the processing liquid can be extremely reduced. This has the effect of achieving a reduction in volume and, consequently, the overall size of the device. Also, in the semiconductor substrate automatic processing apparatus according to the present invention, the center of swing of the substrate holding means is substantially coincident with the center of the semiconductor substrate on the substrate holding means. Therefore, there is an effect that the semiconductor substrate is always kept at a fixed position, and the operation of attaching and detaching the semiconductor substrate to and from the substrate holding means by the automatic transfer mechanism is always performed reliably.

【図面の簡単な説明】[Brief description of the drawings]

【図1】図1は、本考案の実施例としての半導体基板自
動処理装置の縦断面図である。
FIG. 1 is a longitudinal sectional view of an automatic semiconductor substrate processing apparatus as an embodiment of the present invention.

【図2】図2は、図1に示した半導体基板自動処理装置
の要部と、該半導体基板自動処理装置に対する半導体基
板の搬入及び搬出をなすための自動搬送機構を示す、一
部断面を含む正面図である。
FIG. 2 is a partial cross-sectional view showing a main part of the automatic semiconductor substrate processing apparatus shown in FIG. 1 and an automatic transport mechanism for loading and unloading the semiconductor substrate into and from the automatic semiconductor substrate processing apparatus. FIG.

【図3】図3は、図2に示した半導体基板自動処理装置
の要部の拡大図である。
FIG. 3 is an enlarged view of a main part of the automatic semiconductor substrate processing apparatus shown in FIG. 2;

【図4】図4は、図1に示した半導体基板自動処理装置
の構成部材である基板保持部材の側面図である。
FIG. 4 is a side view of a substrate holding member that is a component of the automatic semiconductor substrate processing apparatus shown in FIG.

【図5】図5は、図4に関するAーA断面図である。FIG. 5 is a sectional view taken along the line AA in FIG. 4;

【図6】図6は、図3に示した構成と比較するための構
成の正面図である。
FIG. 6 is a front view of a configuration for comparison with the configuration shown in FIG. 3;

【符合の説明】[Description of sign]

1 処理液 2 処理槽 3 超音波振動子 4、5、6 基板保持部材 7 基板保持手段 8 自動搬送機構 9 半導体基板 DESCRIPTION OF SYMBOLS 1 Processing liquid 2 Processing tank 3 Ultrasonic vibrator 4, 5, 6 Substrate holding member 7 Substrate holding means 8 Automatic transfer mechanism 9 Semiconductor substrate

Claims (4)

(57)【実用新案登録請求の範囲】(57) [Scope of request for utility model registration] 【請求項1】 処理液を貯留する処理槽と、 前記処理槽内に配置され複数の半導体基板各々の外周部
に係合して受ける受け溝を有する複数の基板保持部材に
より主面同士が平行となるように整列保持する基板保持
手段と、 前記基板保持手段を前記半導体基板の主面に略平行な面
内において揺動自在に支持する支持機構と、 前記基板保持手段を所定の角度内で揺動させる駆動手段
と、前記処理槽内の処理液を超音波により励振する励振手段
とを備え、 前記基板保持手段の揺動中心が前記基板保持手段により
保持された前記半導体基板の中心略一致してなること
を特徴とする半導体基板自動処理装置。
1. A a process tank for storing the treating liquid, the outer peripheral portion of the semiconductor substrate, each of the number of multi disposed in said processing bath
To a plurality of substrate holding members having receiving grooves
A substrate holding means for more main surfaces to integer Retsuho lifting so is parallel to, and support mechanism for swingably supported in the substrate holding means said semiconductor substrate a plane substantially parallel to the main surface of said substrate drive means for causing rocking the holding means in a predetermined angle the processing solution in the processing bath exciting means for exciting by ultrasonic
Preparative comprising, a semiconductor substrate an automatic processing apparatus swing center is characterized <br/> that formed by the center substantially matches the semiconductor substrate held by the substrate holding unit of the substrate holding means.
【請求項2】 前記駆動手段は、前記基板保持手段を揺2. The method according to claim 1, wherein the driving unit swings the substrate holding unit.
動させる揺動角度を前記揺動中心に対して対称な角度でThe swing angle to be moved is symmetrical with respect to the swing center.
揺動させてなることを特徴とする請求項1に記載の半導The semiconductor device according to claim 1, wherein the semiconductor device is swung.
体基板自動処理装置。Body substrate automatic processing equipment.
【請求項3】 前記支持機構は、前記処理槽の外部に上
下方向に延しその下端部枢支された垂直アームと、
前記垂直アームの自由端部に一端部が取り付けられた略
水平方向に伸びてなる水平アームと、前記水平アームの
他端部に垂下状態に取り付けられ下端部で前記基板保持
手段を支持する支持フレームで構成されてなり、前記垂
直アームの枢支点が前記半導体基板の中心略一致して
なることを特徴とする請求項1記載の半導体基板自動処
理装置。
Wherein said support mechanism includes a vertical arm which is pivotally supported at the lower portion of the extending perilla vertically on the outside of the processing tank,
A horizontal arm comprising extending substantially <br/> horizontal direction having one end attached to the free end of the vertical arm, wherein the substrate held by the mounting et Re lower end droop state to the other end of the horizontal arm it consists of a supporting frame for supporting the unit, the pivot point of the vertical arm and the center substantially matches the semiconductor substrate
2. The semiconductor substrate automatic processing apparatus according to claim 1, wherein:
【請求項4】 複数の半導体基板の主面同士が平行で且
つ各々が直立した状態で一定間隔で整列把持する複数の
把持アームを相対的に作動可能な自動搬送機構と、 処理液を貯留する処理槽と、 前記処理槽内に配置され前記自動搬送機構により搬送さ
れる複数の半導体基板各々の外周部に係合して受ける受
け溝を有する複数の基板保持部材により主面同士が平行
となるように整列保持する基板保持手段と、 前記基板保持手段を前記半導体基板の主面に略平行な面
内において揺動自在に 支持する支持機構と、 前記基板保持手段を所定の角度内で揺動させる駆動手段
と、 前記処理槽内の処理液を超音波により励振する励振手段
とを備え、 前記基板保持手段の揺動中心が前記基板保持手段により
保持された前記半導体基板の中心と略一致してなること
を特徴とする半導体基板自動処理装置。
4. The semiconductor device according to claim 1 , wherein main surfaces of the plurality of semiconductor substrates are parallel to each other.
One at a time, with each standing upright
An automatic transfer mechanism capable of relatively operating the gripping arm, a processing tank for storing the processing liquid, and a transfer tank disposed in the processing tank and transferred by the automatic transfer mechanism.
Receiving portions engaged with the outer peripheral portions of the plurality of semiconductor substrates to be received.
Principal surfaces are parallel to each other by multiple substrate holding members with grooves
Substrate holding means for aligning and holding the substrate so that the substrate holding means is substantially parallel to a main surface of the semiconductor substrate.
A support mechanism for swingably supported at the inner, drive means for oscillating the substrate holding means within a predetermined angular
When the processing solution in the processing bath exciting means for exciting by ultrasonic
With the door, swinging center of the substrate holding means by the substrate holding means
Be substantially coincident with the center of the held semiconductor substrate
An automatic semiconductor substrate processing apparatus, comprising:
JP1992047233U 1992-06-12 1992-06-12 Semiconductor substrate automatic processing equipment Expired - Fee Related JP2576353Y2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP1992047233U JP2576353Y2 (en) 1992-06-12 1992-06-12 Semiconductor substrate automatic processing equipment

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP1992047233U JP2576353Y2 (en) 1992-06-12 1992-06-12 Semiconductor substrate automatic processing equipment

Publications (2)

Publication Number Publication Date
JPH062685U JPH062685U (en) 1994-01-14
JP2576353Y2 true JP2576353Y2 (en) 1998-07-09

Family

ID=12769500

Family Applications (1)

Application Number Title Priority Date Filing Date
JP1992047233U Expired - Fee Related JP2576353Y2 (en) 1992-06-12 1992-06-12 Semiconductor substrate automatic processing equipment

Country Status (1)

Country Link
JP (1) JP2576353Y2 (en)

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* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP5696491B2 (en) * 2011-01-20 2015-04-08 株式会社Sumco Wafer cleaning apparatus and cleaning method

Family Cites Families (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS62281430A (en) * 1986-05-30 1987-12-07 Hitachi Electronics Eng Co Ltd Method and device fo cleaning wafer prior to diffusion
JPS63174439U (en) * 1987-04-13 1988-11-11
JP2663492B2 (en) * 1988-04-04 1997-10-15 大日本スクリーン製造 株式会社 Rotary surface treatment equipment for substrates
JP2622883B2 (en) * 1989-07-24 1997-06-25 株式会社カイジョー Cleaning equipment
JPH03125429A (en) * 1989-10-11 1991-05-28 Hitachi Ltd Processing method for semiconductor wafer and rotary drier used therefor

Also Published As

Publication number Publication date
JPH062685U (en) 1994-01-14

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