JPS63208223A - Wafer treating apparatus - Google Patents

Wafer treating apparatus

Info

Publication number
JPS63208223A
JPS63208223A JP62040254A JP4025487A JPS63208223A JP S63208223 A JPS63208223 A JP S63208223A JP 62040254 A JP62040254 A JP 62040254A JP 4025487 A JP4025487 A JP 4025487A JP S63208223 A JPS63208223 A JP S63208223A
Authority
JP
Japan
Prior art keywords
wafer
processing
wafers
tank
treatment
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP62040254A
Other languages
Japanese (ja)
Inventor
Tetsuya Takagaki
哲也 高垣
Hiroshi Maejima
前島 央
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Hitachi Ltd
Original Assignee
Hitachi Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Hitachi Ltd filed Critical Hitachi Ltd
Priority to JP62040254A priority Critical patent/JPS63208223A/en
Publication of JPS63208223A publication Critical patent/JPS63208223A/en
Pending legal-status Critical Current

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  • Cleaning Or Drying Semiconductors (AREA)
  • Cleaning By Liquid Or Steam (AREA)
  • Weting (AREA)
  • Container, Conveyance, Adherence, Positioning, Of Wafer (AREA)

Abstract

PURPOSE:To avoid re-contamination of a wafer by a method wherein pushers which can move vertically while holding the wafers are provided in treatment baths and the transfer of the wafers between the respective treatment baths is performed by a separate handling mechanism. CONSTITUTION:A wafer treating apparatus 1 is used for the surface treatment of a wafer 2 in the manufacturing process of a semiconductor device and has a chemical solution bath 3a in which treatment with chemical such as hydrochloric acid is carried out, a washing bath 3b in which washing with pure water is carried out and a vapor drying treatment bath 3c in which moisture and foreign substances on the wafer surface are decomposed and removed by a vapor atmosphere of isopropylalcohol or the like. A handler 4 is composed of handling arms 4a and 4b which can be opened and closed and can hold a plurality of the wafers 2 between the handling arms 4a and 4b in parallel with a certain interval. The transfer of the wafers 2 between the respective treatment baths 3a, 3b and 3c is performed by the handler 4 and the transfer in the treatment baths is performed by pushers 10 which are independent mechanisms and can move vertically. With this constitution, a containing jig which is transferred with the wafers 2 in one piece is eliminated so that the contamination of the wafer 2 caused by the containing jig in the treatment process can be avoided.

Description

【発明の詳細な説明】 〔産業上の利用分野〕 本発明は、半導体ウェハ(以下、単に「ウェハ」という
)の処理、たとえばウェハの洗浄処理に利用して有効な
技術に関するものである。
DETAILED DESCRIPTION OF THE INVENTION [Industrial Application Field] The present invention relates to a technique that is effective when used for processing semiconductor wafers (hereinafter simply referred to as "wafers"), for example, wafer cleaning processing.

〔従来の技術〕[Conventional technology]

ウェハの処理、たとえばウェハの純水洗浄処理に用いら
れるウェハの収容治具として説明されている例としては
、例えば本出願人によって出願された特開昭57−15
5744号公報があり、この出願には、合成樹脂で形成
したウェハ収容治具の構造が説明されている。
An example of a wafer storage jig used for wafer processing, for example, wafer cleaning with pure water, is disclosed in Japanese Unexamined Patent Publication No. 57-15 filed by the present applicant.
No. 5744, and this application describes the structure of a wafer accommodating jig made of synthetic resin.

本発明者は上記収容治具を用いたウェハの処理技術、特
にウェハの洗浄技術について検討した。
The present inventor has studied wafer processing techniques using the above-mentioned storage jig, particularly wafer cleaning techniques.

以下は、公知とされた技術ではないが、本発明者によっ
て検討された技術であり、その概要は次の通りである。
Although the following is not a publicly known technique, it is a technique studied by the present inventor, and its outline is as follows.

すなわち、ウェハの洗浄工程では上記に説明したような
治具中にウェハを収容して、この治具とともに複数個の
洗浄槽への浸漬を順次繰り返す間に、ウェハの清浄度を
高める方法が採られごいる。
That is, in the wafer cleaning process, a method is adopted in which the wafer is housed in a jig such as the one described above, and the cleanliness of the wafer is increased while the wafer is sequentially immersed in a plurality of cleaning tanks together with the jig. There's a lot going on.

〔発明が解決しようとする問題点〕[Problem that the invention seeks to solve]

ところが、上記のようなウェハの洗浄処理技術では、収
容治具とともにウェハが次々に処理槽間を移送される過
程で、ウェハから離脱された塵埃等が収容治具の表面に
付着する場合がある。たとえば、洗浄槽内の洗浄液中に
おいてウェハの洗浄処理を行った場合に、ウェハ自体に
付着されていた塵埃等はウェハの表面から離脱されるが
、この塵埃が洗浄液中を浮遊して、今度は収容治具の表
面に付着する場合がある。このような状態で収容治具と
ともにウェハが次の処理槽に移送されて後続の処理を行
った場合に、再度ウェハが汚染される可能性が高い。こ
のような現象は、薬液等の水分がしみ込みやすいとされ
ている合成樹脂製のウェハ収容治具では特に顕著に現れ
るおそれがある。
However, in the above-mentioned wafer cleaning processing technology, during the process in which the wafers are successively transferred together with the holding jig between processing tanks, dust, etc. separated from the wafers may adhere to the surface of the holding jig. . For example, when a wafer is cleaned in a cleaning solution in a cleaning tank, dust attached to the wafer itself is removed from the surface of the wafer, but this dust floats in the cleaning solution and It may adhere to the surface of the storage jig. If the wafer is transferred to the next processing tank together with the storage jig in such a state and subjected to subsequent processing, there is a high possibility that the wafer will be contaminated again. Such a phenomenon may be particularly noticeable in wafer storage jigs made of synthetic resin, which are said to be susceptible to moisture such as chemical solutions.

本発明は、上記問題点に着目しでなされたものであり、
その目的は処理槽間のウェハの移送を通じてウェハが再
汚染されることを防止して信頼性の高いウェハ処理を実
現することにある。
The present invention has been made by focusing on the above problems,
The purpose of this is to prevent wafers from being re-contaminated during transfer of wafers between processing tanks and to realize highly reliable wafer processing.

本発明の前記ならびにその他の目的と新規な特徴は、本
明細書の記述および添付図面から明らかになるであろう
The above and other objects and novel features of the present invention will become apparent from the description of this specification and the accompanying drawings.

〔問題点を解決するための手段〕[Means for solving problems]

本願において開示される発明のうち代表的なものの概要
を簡単に説明すれば、次の通りである。
A brief overview of typical inventions disclosed in this application is as follows.

すなわち、処理液あるいは処理雰囲気によって処理域の
形成される処理槽の内部に、ウェハを支持した状態で上
下動可能なプッシャを設けるとともに、各処理槽間のウ
ェハの移送は別のハンドル機構によって行うものである
That is, a pusher that can move up and down while supporting a wafer is provided inside a processing tank in which a processing area is formed by a processing solution or a processing atmosphere, and a separate handle mechanism is used to transfer the wafer between each processing tank. It is something.

〔作用〕[Effect]

上記した手段によれば、ウェハと一体的に移送される収
容治具を廃して、各処理槽間のウェハの移送はハンドル
機構によって行うとともに、各処理槽内においてウェハ
の支持手段をそれぞれ独立して備えているため、収容治
具の汚染が原因となるウェハの再汚染が防止され、清浄
度の高いウェハ処理が実現される。
According to the above-mentioned means, the storage jig that is transferred together with the wafer is eliminated, and the wafer is transferred between each processing tank using a handle mechanism, and the wafer supporting means is independent from each other in each processing tank. This prevents re-contamination of wafers caused by contamination of the storage jig, and achieves highly clean wafer processing.

〔実施例〕〔Example〕

第1図は本発明の一実施例であるウェハ処理装置を示す
説明図、第2図は処理槽の内部機構を示す説明図、第3
1!lは処理域へのウェハの浸漬方法を示す説明図であ
る。
FIG. 1 is an explanatory diagram showing a wafer processing apparatus which is an embodiment of the present invention, FIG. 2 is an explanatory diagram showing the internal mechanism of a processing tank, and FIG.
1! FIG. 1 is an explanatory diagram showing a method of immersing a wafer into a processing area.

本実施例のウェハ処理装置lは、半導体装置の製造にお
けるウェハ2の表面処理を行うためのものであり、第1
1図に示すように、塩酸等の薬液処理を行う薬液槽3a
s純水洗浄を行う洗浄槽3b。
The wafer processing apparatus l of this embodiment is for performing surface treatment on a wafer 2 in the manufacture of semiconductor devices.
As shown in Fig. 1, a chemical tank 3a that performs chemical treatment such as hydrochloric acid
s A cleaning tank 3b that performs pure water cleaning.

イソプロピルアルコール等の蒸気雰囲気を用いてウェハ
表面の水分・異物を分解・除去する蒸気乾燥処理槽3C
をそれぞれ有している。被処理物体であるウェハ2は、
これらの各処理槽3a、3b。
Steam drying treatment tank 3C that decomposes and removes moisture and foreign matter on the wafer surface using a steam atmosphere such as isopropyl alcohol.
They each have The wafer 2, which is the object to be processed, is
Each of these processing tanks 3a, 3b.

30間を移送されながら所定の処理が行われるものであ
る。
Predetermined processing is performed while being transferred for 30 minutes.

これらの各処理槽3a、3b、3cの上方には、たとえ
ば図示されない搬送用レールに懸架された状態のハンド
ル4が配置されている。
Above each of these processing tanks 3a, 3b, and 3c, a handle 4 is arranged, for example, suspended from a transport rail (not shown).

このハンドル4は、たとえば各処理槽3a、3b、3c
を通じてウェハ2の移送を単一の機構で行うものであっ
てもよいし、2つの処理槽間のみの移送1、たとえば薬
液槽3aと洗浄槽3b、および洗浄槽3bと蒸気乾燥処
理槽3Cとの移送をそれぞれ分担する機構のものであっ
てもよい。
This handle 4 is connected to each processing tank 3a, 3b, 3c, for example.
The transfer of the wafer 2 may be performed by a single mechanism, or the transfer 1 may be performed only between two processing tanks, for example, between the chemical solution tank 3a and the cleaning tank 3b, and between the cleaning tank 3b and the steam drying processing tank 3C. It is also possible to use a mechanism in which the transportation of the two parts is divided among the two.

前記ハンドル4は、開閉可能なハンドルアーム4a、4
bで構成されており、両ハンドルアーム間に複数枚のウ
ェハ2を一定間隔で並列に保持することができるように
なっている。
The handle 4 includes handle arms 4a, 4 that can be opened and closed.
b, so that a plurality of wafers 2 can be held in parallel at regular intervals between both handle arms.

各処理槽3a、3b、3cの内部構造を一つの処理槽、
たとえば薬液槽3aを代表して説明すると以下の通りで
ある。
The internal structure of each processing tank 3a, 3b, 3c is one processing tank,
For example, the chemical solution tank 3a will be explained as follows.

第2図に示すように、処理槽本体5は、上面が開口され
た筐体形状を有しているが、この上面は図示されないシ
ャッタ機構等により閉塞可能なものであってもよい。第
2図において、処理槽本体5内は薬液6で満たされてい
るが、洗浄槽3bにおいては洗浄液7で満たされており
、また蒸気乾燥処理槽3Cにおいてはイソプロピルアル
コール等の所定の処理蒸気8の雰囲気で満たされており
、それぞれ所定の処理域が形成されている。
As shown in FIG. 2, the processing tank main body 5 has a housing shape with an open top surface, but this top surface may be closed by a shutter mechanism (not shown) or the like. In FIG. 2, the processing tank main body 5 is filled with a chemical solution 6, the cleaning tank 3b is filled with a cleaning liquid 7, and the steam drying processing tank 3C is filled with a predetermined processing vapor 8 such as isopropyl alcohol. , and a predetermined processing area is formed in each area.

第3図に示すように、処理槽本体5内において底部近傍
の中央付近には、処理槽本体5の長手方向に延設される
プッシャ10が設けられている。
As shown in FIG. 3, a pusher 10 extending in the longitudinal direction of the processing tank main body 5 is provided near the center of the processing tank main body 5 near the bottom.

このプッシャ10は上面が快られた弯曲形状を有してお
り、この弯曲上面には幅方向に沿って複数の支持溝11
が形成されている。ウェハ2はこの支持溝11にそれぞ
れ下端部を挿入された状態でプッシャ10上に立設支持
されるようになっている。該プッシャはその端部におい
て処理槽本体5の内部より上面開口部を経てL字状に外
方に延設されるプッシャアーム12が連結されており、
このプッシャアーム12は処理槽本体5の外部において
図示するようなシリンダ装置13あるいは図示しないボ
ールネジ機構等の上下駆動手段と連結されている。
This pusher 10 has a curved shape with a smooth upper surface, and this curved upper surface has a plurality of support grooves 11 along the width direction.
is formed. The wafer 2 is supported upright on the pusher 10 with its lower end inserted into each of the support grooves 11. The pusher is connected at its end to a pusher arm 12 which extends outward in an L-shape from the inside of the processing tank main body 5 through the upper opening.
This pusher arm 12 is connected to a vertical drive means such as a cylinder device 13 as shown in the drawing or a ball screw mechanism (not shown) on the outside of the processing tank main body 5.

処理槽本体5の内部において、上記プッシャlOをはさ
んで対向内壁側には一対のガイド板14a、14bが立
設されている。これらのガイド板14a、14bにはガ
イド溝15がウェハ2の立設方向に沿って形成されてお
り、プッシャlOの上下動によるウェハ2の槽内外への
移動時のガイドとして機能するようになっている。
Inside the processing tank body 5, a pair of guide plates 14a and 14b are erected on the opposing inner wall side with the pusher lO in between. Guide grooves 15 are formed in these guide plates 14a and 14b along the direction in which the wafers 2 are placed, and function as guides when the wafers 2 are moved in and out of the tank by the vertical movement of the pusher lO. ing.

なお、処理槽本体15、プッシャ10およびガイド板1
4a、14b等を構成する部材は、内部に形成される処
理域に対応してその材質を選択して構成することが望ま
しい。たとえば純水洗浄処理を行う洗浄槽3bの場合に
は、内部に満たされる洗浄液が純水であるため、その構
成部材の材質もフッ素樹脂、あるいは無金属性の塩化ビ
ニール等の樹脂系の材料を用いることが可能であるが、
塩酸あるいはイソプロピルアルコール等の薬液処理を行
う薬液槽3aあるいは蒸気乾燥処理槽3C等の場合には
、石英等の耐蝕性材料で構成することが望ましい。なお
、例示したこれらの材質に限定されるものではない。
In addition, the processing tank main body 15, pusher 10, and guide plate 1
It is desirable that the members constituting 4a, 14b, etc. be constructed by selecting materials corresponding to the processing area formed inside. For example, in the case of the cleaning tank 3b that performs a pure water cleaning process, the cleaning liquid filled inside is pure water, so the material of its components is fluororesin or a resin-based material such as metal-free vinyl chloride. Although it is possible to use
In the case of the chemical liquid tank 3a or the steam drying treatment tank 3C, etc., which perform chemical liquid treatment such as hydrochloric acid or isopropyl alcohol, it is desirable to construct them from a corrosion-resistant material such as quartz. Note that the material is not limited to these illustrated materials.

次に、本実施例の作用を第3図に基づいて説明する。Next, the operation of this embodiment will be explained based on FIG. 3.

まず、ハンドル4に挟持された状態の複数枚のウェハ2
が処理槽本体5上に位置されると、該処理槽本体5のシ
リンダ装置13が作動して、プッシャ10が液面の上方
に移動される。
First, a plurality of wafers 2 held between handles 4
is positioned on the processing tank main body 5, the cylinder device 13 of the processing tank main body 5 is activated, and the pusher 10 is moved above the liquid level.

次に、ハンドル4が降下されてプッシャ10の直上に位
置されると図示しない開閉機構が作動してハンドルアー
ム4a、4bが互いに離反方向に開放されて支持してい
たウェハ2をプッシャ10上に載置する。このとき、ハ
ンドル4の汚染を防止するために、該ハンドル4は液面
よりも上方に位置させておくことが望ましい。
Next, when the handle 4 is lowered and positioned directly above the pusher 10, an opening/closing mechanism (not shown) is activated, and the handle arms 4a and 4b are opened in the direction away from each other to move the supported wafer 2 onto the pusher 10. Place it. At this time, in order to prevent the handle 4 from becoming contaminated, it is desirable to position the handle 4 above the liquid level.

このようにしてプッシャ10がハンドル4よりウェハ2
を受け取ると、シリンダ装置13が再度作動して、プッ
シャ10が徐々に降下を開始し、ウェハ2を薬液6中に
浸漬させる。このようなウェハ2の処理槽本体5内への
降下時において、ウェハ2の両側部はガイド板14a、
14bのガイド溝15によってその進行方向をガイドさ
れている。したがって、ウェハ同士の衝突あるいは振動
によるウェハ2の破損等は有効に防止される。
In this way, the pusher 10 moves the wafer 2 from the handle 4.
When received, the cylinder device 13 is activated again, the pusher 10 starts to gradually descend, and the wafer 2 is immersed in the chemical solution 6. When the wafer 2 is lowered into the processing tank main body 5, both sides of the wafer 2 are guided by the guide plates 14a,
It is guided in its traveling direction by a guide groove 15 of 14b. Therefore, damage to the wafer 2 due to collision between wafers or vibration is effectively prevented.

プッシャ10が槽内底部近傍まで降下されて、所定の浸
漬処理が完了されると、再度シリンダ装置13が作動し
てプッシャ10が槽内上方に上昇移動される。このとき
、処理槽本体5の上方においては上記ハンドルアーム4
a、4bが開放状態で静止しており、プッシャ10が上
昇することによって、プッシャlO上のウェハ2は、ハ
ンドルアーム4a、4b間に位置される。
When the pusher 10 is lowered to near the bottom of the tank and the predetermined immersion process is completed, the cylinder device 13 is operated again to move the pusher 10 upwardly into the tank. At this time, above the processing tank main body 5, the handle arm 4
a, 4b remain open and stationary, and as the pusher 10 rises, the wafer 2 on the pusher IO is positioned between the handle arms 4a, 4b.

このような状態で、ハンドルアーム4a、4bが閉塞さ
れると、該ハンドルアーム4a、4b間にウェハ2が支
持された状態となる。
When the handle arms 4a and 4b are closed in this state, the wafer 2 is supported between the handle arms 4a and 4b.

次に、ハンドル4が所定位置まで上昇してさらに水平方
向に移動して次の洗浄槽3bの上方にウェハ2が移送さ
れる。洗浄槽3bにおいては、前記の説明と同様のウェ
ハ2のハンドリングが行われて、洗浄槽3bの洗浄液7
中においてウェハ2の洗浄処理が行われる。
Next, the handle 4 is raised to a predetermined position and further moved in the horizontal direction to transfer the wafer 2 above the next cleaning tank 3b. In the cleaning tank 3b, the wafer 2 is handled in the same manner as described above, and the cleaning liquid 7 in the cleaning tank 3b is
Inside, the wafer 2 is cleaned.

このように洗浄処理の完了したウェハ2は、再度ハンド
ル4に保持されて蒸気乾燥処理槽3cに移送されてその
表面の水分が除去されて一連の処理を完了する。
The wafer 2 that has been cleaned in this way is held by the handle 4 again and transferred to the steam drying tank 3c, where the water on its surface is removed and the series of treatments is completed.

このように、本実施例によれば以下の効果を得ることが
できる。
As described above, according to this embodiment, the following effects can be obtained.

(1)、ウェハ2の各処理槽3a、3b、3c間の移送
をハンドル4で行い、処理槽内部の移送を独立機構で上
下動可能なプッシャ10で行うことにより、ウェハ2と
一体となって移送される収容治具を廃止することができ
、該収容治具が原因となる処理工程におけるウェハ2の
汚染が防止される。
(1) The wafer 2 is transferred between the processing tanks 3a, 3b, and 3c using the handle 4, and the transfer inside the processing tank is performed using the pusher 10, which can move up and down with an independent mechanism, so that the wafer 2 and the wafer 2 are integrated. It is possible to eliminate the storage jig that is transferred by the storage jig, and the contamination of the wafer 2 during the processing process caused by the storage jig is prevented.

(2)、ウェハ2と一体となって移送される収容治具を
廃止することができるため、高効率なウェハ2の処理が
可能となる。
(2) Since the storage jig that is transferred together with the wafer 2 can be eliminated, the wafer 2 can be processed with high efficiency.

(3)、上記(1)により、信頼性の高いウェハ処理が
可能となり、ウェハ2の歩留りを向上させるこ゛とがで
きる。
(3) According to (1) above, highly reliable wafer processing becomes possible, and the yield of wafers 2 can be improved.

〔4)、上記(1)〜(3)により、信頼性の高い半導
体装置を提供することができる。
[4) With the above (1) to (3), a highly reliable semiconductor device can be provided.

以上本発明者によってなされた発明を実施例に基づき具
体的に説明したが、本発明は前記実施例に限定されるも
のではなく、その要旨を逸脱しない範囲で種々変更可能
であることはいうまでもない。たとえば、ハンドル4の
機構については、上記実施例のように、ハンドルアーム
4a、4bによってウェハ2を挟持する構造のものに限
られず、たとえばウェハ2をすくい上げる方式のもので
あってもよい。
Although the invention made by the present inventor has been specifically explained above based on Examples, it goes without saying that the present invention is not limited to the Examples and can be modified in various ways without departing from the gist thereof. Nor. For example, the mechanism of the handle 4 is not limited to the structure in which the wafer 2 is held between the handle arms 4a and 4b as in the above embodiment, but may be of a type that scoops up the wafer 2, for example.

以上の説明では主として本発明者によってなされた発明
をその利用分野である、いわゆるウェハの薬液、洗浄、
蒸気乾燥処理に適用した場合について説明したが、これ
に限定されるものではなく、他のウェハ処理にも適用で
きる。
The above description mainly describes the field of application of the invention made by the present inventor, which is the so-called wafer chemical solution, cleaning,
Although the case where the present invention is applied to steam drying processing has been described, the present invention is not limited to this, and can be applied to other wafer processing.

〔発明の効果〕〔Effect of the invention〕

本願において開示される発明のうち代表的なものによっ
て得られる効果を簡単に説明すれば、下記の通りである
A brief explanation of the effects obtained by typical inventions disclosed in this application is as follows.

すなわち、ウェハを処理液または処理雲囲気で形成され
る処理域中に浸漬して処理を行う処理装置であって、内
部に処理域の形成された複数個の処理槽と、直接ウェハ
を保持して各処理槽間の移送を行うハンド機構とからな
り、処理槽の内部には立設状態のウェハの下端を支持可
能で且つ上下動可能なプッシャを有し、ウェハの処理域
への浸漬に際しては、該プッシャが上昇移動して、処理
域の上方まで降下してきたハンド機構よりウェハを受け
取った状態で処理域内に降下するウェハ処理装置構造と
することによって、治具の汚染が原因となる後続ステッ
プ時のウェハの再汚染が防止され、清浄度の高いウェハ
処理を実現することができる。
In other words, it is a processing device that performs processing by immersing a wafer in a processing region formed by a processing solution or a processing cloud, and includes a plurality of processing tanks each having a processing region formed therein, and a processing device that directly holds the wafer. The processing tank has a pusher that can support the lower end of the wafer in an upright state and can move up and down. The wafer processing equipment structure is such that the pusher moves upward and descends into the processing area after receiving the wafer from the hand mechanism that has descended above the processing area. Re-contamination of the wafer during the step is prevented, and highly clean wafer processing can be achieved.

【図面の簡単な説明】[Brief explanation of the drawing]

第1図は本発明の一実施例であるウェハ処理装置を示す
説明図、 第2図は該実施例の処理槽の内部機構を示す説明図、 第3図は同じ(実施例の処理域へのウェハの浸漬方法を
示す説明図である。 1・・・ウェハ処理装置、2・・・ウェハ、3a・・・
薬液槽、3b・・・洗浄槽、3c・・・蒸気乾燥処理槽
、4・・・ハンドル、4a、4b・・・ハンドルアーム
、5・・・処理槽本体、6・・・薬液、7・・・洗浄液
、8・・・処理蒸気、10・・・プッシャ、11・・・
支持溝、12・・・プッシャアーム、13・・・シリン
ダ装置、14a、  14b ・ ・ ・ガイド板、1
5 ・ ・ ・ガイド溝。 第  1  図
FIG. 1 is an explanatory diagram showing a wafer processing apparatus that is an embodiment of the present invention, FIG. It is an explanatory diagram showing a wafer immersion method. 1... Wafer processing apparatus, 2... Wafer, 3a...
Chemical solution tank, 3b...Cleaning tank, 3c...Steam drying treatment tank, 4...Handle, 4a, 4b...Handle arm, 5...Processing tank body, 6...Medical solution, 7. ...Cleaning liquid, 8...Processing steam, 10...Pusher, 11...
Support groove, 12...Pusher arm, 13...Cylinder device, 14a, 14b... Guide plate, 1
5. Guide groove. Figure 1

Claims (1)

【特許請求の範囲】 1、ウェハを処理液または処理雰囲気で形成される処理
域中に浸漬して処理を行う処理装置であって、内部に処
理域の形成された複数個の処理槽と、ウェハを保持して
各処理槽間の移送を行うハンド機構とからなり、処理槽
の内部には立設状態のウェハの下端を支持可能で且つ上
下動可能なプッシャを有し、ウェハの処理域への浸漬に
際しては、該プッシャが上昇移動して、処理域の上方ま
で降下してきたハンド機構よりウェハを受け取った状態
で処理域内に降下することを特徴とするウェハ処理装置
。 2、処理槽内のプッシャの側方には、ウェハの上下動を
ガイドする溝の形成されたガイド壁が形成されているこ
とを特徴とする特許請求の範囲第1項記載のウェハ処理
装置。
[Claims] 1. A processing apparatus that performs processing by immersing a wafer in a processing region formed by a processing solution or a processing atmosphere, comprising a plurality of processing tanks each having processing regions formed therein; It consists of a hand mechanism that holds the wafer and transfers it between each processing tank, and inside the processing tank there is a pusher that can support the lower end of the wafer in an upright state and can move up and down. When immersing the wafer in the processing area, the pusher moves upward and descends into the processing area while receiving the wafer from the hand mechanism that has descended above the processing area. 2. The wafer processing apparatus according to claim 1, wherein a guide wall having a groove for guiding the vertical movement of the wafer is formed on the side of the pusher in the processing tank.
JP62040254A 1987-02-25 1987-02-25 Wafer treating apparatus Pending JPS63208223A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP62040254A JPS63208223A (en) 1987-02-25 1987-02-25 Wafer treating apparatus

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP62040254A JPS63208223A (en) 1987-02-25 1987-02-25 Wafer treating apparatus

Publications (1)

Publication Number Publication Date
JPS63208223A true JPS63208223A (en) 1988-08-29

Family

ID=12575548

Family Applications (1)

Application Number Title Priority Date Filing Date
JP62040254A Pending JPS63208223A (en) 1987-02-25 1987-02-25 Wafer treating apparatus

Country Status (1)

Country Link
JP (1) JPS63208223A (en)

Cited By (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH01104022U (en) * 1987-12-28 1989-07-13
JPH01201921A (en) * 1988-02-05 1989-08-14 Mitsubishi Electric Corp Vapor cleaning device
JPH0227722A (en) * 1988-06-29 1990-01-30 Samsung Electron Co Ltd Wafer washer for manufacture of semiconductor device
JPH0276227A (en) * 1988-09-12 1990-03-15 Sugai:Kk Method and device for cleaning and drying substrate
JPH05152423A (en) * 1991-08-30 1993-06-18 Dainippon Screen Mfg Co Ltd Surface treatment apparatus
JPH0631147U (en) * 1992-09-25 1994-04-22 大日本スクリーン製造株式会社 Substrate direction changing device in substrate processing apparatus
JPH06252126A (en) * 1993-02-26 1994-09-09 Sugai:Kk Method and system cleaning substrate
JPH07106408A (en) * 1993-10-05 1995-04-21 Kaijo Corp Substrate holding cassette
WO2017170191A1 (en) * 2016-03-31 2017-10-05 株式会社荏原製作所 Conveyance apparatus, cleaning apparatus, and substrate conveying method

Cited By (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH01104022U (en) * 1987-12-28 1989-07-13
JPH01201921A (en) * 1988-02-05 1989-08-14 Mitsubishi Electric Corp Vapor cleaning device
JPH0227722A (en) * 1988-06-29 1990-01-30 Samsung Electron Co Ltd Wafer washer for manufacture of semiconductor device
JPH0276227A (en) * 1988-09-12 1990-03-15 Sugai:Kk Method and device for cleaning and drying substrate
JPH05152423A (en) * 1991-08-30 1993-06-18 Dainippon Screen Mfg Co Ltd Surface treatment apparatus
JPH0631147U (en) * 1992-09-25 1994-04-22 大日本スクリーン製造株式会社 Substrate direction changing device in substrate processing apparatus
JPH06252126A (en) * 1993-02-26 1994-09-09 Sugai:Kk Method and system cleaning substrate
JPH07106408A (en) * 1993-10-05 1995-04-21 Kaijo Corp Substrate holding cassette
WO2017170191A1 (en) * 2016-03-31 2017-10-05 株式会社荏原製作所 Conveyance apparatus, cleaning apparatus, and substrate conveying method

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