JP2565147B2 - ツイスト角およびセルギャップの測定方法 - Google Patents

ツイスト角およびセルギャップの測定方法

Info

Publication number
JP2565147B2
JP2565147B2 JP6338883A JP33888394A JP2565147B2 JP 2565147 B2 JP2565147 B2 JP 2565147B2 JP 6338883 A JP6338883 A JP 6338883A JP 33888394 A JP33888394 A JP 33888394A JP 2565147 B2 JP2565147 B2 JP 2565147B2
Authority
JP
Japan
Prior art keywords
twist angle
cell gap
liquid crystal
angle
cell
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
JP6338883A
Other languages
English (en)
Japanese (ja)
Other versions
JPH08184413A (ja
Inventor
研 住吉
頼子 畑田
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
NEC Corp
Original Assignee
Nippon Electric Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Nippon Electric Co Ltd filed Critical Nippon Electric Co Ltd
Priority to JP6338883A priority Critical patent/JP2565147B2/ja
Priority to KR1019950061272A priority patent/KR0158045B1/ko
Priority to TW84114116A priority patent/TW309586B/zh
Publication of JPH08184413A publication Critical patent/JPH08184413A/ja
Application granted granted Critical
Publication of JP2565147B2 publication Critical patent/JP2565147B2/ja
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Landscapes

  • Length Measuring Devices By Optical Means (AREA)
  • Liquid Crystal (AREA)
JP6338883A 1994-12-29 1994-12-29 ツイスト角およびセルギャップの測定方法 Expired - Fee Related JP2565147B2 (ja)

Priority Applications (3)

Application Number Priority Date Filing Date Title
JP6338883A JP2565147B2 (ja) 1994-12-29 1994-12-29 ツイスト角およびセルギャップの測定方法
KR1019950061272A KR0158045B1 (ko) 1994-12-29 1995-12-28 액정 셀의 갭 및 트위스트각을 측정하기 위한 방법 및 장치
TW84114116A TW309586B (ko) 1994-12-29 1995-12-29

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP6338883A JP2565147B2 (ja) 1994-12-29 1994-12-29 ツイスト角およびセルギャップの測定方法

Publications (2)

Publication Number Publication Date
JPH08184413A JPH08184413A (ja) 1996-07-16
JP2565147B2 true JP2565147B2 (ja) 1996-12-18

Family

ID=18322285

Family Applications (1)

Application Number Title Priority Date Filing Date
JP6338883A Expired - Fee Related JP2565147B2 (ja) 1994-12-29 1994-12-29 ツイスト角およびセルギャップの測定方法

Country Status (3)

Country Link
JP (1) JP2565147B2 (ko)
KR (1) KR0158045B1 (ko)
TW (1) TW309586B (ko)

Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP3535786B2 (ja) * 1999-12-03 2004-06-07 Ｎｅｃエレクトロニクス株式会社 液晶表示素子評価法及び評価装置
US6633358B1 (en) * 2000-11-15 2003-10-14 The Hong Kong University Of Science And Technology Methods and apparatus for measurement of LC cell parameters

Also Published As

Publication number Publication date
KR0158045B1 (ko) 1999-05-01
TW309586B (ko) 1997-07-01
JPH08184413A (ja) 1996-07-16

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