TW309586B - - Google Patents

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Publication number
TW309586B
TW309586B TW84114116A TW84114116A TW309586B TW 309586 B TW309586 B TW 309586B TW 84114116 A TW84114116 A TW 84114116A TW 84114116 A TW84114116 A TW 84114116A TW 309586 B TW309586 B TW 309586B
Authority
TW
Taiwan
Prior art keywords
angle
light
rotation
liquid crystal
mentioned
Prior art date
Application number
TW84114116A
Other languages
English (en)
Chinese (zh)
Original Assignee
Nippon Electric Co
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Nippon Electric Co filed Critical Nippon Electric Co
Application granted granted Critical
Publication of TW309586B publication Critical patent/TW309586B/zh

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  • Length Measuring Devices By Optical Means (AREA)
  • Liquid Crystal (AREA)
TW84114116A 1994-12-29 1995-12-29 TW309586B (ko)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP6338883A JP2565147B2 (ja) 1994-12-29 1994-12-29 ツイスト角およびセルギャップの測定方法

Publications (1)

Publication Number Publication Date
TW309586B true TW309586B (ko) 1997-07-01

Family

ID=18322285

Family Applications (1)

Application Number Title Priority Date Filing Date
TW84114116A TW309586B (ko) 1994-12-29 1995-12-29

Country Status (3)

Country Link
JP (1) JP2565147B2 (ko)
KR (1) KR0158045B1 (ko)
TW (1) TW309586B (ko)

Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP3535786B2 (ja) 1999-12-03 2004-06-07 Ｎｅｃエレクトロニクス株式会社 液晶表示素子評価法及び評価装置
US6633358B1 (en) * 2000-11-15 2003-10-14 The Hong Kong University Of Science And Technology Methods and apparatus for measurement of LC cell parameters

Also Published As

Publication number Publication date
KR0158045B1 (ko) 1999-05-01
JP2565147B2 (ja) 1996-12-18
JPH08184413A (ja) 1996-07-16

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