JP2556967B2 - Single crystal growing equipment - Google Patents

Single crystal growing equipment

Info

Publication number
JP2556967B2
JP2556967B2 JP61100555A JP10055586A JP2556967B2 JP 2556967 B2 JP2556967 B2 JP 2556967B2 JP 61100555 A JP61100555 A JP 61100555A JP 10055586 A JP10055586 A JP 10055586A JP 2556967 B2 JP2556967 B2 JP 2556967B2
Authority
JP
Japan
Prior art keywords
crucible
single crystal
radius
magnetic field
diameter
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
JP61100555A
Other languages
Japanese (ja)
Other versions
JPS62256791A (en
Inventor
新一郎 高須
英一 田路
一元 本間
充博 大和
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Coorstek KK
Original Assignee
Toshiba Ceramics Co Ltd
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Filing date
Publication date
Application filed by Toshiba Ceramics Co Ltd filed Critical Toshiba Ceramics Co Ltd
Priority to JP61100555A priority Critical patent/JP2556967B2/en
Publication of JPS62256791A publication Critical patent/JPS62256791A/en
Application granted granted Critical
Publication of JP2556967B2 publication Critical patent/JP2556967B2/en
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

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  • Liquid Deposition Of Substances Of Which Semiconductor Devices Are Composed (AREA)
  • Crystals, And After-Treatments Of Crystals (AREA)

Description

【発明の詳細な説明】 [産業上の利用分野] 本発明は、導電性を有する物質を加熱して得られた溶
融体からチョクラルスキー法によって単結晶を引上げる
際、溶融体に磁場を加えて単結晶の品質を改善し得る単
結晶の育成方法及びその装置に関する。
DETAILED DESCRIPTION OF THE INVENTION [Industrial field of application] The present invention relates to applying a magnetic field to a melt when pulling a single crystal from the melt obtained by heating a substance having conductivity by the Czochralski method. In addition, the present invention relates to a single crystal growing method and apparatus capable of improving the quality of the single crystal.

[従来の技術] 従来のシリコン等の単結晶の製造方法としては、チョ
クラルスキー法が知られており、このチョクラルスキー
法は、ルツボ内で溶融された多結晶の溶融液の表面に種
子結晶を接触させ、次に種子結晶を回転させながらゆっ
くり引上げて単結晶を成長させる方法である。この場
合、溶融体には、溶融体の側方から加えられる熱による
熱対流、種子結晶の回転による溶融液の表層部の遠心方
向への流れ等の循環流が生ずる。この熱対流及び循環流
は単結晶が成長する界面に温度のゆらぎをもたらし、そ
の結果、成長した単結晶の内部に特性の不均一性および
結晶の欠陥を生じさせるなどの悪影響を及ぼす。
[Prior Art] The Czochralski method is known as a conventional method for producing a single crystal of silicon or the like. The Czochralski method is a method in which seeds are formed on the surface of a polycrystalline melt melted in a crucible. In this method, the crystals are brought into contact with each other, and then the seed crystals are slowly pulled up while rotating to grow a single crystal. In this case, a circulating flow such as heat convection due to heat applied from the side of the melt and a flow of the melt in the centrifugal direction of the surface layer portion due to the rotation of the seed crystal are generated in the melt. This thermal convection and circulation flow bring about temperature fluctuations at the interface where the single crystal grows, resulting in adverse effects such as non-uniformity of properties and crystal defects inside the grown single crystal.

そこで、溶融体がシリコンのような導電性を有する物
質である場合には、直流平行磁界を溶融体に対して水平
方向に加えることにより、溶融体に磁気粘性を生じさせ
て溶融体の循環流を抑制する。この水平磁界を加える手
段としては、有鉄芯電磁石、又は対向円柱型若しくは対
向円板型若しくは対向鞍型の無鉄芯コイルが使用されて
いる。
Therefore, when the melt is a conductive substance such as silicon, a DC parallel magnetic field is applied in the horizontal direction to the melt to cause magnetic viscosity in the melt, thereby causing a circulation flow of the melt. Suppress. As a means for applying this horizontal magnetic field, a ferrous core electromagnet, or a facing columnar type, a facing disk type, or a facing saddle type ironless core coil is used.

[発明が解決しようとする問題点] しかし乍ら、従来は、溶融体に磁界が加えられた状態
で単結晶の引上げを安定的に行なうための、単結晶の直
径とルツボの直径との間の好ましい関係について必ずし
も明確でなく、確実に組織が安定的な単結晶を引上げ得
ない。
[Problems to be Solved by the Invention] However, in the past, between the diameter of the single crystal and the diameter of the crucible for stably pulling up the single crystal in a state where a magnetic field is applied to the melt. Is not always clear, and a single crystal with a stable structure cannot be pulled reliably.

本発明は以上の問題点に鑑み、組織が安定した単結晶
を引上げるために、単結晶の直径とルツボの直径との比
が好ましい範囲にある単結晶の育成装置を提供すること
を目的とする。
In view of the above problems, it is an object of the present invention to provide a single crystal growing device in which the ratio of the diameter of the single crystal and the diameter of the crucible is in a preferable range in order to pull up the single crystal with a stable structure. To do.

[問題点を解決するための手段] 本発明の前記目的は、石英ガラス製の円筒状ルツボ
と、このルツボの外側において前記ルツボの中心軸と同
心に配置されており、前記ルツボ内の導電性を有する物
質を加熱しかつ溶融するための環状の加熱手段と、この
加熱手段の外側において前記ルツボの中心軸に関して対
称に対向して配置されており、溶融した前記物質の熱対
流を阻止するための一対の磁石と、下端が前記溶融した
物質の液面の中心部に接するように保持された単結晶と
からなる前記単結晶を育成する装置において、前記単結
晶の直径が前記ルツボの直径の1/2以下であり、前記ル
ツボの外径半径をr、前記ルツボの底部の曲率半径を
rb、前記一対の磁石の中間地点において、一対の磁石の
中心を結ぶ線を含む水平面上で前記ルツボの最外側部を
通る磁力線の該最外側部近傍の曲率半径をRMF1、前記ル
ツボ最底部を通る磁力線の該最低部近傍の曲率半径をR
MF2とした場合に、r≦RMF1≦4rおよびrb≦RMF2≦4rb
を満たす磁界を発生するように前記ルツボ及び前記磁石
が配置されてなることを特徴とする装置によって達成さ
れる。
[Means for Solving the Problems] The object of the present invention is to provide a cylindrical crucible made of quartz glass, and a conductive material in the crucible, which is arranged concentrically with the central axis of the crucible outside the crucible. And an annular heating means for heating and melting the substance having a heat-dissipating portion, and a heat-convection means for preventing convection of the molten substance, which are arranged symmetrically opposite to the central axis of the crucible outside the heating means. In a device for growing the single crystal consisting of a pair of magnets and a single crystal held so that the lower end is in contact with the center of the liquid surface of the molten substance, the diameter of the single crystal is the diameter of the crucible. 1/2 or less, the outer radius of the crucible is r, and the radius of curvature of the bottom of the crucible is
r b , at the midpoint of the pair of magnets, the radius of curvature near the outermost portion of the magnetic line of force passing through the outermost portion of the crucible on a horizontal plane including the line connecting the centers of the pair of magnets is R MF1 , The radius of curvature near the lowest part of the line of magnetic force passing through the bottom is R
When MF2 , r ≤ R MF1 ≤ 4r and r b ≤ R MF2 ≤ 4r b
The crucible and the magnet are arranged so as to generate a magnetic field satisfying the following.

[作用] 第1A図及び第1B図は本発明の装置の溶融液の流れ及び
磁場を示す平面図及び立断面図であり、第1C図から第1E
図はルツボと磁力線との関係を示す模式図である。であ
り、これらの図によって本発明の方法及び装置の原理を
以下に説明する。
[Operation] FIGS. 1A and 1B are a plan view and an elevation sectional view showing the flow and magnetic field of the molten liquid of the apparatus of the present invention, and FIGS. 1C to 1E.
The figure is a schematic diagram showing the relationship between the crucible and the lines of magnetic force. With these figures, the principle of the method and the device according to the invention is explained below.

円筒形のルツボ1に満たされた溶融体2は通常側方か
ら加熱されるので、溶融体2の外側部の温度は中心部の
温度より高くなり、溶融体2の外周部には、第1A図及び
第1B図に示すように対流3が発生する。一方、シリコン
単結晶4の回転によって、溶融体2の表層部の連れ回り
が生起され、これに起因して前記表層部に遠心方向の流
れ及び溶融体の中心部の上昇流による循環流5が発生す
る。本発明の装置では、これらの対流3及び循環流5を
阻止するために、磁束線6がルツボ1の外周及び底部に
ほぼ沿って加えられており、これによって、磁束線6は
溶融体2の広範囲な領域に渡って対流3及び循環流5と
ほぼ直交し、溶融体2の流れの抑制が効率よく行われ
る。
Since the melt 2 filled in the cylindrical crucible 1 is usually heated from the side, the temperature of the outer portion of the melt 2 becomes higher than the temperature of the central portion thereof, and the outer periphery of the melt 2 has a first Convection 3 occurs as shown in the figure and FIG. 1B. On the other hand, the rotation of the silicon single crystal 4 causes the surface layer portion of the melt 2 to be accompanied, and as a result, the circulation flow 5 due to the flow in the centrifugal direction and the upward flow in the center portion of the melt is generated in the surface layer portion. appear. In the apparatus of the present invention, in order to prevent these convection flow 3 and circulation flow 5, magnetic flux lines 6 are added almost along the outer circumference and bottom of the crucible 1, whereby the magnetic flux lines 6 of the melt 2 are added. It is substantially orthogonal to the convection flow 3 and the circulation flow 5 over a wide range, and the flow of the melt 2 is efficiently suppressed.

第1C図は、コイルの中心を結ぶ線に対して垂直で、ル
ツボ中心軸を含む断面においてルツボおよび磁力線の関
係を示す模式図である。図中xはコイルの中心を結ぶ線
であり、磁界の中心軸である。磁界の強度はxを中心と
する同心円状に分布している。磁界の中心軸xを含む水
平面上で前記ルツボの最外側部を通る磁力線を6rで示し
ており、ルツボの最低部を通る磁力線を6rbで示してい
る。
FIG. 1C is a schematic diagram showing a relationship between a crucible and a magnetic field line in a cross section which is perpendicular to a line connecting the centers of the coils and includes a crucible center axis. In the figure, x is a line connecting the centers of the coils and is the central axis of the magnetic field. The strength of the magnetic field is distributed concentrically around x. A magnetic field line passing through the outermost part of the crucible on the horizontal plane including the central axis x of the magnetic field is indicated by 6r, and a magnetic field line passing through the lowest part of the crucible is indicated by 6rb.

第1C図における磁界の中心軸xを含む水平面(D−
D′)を上から見た模式図が第1D図であり、第1C図にお
ける磁界の中心軸x及びルツボ中心軸を含む鉛直面(E
−E′)を側面から見た模式図が第1E図である。
Horizontal plane including the central axis x of the magnetic field in Fig. 1C (D-
FIG. 1D is a schematic view of D ′) seen from above, and the vertical plane including the central axis x of the magnetic field and the central axis of the crucible in FIG. 1C (E
Fig. 1E is a schematic view of -E ') seen from the side.

また、第1C図は、第1D図におけるルツボ中心軸及び磁
界中心軸を含む面(C−C′)を鉛直面から見た模式図
であると共に、第1E図におけるルツボ中心軸及び磁界中
心軸を含む面(C−C′)を側面から見た模式図であ
る。
Also, FIG. 1C is a schematic view of a plane (CC ′) including the crucible center axis and the magnetic field center axis in FIG. 1D as seen from a vertical plane, and the crucible center axis and the magnetic field center axis in FIG. 1E. It is the schematic diagram which looked at the surface (CC ') containing a from the side surface.

ちなみに、第1A図は第1C図における溶融面(A−
A′)を上から見た場合に対応し、第1B図は第1C図にお
けるルツボ中心軸及び磁界中心軸を含む面を側面から見
た場合に対応する(第1E図と同じ視点になる)。
By the way, Fig. 1A shows the melting surface (A-
FIG. 1B corresponds to the case where the plane including the crucible center axis and the magnetic field center axis in FIG. 1C is viewed from the side (the same viewpoint as FIG. 1E). .

第1D図において、磁界の中心軸から最も離れたルツボ
外側部を通る磁力線6rの該ルツボ外側部近傍の曲率半径
(微少長さ範囲の部分の曲率半径)をRMF1で示す。
In FIG. 1D, the radius of curvature of the magnetic line of force 6r passing through the crucible outermost portion farthest from the central axis of the magnetic field in the vicinity of the crucible outer portion (curvature radius of the portion in the minute length range) is indicated by R MF1 .

同様に、第1E図において、ルツボ最低部を通る磁力線
6rbのルツボ最低部近傍の曲率半径(微少長さ範囲の部
分の曲率半径)をRMF2で示す。
Similarly, in Fig. 1E, the magnetic field lines passing through the lowest part of the crucible.
The radius of curvature near the lowest part of the crucible of 6rb (the radius of curvature of the part of the minute length range) is indicated by R MF2 .

一般に、磁力線の形状及びルツボの形状並びに位置関
係から r:RMF1<rb:RMF2となる場合が多い。
In general, r: R MF1 <r b : R MF2 is often satisfied due to the shape of the lines of magnetic force, the shape of the crucible, and the positional relationship.

第2図は、溶融体に磁界を与えるコイルの半径と、対
向するコイルの間隔との関係を示す説明図であり、半径
rを有する同型のコイル7の夫々が、間隔lを保つと共
に中心がZ軸上に位置するように対向している。この
時、Z軸上の磁界強度Bの強さは第3図のグラフのよう
になる。r=lの時、夫々のコイル7の中心O付近でほ
ぼ平坦な磁界強度Bの分布が得られ、l>rの時は、中
心O付近の磁界強度Bは低下する。一方、l<rの時
は、中心O付近の磁界強度Bが最大である。こうして、
一様な磁界強度Bを得るためには、コイルの半径rと対
向するコイルの間隔lをできるだけ等しくするのが望ま
しいと言える。しかしながら、コイルの配置の制限から
l>rとなるのが通常である。
FIG. 2 is an explanatory diagram showing the relationship between the radius of the coil that applies a magnetic field to the melt and the interval between the opposing coils. Each of the coils 7 of the same type having a radius r maintains the interval l and They are opposed to each other so as to be located on the Z axis. At this time, the strength of the magnetic field strength B on the Z axis is as shown in the graph of FIG. When r = 1, a substantially flat distribution of the magnetic field strength B is obtained near the center O of each coil 7, and when l> r, the magnetic field strength B near the center O decreases. On the other hand, when l <r, the magnetic field strength B near the center O is maximum. Thus
In order to obtain a uniform magnetic field strength B, it can be said that it is desirable to make the radius r of the coil and the interval 1 between the opposing coils as equal as possible. However, it is usual that l> r because of the limitation of the coil arrangement.

[具体例] 以下、本発明の単結晶の育成装置の一具体例について
述べる。
[Specific Example] A specific example of the apparatus for growing a single crystal according to the present invention will be described below.

第4A図及び第4B図は、溶融体に加えられる磁束線を示
す本発明の装置の要部の立面部分断面図及び平面部分断
面図である炭素製ルツボ支持部10の中に半径rの石英ガ
ラス製ルツボ11が内挿されており、その中に溶融体12が
満たされている。石英ガラス製ルツボ11の底部の曲率半
径はrbである。一方、直径Dの育成シリコン単結晶13の
下面が溶融体12の表面に接するように結晶引上げ用ワイ
ヤ14に懸吊されている。前述のルツボ11は半径rhの円筒
状電熱ヒータ15に収容され、ヒータ15は炭素製円筒状保
温部材16に収容されている。半径rcの平板状超電導コイ
ル17が低温保持手段18と共に保温部材16の両側に間隔L
を保って対向しており、コイル17の半径rc、ルツボ11の
外径半径r、ルツボ11の底部半径rb、及びコイル17の間
隔Lを適宜に選択することによって、コイル17の磁束線
19を、ルツボ11の外側部およびルツボ11の底部にほぼ沿
わせて通らせるよう設定することが可能となる。それに
より対流3および循環流5をルツボ内の広い範囲で効果
的に阻止することが可能となる。
FIGS. 4A and 4B are elevational partial cross-sectional views and plan partial cross-sectional views of the essential part of the apparatus of the present invention showing the magnetic flux lines applied to the melt, with a radius r in the carbon crucible support 10. A quartz glass crucible 11 is inserted, and the melt 12 is filled therein. The radius of curvature of the bottom of the quartz glass crucible 11 is r b . On the other hand, the crystal pulling wire 14 is suspended so that the lower surface of the grown silicon single crystal 13 having the diameter D is in contact with the surface of the melt 12. Crucible 11 described above are housed in a cylindrical electric heater 15 having a radius r h, the heater 15 is accommodated in a carbon-made cylindrical heat insulating member 16. A plate-shaped superconducting coil 17 having a radius r c together with the low temperature holding means 18 is provided on both sides of the heat insulating member 16 with a space L.
And the radius r c of the coil 17, the outer diameter radius r of the crucible 11, the bottom radius r b of the crucible 11, and the interval L of the coil 17 are appropriately selected.
It is possible to set 19 so as to pass along the outer side of the crucible 11 and the bottom of the crucible 11. As a result, the convection flow 3 and the circulation flow 5 can be effectively blocked in a wide range within the crucible.

ここで磁束線19がルツボ11の外側部およびルツボ11の
底部にほぼ沿って通っている状態とは、以下のような状
況を言う。
Here, the state in which the magnetic flux lines 19 pass substantially along the outside of the crucible 11 and the bottom of the crucible 11 means the following situation.

すなわち、コイル間の中間(L/2)において、ルツボ
の最外側部を通る磁力線の曲率半径RMF1およびルツボ最
底部を通る磁力線の曲率半径RMF2と、ルツボの外径半径
r、ルツボの底部の曲率半径rbとの間に夫々、 r≦RMF1≦4r rb≦RMF2≦4rb の関係が成り立っているような状態を言う。この範囲外
ではもはや磁力線がルツボ11の外側部およびルツボ11の
底部にほぼ沿って通っている状態とはいえない。
That is, in the middle (L / 2) between the coils, the radius of curvature R MF1 of the magnetic field line passing through the outermost part of the crucible and the radius of curvature R MF2 of the magnetic field line passing through the bottom of the crucible, the outer radius r of the crucible, and the bottom of the crucible. each between the curvature radius r b of, say state as relationship is made up of r ≦ R MF1 ≦ 4r r b ≦ R MF2 ≦ 4r b. Outside this range, it cannot be said that the lines of magnetic force pass along the outer side of the crucible 11 and the bottom of the crucible 11 substantially.

ここで、r>RMF1とすることは、コイルとルツボの位
置関係上、不可能であり、また、RMF1>4rとなると磁力
線はより直線に近くなりルツボ形状に沿った形とは言い
難く、対流および循環流を広い範囲で阻止することはで
きない。
Here, it is impossible to set r> R MF1 due to the positional relationship between the coil and the crucible, and when R MF1 > 4r, the lines of magnetic force become closer to a straight line and it cannot be said that the shape follows the crucible shape. , It is not possible to block convection and circulating flow in a wide range.

このような曲率を有する磁力線を発生させるために要
求される前述の選択事項の内、コイルの条件としては、
コイル17の半径rcを、 rc=(1.5〜5)r となるように設定することが必要である。
Among the above-mentioned selection items required to generate magnetic field lines having such a curvature, the coil conditions are:
It is necessary to set the radius r c of the coil 17 so that r c = (1.5 to 5) r.

ここで、RMF1をrに近づけるためにはルツボとコイル
間の距離を短くし、コイル径をある程度小さくすること
が望ましい。しかし、ルツボとコイル間の距離について
はヒータ、チャンバ等の装置が存在することから実質的
にルツボ半径rに応じて距離が長くなるため、短くする
には限界があり、また、コイルの径についても、あまり
小さくすると、本願明細書で前述したように、相対的に
コイル径rcに対するコイル間距離lが大きくなり、均一
な磁界強度が得られなくなる。
Here, in order to bring R MF1 close to r, it is desirable to shorten the distance between the crucible and the coil and reduce the coil diameter to some extent. However, regarding the distance between the crucible and the coil, since the distance substantially increases according to the crucible radius r due to the existence of devices such as a heater and a chamber, there is a limit to shortening the distance. However, if it is made too small, the inter-coil distance l relative to the coil diameter r c becomes relatively large as described above in the present specification, and uniform magnetic field strength cannot be obtained.

したがって、rcについては1.5以上に設定することが
必要である。
Therefore, it is necessary to set r c to 1.5 or higher.

また、rcが5を越えると、ほぼコイル中心軸上に位置
しているルツボを通る磁力線はほぼ平行に近くなってし
まう。さらにコイル径が大きいため、磁束密度が薄ま
り、コイル中心軸上に位置するルツボ内の溶融体に充分
な強度の磁界を与えられなくなる恐れがある。また、装
置の大型化を招く。
Further, when r c exceeds 5, the magnetic lines of force passing through the crucible located substantially on the coil center axis become nearly parallel. Further, since the coil diameter is large, the magnetic flux density is reduced, and there is a possibility that a magnetic field having sufficient strength cannot be applied to the melt in the crucible located on the coil central axis. In addition, the size of the device is increased.

実際には装置上の制約から、ルツボの外径rによりコ
イル間距離は制約され、ある程度以下にはできなくな
る。また、コイル間距離が長くなるとルツボ近傍を通る
磁力線はより平行に近くなってしまう。また、ルツボ外
径は引き上げようとする単結晶の径に影響するため、ル
ツボ外径rに対する制約の方がルツボ底部の曲率半径に
対する制約よりも大きい。
In practice, the distance between the coils is restricted by the outer diameter r of the crucible due to the restriction on the device, and the distance cannot be reduced to a certain degree or less. Further, when the distance between the coils becomes longer, the magnetic force lines passing near the crucible become closer to parallel. Further, since the crucible outer diameter affects the diameter of the single crystal to be pulled, the constraint on the crucible outer diameter r is larger than the constraint on the radius of curvature of the crucible bottom.

したがって、ルツボの外径r(これによりコイル間距
離lもほぼ決定される)、およびコイル半径rcを適宜決
定して、r≦RMF1≦4rを満たし、その後、rb≦RMF2≦4
rbを満たすようにルツボ底部の半径rbを決定するように
すると好便であるが、これに限定されるものではない。
Therefore, the outer diameter r of the crucible (the distance l between the coils is also substantially determined) and the coil radius r c are appropriately determined to satisfy r ≦ R MF1 ≦ 4r, and then r b ≦ R MF2 ≦ 4
It is convenient if the radius r b of the bottom of the crucible is determined so as to satisfy r b, but the radius is not limited to this.

一方、溶融体の加熱手段は、通常、ルツボの外側にお
いてルツボの中心軸と同心に配置された環状の炭素部材
から成り、この環状の加熱手段には、上端からのスリッ
トと下端からのスリットが周方向に沿って交互に設けら
れている。したがって、加熱電流は加熱手段の中を、加
熱手段の長手方向に関してジクザク状に流れ、この電流
と磁場との作用で生ずるヒータ15の振動を避けるため
に、ヒータ15の加熱電流のリップル値は極力小さい方が
好ましい。しかし、通常、加熱電流には3〜5%のリッ
プルが存在し、この範囲の電流値の変動がある場合に、
コイル17とヒータ15とが近接して配置されると、コイル
17の過大な磁界とヒータ15の変動電流によってヒータ15
に大きな繰返し応力が高温状態で作用するため、ヒータ
15の寿命が短くなる。
On the other hand, the heating means of the melt is usually composed of an annular carbon member arranged concentrically with the central axis of the crucible outside the crucible, and the annular heating means has a slit from the upper end and a slit from the lower end. They are provided alternately along the circumferential direction. Therefore, the heating current flows through the heating means in a zigzag manner in the longitudinal direction of the heating means, and in order to avoid vibration of the heater 15 caused by the action of this current and the magnetic field, the ripple value of the heating current of the heater 15 is as small as possible. Smaller is preferable. However, usually, the heating current has a ripple of 3 to 5%, and when the current value varies in this range,
When the coil 17 and the heater 15 are placed close to each other, the coil
Due to the excessive magnetic field of 17 and the fluctuating current of heater 15, heater 15
Since large cyclic stress acts on the heater at high temperature,
15 life is shortened.

実験の結果によれば、ヒータ15の半径をrh、コイル17
の半径をrc、対向するコイル17間の距離をLとして rc>0.8rh及びL>3rh となるように、コイル17の半径rc及びコイル17間の間隔
Lを選定すると、加熱電流のリップル値が4%時にrc
0.8rh又はL≦3rhの場合に比べて、ヒータ15の耐用使
用回数が20%〜30%増大した。
According to the results of the experiment, the radius of the heater 15 r h, the coil 17
Radius r c of, such that r c> 0.8r h and L> 3r h the distance between the opposing coil 17 as L, when selecting the distance L between the radius r c and a coil 17 of the coil 17, the heating When the ripple value of current is 4%, r c
As compared with the case of the 0.8 R h or L ≦ 3r h, service life times of the heater 15 is increased 20% to 30%.

ところで、溶融体に磁界が加えられた状態で単結晶の引
上げを安定的に行なうために、単結晶13の直径Dとルツ
ボ11の直径2rの間にD/2r<0.75の関係があるのが望まし
く、さらに実験の結果によれば、育成単結晶13中の酸素
濃度は、D/2rの値に関係していることが判明した。
By the way, in order to stably pull the single crystal in a state where a magnetic field is applied to the melt, there is a relationship of D / 2r <0.75 between the diameter D of the single crystal 13 and the diameter 2r of the crucible 11. Desirably, further, according to the result of the experiment, it was found that the oxygen concentration in the grown single crystal 13 is related to the value of D / 2r.

すなわち、溶融体12に3000ガウスの磁界が加えられた
状態において、D/2r<0.7以下の時は容易に単結晶の酸
素濃度を10×1017atoms/cm3以下とし得、D/2r<0.6以下
の時は5×1017atoms/cm3以下とし得た。好ましくは、D
/2r<0.5以下とするのがよく、この場合は酸素濃度は1
×1017atoms/cm3とし得た。但し、以上の実験で、単結
晶13の直径Dは100mmφ以上である。
That is, in the state where a magnetic field of 3000 gauss is applied to the melt 12, when D / 2r <0.7 or less, the oxygen concentration of the single crystal can be easily set to 10 × 10 17 atoms / cm 3 or less, and D / 2r <0.7 When it was 0.6 or less, it could be 5 × 10 17 atoms / cm 3 or less. Preferably D
/ 2r <0.5 or less is preferable, in this case the oxygen concentration is 1
It could be set to × 10 17 atoms / cm 3 . However, in the above experiment, the diameter D of the single crystal 13 is 100 mmφ or more.

第5図は、低温保持手段の高さの制限を示す説明図で
あり、引上げ結晶20は引上げチャンバ21内に配置されて
いる。コイル22の中心線23は溶融体の液面24にほぼ一致
している。この低温保持手段25においてコイル22の直径
を大きくすると、対向する平板状超電導コイルのための
垂直軸を有する円筒型低温保持手段25の外径、及び高さ
が増大する。この円筒型低温保持手段を装備した実験装
置では、低温保持手段の高さは、コイルの上端に300mm
を加えた値とするのが望ましく、低温保持手段の内径は
少なくともコイル間距離Lより100mm以上小さい値であ
ると共に外径は 以上の値とするのが望ましい。
FIG. 5 is an explanatory view showing the limitation of the height of the cryogenic holding means, and the pulling crystal 20 is arranged in the pulling chamber 21. The centerline 23 of the coil 22 is substantially coincident with the melt level 24. Increasing the diameter of the coil 22 in the low temperature holding means 25 increases the outer diameter and height of the cylindrical low temperature holding means 25 having a vertical axis for the opposed flat plate-shaped superconducting coil. In the experimental device equipped with this cylindrical cryostat, the cryostat height is 300 mm at the top of the coil.
It is desirable that the inside diameter of the low temperature holding means is at least 100 mm smaller than the inter-coil distance L and the outside diameter is It is desirable to set it to the above value.

また、装置の操作上の観点から大型の低温保持手段は
望ましくなく、測定用窓26が充分に機能するような高さ
に制限されるのが望ましい。すなわち、単結晶20の直径
を光学的に測定する測定手段27の外形寸法は10cm×10cm
×30cm又は7cmφ×10cm程度であり、引上げ単結晶20を
視認するためには、測定手段27の保持位置が単結晶の界
面の中心と測定用窓26の中心を結ぶ線28上になければな
らず、その高さは引上げチャンバ20のフランジ上200mm
が下限である。したがって、低温保持手段25の高さの限
界は第5図におけるh1が200mm以下であり、この範囲で
あれば、低温保持手段25の取付け及び測定手段27の操作
に支承はない。
Further, from the viewpoint of the operation of the apparatus, a large-sized low temperature holding means is not desirable, and it is desirable that the measurement window 26 is limited to a height such that it can function sufficiently. That is, the outer dimensions of the measuring means 27 for optically measuring the diameter of the single crystal 20 are 10 cm × 10 cm.
It is about 30 cm or 7 cmφ × 10 cm, and in order to visually recognize the pulled single crystal 20, the holding position of the measuring means 27 must be on the line 28 connecting the center of the interface of the single crystal and the center of the measuring window 26. The height is 200 mm above the flange of the pulling chamber 20.
Is the lower limit. Therefore, the limit of the height of the low temperature holding means 25 is 200 mm or less for h 1 in FIG. 5, and within this range, there is no support for mounting the low temperature holding means 25 and operating the measuring means 27.

当然ながら、低温保持手段25の形状は種々変形しても
よく、例えば分離型の低温保持手段を使用することによ
り、上述のような制限は緩和される。また、低温保持手
段の外形が円筒状でもよく、内部が円筒状であって外部
が角柱筒としてもよい。この場合、ルツボの最大径450m
mφ用の低温保持手段の寸法及び重量の一例としては、
内部円筒径は900mm、外部角柱寸法は1350mm(巾)×146
0mm(奥行)×1135mm(高さ)であり、総重量は2.6tで
あった。
Of course, the shape of the low temperature holding means 25 may be variously modified, and for example, by using a separate type low temperature holding means, the above-mentioned limitation is alleviated. Moreover, the external shape of the low temperature holding means may be cylindrical, or the inside may be cylindrical and the outside may be prismatic. In this case, the maximum diameter of the crucible is 450m
As an example of the size and weight of the cryogenic holding means for mφ,
Internal cylinder diameter is 900 mm, external prismatic dimension is 1350 mm (width) x 146
It was 0 mm (depth) x 1135 mm (height), and the total weight was 2.6 t.

第6A図は、昇降可能な低温保持手段を装着した単結晶
の育成装置の説明図であり、引上げチャンバ31に対向し
て低温保持手段32が配置されている。ヒータ等のホット
ゾーン構成部品交換時、ルツボ交換時、多結晶シリコン
の装着時、及びチャンバ内面清浄時のような保守時に
は、第6B図に示すように低温保持手段32が引上げチャン
バ31の下方に下げられ得て保守性を向上させている。さ
らに引上げチャンバ31は回転支柱33及び回転支持腕34に
支持されており、前述の保守時には、第6B図の如く引上
げチャンバ31を回転支柱33の回りに回転させて、ホット
ゾーン構成部品35を露出させて、作業性を向上させてい
る。
FIG. 6A is an explanatory diagram of a single crystal growth apparatus equipped with a low temperature holding means capable of moving up and down, and the low temperature holding means 32 is arranged so as to face the pulling chamber 31. As shown in FIG. 6B, the low temperature holding means 32 is placed below the pulling chamber 31 during the hot zone component replacement such as the heater, the crucible replacement, the polycrystalline silicon mounting, and the maintenance such as the chamber inner surface cleaning. It can be lowered to improve maintainability. Further, the pulling chamber 31 is supported by the rotary column 33 and the rotary support arm 34, and during the aforementioned maintenance, the pulling chamber 31 is rotated around the rotary column 33 as shown in FIG. 6B to expose the hot zone components 35. To improve the workability.

[発明の効果] 本発明の装置によれば、単結晶の直径とルツボの直径
との比が好ましい範囲にあるが故に、組織が安定した単
結晶を引上げ得る。
[Effect of the Invention] According to the device of the present invention, since the ratio of the diameter of the single crystal to the diameter of the crucible is in a preferable range, a single crystal having a stable structure can be pulled up.

【図面の簡単な説明】[Brief description of drawings]

第1A図は本発明の装置の溶融体の流れ及び磁場を示す平
面図、第1B図は第1A図の立断面図、第1C図はルツボと磁
力線との関係を示す鉛直面の模式図、第1D図はルツボと
磁力線との関係を示す水平面の模式図、第1E図はルツボ
と磁力線との関係を示す他の鉛直面の模式図、第2図は
溶融体に磁界を与えるコイルの半径と対向するコイルの
間隔との関係を示す説明図、第3図は第2図におけるZ
軸上の磁界の強さを示すグラフ、第4A図は溶融体に加え
られる磁束線を示す本発明の装置の要部の立面部分断面
図、第4B図は第4A図の平面部分断面図、第5図は低温保
持手段の高さの制限を示す概略図、第6A図及び第6B図は
昇降可能な低温保持手段を装着した単結晶の育成装置の
説明図である。 1,11……ルツボ、2,12……溶融体、3,19……磁束線、15
……ヒータ、17……コイル、25……低温保持手段。
1A is a plan view showing the flow and magnetic field of the melt of the apparatus of the present invention, FIG. 1B is an elevation sectional view of FIG. 1A, FIG. 1C is a schematic view of a vertical plane showing the relationship between the crucible and the magnetic field lines, Fig. 1D is a schematic diagram of the horizontal plane showing the relationship between the crucible and the magnetic field lines, Fig. 1E is another schematic diagram of the vertical plane showing the relationship between the crucible and the magnetic field lines, and Fig. 2 is the radius of the coil that gives a magnetic field to the melt. And FIG. 3 is an explanatory view showing the relationship between the distance between the opposing coils and FIG.
A graph showing the strength of the magnetic field on the axis, FIG. 4A is an elevational partial sectional view of an essential part of the device of the present invention showing magnetic flux lines applied to the melt, and FIG. 4B is a plan partial sectional view of FIG. 4A. FIG. 5 is a schematic view showing the limitation of the height of the low temperature holding means, and FIGS. 6A and 6B are explanatory views of a single crystal growing apparatus equipped with a low temperature holding means capable of moving up and down. 1,11 ・ ・ ・ Crucible, 2, 12 ・ ・ ・ Melt, 3, 19 …… Flux line, 15
...... Heater, 17 …… Coil, 25 …… Low temperature holding means.

フロントページの続き (72)発明者 大和 充博 秦野市曽屋30番地 東芝セラミツクス株 式会社中央研究所内 (56)参考文献 特開 昭62−3091(JP,A) 特開 昭61−286294(JP,A) 特開 昭60−251193(JP,A) 特開 昭60−36392(JP,A)Front page continuation (72) Inventor Mitsuhiro Yamato 30 Soya, Hadano City Central Research Laboratory, Toshiba Ceramics Co., Ltd. (56) Reference JP 62-3091 (JP, A) JP 61-286294 (JP, A) ) JP-A-60-251193 (JP, A) JP-A-60-36392 (JP, A)

Claims (2)

(57)【特許請求の範囲】(57) [Claims] 【請求項1】石英ガラス製の円筒状ルツボと、このルツ
ボの外側において前記ルツボの中心軸と同心に配置され
ており、前記ルツボ内の導電性を有する物質を加熱しか
つ溶融するための環状の加熱手段と、この加熱手段の外
側において前記ルツボの中心軸に関して対称に対向して
配置されており、溶融した前記物質の熱対流を阻止する
ための一対の磁石と、下端が前記溶融した物質の液面の
中心部に接するように保持された単結晶とからなる前記
単結晶を育成する装置において、前記単結晶の直径が前
記ルツボの直径の1/2以下であり、前記ルツボの外径半
径をr、前記ルツボの底部の曲率半径をrb、前記一対の
磁石の中間地点において、一対の磁石の中心軸を含む水
平面上で前記ルツボの最外側部を通る磁力線の該最外側
部近傍の曲率半径をRMF1、前記ルツボ最底部を通る磁力
線の該最低部近傍の曲率半径をRMF2とした場合に、r≦
RMF1≦4rおよびrb≦RMF2≦4rbを満たす磁界を発生する
ように前記ルツボ及び前記一対の磁石が配置されてなる
ことを特徴とする装置。
1. A cylindrical crucible made of quartz glass, and an annular ring arranged outside the crucible and concentric with the central axis of the crucible, for heating and melting a conductive substance in the crucible. Heating means, and a pair of magnets arranged symmetrically opposite to the central axis of the crucible outside the heating means, for preventing thermal convection of the melted substance, and the lower end of the melted substance. In the device for growing the single crystal consisting of the single crystal held so as to contact the center of the liquid surface, the diameter of the single crystal is 1/2 or less of the diameter of the crucible, and the outer diameter of the crucible. Radius r, radius of curvature of the bottom of the crucible r b , near the outermost part of the magnetic force line passing through the outermost part of the crucible on the horizontal plane including the central axes of the pair of magnets at the midpoint of the pair of magnets. Radius of curvature of R MF1 , r ≦ 2 where R MF2 is the radius of curvature of the line of magnetic force passing through the bottom of the crucible near the lowest part
An apparatus comprising the crucible and the pair of magnets arranged so as to generate a magnetic field satisfying R MF1 ≤4r and r b ≤R MF2 ≤4r b .
【請求項2】前記物質が多結晶シリコンからなることを
特徴とする特許請求の範囲第1項に記載の装置。
2. A device according to claim 1, characterized in that the material comprises polycrystalline silicon.
JP61100555A 1986-04-30 1986-04-30 Single crystal growing equipment Expired - Fee Related JP2556967B2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP61100555A JP2556967B2 (en) 1986-04-30 1986-04-30 Single crystal growing equipment

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP61100555A JP2556967B2 (en) 1986-04-30 1986-04-30 Single crystal growing equipment

Publications (2)

Publication Number Publication Date
JPS62256791A JPS62256791A (en) 1987-11-09
JP2556967B2 true JP2556967B2 (en) 1996-11-27

Family

ID=14277181

Family Applications (1)

Application Number Title Priority Date Filing Date
JP61100555A Expired - Fee Related JP2556967B2 (en) 1986-04-30 1986-04-30 Single crystal growing equipment

Country Status (1)

Country Link
JP (1) JP2556967B2 (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE102008062049A1 (en) 2008-05-19 2009-12-03 Covalent Materials Corp. Manufacture of low-oxygen concentrated silicon single crystal for silicon semiconductor, involves subjecting raw material silicon to silicon single crystal drawing by horizontal magnetic field type Czochralski method

Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2010100474A (en) * 2008-10-23 2010-05-06 Covalent Materials Corp Method for optimizing horizontal magnetic field in pulling-up silicon single crystal, and method for manufacturing silicon single crystal
JP5304206B2 (en) 2008-12-04 2013-10-02 信越半導体株式会社 Single crystal manufacturing method and single crystal manufacturing apparatus

Family Cites Families (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS6033296A (en) * 1983-07-29 1985-02-20 Toshiba Ceramics Co Ltd Pulling device for single crystal semiconductor
JPS6036392A (en) * 1983-08-05 1985-02-25 Toshiba Corp Apparatus for pulling single crystal
JPS60251193A (en) * 1984-05-28 1985-12-11 Toshiba Corp Process and device for preparing single crystal
JPS6153189A (en) * 1984-08-21 1986-03-17 Toshiba Corp Device for pulling up single crystal
JPS61286294A (en) * 1985-06-07 1986-12-16 Toshiba Corp Pulling device for single crystal
JPS623091A (en) * 1985-06-26 1987-01-09 Toshiba Corp Single crystal pulling up apparatus

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE102008062049A1 (en) 2008-05-19 2009-12-03 Covalent Materials Corp. Manufacture of low-oxygen concentrated silicon single crystal for silicon semiconductor, involves subjecting raw material silicon to silicon single crystal drawing by horizontal magnetic field type Czochralski method

Also Published As

Publication number Publication date
JPS62256791A (en) 1987-11-09

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