JP2537892Y2 - Ｉｃ試験装置 - Google Patents

Ｉｃ試験装置

Info

Publication number
JP2537892Y2
JP2537892Y2 JP1990060799U JP6079990U JP2537892Y2 JP 2537892 Y2 JP2537892 Y2 JP 2537892Y2 JP 1990060799 U JP1990060799 U JP 1990060799U JP 6079990 U JP6079990 U JP 6079990U JP 2537892 Y2 JP2537892 Y2 JP 2537892Y2
Authority
JP
Japan
Prior art keywords
connector
motherboard
contact
pin card
zero insertion
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
JP1990060799U
Other languages
English (en)
Japanese (ja)
Other versions
JPH0421881U (enrdf_load_stackoverflow
Inventor
和成 菅
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Advantest Corp
Original Assignee
Advantest Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Advantest Corp filed Critical Advantest Corp
Priority to JP1990060799U priority Critical patent/JP2537892Y2/ja
Publication of JPH0421881U publication Critical patent/JPH0421881U/ja
Application granted granted Critical
Publication of JP2537892Y2 publication Critical patent/JP2537892Y2/ja
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Landscapes

  • Testing Of Individual Semiconductor Devices (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
JP1990060799U 1990-06-08 1990-06-08 Ｉｃ試験装置 Expired - Lifetime JP2537892Y2 (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP1990060799U JP2537892Y2 (ja) 1990-06-08 1990-06-08 Ｉｃ試験装置

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP1990060799U JP2537892Y2 (ja) 1990-06-08 1990-06-08 Ｉｃ試験装置

Publications (2)

Publication Number Publication Date
JPH0421881U JPH0421881U (enrdf_load_stackoverflow) 1992-02-24
JP2537892Y2 true JP2537892Y2 (ja) 1997-06-04

Family

ID=31588481

Family Applications (1)

Application Number Title Priority Date Filing Date
JP1990060799U Expired - Lifetime JP2537892Y2 (ja) 1990-06-08 1990-06-08 Ｉｃ試験装置

Country Status (1)

Country Link
JP (1) JP2537892Y2 (enrdf_load_stackoverflow)

Families Citing this family (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH11237439A (ja) * 1998-02-20 1999-08-31 Advantest Corp テストフィクスチャ
US6476628B1 (en) * 1999-06-28 2002-11-05 Teradyne, Inc. Semiconductor parallel tester
US20070057682A1 (en) * 2005-09-15 2007-03-15 Mctigue Michael T Signal probe and probe assembly
WO2008062579A1 (en) * 2006-11-22 2008-05-29 Panasonic Corporation Semiconductor inspection equipment
JP5161975B2 (ja) * 2008-11-04 2013-03-13 株式会社アドバンテスト コネクタ着脱装置およびテストヘッド

Family Cites Families (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5960269A (ja) * 1982-09-29 1984-04-06 Nec Corp 汎用フイクスチヤ−
JPS62120289U (enrdf_load_stackoverflow) * 1986-01-22 1987-07-30
JPH0627782B2 (ja) * 1986-12-18 1994-04-13 アジアエレクトロニクス株式会社 集積回路測定用接続装置

Also Published As

Publication number Publication date
JPH0421881U (enrdf_load_stackoverflow) 1992-02-24

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