JP2537892Y2 - Ｉｃ試験装置 - Google Patents

Ｉｃ試験装置

Info

Publication number
JP2537892Y2
JP2537892Y2 JP1990060799U JP6079990U JP2537892Y2 JP 2537892 Y2 JP2537892 Y2 JP 2537892Y2 JP 1990060799 U JP1990060799 U JP 1990060799U JP 6079990 U JP6079990 U JP 6079990U JP 2537892 Y2 JP2537892 Y2 JP 2537892Y2
Authority
JP
Japan
Prior art keywords
connector
motherboard
contact
pin card
zero insertion
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
JP1990060799U
Other languages
English (en)
Japanese (ja)
Other versions
JPH0421881U (OSRAM
Inventor
和成 菅
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Advantest Corp
Original Assignee
Advantest Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Advantest Corp filed Critical Advantest Corp
Priority to JP1990060799U priority Critical patent/JP2537892Y2/ja
Publication of JPH0421881U publication Critical patent/JPH0421881U/ja
Application granted granted Critical
Publication of JP2537892Y2 publication Critical patent/JP2537892Y2/ja
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Landscapes

  • Testing Of Individual Semiconductor Devices (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
JP1990060799U 1990-06-08 1990-06-08 Ｉｃ試験装置 Expired - Lifetime JP2537892Y2 (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP1990060799U JP2537892Y2 (ja) 1990-06-08 1990-06-08 Ｉｃ試験装置

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP1990060799U JP2537892Y2 (ja) 1990-06-08 1990-06-08 Ｉｃ試験装置

Publications (2)

Publication Number Publication Date
JPH0421881U JPH0421881U (OSRAM) 1992-02-24
JP2537892Y2 true JP2537892Y2 (ja) 1997-06-04

Family

ID=31588481

Family Applications (1)

Application Number Title Priority Date Filing Date
JP1990060799U Expired - Lifetime JP2537892Y2 (ja) 1990-06-08 1990-06-08 Ｉｃ試験装置

Country Status (1)

Country Link
JP (1) JP2537892Y2 (OSRAM)

Families Citing this family (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH11237439A (ja) * 1998-02-20 1999-08-31 Advantest Corp テストフィクスチャ
US6476628B1 (en) * 1999-06-28 2002-11-05 Teradyne, Inc. Semiconductor parallel tester
US20070057682A1 (en) * 2005-09-15 2007-03-15 Mctigue Michael T Signal probe and probe assembly
JPWO2008062579A1 (ja) * 2006-11-22 2010-03-04 パナソニック株式会社 半導体検査装置
KR101250844B1 (ko) * 2008-11-04 2013-04-09 가부시키가이샤 아드반테스트 커넥터 착탈장치 및 테스트헤드

Family Cites Families (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5960269A (ja) * 1982-09-29 1984-04-06 Nec Corp 汎用フイクスチヤ−
JPS62120289U (OSRAM) * 1986-01-22 1987-07-30
JPH0627782B2 (ja) * 1986-12-18 1994-04-13 アジアエレクトロニクス株式会社 集積回路測定用接続装置

Also Published As

Publication number Publication date
JPH0421881U (OSRAM) 1992-02-24

Similar Documents

Publication Publication Date Title
US5795172A (en) Production printed circuit board (PCB) edge connector test connector
US5793218A (en) Generic interface test adapter
KR950012466B1 (ko) 평면 가요성 케이블용 가압 접촉형 전기 커넥터
US8864512B2 (en) Electrical connector
JPS63304180A (ja) 印刷回路板テスト装置
US8651888B2 (en) Electrical connector
KR100344048B1 (ko) Ｐｇａ 패키지용의 점검 가능한 전기 커넥터
US7004776B2 (en) ZIF connector and semiconductor-testing apparatus using the same
US4538866A (en) Backplane connector
JP2537892Y2 (ja) Ｉｃ試験装置
US6751856B2 (en) Method for electrically connecting a circuit board connector to an external device
US6679716B2 (en) Connector
JP3810134B2 (ja) コンタクト及びこのコンタクトを備えたｉｃソケット
US5490797A (en) Multipin connector apparatus
RU2319263C1 (ru) Контактирующее устройство для электрического соединения жестких печатных плат
EP2568538A1 (en) Electrical connector
US4131328A (en) Electrical connector for sequential connection and disconnection of circuits
US5386197A (en) Slidable adapter for simultaneous connection of a plurality of contacts of a backboard test module to conductors of a backboard
EP0004708B1 (en) Electrical connector with ejector mechanism
KR970000555B1 (ko) 전기컨넥터 래치기구
JPS6010304Y2 (ja) 電子装置
US7833043B2 (en) Socket connector
JPH09501793A (ja) 電子システム用セルフスイッチングコネクタ
US6239592B1 (en) Test fixture with quick connect and release board interconnect mechanism
JP2000208187A (ja) クリップ式中継コネクタ

Legal Events

Date Code Title Description
A977 Report on retrieval

Free format text: JAPANESE INTERMEDIATE CODE: A971007

Effective date: 20050622

A131 Notification of reasons for refusal

Effective date: 20050705

Free format text: JAPANESE INTERMEDIATE CODE: A131

A521 Written amendment

Effective date: 20050902

Free format text: JAPANESE INTERMEDIATE CODE: A523

A02 Decision of refusal

Effective date: 20051004

Free format text: JAPANESE INTERMEDIATE CODE: A02