JP2535480Y2 - X線回折装置 - Google Patents
X線回折装置Info
- Publication number
- JP2535480Y2 JP2535480Y2 JP1989095921U JP9592189U JP2535480Y2 JP 2535480 Y2 JP2535480 Y2 JP 2535480Y2 JP 1989095921 U JP1989095921 U JP 1989095921U JP 9592189 U JP9592189 U JP 9592189U JP 2535480 Y2 JP2535480 Y2 JP 2535480Y2
- Authority
- JP
- Japan
- Prior art keywords
- sample
- curved
- dimensional
- ray
- optical microscope
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Lifetime
Links
Landscapes
- Analysing Materials By The Use Of Radiation (AREA)
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP1989095921U JP2535480Y2 (ja) | 1989-08-16 | 1989-08-16 | X線回折装置 |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP1989095921U JP2535480Y2 (ja) | 1989-08-16 | 1989-08-16 | X線回折装置 |
Publications (2)
Publication Number | Publication Date |
---|---|
JPH0335460U JPH0335460U (enrdf_load_stackoverflow) | 1991-04-08 |
JP2535480Y2 true JP2535480Y2 (ja) | 1997-05-14 |
Family
ID=31645155
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP1989095921U Expired - Lifetime JP2535480Y2 (ja) | 1989-08-16 | 1989-08-16 | X線回折装置 |
Country Status (1)
Country | Link |
---|---|
JP (1) | JP2535480Y2 (enrdf_load_stackoverflow) |
Family Cites Families (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS5560843A (en) * | 1978-10-30 | 1980-05-08 | Nippon X Sen Kk | Minute region x-ray diffractometer |
-
1989
- 1989-08-16 JP JP1989095921U patent/JP2535480Y2/ja not_active Expired - Lifetime
Also Published As
Publication number | Publication date |
---|---|
JPH0335460U (enrdf_load_stackoverflow) | 1991-04-08 |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
KR102221931B1 (ko) | 시료에 따른 전자 회절 패턴 분석을 수행하는 방법 | |
EP4056984B1 (en) | Sample milling apparatus and method of adjustment therefor | |
JPH01187441A (ja) | X線回折装置の三軸回転ゴニオメータ | |
JP2535480Y2 (ja) | X線回折装置 | |
JPS6178041A (ja) | 表面原子配列構造の観察方法及びその装置 | |
JP3677895B2 (ja) | 3次元構造観察用試料作製装置、電子顕微鏡及びその方法 | |
JP2001013095A (ja) | 試料の無機物分析装置ならびに試料の無機物および/または有機物分析装置 | |
EP0137547B1 (en) | Two-crystal x-ray spectrometer | |
JPH1144662A (ja) | 微小部x線分析装置 | |
JP2000258366A (ja) | 微小部x線回折装置 | |
JP3269692B2 (ja) | 微小領域x線回折測定方法 | |
JP3462910B2 (ja) | 微小角入射x線装置のx線入射角設定方法及びその機構 | |
JP3236688B2 (ja) | 微小領域x線回折装置 | |
JPH05312736A (ja) | X線単結晶方位測定装置及び測定方法 | |
JP2002319365A (ja) | ステージ及びfib試料作成装置 | |
KR102777155B1 (ko) | 3차원 엑스선 현미경의 해상도 듀얼모드 변환 장치 | |
US4400825A (en) | Adjustable slit radiographic apparatus | |
JP2768545B2 (ja) | X線光源装置 | |
JPS63281341A (ja) | エネルギ−分散型x線分光器を備えたx線分析装置 | |
JPS61178650A (ja) | 微小部x線回折装置 | |
JPS6032906U (ja) | 歯科用鋳造体x線検査装置 | |
JPH0227488Y2 (enrdf_load_stackoverflow) | ||
JPH07260714A (ja) | X線分析装置 | |
JPS63151843A (ja) | X線分析用試料ホルダ− | |
JPH11248651A (ja) | 微小領域x線回折装置 |