JP2025523096A - 半導体式のガスセンサを備えたスニファー式リーク検知装置およびスニファー式リーク検知方法 - Google Patents

半導体式のガスセンサを備えたスニファー式リーク検知装置およびスニファー式リーク検知方法

Info

Publication number
JP2025523096A
JP2025523096A JP2025501736A JP2025501736A JP2025523096A JP 2025523096 A JP2025523096 A JP 2025523096A JP 2025501736 A JP2025501736 A JP 2025501736A JP 2025501736 A JP2025501736 A JP 2025501736A JP 2025523096 A JP2025523096 A JP 2025523096A
Authority
JP
Japan
Prior art keywords
gas
measurement
sniffer
sensor
gas inlet
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP2025501736A
Other languages
English (en)
Japanese (ja)
Other versions
JP2025523096A5 (enExample
Inventor
ヴェツィヒ・ダニエル
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Inficon GmbH Deutschland
Original Assignee
Inficon GmbH Deutschland
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Inficon GmbH Deutschland filed Critical Inficon GmbH Deutschland
Publication of JP2025523096A publication Critical patent/JP2025523096A/ja
Publication of JP2025523096A5 publication Critical patent/JP2025523096A5/ja
Pending legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01M—TESTING STATIC OR DYNAMIC BALANCE OF MACHINES OR STRUCTURES; TESTING OF STRUCTURES OR APPARATUS, NOT OTHERWISE PROVIDED FOR
    • G01M3/00—Investigating fluid-tightness of structures
    • G01M3/02—Investigating fluid-tightness of structures by using fluid or vacuum
    • G01M3/04—Investigating fluid-tightness of structures by using fluid or vacuum by detecting the presence of fluid at the leakage point
    • G01M3/16—Investigating fluid-tightness of structures by using fluid or vacuum by detecting the presence of fluid at the leakage point using electric detection means
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01M—TESTING STATIC OR DYNAMIC BALANCE OF MACHINES OR STRUCTURES; TESTING OF STRUCTURES OR APPARATUS, NOT OTHERWISE PROVIDED FOR
    • G01M3/00—Investigating fluid-tightness of structures
    • G01M3/002—Investigating fluid-tightness of structures by using thermal means
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N25/00—Investigating or analyzing materials by the use of thermal means
    • G01N25/18—Investigating or analyzing materials by the use of thermal means by investigating thermal conductivity
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N27/00—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means
    • G01N27/02—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating impedance
    • G01N27/04—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating impedance by investigating resistance
    • G01N27/12—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating impedance by investigating resistance of a solid body in dependence upon absorption of a fluid; of a solid body in dependence upon reaction with a fluid, for detecting components in the fluid
    • G01N27/128—Microapparatus
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N33/00—Investigating or analysing materials by specific methods not covered by groups G01N1/00 - G01N31/00
    • G01N33/0004—Gaseous mixtures, e.g. polluted air
    • G01N33/0009—General constructional details of gas analysers, e.g. portable test equipment
    • G01N33/0026—General constructional details of gas analysers, e.g. portable test equipment using an alternating circulation of another gas

Landscapes

  • General Physics & Mathematics (AREA)
  • Physics & Mathematics (AREA)
  • Chemical & Material Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Health & Medical Sciences (AREA)
  • General Health & Medical Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Engineering & Computer Science (AREA)
  • Electrochemistry (AREA)
  • Chemical Kinetics & Catalysis (AREA)
  • Combustion & Propulsion (AREA)
  • Food Science & Technology (AREA)
  • Medicinal Chemistry (AREA)
  • Examining Or Testing Airtightness (AREA)
  • Investigating Or Analyzing Materials By The Use Of Electric Means (AREA)
JP2025501736A 2022-07-22 2023-07-12 半導体式のガスセンサを備えたスニファー式リーク検知装置およびスニファー式リーク検知方法 Pending JP2025523096A (ja)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
DE102022118431.5 2022-07-22
DE102022118431.5A DE102022118431A1 (de) 2022-07-22 2022-07-22 Schnüffellecksuchvorrichtung mit Halbleitergassensor sowie Verfahren zur Schnüffellecksuche
PCT/EP2023/069347 WO2024017738A2 (de) 2022-07-22 2023-07-12 Schnüffellecksuchvorrichtung mit halbleitergassensor sowie verfahren zur schnüffellecksuche

Publications (2)

Publication Number Publication Date
JP2025523096A true JP2025523096A (ja) 2025-07-17
JP2025523096A5 JP2025523096A5 (enExample) 2026-02-18

Family

ID=87340829

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2025501736A Pending JP2025523096A (ja) 2022-07-22 2023-07-12 半導体式のガスセンサを備えたスニファー式リーク検知装置およびスニファー式リーク検知方法

Country Status (6)

Country Link
US (1) US20260016360A1 (enExample)
EP (1) EP4558799A2 (enExample)
JP (1) JP2025523096A (enExample)
CN (1) CN119301432A (enExample)
DE (1) DE102022118431A1 (enExample)
WO (1) WO2024017738A2 (enExample)

Family Cites Families (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4185490A (en) * 1978-10-06 1980-01-29 Hewlett-Packard Company Phase discrimination in modulated thermal conductivity detector
CH668648A5 (de) * 1984-04-04 1989-01-13 Cerberus Ag Verfahren und vorrichtung zum nachweis von reduzierenden gasen in einem gasgemisch.
JPS61130864A (ja) * 1984-11-30 1986-06-18 Nippon Paionikusu Kk 不純ガスの検知方法
US6085576A (en) 1998-03-20 2000-07-11 Cyrano Sciences, Inc. Handheld sensing apparatus
DE10062126A1 (de) 2000-12-13 2002-06-20 Inficon Gmbh Verfahren zur Feststellung eines Gases mit Hilfe eines Infrarot-Gasanlaysators sowie für die Durchführung dieser Verfahren geigneter Gasanalysator
US7051577B2 (en) 2003-12-12 2006-05-30 Radiaulics, Inc. Multi-functional leak detection instrument along with sensor mounting assembly and methodology utilizing the same
JP5757837B2 (ja) * 2011-10-11 2015-08-05 ジーエルサイエンス株式会社 ガスリ−クディテクタ−
US11747233B2 (en) 2020-09-28 2023-09-05 Agilent Technologies, Inc. Gas leak detector cartridge

Also Published As

Publication number Publication date
WO2024017738A3 (de) 2024-03-28
WO2024017738A2 (de) 2024-01-25
US20260016360A1 (en) 2026-01-15
CN119301432A (zh) 2025-01-10
EP4558799A2 (de) 2025-05-28
DE102022118431A1 (de) 2024-01-25

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