JP2025512239A5 - - Google Patents

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Publication number
JP2025512239A5
JP2025512239A5 JP2024550230A JP2024550230A JP2025512239A5 JP 2025512239 A5 JP2025512239 A5 JP 2025512239A5 JP 2024550230 A JP2024550230 A JP 2024550230A JP 2024550230 A JP2024550230 A JP 2024550230A JP 2025512239 A5 JP2025512239 A5 JP 2025512239A5
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JP
Japan
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patent document
publication
application
international
prior
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Pending
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JP2024550230A
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English (en)
Japanese (ja)
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JP2025512239A (ja
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Application filed filed Critical
Priority claimed from PCT/US2023/015989 external-priority patent/WO2023200565A1/en
Publication of JP2025512239A publication Critical patent/JP2025512239A/ja
Publication of JP2025512239A5 publication Critical patent/JP2025512239A5/ja
Pending legal-status Critical Current

Links

JP2024550230A 2022-04-14 2023-03-23 ワイヤーボンディング装置上でワイヤーループの高さおよび高さプロファイルを決定する方法 Pending JP2025512239A (ja)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
US202263331130P 2022-04-14 2022-04-14
US63/331,130 2022-04-14
PCT/US2023/015989 WO2023200565A1 (en) 2022-04-14 2023-03-23 Methods of determining a height, and a height profile, of a wire loop on a wire bonding machine

Publications (2)

Publication Number Publication Date
JP2025512239A JP2025512239A (ja) 2025-04-17
JP2025512239A5 true JP2025512239A5 (enExample) 2025-09-18

Family

ID=88308027

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2024550230A Pending JP2025512239A (ja) 2022-04-14 2023-03-23 ワイヤーボンディング装置上でワイヤーループの高さおよび高さプロファイルを決定する方法

Country Status (6)

Country Link
US (1) US12538759B2 (enExample)
JP (1) JP2025512239A (enExample)
KR (1) KR20250002132A (enExample)
CN (1) CN118786326A (enExample)
TW (1) TW202407292A (enExample)
WO (1) WO2023200565A1 (enExample)

Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN118989551B (zh) * 2024-06-06 2025-04-29 深圳市中顺半导体照明有限公司 结合机器视觉调节led半导体器件的焊线线弧的方法及系统
WO2026089858A1 (en) * 2024-10-23 2026-04-30 Kulicke And Soffa Industries, Inc. Wire guides, wire bonding systems, and related methods

Family Cites Families (17)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH01251731A (ja) * 1988-03-31 1989-10-06 Toshiba Corp ボンディングワイヤ検査装置
JP2851151B2 (ja) * 1990-10-12 1999-01-27 株式会社東芝 ワイヤボンディング検査装置
JP3298753B2 (ja) * 1994-10-14 2002-07-08 株式会社新川 ワイヤ曲がり検査装置
JP3370547B2 (ja) 1997-03-17 2003-01-27 株式会社新川 ボンディングワイヤ高さ検査装置
KR200174667Y1 (ko) 1997-03-25 2000-03-02 유무성 와이어 루프의 높이 측정 장치
JPH1163932A (ja) * 1997-08-25 1999-03-05 Matsushita Electric Ind Co Ltd ワイヤボンディングにおけるワイヤの高さ検査方法
US6189765B1 (en) 1998-04-14 2001-02-20 Hyundai Electronics Industries Co., Ltd. Apparatus and method for detecting double wire bonding
ATE344445T1 (de) * 2002-02-01 2006-11-15 F & K Delvotec Bondtech Gmbh Testvorrichtung zur ausführung eines pulltests
US7145162B2 (en) * 2003-10-31 2006-12-05 Asm Assembly Automation Ltd. Wire loop height measurement apparatus and method
US7481351B2 (en) * 2003-12-23 2009-01-27 Samsung Electronics Co., Ltd. Wire bonding apparatus and method for clamping a wire
JP2006080139A (ja) * 2004-09-07 2006-03-23 Shinko Electric Ind Co Ltd ワイヤボンディング装置
US7188759B2 (en) 2004-09-08 2007-03-13 Kulicke And Soffa Industries, Inc. Methods for forming conductive bumps and wire loops
WO2009002345A1 (en) * 2007-06-28 2008-12-31 Kulicke And Soffa Industries, Inc. Method of determining a height profile of a wire loop on a wire bonding machine
JP4625858B2 (ja) * 2008-09-10 2011-02-02 株式会社カイジョー ワイヤボンディング方法、ワイヤボンディング装置及びワイヤボンディング制御プログラム
JP4787374B2 (ja) * 2010-01-27 2011-10-05 株式会社新川 半導体装置の製造方法並びにワイヤボンディング装置
JP6433810B2 (ja) * 2015-02-23 2018-12-05 キヤノンマシナリー株式会社 ボンディングワイヤの検出方法及びボンディングワイヤの検出装置
US11721571B2 (en) * 2020-10-14 2023-08-08 Emage Vision Pte. Ltd. Loop height measurement of overlapping bond wires

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