JP2023173518A - プローブ - Google Patents

プローブ Download PDF

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Publication number
JP2023173518A
JP2023173518A JP2022085828A JP2022085828A JP2023173518A JP 2023173518 A JP2023173518 A JP 2023173518A JP 2022085828 A JP2022085828 A JP 2022085828A JP 2022085828 A JP2022085828 A JP 2022085828A JP 2023173518 A JP2023173518 A JP 2023173518A
Authority
JP
Japan
Prior art keywords
plunger
barrel
end turn
spring
loosely wound
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP2022085828A
Other languages
English (en)
Japanese (ja)
Other versions
JP2023173518A5 (https=
Inventor
拓也 林
Takuya Hayashi
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Yokowo Co Ltd
Original Assignee
Yokowo Co Ltd
Yokowo Mfg Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Yokowo Co Ltd, Yokowo Mfg Co Ltd filed Critical Yokowo Co Ltd
Priority to JP2022085828A priority Critical patent/JP2023173518A/ja
Priority to PCT/JP2023/018524 priority patent/WO2023228844A1/ja
Priority to TW112118557A priority patent/TW202405449A/zh
Publication of JP2023173518A publication Critical patent/JP2023173518A/ja
Publication of JP2023173518A5 publication Critical patent/JP2023173518A5/ja
Pending legal-status Critical Current

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Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02General constructional details
    • G01R1/06Measuring leads; Measuring probes
    • G01R1/067Measuring probes

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Measuring Leads Or Probes (AREA)
JP2022085828A 2022-05-26 2022-05-26 プローブ Pending JP2023173518A (ja)

Priority Applications (3)

Application Number Priority Date Filing Date Title
JP2022085828A JP2023173518A (ja) 2022-05-26 2022-05-26 プローブ
PCT/JP2023/018524 WO2023228844A1 (ja) 2022-05-26 2023-05-18 プローブ
TW112118557A TW202405449A (zh) 2022-05-26 2023-05-18 探針

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2022085828A JP2023173518A (ja) 2022-05-26 2022-05-26 プローブ

Publications (2)

Publication Number Publication Date
JP2023173518A true JP2023173518A (ja) 2023-12-07
JP2023173518A5 JP2023173518A5 (https=) 2025-05-23

Family

ID=88919268

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2022085828A Pending JP2023173518A (ja) 2022-05-26 2022-05-26 プローブ

Country Status (3)

Country Link
JP (1) JP2023173518A (https=)
TW (1) TW202405449A (https=)
WO (1) WO2023228844A1 (https=)

Family Cites Families (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US7315176B2 (en) * 2004-06-16 2008-01-01 Rika Denshi America, Inc. Electrical test probes, methods of making, and methods of using
US7362118B2 (en) * 2006-08-25 2008-04-22 Interconnect Devices, Inc. Probe with contact ring
WO2008133209A1 (ja) * 2007-04-19 2008-11-06 Nhk Spring Co., Ltd. 導電性接触子および導電性接触子ユニット
JP5197754B2 (ja) * 2009-11-13 2013-05-15 テスト ツーリング ソリューションズ グループ ピイ ティ イー リミテッド プローブピン
JP2016008904A (ja) * 2014-06-25 2016-01-18 株式会社ミタカ コンタクトプローブ

Also Published As

Publication number Publication date
WO2023228844A1 (ja) 2023-11-30
TW202405449A (zh) 2024-02-01

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Legal Events

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Free format text: JAPANESE INTERMEDIATE CODE: A523

Effective date: 20250515

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Effective date: 20250515