TW202405449A - 探針 - Google Patents

探針 Download PDF

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Publication number
TW202405449A
TW202405449A TW112118557A TW112118557A TW202405449A TW 202405449 A TW202405449 A TW 202405449A TW 112118557 A TW112118557 A TW 112118557A TW 112118557 A TW112118557 A TW 112118557A TW 202405449 A TW202405449 A TW 202405449A
Authority
TW
Taiwan
Prior art keywords
plunger
central axis
roll
spring
sparse
Prior art date
Application number
TW112118557A
Other languages
English (en)
Chinese (zh)
Inventor
林拓也
Original Assignee
日商友華股份有限公司
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by 日商友華股份有限公司 filed Critical 日商友華股份有限公司
Publication of TW202405449A publication Critical patent/TW202405449A/zh

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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/06—Measuring leads; Measuring probes
    • G01R1/067—Measuring probes

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Measuring Leads Or Probes (AREA)
TW112118557A 2022-05-26 2023-05-18 探針 TW202405449A (zh)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP2022-085828 2022-05-26
JP2022085828A JP2023173518A (ja) 2022-05-26 2022-05-26 プローブ

Publications (1)

Publication Number Publication Date
TW202405449A true TW202405449A (zh) 2024-02-01

Family

ID=88919268

Family Applications (1)

Application Number Title Priority Date Filing Date
TW112118557A TW202405449A (zh) 2022-05-26 2023-05-18 探針

Country Status (3)

Country Link
JP (1) JP2023173518A (https=)
TW (1) TW202405449A (https=)
WO (1) WO2023228844A1 (https=)

Family Cites Families (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US7315176B2 (en) * 2004-06-16 2008-01-01 Rika Denshi America, Inc. Electrical test probes, methods of making, and methods of using
US7362118B2 (en) * 2006-08-25 2008-04-22 Interconnect Devices, Inc. Probe with contact ring
WO2008133209A1 (ja) * 2007-04-19 2008-11-06 Nhk Spring Co., Ltd. 導電性接触子および導電性接触子ユニット
JP5197754B2 (ja) * 2009-11-13 2013-05-15 テスト ツーリング ソリューションズ グループ ピイ ティ イー リミテッド プローブピン
JP2016008904A (ja) * 2014-06-25 2016-01-18 株式会社ミタカ コンタクトプローブ

Also Published As

Publication number Publication date
WO2023228844A1 (ja) 2023-11-30
JP2023173518A (ja) 2023-12-07

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