JP2022178910A5 - - Google Patents
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- Publication number
- JP2022178910A5 JP2022178910A5 JP2021086036A JP2021086036A JP2022178910A5 JP 2022178910 A5 JP2022178910 A5 JP 2022178910A5 JP 2021086036 A JP2021086036 A JP 2021086036A JP 2021086036 A JP2021086036 A JP 2021086036A JP 2022178910 A5 JP2022178910 A5 JP 2022178910A5
- Authority
- JP
- Japan
- Prior art keywords
- temperature
- temperature calibration
- block
- calibration block
- calibration
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
- 238000000034 method Methods 0.000 claims description 16
- 230000007704 transition Effects 0.000 claims description 2
- 230000004308 accommodation Effects 0.000 claims 1
- 238000009413 insulation Methods 0.000 claims 1
- BASFCYQUMIYNBI-UHFFFAOYSA-N platinum Chemical compound [Pt] BASFCYQUMIYNBI-UHFFFAOYSA-N 0.000 description 2
- 238000010586 diagram Methods 0.000 description 1
- 239000011810 insulating material Substances 0.000 description 1
- 229910052697 platinum Inorganic materials 0.000 description 1
- 239000010409 thin film Substances 0.000 description 1
Priority Applications (4)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2021086036A JP7339983B2 (ja) | 2021-05-21 | 2021-05-21 | 温度校正方法 |
| CN202280030959.2A CN117203508A (zh) | 2021-05-21 | 2022-03-24 | 温度校正方法 |
| PCT/JP2022/013936 WO2022244464A1 (ja) | 2021-05-21 | 2022-03-24 | 温度校正方法 |
| US18/556,679 US20240201030A1 (en) | 2021-05-21 | 2022-03-24 | Temperature calibration method |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2021086036A JP7339983B2 (ja) | 2021-05-21 | 2021-05-21 | 温度校正方法 |
Publications (3)
| Publication Number | Publication Date |
|---|---|
| JP2022178910A JP2022178910A (ja) | 2022-12-02 |
| JP2022178910A5 true JP2022178910A5 (https=) | 2023-05-02 |
| JP7339983B2 JP7339983B2 (ja) | 2023-09-06 |
Family
ID=84141193
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2021086036A Active JP7339983B2 (ja) | 2021-05-21 | 2021-05-21 | 温度校正方法 |
Country Status (4)
| Country | Link |
|---|---|
| US (1) | US20240201030A1 (https=) |
| JP (1) | JP7339983B2 (https=) |
| CN (1) | CN117203508A (https=) |
| WO (1) | WO2022244464A1 (https=) |
Families Citing this family (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN115805824B (zh) * | 2022-11-28 | 2025-05-16 | 华为数字能源技术有限公司 | 充电枪温度传感器的状态检测的方法、充电设备及充电系统 |
| WO2025121243A1 (ja) * | 2023-12-07 | 2025-06-12 | Ｓｅｍｉｔｅｃ株式会社 | 温度測定装置及びその温度校正方法 |
Family Cites Families (14)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US5265957A (en) * | 1992-08-11 | 1993-11-30 | Texas Instruments Incorporated | Wireless temperature calibration device and method |
| JP3328408B2 (ja) * | 1993-12-30 | 2002-09-24 | 安立計器株式会社 | 表面温度測定方法 |
| NO312119B1 (no) * | 1999-04-29 | 2002-03-18 | Ole Einar Broenlund | Innretning for kalibrering av temperaturfölere |
| JP4714850B2 (ja) | 2006-03-16 | 2011-06-29 | 独立行政法人産業技術総合研究所 | 温度計の低温度校正装置 |
| KR100817437B1 (ko) * | 2006-07-13 | 2008-03-27 | 한국표준과학연구원 | 온도 보정용 다중 셀 및 이를 이용한 온도계 교정장치 |
| US8556501B2 (en) * | 2008-06-11 | 2013-10-15 | Utah State University Research Foundation | Mini-cell, on-orbit, temperature re-calibration apparatus and method |
| JP2010175344A (ja) * | 2009-01-28 | 2010-08-12 | Nippon Spindle Mfg Co Ltd | 温度センサの配置構造、温度校正装置、及び温度校正方法 |
| JP5123867B2 (ja) * | 2009-01-28 | 2013-01-23 | 日本スピンドル製造株式会社 | 温度校正装置 |
| JP5619493B2 (ja) | 2010-05-31 | 2014-11-05 | 株式会社チノー | 恒温装置用均熱ブロック |
| JP6124367B2 (ja) | 2015-03-30 | 2017-05-10 | 株式会社岡崎製作所 | 低温用比較校正装置 |
| DE102015106805A1 (de) * | 2015-04-30 | 2016-11-03 | Anton Paar Optotec Gmbh | Temperaturkalibration für Messgerät |
| DE102016117572B3 (de) * | 2016-09-19 | 2017-09-21 | SIKA Dr. Siebert & Kühn GmbH & Co. KG | Blockkalibrator zur kalibrierung eines temperatursensors |
| CN110487445B (zh) * | 2019-03-22 | 2025-01-28 | 中国计量科学研究院 | 一种pcr仪温度校准装置的校正装置及校正方法 |
| FI129727B (en) | 2019-10-28 | 2022-08-15 | Beamex Oy Ab | IMPROVEMENT, DETECTION AND DISPLAY OF STABILITY IN AN INDUSTRIAL TEMPERATURE CALIBRATOR |
-
2021
- 2021-05-21 JP JP2021086036A patent/JP7339983B2/ja active Active
-
2022
- 2022-03-24 WO PCT/JP2022/013936 patent/WO2022244464A1/ja not_active Ceased
- 2022-03-24 US US18/556,679 patent/US20240201030A1/en active Pending
- 2022-03-24 CN CN202280030959.2A patent/CN117203508A/zh active Pending
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