CN117203508A - 温度校正方法 - Google Patents

温度校正方法 Download PDF

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Publication number
CN117203508A
CN117203508A CN202280030959.2A CN202280030959A CN117203508A CN 117203508 A CN117203508 A CN 117203508A CN 202280030959 A CN202280030959 A CN 202280030959A CN 117203508 A CN117203508 A CN 117203508A
Authority
CN
China
Prior art keywords
temperature
temperature correction
correction method
correction block
corrected
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
CN202280030959.2A
Other languages
English (en)
Chinese (zh)
Inventor
圆山重直
冈部孝裕
井関祐也
野中崇
古川琢磨
细川靖
折戸学
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Institute of National Colleges of Technologies Japan
Hirosaki University NUC
Semitec Corp
Original Assignee
Institute of National Colleges of Technologies Japan
Hirosaki University NUC
Semitec Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Institute of National Colleges of Technologies Japan, Hirosaki University NUC, Semitec Corp filed Critical Institute of National Colleges of Technologies Japan
Publication of CN117203508A publication Critical patent/CN117203508A/zh
Pending legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01K—MEASURING TEMPERATURE; MEASURING QUANTITY OF HEAT; THERMALLY-SENSITIVE ELEMENTS NOT OTHERWISE PROVIDED FOR
    • G01K15/00—Testing or calibrating of thermometers
    • G01K15/005—Calibration
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01K—MEASURING TEMPERATURE; MEASURING QUANTITY OF HEAT; THERMALLY-SENSITIVE ELEMENTS NOT OTHERWISE PROVIDED FOR
    • G01K15/00—Testing or calibrating of thermometers
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01K—MEASURING TEMPERATURE; MEASURING QUANTITY OF HEAT; THERMALLY-SENSITIVE ELEMENTS NOT OTHERWISE PROVIDED FOR
    • G01K15/00—Testing or calibrating of thermometers
    • G01K15/002—Calibrated temperature sources, temperature standards therefor

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Measuring Temperature Or Quantity Of Heat (AREA)
CN202280030959.2A 2021-05-21 2022-03-24 温度校正方法 Pending CN117203508A (zh)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
JP2021086036A JP7339983B2 (ja) 2021-05-21 2021-05-21 温度校正方法
JP2021-086036 2021-05-21
PCT/JP2022/013936 WO2022244464A1 (ja) 2021-05-21 2022-03-24 温度校正方法

Publications (1)

Publication Number Publication Date
CN117203508A true CN117203508A (zh) 2023-12-08

Family

ID=84141193

Family Applications (1)

Application Number Title Priority Date Filing Date
CN202280030959.2A Pending CN117203508A (zh) 2021-05-21 2022-03-24 温度校正方法

Country Status (4)

Country Link
US (1) US20240201030A1 (https=)
JP (1) JP7339983B2 (https=)
CN (1) CN117203508A (https=)
WO (1) WO2022244464A1 (https=)

Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN115805824B (zh) * 2022-11-28 2025-05-16 华为数字能源技术有限公司 充电枪温度传感器的状态检测的方法、充电设备及充电系统
WO2025121243A1 (ja) * 2023-12-07 2025-06-12 Ｓｅｍｉｔｅｃ株式会社 温度測定装置及びその温度校正方法

Family Cites Families (14)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5265957A (en) * 1992-08-11 1993-11-30 Texas Instruments Incorporated Wireless temperature calibration device and method
JP3328408B2 (ja) * 1993-12-30 2002-09-24 安立計器株式会社 表面温度測定方法
NO312119B1 (no) * 1999-04-29 2002-03-18 Ole Einar Broenlund Innretning for kalibrering av temperaturfölere
JP4714850B2 (ja) 2006-03-16 2011-06-29 独立行政法人産業技術総合研究所 温度計の低温度校正装置
KR100817437B1 (ko) * 2006-07-13 2008-03-27 한국표준과학연구원 온도 보정용 다중 셀 및 이를 이용한 온도계 교정장치
US8556501B2 (en) * 2008-06-11 2013-10-15 Utah State University Research Foundation Mini-cell, on-orbit, temperature re-calibration apparatus and method
JP2010175344A (ja) * 2009-01-28 2010-08-12 Nippon Spindle Mfg Co Ltd 温度センサの配置構造、温度校正装置、及び温度校正方法
JP5123867B2 (ja) * 2009-01-28 2013-01-23 日本スピンドル製造株式会社 温度校正装置
JP5619493B2 (ja) 2010-05-31 2014-11-05 株式会社チノー 恒温装置用均熱ブロック
JP6124367B2 (ja) 2015-03-30 2017-05-10 株式会社岡崎製作所 低温用比較校正装置
DE102015106805A1 (de) * 2015-04-30 2016-11-03 Anton Paar Optotec Gmbh Temperaturkalibration für Messgerät
DE102016117572B3 (de) * 2016-09-19 2017-09-21 SIKA Dr. Siebert & Kühn GmbH & Co. KG Blockkalibrator zur kalibrierung eines temperatursensors
CN110487445B (zh) * 2019-03-22 2025-01-28 中国计量科学研究院 一种pcr仪温度校准装置的校正装置及校正方法
FI129727B (en) 2019-10-28 2022-08-15 Beamex Oy Ab IMPROVEMENT, DETECTION AND DISPLAY OF STABILITY IN AN INDUSTRIAL TEMPERATURE CALIBRATOR

Also Published As

Publication number Publication date
US20240201030A1 (en) 2024-06-20
JP2022178910A (ja) 2022-12-02
JP7339983B2 (ja) 2023-09-06
WO2022244464A1 (ja) 2022-11-24

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