JP2022064881A - コンタクトレンズの欠陥分析及び追跡システム - Google Patents
コンタクトレンズの欠陥分析及び追跡システム Download PDFInfo
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- 230000007547 defect Effects 0.000 title claims abstract description 65
- 230000003287 optical effect Effects 0.000 claims abstract description 17
- 238000005259 measurement Methods 0.000 claims abstract description 14
- 238000004519 manufacturing process Methods 0.000 claims abstract description 12
- 239000011521 glass Substances 0.000 claims abstract description 7
- 238000007689 inspection Methods 0.000 claims description 28
- 238000000034 method Methods 0.000 claims description 27
- 230000007246 mechanism Effects 0.000 claims description 3
- 238000000275 quality assurance Methods 0.000 claims description 2
- 239000002537 cosmetic Substances 0.000 claims 1
- 238000013507 mapping Methods 0.000 claims 1
- 238000012937 correction Methods 0.000 abstract description 2
- 238000005286 illumination Methods 0.000 description 10
- 230000008569 process Effects 0.000 description 9
- 230000002950 deficient Effects 0.000 description 3
- 210000003128 head Anatomy 0.000 description 3
- 230000004075 alteration Effects 0.000 description 2
- 229920000642 polymer Polymers 0.000 description 2
- 238000003908 quality control method Methods 0.000 description 2
- 241000282412 Homo Species 0.000 description 1
- 206010020675 Hypermetropia Diseases 0.000 description 1
- 230000009471 action Effects 0.000 description 1
- 238000011109 contamination Methods 0.000 description 1
- 238000010586 diagram Methods 0.000 description 1
- 238000009792 diffusion process Methods 0.000 description 1
- 230000000694 effects Effects 0.000 description 1
- 230000004305 hyperopia Effects 0.000 description 1
- 201000006318 hyperopia Diseases 0.000 description 1
- 238000002347 injection Methods 0.000 description 1
- 239000007924 injection Substances 0.000 description 1
- 238000012986 modification Methods 0.000 description 1
- 230000004048 modification Effects 0.000 description 1
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- 230000004379 myopia Effects 0.000 description 1
- 208000001491 myopia Diseases 0.000 description 1
- 230000004304 visual acuity Effects 0.000 description 1
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- G01M11/0278—Detecting defects of the object to be tested, e.g. scratches or dust
-
- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
- G06T7/00—Image analysis
- G06T7/0002—Inspection of images, e.g. flaw detection
- G06T7/0004—Industrial image inspection
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- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
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-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
- G01N21/95—Investigating the presence of flaws or contamination characterised by the material or shape of the object to be examined
- G01N21/958—Inspecting transparent materials or objects, e.g. windscreens
-
- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06F—ELECTRIC DIGITAL DATA PROCESSING
- G06F18/00—Pattern recognition
- G06F18/20—Analysing
- G06F18/24—Classification techniques
- G06F18/241—Classification techniques relating to the classification model, e.g. parametric or non-parametric approaches
-
- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06V—IMAGE OR VIDEO RECOGNITION OR UNDERSTANDING
- G06V10/00—Arrangements for image or video recognition or understanding
- G06V10/10—Image acquisition
- G06V10/12—Details of acquisition arrangements; Constructional details thereof
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
- G01N21/8806—Specially adapted optical and illumination features
- G01N2021/8822—Dark field detection
- G01N2021/8825—Separate detection of dark field and bright field
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
- G01N21/8851—Scan or image signal processing specially adapted therefor, e.g. for scan signal adjustment, for detecting different kinds of defects, for compensating for structures, markings, edges
- G01N2021/8854—Grading and classifying of flaws
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
- G01N21/8851—Scan or image signal processing specially adapted therefor, e.g. for scan signal adjustment, for detecting different kinds of defects, for compensating for structures, markings, edges
- G01N2021/8887—Scan or image signal processing specially adapted therefor, e.g. for scan signal adjustment, for detecting different kinds of defects, for compensating for structures, markings, edges based on image processing techniques
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- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
- G01N21/95—Investigating the presence of flaws or contamination characterised by the material or shape of the object to be examined
- G01N21/958—Inspecting transparent materials or objects, e.g. windscreens
- G01N2021/9583—Lenses
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N2201/00—Features of devices classified in G01N21/00
- G01N2201/10—Scanning
- G01N2201/104—Mechano-optical scan, i.e. object and beam moving
-
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- G06—COMPUTING; CALCULATING OR COUNTING
- G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
- G06T2207/00—Indexing scheme for image analysis or image enhancement
- G06T2207/10—Image acquisition modality
- G06T2207/10024—Color image
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- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
- G06T2207/00—Indexing scheme for image analysis or image enhancement
- G06T2207/10—Image acquisition modality
- G06T2207/10052—Images from lightfield camera
-
- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
- G06T2207/00—Indexing scheme for image analysis or image enhancement
- G06T2207/10—Image acquisition modality
- G06T2207/10056—Microscopic image
-
- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06V—IMAGE OR VIDEO RECOGNITION OR UNDERSTANDING
- G06V2201/00—Indexing scheme relating to image or video recognition or understanding
- G06V2201/06—Recognition of objects for industrial automation
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Abstract
Description
Claims (7)
- リアプロジェクションを用いた透明及び装飾用コンタクトレンズの欠陥分析及び追跡システムであって、
コンタクトレンズを保持するために湾曲したガラス製のキュベットと、
背面及び前面の照明のために、前記キュベットの方に向けられた一対の照明モジュールと、
必要に応じてバックライト照明を拡散させるために、水平旋回アームに取り付けられたディフューザーと、
少なくとも2つの光学フィルタが取り付けられた回転ホイールと、
収差のない画像をキャプチャするために、前記コンタクトレンズに合焦された第1の光学モジュールと、
1つの段階でコンピュータによって画像をキャプチャし、第2の段階で観察用スクリーン上に画像を投影するために、光ビームを分割するビームスプリッタと、
前記コンピュータに接続され、第1の段階で画像をキャプチャする第1のカメラと、第2の段階で前記観察用スクリーンから画像をキャプチャする第2のカメラと、
検査中の物体の様々な寸法及び欠陥を測定するためのガラス製の精密較正器を取り付けるためのゲージホルダと、
前記較正ゲージの後に取り付けられ、前記ゲージ上の前記コンタクトレンズの較正パターンとの重ね合わせ画像を前記観察用スクリーン上に投影する第2の光学モジュールと、
前記コンタクトレンズの様々な特徴を正確に測定するために、画像が投影される大きな前記観察用スクリーンと、を備えるコンタクトレンズの欠陥分析及び追跡システム。 - 異なる種類のコンタクトレンズを検査及び測定するための様々な較正ゲージを収容するための交換可能な機構を特徴とするゲージホルダをさらに含む、請求項1に記載のシステム。
- 前記旋回アーム上に取り付けられた第2のカメラをさらに含み、それを前記観察用スクリーンの前方に手動で位置決めして、コンタクトレンズ上の特定の特徴の拡大画像をキャプチャする、請求項1に記載のシステム。
- 背面投影を用いた透明及び化粧用コンタクトレンズの欠陥分析及び追跡方法であって、
バックライト照明及びフロントライト照明を用いた検査中の前記コンタクトレンズの画像のキャプチャすることと、
気泡、裂け目、傷、ロット情報を含むパターンなどの欠陥を強調するために、照明モジュールを異なる時間領域で動的にパルス化することと、
第1のカメラからの画像を取り込んで重要な特徴を識別し、追跡のためにロット情報にタグ付け処理することと、
重要な特徴の特定とロット情報への欠陥のマッピングによるデータベースの作成することと、
観察用スクリーン上の識別された欠陥の近くに第2のカメラを手動で位置決めすることによって、第1のカメラからの画像を処理するときに決定された重大な欠陥の拡大画像をキャプチャするように第2のカメラをトリガすることと、
拡大された画像を指定されたロットに統合し、タグ付けし、拡大された領域と共に重要な欠陥のリストを用いてデータベースの有効性を向上させることと、
作表された実績とデータベースを外部インターフェースに伝達すること、又は品質保証担当チームが製造工程の微調整を目的として使用するためにそれらを印刷することと、を含むコンタクトレンズの欠陥分析及び追跡方法。 - 特徴又は欠陥の測定が、欠陥種類に適合するように測定ゲージを変更することを含む、請求項4に記載の方法。
- 特徴又は欠陥の測定が、特定の欠陥種類についての複数の倍率設定の下での欠陥の画像をキャプチャすることを含む、請求項4に記載の方法。
- 特徴又は欠陥の測定がコンタクトレンズ上の特徴を強調するために、回転ホイール上に取り付けられた異なる光学フィルタを利用することを含む、請求項4に記載の方法。
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JP (2) | JP7309225B2 (ja) |
KR (1) | KR20220049481A (ja) |
CN (1) | CN114429444A (ja) |
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Citations (3)
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JPH07190885A (ja) * | 1993-09-17 | 1995-07-28 | Essilor Internatl (Cie Gen Opt) | 光学素子の幾何学的または光学的構造の絶対的測定方法および実施装置 |
JPH10274591A (ja) * | 1997-01-29 | 1998-10-13 | Naitsu:Kk | 透明物体の拡大観察装置 |
JP2008180722A (ja) * | 1994-06-14 | 2008-08-07 | Visionix Ltd | 光要素をマッピングするための装置 |
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EP0822440B1 (en) * | 1996-01-10 | 2003-12-03 | Kabushiki Kaisha Topcon | Layout judgement apparatus and layout judgement system |
US8143600B2 (en) * | 2008-02-18 | 2012-03-27 | Visiongate, Inc. | 3D imaging of live cells with ultraviolet radiation |
EP2489467A1 (de) * | 2011-02-15 | 2012-08-22 | Schneider GmbH & Co. KG | Vorrichtung und Verfahren zum Bearbeiten einer optischen Linse mit einer Vorrichtung zur optischen Erfassung des Übergangs des Linsenmaterials zum Block- oder Folienmaterial zur Bestimmung des Randkantenverlaufs der Linse |
KR102166189B1 (ko) * | 2013-10-08 | 2020-10-15 | 이미지 비전 피티이. 리미티드 | 습식 안과 렌즈 검사 시스템 및 방법 |
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SG10201501672PA (en) * | 2015-03-05 | 2016-10-28 | Emage Vision Pte Ltd | Inspection of sealing quality in blister packages |
SG10201509497VA (en) * | 2015-11-18 | 2017-06-29 | Emage Vision Pte Ltd | Contact lens defect inspection using uv illumination |
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SG10201701099XA (en) * | 2017-02-10 | 2018-09-27 | Emage Vision Pte Ltd | Contact lens inspection in a plastic shell |
US9970884B1 (en) * | 2017-04-28 | 2018-05-15 | Hong Kong Applied Science and Technology Research Institute Company Limited | Apparatus and a method for inspecting a light transmissive optical component |
SG10201803290VA (en) * | 2018-04-19 | 2019-11-28 | Emage Vision Pte Ltd | System and method for inspecting optical power and thickness of ophthalmic lenses immersed in a solution |
JP7190885B2 (ja) | 2018-11-30 | 2022-12-16 | 株式会社マキタ | 電力供給システム |
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- 2021-10-14 CN CN202111200256.3A patent/CN114429444A/zh active Pending
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Patent Citations (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH07190885A (ja) * | 1993-09-17 | 1995-07-28 | Essilor Internatl (Cie Gen Opt) | 光学素子の幾何学的または光学的構造の絶対的測定方法および実施装置 |
JP2008180722A (ja) * | 1994-06-14 | 2008-08-07 | Visionix Ltd | 光要素をマッピングするための装置 |
JPH10274591A (ja) * | 1997-01-29 | 1998-10-13 | Naitsu:Kk | 透明物体の拡大観察装置 |
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JP7510215B2 (ja) | 2024-07-03 |
TW202235860A (zh) | 2022-09-16 |
KR20220049481A (ko) | 2022-04-21 |
US20220178787A1 (en) | 2022-06-09 |
JP7309225B2 (ja) | 2023-07-18 |
CN114429444A (zh) | 2022-05-03 |
DE102021211596A1 (de) | 2022-04-14 |
US11796418B2 (en) | 2023-10-24 |
JP2023131173A (ja) | 2023-09-21 |
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