JP7309225B2 - コンタクトレンズの欠陥分析及び追跡システム - Google Patents
コンタクトレンズの欠陥分析及び追跡システム Download PDFInfo
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- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
- G06T7/00—Image analysis
- G06T7/0002—Inspection of images, e.g. flaw detection
- G06T7/0004—Industrial image inspection
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01M—TESTING STATIC OR DYNAMIC BALANCE OF MACHINES OR STRUCTURES; TESTING OF STRUCTURES OR APPARATUS, NOT OTHERWISE PROVIDED FOR
- G01M11/00—Testing of optical apparatus; Testing structures by optical methods not otherwise provided for
- G01M11/02—Testing optical properties
- G01M11/0242—Testing optical properties by measuring geometrical properties or aberrations
- G01M11/0278—Detecting defects of the object to be tested, e.g. scratches or dust
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
- G01N21/95—Investigating the presence of flaws or contamination characterised by the material or shape of the object to be examined
- G01N21/958—Inspecting transparent materials or objects, e.g. windscreens
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01M—TESTING STATIC OR DYNAMIC BALANCE OF MACHINES OR STRUCTURES; TESTING OF STRUCTURES OR APPARATUS, NOT OTHERWISE PROVIDED FOR
- G01M11/00—Testing of optical apparatus; Testing structures by optical methods not otherwise provided for
- G01M11/02—Testing optical properties
- G01M11/0242—Testing optical properties by measuring geometrical properties or aberrations
- G01M11/0257—Testing optical properties by measuring geometrical properties or aberrations by analyzing the image formed by the object to be tested
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- G01—MEASURING; TESTING
- G01M—TESTING STATIC OR DYNAMIC BALANCE OF MACHINES OR STRUCTURES; TESTING OF STRUCTURES OR APPARATUS, NOT OTHERWISE PROVIDED FOR
- G01M11/00—Testing of optical apparatus; Testing structures by optical methods not otherwise provided for
- G01M11/02—Testing optical properties
- G01M11/0242—Testing optical properties by measuring geometrical properties or aberrations
- G01M11/0257—Testing optical properties by measuring geometrical properties or aberrations by analyzing the image formed by the object to be tested
- G01M11/0264—Testing optical properties by measuring geometrical properties or aberrations by analyzing the image formed by the object to be tested by using targets or reference patterns
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
- G01N21/8806—Specially adapted optical and illumination features
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
- G01N21/8851—Scan or image signal processing specially adapted therefor, e.g. for scan signal adjustment, for detecting different kinds of defects, for compensating for structures, markings, edges
-
- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06F—ELECTRIC DIGITAL DATA PROCESSING
- G06F18/00—Pattern recognition
- G06F18/20—Analysing
- G06F18/24—Classification techniques
- G06F18/241—Classification techniques relating to the classification model, e.g. parametric or non-parametric approaches
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- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06V—IMAGE OR VIDEO RECOGNITION OR UNDERSTANDING
- G06V10/00—Arrangements for image or video recognition or understanding
- G06V10/10—Image acquisition
- G06V10/12—Details of acquisition arrangements; Constructional details thereof
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
- G01N21/8806—Specially adapted optical and illumination features
- G01N2021/8822—Dark field detection
- G01N2021/8825—Separate detection of dark field and bright field
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
- G01N21/8851—Scan or image signal processing specially adapted therefor, e.g. for scan signal adjustment, for detecting different kinds of defects, for compensating for structures, markings, edges
- G01N2021/8854—Grading and classifying of flaws
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
- G01N21/8851—Scan or image signal processing specially adapted therefor, e.g. for scan signal adjustment, for detecting different kinds of defects, for compensating for structures, markings, edges
- G01N2021/8887—Scan or image signal processing specially adapted therefor, e.g. for scan signal adjustment, for detecting different kinds of defects, for compensating for structures, markings, edges based on image processing techniques
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
- G01N21/95—Investigating the presence of flaws or contamination characterised by the material or shape of the object to be examined
- G01N21/958—Inspecting transparent materials or objects, e.g. windscreens
- G01N2021/9583—Lenses
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N2201/00—Features of devices classified in G01N21/00
- G01N2201/10—Scanning
- G01N2201/104—Mechano-optical scan, i.e. object and beam moving
-
- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
- G06T2207/00—Indexing scheme for image analysis or image enhancement
- G06T2207/10—Image acquisition modality
- G06T2207/10024—Color image
-
- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
- G06T2207/00—Indexing scheme for image analysis or image enhancement
- G06T2207/10—Image acquisition modality
- G06T2207/10052—Images from lightfield camera
-
- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
- G06T2207/00—Indexing scheme for image analysis or image enhancement
- G06T2207/10—Image acquisition modality
- G06T2207/10056—Microscopic image
-
- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06V—IMAGE OR VIDEO RECOGNITION OR UNDERSTANDING
- G06V2201/00—Indexing scheme relating to image or video recognition or understanding
- G06V2201/06—Recognition of objects for industrial automation
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- Bioinformatics & Cheminformatics (AREA)
- Bioinformatics & Computational Biology (AREA)
- Evolutionary Biology (AREA)
- Evolutionary Computation (AREA)
- General Engineering & Computer Science (AREA)
- Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
- Testing Of Optical Devices Or Fibers (AREA)
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Description
Claims (3)
- リアプロジェクションを用いたコンタクトレンズの欠陥分析及び追跡システムであって、
コンタクトレンズを保持するために湾曲したガラス製のキュベットと、
背面及び前面の照明のために、前記キュベットの方に向けられた一対の照明モジュールと、
必要に応じてバックライト照明を拡散させるために、水平旋回アームに取り付けられたディフューザーと、
異なる種類の欠陥を観察するための少なくとも2つの異なる光学フィルタが取り付けられた回転ホイールと、
収差のない画像をキャプチャするために、前記コンタクトレンズに合焦された第1の光学モジュールと、
第1の段階でコンピュータによって画像をキャプチャし、第2の段階で観察用スクリーン上に画像を投影するために、光ビームを分割するビームスプリッタと、
前記コンピュータに接続され、第1の段階で画像をキャプチャする第1のカメラと、第2の段階で前記観察用スクリーンから画像をキャプチャする第2のカメラと、
検査中の物体の様々な寸法及び欠陥を測定するためのガラス製の精密較正器を取り付けるためのゲージホルダと、
較正ゲージの後に取り付けられ、前記ゲージ上の前記コンタクトレンズの較正パターンとの重ね合わせ画像を前記観察用スクリーン上に投影する第2の光学モジュールと、
前記コンタクトレンズの様々な特徴を正確に測定するために、画像が投影される大きな前記観察用スクリーンと、を備えるコンタクトレンズの欠陥分析及び追跡システム。 - 異なる種類のコンタクトレンズを検査及び測定するための様々な較正ゲージを収容するための交換可能な機構を特徴とするゲージホルダをさらに含む、請求項1に記載のシステム。
- 前記旋回アーム上に取り付けられた第2のカメラをさらに含み、それを前記観察用スクリーンの前方に手動で位置決めして、コンタクトレンズ上の特定の特徴の拡大画像をキャプチャする、請求項1に記載のシステム。
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
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JP2023105994A JP7510215B2 (ja) | 2020-10-14 | 2023-06-28 | コンタクトレンズの欠陥分析及び追跡システム |
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SG10202010191P | 2020-10-14 | ||
SG10202010191P | 2020-10-14 |
Related Child Applications (1)
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JP2023105994A Division JP7510215B2 (ja) | 2020-10-14 | 2023-06-28 | コンタクトレンズの欠陥分析及び追跡システム |
Publications (2)
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JP2022064881A JP2022064881A (ja) | 2022-04-26 |
JP7309225B2 true JP7309225B2 (ja) | 2023-07-18 |
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JP2021169140A Active JP7309225B2 (ja) | 2020-10-14 | 2021-10-14 | コンタクトレンズの欠陥分析及び追跡システム |
JP2023105994A Active JP7510215B2 (ja) | 2020-10-14 | 2023-06-28 | コンタクトレンズの欠陥分析及び追跡システム |
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JP2023105994A Active JP7510215B2 (ja) | 2020-10-14 | 2023-06-28 | コンタクトレンズの欠陥分析及び追跡システム |
Country Status (6)
Country | Link |
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US (1) | US11796418B2 (ja) |
JP (2) | JP7309225B2 (ja) |
KR (1) | KR20220049481A (ja) |
CN (1) | CN114429444A (ja) |
DE (1) | DE102021211596A1 (ja) |
TW (1) | TW202235860A (ja) |
Families Citing this family (1)
Publication number | Priority date | Publication date | Assignee | Title |
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CN116990450B (zh) * | 2023-07-18 | 2024-04-26 | 欧几里德(苏州)医疗科技有限公司 | 一种角膜塑形镜的缺陷检测方法及系统 |
Citations (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2008180722A (ja) | 1994-06-14 | 2008-08-07 | Visionix Ltd | 光要素をマッピングするための装置 |
JP7190885B2 (ja) | 2018-11-30 | 2022-12-16 | 株式会社マキタ | 電力供給システム |
Family Cites Families (13)
Publication number | Priority date | Publication date | Assignee | Title |
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DE69402281T2 (de) * | 1993-09-17 | 1997-09-04 | Essilor Int | Verfahren und Gerät zur absoluten Messung der geometrischen oder optischen Struktur eines optischen Bestandteiles |
EP0822440B1 (en) * | 1996-01-10 | 2003-12-03 | Kabushiki Kaisha Topcon | Layout judgement apparatus and layout judgement system |
JPH10274591A (ja) * | 1997-01-29 | 1998-10-13 | Naitsu:Kk | 透明物体の拡大観察装置 |
US8143600B2 (en) * | 2008-02-18 | 2012-03-27 | Visiongate, Inc. | 3D imaging of live cells with ultraviolet radiation |
EP2489467A1 (de) * | 2011-02-15 | 2012-08-22 | Schneider GmbH & Co. KG | Vorrichtung und Verfahren zum Bearbeiten einer optischen Linse mit einer Vorrichtung zur optischen Erfassung des Übergangs des Linsenmaterials zum Block- oder Folienmaterial zur Bestimmung des Randkantenverlaufs der Linse |
KR102166189B1 (ko) * | 2013-10-08 | 2020-10-15 | 이미지 비전 피티이. 리미티드 | 습식 안과 렌즈 검사 시스템 및 방법 |
CN106537110A (zh) * | 2014-05-15 | 2017-03-22 | 伊麦视觉私人有限公司 | 用于检查眼镜镜片的系统和方法 |
SG10201501672PA (en) * | 2015-03-05 | 2016-10-28 | Emage Vision Pte Ltd | Inspection of sealing quality in blister packages |
SG10201509497VA (en) * | 2015-11-18 | 2017-06-29 | Emage Vision Pte Ltd | Contact lens defect inspection using uv illumination |
US9961253B2 (en) * | 2016-05-03 | 2018-05-01 | Mitutoyo Corporation | Autofocus system for a high speed periodically modulated variable focal length lens |
SG10201701099XA (en) * | 2017-02-10 | 2018-09-27 | Emage Vision Pte Ltd | Contact lens inspection in a plastic shell |
US9970884B1 (en) * | 2017-04-28 | 2018-05-15 | Hong Kong Applied Science and Technology Research Institute Company Limited | Apparatus and a method for inspecting a light transmissive optical component |
SG10201803290VA (en) * | 2018-04-19 | 2019-11-28 | Emage Vision Pte Ltd | System and method for inspecting optical power and thickness of ophthalmic lenses immersed in a solution |
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2021
- 2021-10-14 JP JP2021169140A patent/JP7309225B2/ja active Active
- 2021-10-14 KR KR1020210136953A patent/KR20220049481A/ko active Search and Examination
- 2021-10-14 TW TW110138202A patent/TW202235860A/zh unknown
- 2021-10-14 CN CN202111200256.3A patent/CN114429444A/zh active Pending
- 2021-10-14 US US17/501,368 patent/US11796418B2/en active Active
- 2021-10-14 DE DE102021211596.9A patent/DE102021211596A1/de active Pending
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2023
- 2023-06-28 JP JP2023105994A patent/JP7510215B2/ja active Active
Patent Citations (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2008180722A (ja) | 1994-06-14 | 2008-08-07 | Visionix Ltd | 光要素をマッピングするための装置 |
JP7190885B2 (ja) | 2018-11-30 | 2022-12-16 | 株式会社マキタ | 電力供給システム |
Also Published As
Publication number | Publication date |
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JP7510215B2 (ja) | 2024-07-03 |
TW202235860A (zh) | 2022-09-16 |
KR20220049481A (ko) | 2022-04-21 |
US20220178787A1 (en) | 2022-06-09 |
CN114429444A (zh) | 2022-05-03 |
DE102021211596A1 (de) | 2022-04-14 |
JP2022064881A (ja) | 2022-04-26 |
US11796418B2 (en) | 2023-10-24 |
JP2023131173A (ja) | 2023-09-21 |
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