JP2022054974A5 - - Google Patents

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Publication number
JP2022054974A5
JP2022054974A5 JP2020162284A JP2020162284A JP2022054974A5 JP 2022054974 A5 JP2022054974 A5 JP 2022054974A5 JP 2020162284 A JP2020162284 A JP 2020162284A JP 2020162284 A JP2020162284 A JP 2020162284A JP 2022054974 A5 JP2022054974 A5 JP 2022054974A5
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JP
Japan
Prior art keywords
end surface
contact
pressure
sample chamber
sample
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Application number
JP2020162284A
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English (en)
Japanese (ja)
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JP7412770B2 (ja
JP2022054974A (ja
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Priority claimed from JP2020162284A external-priority patent/JP7412770B2/ja
Priority to JP2020162284A priority Critical patent/JP7412770B2/ja
Priority to EP21198405.9A priority patent/EP3974820B1/en
Priority to US17/482,591 priority patent/US11913891B2/en
Priority to KR1020210126151A priority patent/KR102897370B1/ko
Priority to CN202111132714.4A priority patent/CN114280091A/zh
Publication of JP2022054974A publication Critical patent/JP2022054974A/ja
Publication of JP2022054974A5 publication Critical patent/JP2022054974A5/ja
Publication of JP7412770B2 publication Critical patent/JP7412770B2/ja
Application granted granted Critical
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JP2020162284A 2020-09-28 2020-09-28 加圧分析用構造体、ｘ線回折装置及び加圧分析システム Active JP7412770B2 (ja)

Priority Applications (5)

Application Number Priority Date Filing Date Title
JP2020162284A JP7412770B2 (ja) 2020-09-28 2020-09-28 加圧分析用構造体、ｘ線回折装置及び加圧分析システム
EP21198405.9A EP3974820B1 (en) 2020-09-28 2021-09-23 Structure for pressurization analysis, x-ray diffraction apparatus and pressurization analysis system
US17/482,591 US11913891B2 (en) 2020-09-28 2021-09-23 Structure for pressurization analysis, X-ray diffraction apparatus and pressurization analysis system
KR1020210126151A KR102897370B1 (ko) 2020-09-28 2021-09-24 가압 분석용 구조체, x선 회절 장치 및 가압 분석 시스템
CN202111132714.4A CN114280091A (zh) 2020-09-28 2021-09-27 加压分析用结构体、x射线衍射装置及加压分析系统

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2020162284A JP7412770B2 (ja) 2020-09-28 2020-09-28 加圧分析用構造体、ｘ線回折装置及び加圧分析システム

Publications (3)

Publication Number Publication Date
JP2022054974A JP2022054974A (ja) 2022-04-07
JP2022054974A5 true JP2022054974A5 (enExample) 2022-12-13
JP7412770B2 JP7412770B2 (ja) 2024-01-15

Family

ID=77910632

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2020162284A Active JP7412770B2 (ja) 2020-09-28 2020-09-28 加圧分析用構造体、ｘ線回折装置及び加圧分析システム

Country Status (5)

Country Link
US (1) US11913891B2 (enExample)
EP (1) EP3974820B1 (enExample)
JP (1) JP7412770B2 (enExample)
KR (1) KR102897370B1 (enExample)
CN (1) CN114280091A (enExample)

Families Citing this family (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR20250094363A (ko) * 2023-12-18 2025-06-25 삼성에스디아이 주식회사 전고체 이차 전지의 검사 시스템 및 방법
JP2025143861A (ja) * 2024-03-19 2025-10-02 株式会社リガク 電池分析用構造体
WO2025248653A1 (ja) * 2024-05-29 2025-12-04 日産自動車株式会社 電池モジュールの検査方法及び検査装置

Family Cites Families (12)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH09166528A (ja) * 1995-12-15 1997-06-24 Rigaku Corp Ｘ線装置の試料格納容器
US7022290B2 (en) * 2001-06-19 2006-04-04 Rutgers, The State University System structure for in situ x-ray study of electrochemical cell component performance
JP4128397B2 (ja) * 2002-06-12 2008-07-30 東芝Ｉｔコントロールシステム株式会社 電池検査装置
JP5220581B2 (ja) * 2008-12-24 2013-06-26 本田技研工業株式会社 Ｘ線解析装置
JP2012159311A (ja) * 2011-01-29 2012-08-23 Rigaku Corp Ｘ線測定用電池構造体及びその支持装置
JP2016143528A (ja) * 2015-01-30 2016-08-08 株式会社日立ハイテクサイエンス 試料搬送機構及び真空装置
TW201703064A (zh) * 2015-04-24 2017-01-16 Littelfuse Japan G K 保護元件
JP2017072530A (ja) * 2015-10-09 2017-04-13 ソニー株式会社 分析用セル及び分析用セル組立体
CN209656593U (zh) * 2018-12-14 2019-11-19 深圳先进技术研究院 电池原位x射线衍射测试辅助装置
CN110806419B (zh) * 2019-11-29 2025-04-15 散裂中子源科学中心 一种用于中子散射的高压容器实验装置
CN111721752A (zh) * 2020-07-29 2020-09-29 中山大学 一种拉曼与质谱联用的原位检测密封电解池装置及方法
CN112436204B (zh) * 2020-11-25 2022-04-05 中山大学 一种可原位测试x射线衍射和质谱分析的电池装置与方法

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