JP2021523562A5 - - Google Patents

Info

Publication number
JP2021523562A5
JP2021523562A5 JP2020561720A JP2020561720A JP2021523562A5 JP 2021523562 A5 JP2021523562 A5 JP 2021523562A5 JP 2020561720 A JP2020561720 A JP 2020561720A JP 2020561720 A JP2020561720 A JP 2020561720A JP 2021523562 A5 JP2021523562 A5 JP 2021523562A5
Authority
JP
Japan
Prior art keywords
optical
mirror
laser
characterization apparatus
cavity
Prior art date
Application number
JP2020561720A
Other languages
English (en)
Japanese (ja)
Other versions
JPWO2019212735A5 (https=
JP2021523562A (ja
Filing date
Publication date
Application filed filed Critical
Priority claimed from PCT/US2019/027534 external-priority patent/WO2019212735A1/en
Publication of JP2021523562A publication Critical patent/JP2021523562A/ja
Publication of JP2021523562A5 publication Critical patent/JP2021523562A5/ja
Publication of JPWO2019212735A5 publication Critical patent/JPWO2019212735A5/ja
Pending legal-status Critical Current

Links

JP2020561720A 2018-05-03 2019-04-15 光学素子の特徴付け Pending JP2021523562A (ja)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
US201862666677P 2018-05-03 2018-05-03
US62/666,677 2018-05-03
PCT/US2019/027534 WO2019212735A1 (en) 2018-05-03 2019-04-15 Characterizing an optical element

Publications (3)

Publication Number Publication Date
JP2021523562A JP2021523562A (ja) 2021-09-02
JP2021523562A5 true JP2021523562A5 (https=) 2022-04-25
JPWO2019212735A5 JPWO2019212735A5 (https=) 2022-04-25

Family

ID=66429564

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2020561720A Pending JP2021523562A (ja) 2018-05-03 2019-04-15 光学素子の特徴付け

Country Status (11)

Country Link
US (2) US11128098B2 (https=)
EP (1) EP3788684A1 (https=)
JP (1) JP2021523562A (https=)
KR (1) KR20210005215A (https=)
CN (1) CN112166534A (https=)
AU (1) AU2019262767A1 (https=)
BR (1) BR112020021337A2 (https=)
CA (1) CA3098712A1 (https=)
MX (1) MX2020011617A (https=)
TW (1) TW201947207A (https=)
WO (1) WO2019212735A1 (https=)

Families Citing this family (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US10732105B1 (en) * 2019-02-15 2020-08-04 Agilent Technologies, Inc. Method and apparatus for characterizing laser gain chips
CN113375914B (zh) * 2021-06-04 2022-09-02 哈尔滨工程大学 一种用于激光板条面检测的光斑强度分布获取方法
JP7789508B2 (ja) * 2021-08-19 2025-12-22 株式会社ディスコ パルス幅計測治具
WO2024214298A1 (ja) * 2023-04-14 2024-10-17 ギガフォトン株式会社 レーザ装置及び光学素子の劣化判定方法
CN116780336B (zh) * 2023-06-25 2024-02-09 重庆师范大学 利用半导体材料非线性效应实现自锁模的超快紫外激光器

Family Cites Families (44)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP3163779B2 (ja) * 1992-09-22 2001-05-08 松下電器産業株式会社 レーザー装置
US5814565A (en) 1995-02-23 1998-09-29 University Of Utah Research Foundation Integrated optic waveguide immunosensor
JPH09260753A (ja) * 1996-03-25 1997-10-03 Ando Electric Co Ltd 外部共振器型波長可変光源
JPH09289347A (ja) * 1996-04-23 1997-11-04 Mitsubishi Electric Corp レーザ装置
JP3022437B2 (ja) * 1997-09-25 2000-03-21 日本電気株式会社 モード同期半導体レーザ
JP3197869B2 (ja) * 1998-03-31 2001-08-13 アンリツ株式会社 波長可変レーザ光源装置
US6795198B1 (en) * 1998-05-28 2004-09-21 Martin Fuchs Method and device for measuring thin films and semiconductor substrates using reflection mode geometry
US6787308B2 (en) 1998-07-30 2004-09-07 Solexa Ltd. Arrayed biomolecules and their use in sequencing
US6252892B1 (en) * 1998-09-08 2001-06-26 Imra America, Inc. Resonant fabry-perot semiconductor saturable absorbers and two photon absorption power limiters
US7175811B2 (en) 2000-04-28 2007-02-13 Edgelight Biosciences Micro-array evanescent wave fluorescence detection device
US6917726B2 (en) 2001-09-27 2005-07-12 Cornell Research Foundation, Inc. Zero-mode clad waveguides for performing spectroscopy with confined effective observation volumes
US6504967B1 (en) * 2000-06-02 2003-01-07 Calient Networks, Inc. Passive alignment method and apparatus for fabricating a MEMS device
FR2813121A1 (fr) 2000-08-21 2002-02-22 Claude Weisbuch Dispositif perfectionne de support d'elements chromophores
WO2002045219A1 (en) * 2000-11-29 2002-06-06 Ron Nagar Tunable laser
US6781734B2 (en) * 2001-03-30 2004-08-24 Santur Corporation Modulator alignment for laser
US6980572B2 (en) * 2002-05-28 2005-12-27 The Regents Of The University Of California Wavelength selectable light source
US7738086B2 (en) 2005-05-09 2010-06-15 The Trustees Of Columbia University In The City Of New York Active CMOS biosensor chip for fluorescent-based detection
US7991024B2 (en) * 2005-07-01 2011-08-02 Nec Corporation External cavity wavelength tunable laser device and optical output module
US7426322B2 (en) 2005-07-20 2008-09-16 Searete Llc. Plasmon photocatalysis
US20070046934A1 (en) * 2005-08-26 2007-03-01 New Wave Research, Inc. Multi-function laser induced breakdown spectroscopy and laser ablation material analysis system and method
US8975216B2 (en) 2006-03-30 2015-03-10 Pacific Biosciences Of California Articles having localized molecules disposed thereon and methods of producing same
JP4478800B2 (ja) * 2006-05-15 2010-06-09 独立行政法人産業技術総合研究所 クロック伝送装置
US8207509B2 (en) 2006-09-01 2012-06-26 Pacific Biosciences Of California, Inc. Substrates, systems and methods for analyzing materials
EP3936857B1 (en) 2006-09-01 2023-06-21 Pacific Biosciences Of California, Inc. Substrates, systems and methods for analyzing materials
FR2908888B1 (fr) 2006-11-21 2012-08-03 Centre Nat Rech Scient Dispositif pour la detection exaltee de l'emission d'une particule cible
US7599048B2 (en) * 2007-02-09 2009-10-06 Wafermasters, Inc. Optical emission spectroscopy process monitoring and material characterization
WO2009082706A1 (en) 2007-12-21 2009-07-02 The Trustees Of Columbia University In The City Of New York Active cmos sensor array for electrochemical biomolecular detection
WO2009102949A2 (en) * 2008-02-13 2009-08-20 Xitronix Corporation Method and apparatus of z-scan photoreflectance characterization
WO2009137494A1 (en) * 2008-05-05 2009-11-12 Applied Spectra, Inc. Laser ablation apparatus and method
CA2737505C (en) 2008-09-16 2017-08-29 Pacific Biosciences Of California, Inc. Substrates and optical systems and methods of use thereof
US8160113B2 (en) * 2009-07-21 2012-04-17 Mobius Photonics, Inc. Tailored pulse burst
US8278728B2 (en) 2009-10-17 2012-10-02 Florida Institute Of Technology Array of concentric CMOS photodiodes for detection and de-multiplexing of spatially modulated optical channels
CN102985803A (zh) 2010-02-19 2013-03-20 加利福尼亚太平洋生物科学股份有限公司 集成的分析系统和方法
JP5368360B2 (ja) 2010-04-09 2013-12-18 浜松ホトニクス株式会社 パルスファイバレーザ装置
US8865078B2 (en) 2010-06-11 2014-10-21 Industrial Technology Research Institute Apparatus for single-molecule detection
CA2856163C (en) 2011-10-28 2019-05-07 Illumina, Inc. Microarray fabrication system and method
US9606060B2 (en) 2012-01-13 2017-03-28 California Institute Of Technology Filterless time-domain detection of one or more fluorophores
US9372308B1 (en) 2012-06-17 2016-06-21 Pacific Biosciences Of California, Inc. Arrays of integrated analytical devices and methods for production
US9223084B2 (en) 2012-12-18 2015-12-29 Pacific Biosciences Of California, Inc. Illumination of optical analytical devices
US20150016479A1 (en) * 2013-07-12 2015-01-15 Coherent Kaiserslautern GmbH Laser apparatus with beam translation
US9765395B2 (en) 2014-04-28 2017-09-19 Nanomedical Diagnostics, Inc. System and method for DNA sequencing and blood chemistry analysis
CN104242051B (zh) * 2014-09-18 2017-05-10 武汉光迅科技股份有限公司 一种外腔可调谐激光器以及其腔模锁定方法
US9666748B2 (en) 2015-01-14 2017-05-30 International Business Machines Corporation Integrated on chip detector and zero waveguide module structure for use in DNA sequencing
EP3271762B1 (en) 2015-03-16 2023-01-04 Pacific Biosciences of California, Inc. Analytical system comprising integrated devices and systems for free-space optical coupling

Similar Documents

Publication Publication Date Title
JP2021523562A5 (https=)
US10310085B2 (en) Photonic integrated distance measuring pixel and method of distance measurement
US8456640B2 (en) Apparatus and method for measuring reflectance of optical laser components
US7679750B2 (en) Cavity ring-down apparatus and method for measuring reflectivity of highly reflective mirrors
CN107132029B (zh) 一种同时测量高反射/高透射光学元件的反射率、透过率、散射损耗和吸收损耗的方法
CN103308903B (zh) 一种激光测距机的测距精度测试装置及方法
CN107884079B (zh) 单发次超短激光脉冲宽度测量装置及测量方法
CN103454074B (zh) 一种小孔径高反镜反射率测量方法
US20060192975A1 (en) Surface shape measuring apparatus
JP6793033B2 (ja) 測距装置
US20150139638A1 (en) System and method of estimating beam mode content for waveguide alignment
KR101630731B1 (ko) 변위센서를 이용한 휴대폰 카메라의 틸트 및 성능 측정시스템
CN104297598B (zh) 一种vcsel的多参数测试装置及方法
CN113412561B (zh) 表征激光增益芯片的方法和装置
US9052179B2 (en) Optical coherence tomography apparatus and method
CN102252828A (zh) 一种监测高反射光学元件在激光辐照下反射率实时变化的方法
JPWO2019212735A5 (https=)
CN107687935A (zh) 一种高反射腔镜透过率的标定方法
CN110579284B (zh) 一种干涉式激光波长测量装置及其使用方法
CN104505708A (zh) 一种垂直腔面发射激光器组件
US20120316830A1 (en) Coupled multi-wavelength confocal systems for distance measurements
KR101282932B1 (ko) 가시도 향상 저결맞음 간섭계
JP4794573B2 (ja) 光学プローブ並びにその製造装置及び方法
Fatadin et al. Accurate magnified near-field measurement of optical waveguides using a calibrated CCD camera
Herper et al. VECSEL for 3D LiDAR applications