JP2021009890A - 電子部品および電子部品の製造方法および検査方法、機器 - Google Patents
電子部品および電子部品の製造方法および検査方法、機器 Download PDFInfo
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- 238000004519 manufacturing process Methods 0.000 title claims description 7
- 238000007689 inspection Methods 0.000 title claims description 6
- 229920005989 resin Polymers 0.000 claims abstract description 246
- 239000011347 resin Substances 0.000 claims abstract description 246
- 230000002093 peripheral effect Effects 0.000 claims abstract description 44
- 239000000463 material Substances 0.000 claims description 56
- 239000007788 liquid Substances 0.000 claims description 26
- 125000006850 spacer group Chemical group 0.000 claims description 25
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- 238000001723 curing Methods 0.000 description 4
- 238000006073 displacement reaction Methods 0.000 description 4
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- 238000009826 distribution Methods 0.000 description 3
- 238000007789 sealing Methods 0.000 description 3
- 239000004065 semiconductor Substances 0.000 description 3
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- 238000000576 coating method Methods 0.000 description 2
- 239000004973 liquid crystal related substance Substances 0.000 description 2
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- 229920001187 thermosetting polymer Polymers 0.000 description 2
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- 238000004458 analytical method Methods 0.000 description 1
- 239000000919 ceramic Substances 0.000 description 1
- 239000011248 coating agent Substances 0.000 description 1
- 238000007796 conventional method Methods 0.000 description 1
- 230000000694 effects Effects 0.000 description 1
- 238000005401 electroluminescence Methods 0.000 description 1
- 239000003822 epoxy resin Substances 0.000 description 1
- 239000000945 filler Substances 0.000 description 1
- 238000010438 heat treatment Methods 0.000 description 1
- 239000012212 insulator Substances 0.000 description 1
- 238000000691 measurement method Methods 0.000 description 1
- 238000002156 mixing Methods 0.000 description 1
- 238000012986 modification Methods 0.000 description 1
- 230000004048 modification Effects 0.000 description 1
- 229920000647 polyepoxide Polymers 0.000 description 1
- 238000003892 spreading Methods 0.000 description 1
- 239000000126 substance Substances 0.000 description 1
- 238000002834 transmittance Methods 0.000 description 1
- 238000011282 treatment Methods 0.000 description 1
- 238000009281 ultraviolet germicidal irradiation Methods 0.000 description 1
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Abstract
Description
次に図5(a)に示す様に、対向板20を貼り合せる。詳細には、対向板20を素子板10の上方まで移動させたのち、対向板20の自重もしくは、制御された力でスペーサ60に接するまで移動させる。第一実施形態では、対向板20と素子板10のそれぞれの位置を機械的に移動することでギャップが制御されるが、本実施形態では、スペーサ60によりギャップが制御される。樹脂部材30となる液体の樹脂材料31を配置した後であって、対向板20を配置する前には、樹脂部材40となる樹脂材料41は球状のスペーサ60を内包する液体である。これにより、スペーサ60により素子板10と対向板20の間隔を制御できる。仮に、樹脂材料41が固体の樹脂部材40であると、樹脂部材40の厚みによって素子板10と対向板20の間隔が規定される可能性があるため、スペーサ60を用いる効果が低下する。
20 対向板
100 機能素子
50 素子領域
70 周辺領域
30 樹脂部材
40 樹脂部材
EC 電子部品
Claims (20)
- 機能素子が設けられた素子領域および前記素子領域の周囲に配された周辺領域と、を備える素子板と、
前記素子領域および前記周辺領域に対向する対向板と、
前記素子領域および前記周辺領域の少なくとも一方と前記対向板との間に配置された第1樹脂部材と、
前記周辺領域と前記対向板との間に配置された第2樹脂部材と、
を備え、
前記第2樹脂部材の屈折率と前記対向板の屈折率との差が0.2以上であることを特徴とする電子部品。 - 前記第1樹脂部材と前記対向板の前記屈折率との差が0.1以下である、請求項1に記載の電子部品。
- 前記第2樹脂部材は、各々が互いに離間して設けられた第1部材と第2部材と第3部材とを含み、前記第1部材と前記第2部材とを結ぶ直線上に前記第3部材が位置しない、請求項1または2に記載の電子部品。
- 前記第2樹脂部材は、各々が互いに離間して設けられた第1部材と第2部材と第3部材とを含み、前記第1部材と前記第2部材とを結ぶ直線上に前記第3部材が位置する、請求項1または2に記載の電子部品。
- 前記第2樹脂部材は、各々が互いに離間して設けられた第1部材と第2部材と第3部材とを含み、前記第1部材と前記第2部材とを結ぶ円弧上に前記第3部材が位置する、請求項1または2に記載の電子部品。
- 前記素子板と前記対向板との間にはスペーサが設けられており、前記スペーサは前記第2樹脂部材に覆われている、請求項1乃至5のいずれか1項に記載の電子部品。
- 前記第1樹脂部材は前記素子領域および前記周辺領域と前記対向板との間に配置されており、前記第2樹脂部材は前記第1樹脂部材で囲まれている、請求項1乃至5のいずれか1項に記載の電子部品。
- 前記第1樹脂部材は少なくとも前記素子領域に設けられており、
前記周辺領域と前記対向板との間に配置された第3樹脂部材を更に備え、
前記第3樹脂部材の屈折率と前記対向板の前記屈折率との差は、前記第1樹脂部材の前記屈折率と前記対向板の前記屈折率との差よりも大きく、かつ、前記第2樹脂部材の前記屈折率と前記対向板の前記屈折率との差よりも小さい、請求項1乃至7のいずれか1項に記載の電子部品。 - 前記素子板は前記対向板に対向しない領域を有する、請求項1乃至8のいずれか1項に記載の電子部品。
- 前記第1樹脂部材および前記第2樹脂部材は前記対向板に接する、請求項1乃至9のいずれか1項に記載の電子部品。
- 前記機能素子は表示素子である、請求項1乃至10のいずれか1項に記載の電子部品。
- 前記機能素子は撮像素子である、請求項1乃至10のいずれか1項に記載の電子部品。
- 前記対向板はガラス基板を含む、請求項1乃至12のいずれか1項に記載の電子部品。
- 前記素子板はシリコン基板を含む、請求項1乃至13のいずれか1項に記載の電子部品。
- 前記素子領域と前記第1樹脂部材との間にカラーフィルタアレイが設けられている、請求項1乃至14のいずれか1項に記載の電子部品。
- 前記素子領域と前記第1樹脂部材との間にマイクロレンズアレイが設けられている、請求項1乃至15のいずれか1項に記載の電子部品。
- 請求項1乃至16のいずれか1項に記載の電子部品と、
前記電子部品に接続された配線部品と、
前記電子部品に前記配線部品を介して接続された回路部品と、を備える機器。 - 機能素子が設けられた素子領域および前記素子領域の周囲に配された周辺領域と、を備える素子板を用意する工程と、
前記周辺領域の上に第1樹脂材料を配置する工程と、
前記素子領域の上に液体の第2樹脂材料を配置する工程と、
前記素子領域および前記周辺領域に対向する対向板が前記第1樹脂材料および前記第2樹脂材料に接触するように配置した後に、前記第2樹脂材料を流動させて前記第2樹脂材料を前記第1樹脂材料に接触させる工程と、
前記第2樹脂材料を硬化する工程と、
を有ることを特徴とする電子部品の製造方法。 - 前記対向板を配置する前には、前記第1樹脂材料は球状のスペーサを内包する液体であり、前記対向板を配置したあとに、前記第1樹脂材料を硬化する、請求項18に記載の電子部品の製造方法。
- 請求項1乃至16のいずれか1項に記載の電子部品を用意し、
前記対向板および前記第2樹脂部材を介して前記素子板に光を照射し、
前記素子板と前記第2樹脂部材との間での反射光と、前記対向板と前記第2樹脂部材との間での反射光から、前記対向板と前記素子板のギャップを測定することを特徴とする電子部品の検査方法。
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JP2017134886A (ja) | 2014-06-19 | 2017-08-03 | パナソニックIpマネジメント株式会社 | 発光装置 |
JP2016138992A (ja) | 2015-01-27 | 2016-08-04 | Jsr株式会社 | 液晶表示素子および感放射線性樹脂組成物 |
JP2019029137A (ja) | 2017-07-27 | 2019-02-21 | 双葉電子工業株式会社 | 有機el表示装置 |
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JP2004152664A (ja) * | 2002-10-31 | 2004-05-27 | Seiko Epson Corp | 表示パネル及びその表示パネルを備えた電子機器並びに表示パネルの製造方法 |
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WO2014148276A1 (ja) * | 2013-03-18 | 2014-09-25 | ソニー株式会社 | 半導体装置、電子機器 |
WO2015115553A1 (ja) * | 2014-01-29 | 2015-08-06 | 日立化成株式会社 | 接着剤組成物、接着剤組成物を用いた半導体装置の製造方法、及び固体撮像素子 |
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