JP2021001887A5 - - Google Patents

Download PDF

Info

Publication number
JP2021001887A5
JP2021001887A5 JP2020107072A JP2020107072A JP2021001887A5 JP 2021001887 A5 JP2021001887 A5 JP 2021001887A5 JP 2020107072 A JP2020107072 A JP 2020107072A JP 2020107072 A JP2020107072 A JP 2020107072A JP 2021001887 A5 JP2021001887 A5 JP 2021001887A5
Authority
JP
Japan
Prior art keywords
image
sample
determining
structure factor
phase
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP2020107072A
Other languages
English (en)
Japanese (ja)
Other versions
JP7374860B2 (ja
JP2021001887A (ja
Filing date
Publication date
Priority claimed from US16/450,321 external-priority patent/US10935506B2/en
Application filed filed Critical
Publication of JP2021001887A publication Critical patent/JP2021001887A/ja
Publication of JP2021001887A5 publication Critical patent/JP2021001887A5/ja
Application granted granted Critical
Publication of JP7374860B2 publication Critical patent/JP7374860B2/ja
Active legal-status Critical Current
Anticipated expiration legal-status Critical

Links

JP2020107072A 2019-06-24 2020-06-22 分子構造を決定するための方法およびシステム Active JP7374860B2 (ja)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US16/450321 2019-06-24
US16/450,321 US10935506B2 (en) 2019-06-24 2019-06-24 Method and system for determining molecular structure

Publications (3)

Publication Number Publication Date
JP2021001887A JP2021001887A (ja) 2021-01-07
JP2021001887A5 true JP2021001887A5 (https=) 2023-06-07
JP7374860B2 JP7374860B2 (ja) 2023-11-07

Family

ID=71614674

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2020107072A Active JP7374860B2 (ja) 2019-06-24 2020-06-22 分子構造を決定するための方法およびシステム

Country Status (4)

Country Link
US (1) US10935506B2 (https=)
EP (1) EP3764091B1 (https=)
JP (1) JP7374860B2 (https=)
CN (1) CN112129795B (https=)

Families Citing this family (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US11499926B2 (en) * 2020-06-30 2022-11-15 Fei Company Method for diffraction pattern acquisition
JP2024075799A (ja) * 2021-03-24 2024-06-05 国立研究開発法人理化学研究所 ３次元像観察装置、及び方法
US11988618B2 (en) * 2021-03-31 2024-05-21 Fei Company Method and system to determine crystal structure
US11694874B2 (en) * 2021-07-13 2023-07-04 Fei Company Method and system for generating a diffraction image
TWI783896B (zh) 2022-04-08 2022-11-11 國立清華大學 用於輕元素薄膜的三維影像重建方法及系統
CN120142345B (zh) * 2025-04-07 2025-12-12 上海交通大学 单晶材料的三维中子衍射数据处理方法及系统

Family Cites Families (18)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5353236A (en) * 1992-04-23 1994-10-04 The Board Of Trustees Of The Leland Stanford University High-resolution crystallographic modelling of a macromolecule
JP3335680B2 (ja) * 1992-11-12 2002-10-21 健太郎 山口 三次元分子構造解析法
US6438205B1 (en) 2000-05-08 2002-08-20 Accelrys Inc. System and method for reducing phase ambiguity of crystal structure factors
AU8292901A (en) 2000-07-20 2002-02-05 Jonathan M Friedman A method for ab initio determination of macromolecular crystallographic phases at moderate resolution by symmetry-enforced orthogonal multicenter spherical harmonic-spherical bessel expansion
GB0115714D0 (en) 2001-06-27 2001-08-22 Imperial College Structure determination of macromolecules
US7576325B2 (en) * 2004-05-20 2009-08-18 National University Corporation Hokkaido University Electron microscopic method and electron microscope using same
JP4726048B2 (ja) * 2005-05-27 2011-07-20 株式会社日立製作所 位相回復方式の電子顕微鏡による観察方法
US8131481B2 (en) * 2007-05-03 2012-03-06 State Of Oregon Acting By And Through The State Board Of Higher Education On Behalf Of Portland State University Database supported nanocrystal structure identification by lattice-fringe fingerprinting with structure factor extraction
GB0709796D0 (en) * 2007-05-22 2007-06-27 Phase Focus Ltd Three dimensional imaging
US8076640B2 (en) * 2009-08-27 2011-12-13 Max-Planck-Gesellschaft Zur Foerderung Der Wissenschaften E.V. Method and device for measuring electron diffraction of a sample
JP2010117365A (ja) * 2010-02-10 2010-05-27 Japan Synchrotron Radiation Research Inst 構造因子テンソル要素決定法及びそのためのｘ線回折装置利用法
EP2402976A1 (en) * 2010-06-30 2012-01-04 Fei Company Method of electron diffraction tomography
EP2485239A1 (en) * 2011-02-07 2012-08-08 FEI Company Method for centering an optical element in a TEM comprising a contrast enhancing element
GB201302624D0 (en) * 2013-02-14 2013-04-03 Univ Antwerpen High-resolution amplitude contrast imaging
US9279777B2 (en) * 2013-08-06 2016-03-08 International Business Machines Corporation Analyzing strain distribution in semiconductor structures using nano-beam diffraction
US9978557B2 (en) * 2016-04-21 2018-05-22 Fei Company System for orienting a sample using a diffraction pattern
KR102149947B1 (ko) * 2017-04-27 2020-09-02 킹 압둘라 유니버시티 오브 사이언스 앤드 테크놀로지 투과 전자 현미경 샘플 정렬 시스템 및 방법
EP3444836B1 (en) * 2017-08-17 2020-01-29 FEI Company Diffraction pattern detection in a transmission charged particle microscope

Similar Documents

Publication Publication Date Title
JP2021001887A5 (https=)
RU2619839C1 (ru) Способ исследования с помощью кт и устройство для кт
CN107631995B (zh) 一种三维太赫兹层析成像系统及扫描和图像重建方法
EP2718936B1 (en) Multiple focal spot x-ray radiation filtering
CN107095690B (zh) 一种跟踪x光源焦点位置的装置、系统及方法
JP2019529017A5 (https=)
CN116075763B (zh) 估计样品中发射体位置的方法、器件、显微镜和计算机程序
JP2021163753A5 (https=)
CN112129795B (zh) 用于确定分子结构的方法和系统
CN114062331A (zh) 调整在显微镜中使用的估计器的方法、计算机程序和装置
RU2016119367A (ru) Рентгеновская система, в частности система томосинтеза и способ получения изображения объекта
US12097389B2 (en) Techniques for skin illumination of radiation therapy treatment region using non-coaxial digital projector
Castón Conventional electron microscopy, cryo-electron microscopy and cryo-electron tomography of viruses
US20250127473A1 (en) Device and method to reconstruct three dimensional shape of vessel
CN110133014A (zh) 一种芯片内部缺陷检测方法及系统
EP3773211A1 (en) Device, system and method for controlling a position of an anti-scatter grid in an x-ray image acquisition system
CN106535770B (zh) 多焦斑成像系统
JP7323574B2 (ja) 荷電粒子線装置および画像取得方法
JP7385564B2 (ja) Ｘ線画像化装置
CN113447507A (zh) 一种x射线衍射信号的采集方法、系统、设备及存储介质
JP6638479B2 (ja) イオンビーム照射方法およびイオンビーム照射装置
JPS6365884B2 (https=)
CN106796302B (zh) 用于倾斜角度x射线辐射的x射线探测器设备
CN110101977B (zh) 一种实现医用直线加速器位置校准的方法及装置
KR101214377B1 (ko) 교정 팬텀을 이용한 엑스선 초점 위치 교정 방법