JP2020535666A5 - - Google Patents

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Publication number
JP2020535666A5
JP2020535666A5 JP2020538754A JP2020538754A JP2020535666A5 JP 2020535666 A5 JP2020535666 A5 JP 2020535666A5 JP 2020538754 A JP2020538754 A JP 2020538754A JP 2020538754 A JP2020538754 A JP 2020538754A JP 2020535666 A5 JP2020535666 A5 JP 2020535666A5
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JP
Japan
Prior art keywords
processing system
substrate processing
injector assemblies
valve
pulse width
Prior art date
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Application number
JP2020538754A
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English (en)
Japanese (ja)
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JP2020535666A (ja
JP7421482B2 (ja
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Priority claimed from PCT/US2018/052246 external-priority patent/WO2019067323A1/en
Publication of JP2020535666A publication Critical patent/JP2020535666A/ja
Publication of JP2020535666A5 publication Critical patent/JP2020535666A5/ja
Priority to JP2024002916A priority Critical patent/JP7754960B2/ja
Application granted granted Critical
Publication of JP7421482B2 publication Critical patent/JP7421482B2/ja
Active legal-status Critical Current
Anticipated expiration legal-status Critical

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JP2020538754A 2017-09-26 2018-09-21 パルス幅変調されたドーズ制御のためのシステムおよび方法 Active JP7421482B2 (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP2024002916A JP7754960B2 (ja) 2017-09-26 2024-01-12 パルス幅変調されたドーズ制御のためのシステムおよび方法

Applications Claiming Priority (5)

Application Number Priority Date Filing Date Title
US201762563129P 2017-09-26 2017-09-26
US62/563,129 2017-09-26
US201762590815P 2017-11-27 2017-11-27
US62/590,815 2017-11-27
PCT/US2018/052246 WO2019067323A1 (en) 2017-09-26 2018-09-21 DOSE CONTROL SYSTEMS AND METHODS MODULATED BY TIME PULSES

Related Child Applications (1)

Application Number Title Priority Date Filing Date
JP2024002916A Division JP7754960B2 (ja) 2017-09-26 2024-01-12 パルス幅変調されたドーズ制御のためのシステムおよび方法

Publications (3)

Publication Number Publication Date
JP2020535666A JP2020535666A (ja) 2020-12-03
JP2020535666A5 true JP2020535666A5 (enExample) 2021-11-04
JP7421482B2 JP7421482B2 (ja) 2024-01-24

Family

ID=65903780

Family Applications (2)

Application Number Title Priority Date Filing Date
JP2020538754A Active JP7421482B2 (ja) 2017-09-26 2018-09-21 パルス幅変調されたドーズ制御のためのシステムおよび方法
JP2024002916A Active JP7754960B2 (ja) 2017-09-26 2024-01-12 パルス幅変調されたドーズ制御のためのシステムおよび方法

Family Applications After (1)

Application Number Title Priority Date Filing Date
JP2024002916A Active JP7754960B2 (ja) 2017-09-26 2024-01-12 パルス幅変調されたドーズ制御のためのシステムおよび方法

Country Status (8)

Country Link
US (4) US11542598B2 (enExample)
EP (3) EP4235743B1 (enExample)
JP (2) JP7421482B2 (enExample)
KR (3) KR102654894B1 (enExample)
CN (2) CN120854322A (enExample)
SG (1) SG11202002686YA (enExample)
TW (3) TWI829651B (enExample)
WO (1) WO2019067323A1 (enExample)

Families Citing this family (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2019067323A1 (en) 2017-09-26 2019-04-04 Lam Research Corporation DOSE CONTROL SYSTEMS AND METHODS MODULATED BY TIME PULSES
EP4367713A4 (en) * 2021-07-07 2026-02-18 Inficon Inc UPSTREAM PROCESSING MONITORING FOR DEPOSIT AND ENGRAVING ROOMS
US20240203695A1 (en) * 2022-12-16 2024-06-20 Applied Materials, Inc. Fast gas switching
KR20250148210A (ko) 2024-04-05 2025-10-14 주식회사 엘지에너지솔루션 배터리 팩 및 이를 포함하는 자동차

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US6197123B1 (en) * 1997-12-18 2001-03-06 Texas Instruments Incorporated Method for cleaning a process chamber used for manufacturing substrates during nonproduction intervals
JP3830670B2 (ja) * 1998-09-03 2006-10-04 三菱電機株式会社 半導体製造装置
US6348098B1 (en) * 1999-01-20 2002-02-19 Mykrolis Corporation Flow controller
US6143080A (en) * 1999-02-02 2000-11-07 Silicon Valley Group Thermal Systems Llc Wafer processing reactor having a gas flow control system and method
US6706541B1 (en) 1999-10-20 2004-03-16 Advanced Micro Devices, Inc. Method and apparatus for controlling wafer uniformity using spatially resolved sensors
US20040224504A1 (en) * 2000-06-23 2004-11-11 Gadgil Prasad N. Apparatus and method for plasma enhanced monolayer processing
US6333272B1 (en) 2000-10-06 2001-12-25 Lam Research Corporation Gas distribution apparatus for semiconductor processing
US20030116089A1 (en) 2001-12-04 2003-06-26 Walther Steven R. Plasma implantation system and method with target movement
US20030101935A1 (en) * 2001-12-04 2003-06-05 Walther Steven R. Dose uniformity control for plasma doping systems
US20040040502A1 (en) * 2002-08-29 2004-03-04 Micron Technology, Inc. Micromachines for delivering precursors and gases for film deposition
US20040040503A1 (en) * 2002-08-29 2004-03-04 Micron Technology, Inc. Micromachines for delivering precursors and gases for film deposition
US20040050325A1 (en) * 2002-09-12 2004-03-18 Samoilov Arkadii V. Apparatus and method for delivering process gas to a substrate processing system
US7628860B2 (en) * 2004-04-12 2009-12-08 Mks Instruments, Inc. Pulsed mass flow delivery system and method
JP4502189B2 (ja) 2004-06-02 2010-07-14 ルネサスエレクトロニクス株式会社 薄膜の形成方法および半導体装置の製造方法
US7228645B2 (en) * 2005-01-11 2007-06-12 Xuyen Ngoc Pham Multi-zone shower head for drying single semiconductor substrate
US8088223B2 (en) 2005-03-10 2012-01-03 Asm America, Inc. System for control of gas injectors
US7846497B2 (en) 2007-02-26 2010-12-07 Applied Materials, Inc. Method and apparatus for controlling gas flow to a processing chamber
US8486191B2 (en) * 2009-04-07 2013-07-16 Asm America, Inc. Substrate reactor with adjustable injectors for mixing gases within reaction chamber
US9303319B2 (en) * 2010-12-17 2016-04-05 Veeco Instruments Inc. Gas injection system for chemical vapor deposition using sequenced valves
US9840778B2 (en) * 2012-06-01 2017-12-12 Taiwan Semiconductor Manufacturing Company, Ltd. Plasma chamber having an upper electrode having controllable valves and a method of using the same
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US9624805B2 (en) * 2014-08-26 2017-04-18 Caterpillar Inc. Aftertreatment system having dynamic independent injector control
JP6502779B2 (ja) 2015-07-29 2019-04-17 東京エレクトロン株式会社 ガス供給系のバルブのリークを検査する方法
US20170092470A1 (en) 2015-09-28 2017-03-30 Applied Materials, Inc. Plasma reactor for processing a workpiece with an array of plasma point sources
US10256075B2 (en) * 2016-01-22 2019-04-09 Applied Materials, Inc. Gas splitting by time average injection into different zones by fast gas valves
US10453721B2 (en) * 2016-03-15 2019-10-22 Applied Materials, Inc. Methods and assemblies for gas flow ratio control
US10403476B2 (en) 2016-11-09 2019-09-03 Lam Research Corporation Active showerhead
WO2019067323A1 (en) 2017-09-26 2019-04-04 Lam Research Corporation DOSE CONTROL SYSTEMS AND METHODS MODULATED BY TIME PULSES

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