|
JPS61187657U
(https=)
|
1985-05-17 |
1986-11-22 |
|
|
|
JPS6316980A
(ja)
*
|
1986-07-04 |
1988-01-23 |
Fuji Photo Film Co Ltd |
研磨テ−プ
|
|
US5177908A
(en)
*
|
1990-01-22 |
1993-01-12 |
Micron Technology, Inc. |
Polishing pad
|
|
US5489233A
(en)
*
|
1994-04-08 |
1996-02-06 |
Rodel, Inc. |
Polishing pads and methods for their use
|
|
US5958794A
(en)
*
|
1995-09-22 |
1999-09-28 |
Minnesota Mining And Manufacturing Company |
Method of modifying an exposed surface of a semiconductor wafer
|
|
US6206759B1
(en)
|
1998-11-30 |
2001-03-27 |
Micron Technology, Inc. |
Polishing pads and planarizing machines for mechanical or chemical-mechanical planarization of microelectronic-device substrate assemblies, and methods for making and using such pads and machines
|
|
US8485862B2
(en)
*
|
2000-05-19 |
2013-07-16 |
Applied Materials, Inc. |
Polishing pad for endpoint detection and related methods
|
|
US20020090901A1
(en)
|
2000-11-03 |
2002-07-11 |
3M Innovative Properties Company |
Flexible abrasive product and method of making and using the same
|
|
US6612917B2
(en)
*
|
2001-02-07 |
2003-09-02 |
3M Innovative Properties Company |
Abrasive article suitable for modifying a semiconductor wafer
|
|
US6949128B2
(en)
|
2001-12-28 |
2005-09-27 |
3M Innovative Properties Company |
Method of making an abrasive product
|
|
US8864859B2
(en)
*
|
2003-03-25 |
2014-10-21 |
Nexplanar Corporation |
Customized polishing pads for CMP and methods of fabrication and use thereof
|
|
US7160178B2
(en)
|
2003-08-07 |
2007-01-09 |
3M Innovative Properties Company |
In situ activation of a three-dimensional fixed abrasive article
|
|
US7066795B2
(en)
*
|
2004-10-12 |
2006-06-27 |
Applied Materials, Inc. |
Polishing pad conditioner with shaped abrasive patterns and channels
|
|
US7449124B2
(en)
|
2005-02-25 |
2008-11-11 |
3M Innovative Properties Company |
Method of polishing a wafer
|
|
US20070243798A1
(en)
|
2006-04-18 |
2007-10-18 |
3M Innovative Properties Company |
Embossed structured abrasive article and method of making and using the same
|
|
TWI409136B
(zh)
*
|
2006-07-19 |
2013-09-21 |
Innopad Inc |
表面具微溝槽之化學機械平坦化墊
|
|
US20090011679A1
(en)
*
|
2007-04-06 |
2009-01-08 |
Rajeev Bajaj |
Method of removal profile modulation in cmp pads
|
|
JP2009082995A
(ja)
|
2007-09-27 |
2009-04-23 |
Covalent Materials Corp |
ラッピング用研磨布、プラズマエッチング装置用シリコン電極のラッピング方法
|
|
JP5555453B2
(ja)
|
2008-07-24 |
2014-07-23 |
スリーエム イノベイティブ プロパティズ カンパニー |
研磨材製品、その製造方法及び使用方法
|
|
KR101161015B1
(ko)
*
|
2010-09-10 |
2012-07-02 |
신한다이아몬드공업 주식회사 |
Cmp 패드 컨디셔너 및 그 제조방법
|
|
SG11201402224WA
(en)
*
|
2011-11-29 |
2014-09-26 |
Nexplanar Corp |
Polishing pad with foundation layer and polishing surface layer
|
|
KR101389572B1
(ko)
*
|
2012-04-23 |
2014-04-29 |
주식회사 디어포스 |
다방향성 연마돌기를 갖는 연마제품
|
|
JP6188286B2
(ja)
*
|
2012-07-13 |
2017-08-30 |
スリーエム イノベイティブ プロパティズ カンパニー |
研磨パッド及びガラス、セラミックス、及び金属材料の研磨方法
|
|
KR102148050B1
(ko)
*
|
2012-11-06 |
2020-10-14 |
캐보트 마이크로일렉트로닉스 코포레이션 |
오프셋 동심형 그루빙 패턴을 갖는 폴리싱 패드, 및 이로써 기판을 폴리싱하는 방법
|
|
US20150038066A1
(en)
|
2013-07-31 |
2015-02-05 |
Nexplanar Corporation |
Low density polishing pad
|
|
SG11201602206PA
(en)
|
2013-09-25 |
2016-04-28 |
3M Innovative Properties Co |
Composite ceramic abrasive polishing solution
|
|
WO2015048011A1
(en)
|
2013-09-25 |
2015-04-02 |
3M Innovative Properties Company |
Multi-layered polishing pads
|
|
JP2017503670A
(ja)
*
|
2014-01-24 |
2017-02-02 |
スリーエム イノベイティブ プロパティズ カンパニー |
構造化表面を有する研磨材料
|
|
JP6376922B2
(ja)
*
|
2014-02-18 |
2018-08-22 |
株式会社松風 |
歯科用研磨器具
|
|
SG11201608134YA
(en)
*
|
2014-04-03 |
2016-10-28 |
3M Innovative Properties Co |
Polishing pads and systems and methods of making and using the same
|
|
US20150306737A1
(en)
*
|
2014-04-23 |
2015-10-29 |
Taiwan Semiconductor Manufacturing Co., Ltd. |
Chemical mechanical polishing pad
|
|
US10105812B2
(en)
*
|
2014-07-17 |
2018-10-23 |
Applied Materials, Inc. |
Polishing pad configuration and polishing pad support
|
|
US10946495B2
(en)
*
|
2015-01-30 |
2021-03-16 |
Cmc Materials, Inc. |
Low density polishing pad
|
|
US10556316B2
(en)
|
2015-05-13 |
2020-02-11 |
3M Innovative Properties Company |
Polishing pads and systems for and methods of using same
|
|
US9539694B1
(en)
|
2015-06-26 |
2017-01-10 |
Rohm And Haas Electronic Materials Cmp Holdings, Inc. |
Composite polishing layer chemical mechanical polishing pad
|
|
TWI769988B
(zh)
|
2015-10-07 |
2022-07-11 |
美商3M新設資產公司 |
拋光墊與系統及其製造與使用方法
|
|
CN106853610B
(zh)
*
|
2015-12-08 |
2019-11-01 |
中芯国际集成电路制造(北京)有限公司 |
抛光垫及其监测方法和监测系统
|