CN111032285B - 表面突起抛光垫 - Google Patents
表面突起抛光垫 Download PDFInfo
- Publication number
- CN111032285B CN111032285B CN201880054222.8A CN201880054222A CN111032285B CN 111032285 B CN111032285 B CN 111032285B CN 201880054222 A CN201880054222 A CN 201880054222A CN 111032285 B CN111032285 B CN 111032285B
- Authority
- CN
- China
- Prior art keywords
- protrusions
- polishing pad
- article
- major surface
- polishing
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Active
Links
Images
Classifications
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B24—GRINDING; POLISHING
- B24B—MACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
- B24B37/00—Lapping machines or devices; Accessories
- B24B37/11—Lapping tools
- B24B37/20—Lapping pads for working plane surfaces
- B24B37/26—Lapping pads for working plane surfaces characterised by the shape of the lapping pad surface, e.g. grooved
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B24—GRINDING; POLISHING
- B24B—MACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
- B24B37/00—Lapping machines or devices; Accessories
- B24B37/04—Lapping machines or devices; Accessories designed for working plane surfaces
- B24B37/07—Lapping machines or devices; Accessories designed for working plane surfaces characterised by the movement of the work or lapping tool
- B24B37/10—Lapping machines or devices; Accessories designed for working plane surfaces characterised by the movement of the work or lapping tool for single side lapping
- B24B37/105—Lapping machines or devices; Accessories designed for working plane surfaces characterised by the movement of the work or lapping tool for single side lapping the workpieces or work carriers being actively moved by a drive, e.g. in a combined rotary and translatory movement
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B24—GRINDING; POLISHING
- B24B—MACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
- B24B37/00—Lapping machines or devices; Accessories
- B24B37/11—Lapping tools
- B24B37/20—Lapping pads for working plane surfaces
- B24B37/22—Lapping pads for working plane surfaces characterised by a multi-layered structure
Landscapes
- Engineering & Computer Science (AREA)
- Mechanical Engineering (AREA)
- Finish Polishing, Edge Sharpening, And Grinding By Specific Grinding Devices (AREA)
- Mechanical Treatment Of Semiconductor (AREA)
Applications Claiming Priority (3)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US201762550055P | 2017-08-25 | 2017-08-25 | |
| US62/550,055 | 2017-08-25 | ||
| PCT/IB2018/056320 WO2019038675A1 (en) | 2017-08-25 | 2018-08-21 | SURFACE SURFACE SURFACE POLISHING PAD |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| CN111032285A CN111032285A (zh) | 2020-04-17 |
| CN111032285B true CN111032285B (zh) | 2022-07-19 |
Family
ID=65439977
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201880054222.8A Active CN111032285B (zh) | 2017-08-25 | 2018-08-21 | 表面突起抛光垫 |
Country Status (4)
| Country | Link |
|---|---|
| US (1) | US12048980B2 (https=) |
| JP (1) | JP7273796B2 (https=) |
| CN (1) | CN111032285B (https=) |
| WO (1) | WO2019038675A1 (https=) |
Families Citing this family (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| KR20230106863A (ko) * | 2022-01-07 | 2023-07-14 | 삼성전자주식회사 | 연마 패드, 그를 포함하는 화학적 기계적 연마 장치, 및 그를 이용하는 반도체 소자의 제조 방법 |
| US20230219189A1 (en) * | 2022-01-07 | 2023-07-13 | Applied Materials, Inc. | Apparatus and method for selective material removal during polishing |
Family Cites Families (37)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS61187657U (https=) | 1985-05-17 | 1986-11-22 | ||
| JPS6316980A (ja) * | 1986-07-04 | 1988-01-23 | Fuji Photo Film Co Ltd | 研磨テ−プ |
| US5177908A (en) * | 1990-01-22 | 1993-01-12 | Micron Technology, Inc. | Polishing pad |
| US5489233A (en) * | 1994-04-08 | 1996-02-06 | Rodel, Inc. | Polishing pads and methods for their use |
| US5958794A (en) * | 1995-09-22 | 1999-09-28 | Minnesota Mining And Manufacturing Company | Method of modifying an exposed surface of a semiconductor wafer |
| US6206759B1 (en) | 1998-11-30 | 2001-03-27 | Micron Technology, Inc. | Polishing pads and planarizing machines for mechanical or chemical-mechanical planarization of microelectronic-device substrate assemblies, and methods for making and using such pads and machines |
| US8485862B2 (en) * | 2000-05-19 | 2013-07-16 | Applied Materials, Inc. | Polishing pad for endpoint detection and related methods |
| US20020090901A1 (en) | 2000-11-03 | 2002-07-11 | 3M Innovative Properties Company | Flexible abrasive product and method of making and using the same |
| US6612917B2 (en) * | 2001-02-07 | 2003-09-02 | 3M Innovative Properties Company | Abrasive article suitable for modifying a semiconductor wafer |
| US6949128B2 (en) | 2001-12-28 | 2005-09-27 | 3M Innovative Properties Company | Method of making an abrasive product |
| US8864859B2 (en) * | 2003-03-25 | 2014-10-21 | Nexplanar Corporation | Customized polishing pads for CMP and methods of fabrication and use thereof |
| US7160178B2 (en) | 2003-08-07 | 2007-01-09 | 3M Innovative Properties Company | In situ activation of a three-dimensional fixed abrasive article |
| US7066795B2 (en) * | 2004-10-12 | 2006-06-27 | Applied Materials, Inc. | Polishing pad conditioner with shaped abrasive patterns and channels |
| US7449124B2 (en) | 2005-02-25 | 2008-11-11 | 3M Innovative Properties Company | Method of polishing a wafer |
| US20070243798A1 (en) | 2006-04-18 | 2007-10-18 | 3M Innovative Properties Company | Embossed structured abrasive article and method of making and using the same |
| TWI409136B (zh) * | 2006-07-19 | 2013-09-21 | Innopad Inc | 表面具微溝槽之化學機械平坦化墊 |
| US20090011679A1 (en) * | 2007-04-06 | 2009-01-08 | Rajeev Bajaj | Method of removal profile modulation in cmp pads |
| JP2009082995A (ja) | 2007-09-27 | 2009-04-23 | Covalent Materials Corp | ラッピング用研磨布、プラズマエッチング装置用シリコン電極のラッピング方法 |
| JP5555453B2 (ja) | 2008-07-24 | 2014-07-23 | スリーエム イノベイティブ プロパティズ カンパニー | 研磨材製品、その製造方法及び使用方法 |
| KR101161015B1 (ko) * | 2010-09-10 | 2012-07-02 | 신한다이아몬드공업 주식회사 | Cmp 패드 컨디셔너 및 그 제조방법 |
| SG11201402224WA (en) * | 2011-11-29 | 2014-09-26 | Nexplanar Corp | Polishing pad with foundation layer and polishing surface layer |
| KR101389572B1 (ko) * | 2012-04-23 | 2014-04-29 | 주식회사 디어포스 | 다방향성 연마돌기를 갖는 연마제품 |
| JP6188286B2 (ja) * | 2012-07-13 | 2017-08-30 | スリーエム イノベイティブ プロパティズ カンパニー | 研磨パッド及びガラス、セラミックス、及び金属材料の研磨方法 |
| KR102148050B1 (ko) * | 2012-11-06 | 2020-10-14 | 캐보트 마이크로일렉트로닉스 코포레이션 | 오프셋 동심형 그루빙 패턴을 갖는 폴리싱 패드, 및 이로써 기판을 폴리싱하는 방법 |
| US20150038066A1 (en) | 2013-07-31 | 2015-02-05 | Nexplanar Corporation | Low density polishing pad |
| SG11201602206PA (en) | 2013-09-25 | 2016-04-28 | 3M Innovative Properties Co | Composite ceramic abrasive polishing solution |
| WO2015048011A1 (en) | 2013-09-25 | 2015-04-02 | 3M Innovative Properties Company | Multi-layered polishing pads |
| JP2017503670A (ja) * | 2014-01-24 | 2017-02-02 | スリーエム イノベイティブ プロパティズ カンパニー | 構造化表面を有する研磨材料 |
| JP6376922B2 (ja) * | 2014-02-18 | 2018-08-22 | 株式会社松風 | 歯科用研磨器具 |
| SG11201608134YA (en) * | 2014-04-03 | 2016-10-28 | 3M Innovative Properties Co | Polishing pads and systems and methods of making and using the same |
| US20150306737A1 (en) * | 2014-04-23 | 2015-10-29 | Taiwan Semiconductor Manufacturing Co., Ltd. | Chemical mechanical polishing pad |
| US10105812B2 (en) * | 2014-07-17 | 2018-10-23 | Applied Materials, Inc. | Polishing pad configuration and polishing pad support |
| US10946495B2 (en) * | 2015-01-30 | 2021-03-16 | Cmc Materials, Inc. | Low density polishing pad |
| US10556316B2 (en) | 2015-05-13 | 2020-02-11 | 3M Innovative Properties Company | Polishing pads and systems for and methods of using same |
| US9539694B1 (en) | 2015-06-26 | 2017-01-10 | Rohm And Haas Electronic Materials Cmp Holdings, Inc. | Composite polishing layer chemical mechanical polishing pad |
| TWI769988B (zh) | 2015-10-07 | 2022-07-11 | 美商3M新設資產公司 | 拋光墊與系統及其製造與使用方法 |
| CN106853610B (zh) * | 2015-12-08 | 2019-11-01 | 中芯国际集成电路制造(北京)有限公司 | 抛光垫及其监测方法和监测系统 |
-
2018
- 2018-08-21 US US16/640,175 patent/US12048980B2/en active Active
- 2018-08-21 WO PCT/IB2018/056320 patent/WO2019038675A1/en not_active Ceased
- 2018-08-21 CN CN201880054222.8A patent/CN111032285B/zh active Active
- 2018-08-21 JP JP2020511324A patent/JP7273796B2/ja active Active
Also Published As
| Publication number | Publication date |
|---|---|
| JP2020531298A (ja) | 2020-11-05 |
| US20200171619A1 (en) | 2020-06-04 |
| JP7273796B2 (ja) | 2023-05-15 |
| CN111032285A (zh) | 2020-04-17 |
| WO2019038675A1 (en) | 2019-02-28 |
| US12048980B2 (en) | 2024-07-30 |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| PB01 | Publication | ||
| PB01 | Publication | ||
| SE01 | Entry into force of request for substantive examination | ||
| SE01 | Entry into force of request for substantive examination | ||
| GR01 | Patent grant | ||
| GR01 | Patent grant |