JP2020161451A5 - - Google Patents

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Publication number
JP2020161451A5
JP2020161451A5 JP2019062915A JP2019062915A JP2020161451A5 JP 2020161451 A5 JP2020161451 A5 JP 2020161451A5 JP 2019062915 A JP2019062915 A JP 2019062915A JP 2019062915 A JP2019062915 A JP 2019062915A JP 2020161451 A5 JP2020161451 A5 JP 2020161451A5
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JP
Japan
Prior art keywords
ion
detection device
negative
conversion dynode
ions
Prior art date
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Application number
JP2019062915A
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English (en)
Japanese (ja)
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JP7217189B2 (ja
JP2020161451A (ja
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Priority claimed from JP2019062915A external-priority patent/JP7217189B2/ja
Priority to JP2019062915A priority Critical patent/JP7217189B2/ja
Priority to EP20778417.4A priority patent/EP3951833B1/en
Priority to CN202080019870.7A priority patent/CN113557587B/zh
Priority to PCT/JP2020/002073 priority patent/WO2020195062A1/ja
Priority to US17/433,133 priority patent/US11955327B2/en
Publication of JP2020161451A publication Critical patent/JP2020161451A/ja
Publication of JP2020161451A5 publication Critical patent/JP2020161451A5/ja
Publication of JP7217189B2 publication Critical patent/JP7217189B2/ja
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JP2019062915A 2019-03-28 2019-03-28 イオン検出装置 Active JP7217189B2 (ja)

Priority Applications (5)

Application Number Priority Date Filing Date Title
JP2019062915A JP7217189B2 (ja) 2019-03-28 2019-03-28 イオン検出装置
US17/433,133 US11955327B2 (en) 2019-03-28 2020-01-22 Ion detector
CN202080019870.7A CN113557587B (zh) 2019-03-28 2020-01-22 离子检测装置
PCT/JP2020/002073 WO2020195062A1 (ja) 2019-03-28 2020-01-22 イオン検出装置
EP20778417.4A EP3951833B1 (en) 2019-03-28 2020-01-22 Ion detector

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2019062915A JP7217189B2 (ja) 2019-03-28 2019-03-28 イオン検出装置

Publications (3)

Publication Number Publication Date
JP2020161451A JP2020161451A (ja) 2020-10-01
JP2020161451A5 true JP2020161451A5 (enExample) 2021-12-09
JP7217189B2 JP7217189B2 (ja) 2023-02-02

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ID=72611760

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2019062915A Active JP7217189B2 (ja) 2019-03-28 2019-03-28 イオン検出装置

Country Status (5)

Country Link
US (1) US11955327B2 (enExample)
EP (1) EP3951833B1 (enExample)
JP (1) JP7217189B2 (enExample)
CN (1) CN113557587B (enExample)
WO (1) WO2020195062A1 (enExample)

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
GB201817145D0 (en) * 2018-10-22 2018-12-05 Micromass Ltd ION Detector

Family Cites Families (17)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
GB1171700A (en) * 1967-10-31 1969-11-26 Atomic Energy Authority Uk Improvements in or relating to Ion Beam Intensity Measuring Apparatus and Methods
JPS5818542B2 (ja) 1975-04-16 1983-04-13 トキコ株式会社 ユアツカンシヨウキ
JPH061260B2 (ja) * 1983-12-30 1994-01-05 株式会社島津製作所 質量分析計
GB8705289D0 (en) 1987-03-06 1987-04-08 Vg Instr Group Mass spectrometer
JP2735222B2 (ja) * 1988-06-01 1998-04-02 株式会社日立製作所 質量分析計
FR2658361A1 (fr) * 1990-02-14 1991-08-16 Nermag Ste Nouvelle Dispositif de detection et d'amplification de faibles courants ioniques positifs et negatifs.
JPH0580157A (ja) * 1991-09-19 1993-04-02 Murata Mfg Co Ltd イオン検出装置
JPH10154483A (ja) * 1996-11-22 1998-06-09 Shimadzu Corp イオン検出器
JP4231123B2 (ja) * 1998-06-15 2009-02-25 浜松ホトニクス株式会社 電子管及び光電子増倍管
JP3721833B2 (ja) * 1999-03-12 2005-11-30 株式会社日立製作所 質量分析装置
JP2001351566A (ja) * 2000-06-08 2001-12-21 Hamamatsu Photonics Kk イオン検出器
CN1307432C (zh) * 2001-01-31 2007-03-28 滨松光子学株式会社 电子束检测器、扫描型电子显微镜、质量分析装置及离子检测器
US7009187B2 (en) * 2002-08-08 2006-03-07 Fei Company Particle detector suitable for detecting ions and electrons
US7728292B2 (en) 2006-08-28 2010-06-01 Ionics Mass Spectrometry Group Inc. Method and apparatus for detecting positively charged and negatively charged ionized particles
US7855361B2 (en) 2008-05-30 2010-12-21 Varian, Inc. Detection of positive and negative ions
JP5818542B2 (ja) 2010-07-29 2015-11-18 浜松ホトニクス株式会社 イオン検出装置
JP5948053B2 (ja) * 2011-12-26 2016-07-06 株式会社日立ハイテクノロジーズ 質量分析装置及び質量分析方法

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