JP2020141137A5 - - Google Patents

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JP2020141137A5
JP2020141137A5 JP2020032056A JP2020032056A JP2020141137A5 JP 2020141137 A5 JP2020141137 A5 JP 2020141137A5 JP 2020032056 A JP2020032056 A JP 2020032056A JP 2020032056 A JP2020032056 A JP 2020032056A JP 2020141137 A5 JP2020141137 A5 JP 2020141137A5
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Japan
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group
alanine
combinations
acid
composition
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JP2020032056A
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Japanese (ja)
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JP2020141137A (ja
JP7240346B2 (ja
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Priority claimed from US16/752,116 external-priority patent/US20200277514A1/en
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JP2020032056A 2019-02-28 2020-02-27 銅及びスルーシリコンビア用途のための化学機械研磨 Active JP7240346B2 (ja)

Applications Claiming Priority (4)

Application Number Priority Date Filing Date Title
US201962811874P 2019-02-28 2019-02-28
US62/811,874 2019-02-28
US16/752,116 US20200277514A1 (en) 2019-02-28 2020-01-24 Chemical Mechanical Polishing For Copper And Through Silicon Via Applications
US16/752,116 2020-01-24

Publications (3)

Publication Number Publication Date
JP2020141137A JP2020141137A (ja) 2020-09-03
JP2020141137A5 true JP2020141137A5 (enExample) 2022-11-21
JP7240346B2 JP7240346B2 (ja) 2023-03-15

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ID=69742787

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JP2020032056A Active JP7240346B2 (ja) 2019-02-28 2020-02-27 銅及びスルーシリコンビア用途のための化学機械研磨

Country Status (8)

Country Link
US (1) US20200277514A1 (enExample)
EP (1) EP3702425A1 (enExample)
JP (1) JP7240346B2 (enExample)
KR (1) KR20200105431A (enExample)
CN (1) CN111732897A (enExample)
IL (1) IL272585B2 (enExample)
SG (1) SG10202001386VA (enExample)
TW (1) TW202039775A (enExample)

Families Citing this family (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP7405872B2 (ja) * 2020-01-28 2023-12-26 富士フイルム株式会社 組成物、基板の処理方法
KR20230139386A (ko) * 2020-12-14 2023-10-05 버슘머트리얼즈 유에스, 엘엘씨 구리 및 관통 실리콘 비아(tsv)를 위한 화학적 기계적평탄화(cmp)
US20220306902A1 (en) * 2021-03-29 2022-09-29 Entegris, Inc. Suspension for chemical mechanical planarization (cmp) and method employing the same
CN115959779A (zh) * 2021-10-12 2023-04-14 中国石油化工股份有限公司 循环水系统预膜用组合物及其应用以及循环水系统预膜处理方法
CN113789127B (zh) * 2021-10-20 2023-07-28 博力思(天津)电子科技有限公司 一种硅通孔铜膜抛光液
WO2025175199A1 (en) 2024-02-16 2025-08-21 Versum Materials Us, Llc Corrosion inhibitors for metal chemical mechanical planarization (cmp) polishing compositions
CN118406439B (zh) * 2024-07-01 2024-10-18 万华化学集团电子材料有限公司 化学机械抛光组合物及其在钨化学机械抛光中的应用

Family Cites Families (27)

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SG144688A1 (en) 2001-07-23 2008-08-28 Fujimi Inc Polishing composition and polishing method employing it
US7300601B2 (en) 2002-12-10 2007-11-27 Advanced Technology Materials, Inc. Passivative chemical mechanical polishing composition for copper film planarization
US20040175942A1 (en) 2003-01-03 2004-09-09 Chang Song Y. Composition and method used for chemical mechanical planarization of metals
KR20070104479A (ko) * 2003-06-06 2007-10-25 어플라이드 머티어리얼스, 인코포레이티드 전도성 물질을 폴리싱하기 위한 폴리싱 조성물 및 방법
EP1929512A2 (en) 2005-08-05 2008-06-11 Advanced Technology Materials, Inc. High throughput chemical mechanical polishing composition for metal film planarization
TWI385226B (zh) 2005-09-08 2013-02-11 羅門哈斯電子材料Cmp控股公司 用於移除聚合物阻障之研磨漿液
US8791019B2 (en) 2005-12-27 2014-07-29 Hitachi Chemical Company, Ltd. Metal polishing slurry and method of polishing a film to be polished
WO2008078909A1 (en) 2006-12-22 2008-07-03 Techno Semichem Co., Ltd. Chemical mechanical polishing composition for copper comprising zeolite
WO2009020625A1 (en) 2007-08-09 2009-02-12 Planar Solutions, Llc Copper polishing slurry
JPWO2009031389A1 (ja) 2007-09-03 2010-12-09 Jsr株式会社 化学機械研磨用水系分散体およびその調製方法、化学機械研磨用水系分散体を調製するためのキット、ならびに半導体装置の化学機械研磨方法
US7955520B2 (en) 2007-11-27 2011-06-07 Cabot Microelectronics Corporation Copper-passivating CMP compositions and methods
US8435421B2 (en) 2007-11-27 2013-05-07 Cabot Microelectronics Corporation Metal-passivating CMP compositions and methods
WO2010123300A2 (en) 2009-04-22 2010-10-28 Lg Chem, Ltd. Slurry for chemical mechanical polishing
EP2427523B1 (en) 2009-05-06 2015-10-28 Basf Se An aqueous metal polishing agent comprising a polymeric abrasive containing pendant functional groups and its use in a cmp process
JP5646862B2 (ja) 2009-09-18 2014-12-24 長興開発科技股▲ふん▼有限公司 シリコン貫通ビア構造を有する半導体ウェハーの研磨方法、及びそれに使用する研磨組成物
WO2011152966A2 (en) 2010-06-01 2011-12-08 Applied Materials, Inc. Chemical planarization of copper wafer polishing
US8980122B2 (en) 2011-07-08 2015-03-17 General Engineering & Research, L.L.C. Contact release capsule useful for chemical mechanical planarization slurry
US9057004B2 (en) 2011-09-23 2015-06-16 International Business Machines Corporation Slurry for chemical-mechanical polishing of metals and use thereof
US8734665B2 (en) 2011-10-12 2014-05-27 International Business Machines Corporation Slurry for chemical-mechanical polishing of copper and use thereof
US8974692B2 (en) * 2013-06-27 2015-03-10 Air Products And Chemicals, Inc. Chemical mechanical polishing slurry compositions and method using the same for copper and through-silicon via applications
US10217645B2 (en) * 2014-07-25 2019-02-26 Versum Materials Us, Llc Chemical mechanical polishing (CMP) of cobalt-containing substrate
KR101854499B1 (ko) 2015-04-24 2018-05-04 삼성에스디아이 주식회사 구리 배선 연마용 cmp 슬러리 조성물 및 이를 이용한 연마방법
US9978609B2 (en) 2015-04-27 2018-05-22 Versum Materials Us, Llc Low dishing copper chemical mechanical planarization
WO2016195997A1 (en) 2015-05-29 2016-12-08 Weatherby Michael T Automated helmet gas bladder maintenance system and method
US10253216B2 (en) 2016-07-01 2019-04-09 Versum Materials Us, Llc Additives for barrier chemical mechanical planarization
CN110099977B (zh) 2016-11-09 2021-05-11 福吉米株式会社 研磨用组合物及硅晶圆的研磨方法
US11401441B2 (en) * 2017-08-17 2022-08-02 Versum Materials Us, Llc Chemical mechanical planarization (CMP) composition and methods therefore for copper and through silica via (TSV) applications

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