SG10202001386VA - Chemical mechanical polishing for copper and through silicon via applications - Google Patents
Chemical mechanical polishing for copper and through silicon via applicationsInfo
- Publication number
- SG10202001386VA SG10202001386VA SG10202001386VA SG10202001386VA SG10202001386VA SG 10202001386V A SG10202001386V A SG 10202001386VA SG 10202001386V A SG10202001386V A SG 10202001386VA SG 10202001386V A SG10202001386V A SG 10202001386VA SG 10202001386V A SG10202001386V A SG 10202001386VA
- Authority
- SG
- Singapore
- Prior art keywords
- copper
- mechanical polishing
- chemical mechanical
- silicon via
- via applications
- Prior art date
Links
- RYGMFSIKBFXOCR-UHFFFAOYSA-N Copper Chemical compound [Cu] RYGMFSIKBFXOCR-UHFFFAOYSA-N 0.000 title 1
- 229910052802 copper Inorganic materials 0.000 title 1
- 239000010949 copper Substances 0.000 title 1
- 238000005498 polishing Methods 0.000 title 1
- 229910052710 silicon Inorganic materials 0.000 title 1
- 239000010703 silicon Substances 0.000 title 1
- 239000000126 substance Substances 0.000 title 1
Classifications
-
- C—CHEMISTRY; METALLURGY
- C09—DYES; PAINTS; POLISHES; NATURAL RESINS; ADHESIVES; COMPOSITIONS NOT OTHERWISE PROVIDED FOR; APPLICATIONS OF MATERIALS NOT OTHERWISE PROVIDED FOR
- C09G—POLISHING COMPOSITIONS; SKI WAXES
- C09G1/00—Polishing compositions
- C09G1/02—Polishing compositions containing abrasives or grinding agents
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B24—GRINDING; POLISHING
- B24B—MACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
- B24B1/00—Processes of grinding or polishing; Use of auxiliary equipment in connection with such processes
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B24—GRINDING; POLISHING
- B24B—MACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
- B24B37/00—Lapping machines or devices; Accessories
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B24—GRINDING; POLISHING
- B24B—MACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
- B24B37/00—Lapping machines or devices; Accessories
- B24B37/04—Lapping machines or devices; Accessories designed for working plane surfaces
- B24B37/042—Lapping machines or devices; Accessories designed for working plane surfaces operating processes therefor
- B24B37/044—Lapping machines or devices; Accessories designed for working plane surfaces operating processes therefor characterised by the composition of the lapping agent
-
- C—CHEMISTRY; METALLURGY
- C09—DYES; PAINTS; POLISHES; NATURAL RESINS; ADHESIVES; COMPOSITIONS NOT OTHERWISE PROVIDED FOR; APPLICATIONS OF MATERIALS NOT OTHERWISE PROVIDED FOR
- C09K—MATERIALS FOR MISCELLANEOUS APPLICATIONS, NOT PROVIDED FOR ELSEWHERE
- C09K13/00—Etching, surface-brightening or pickling compositions
-
- C—CHEMISTRY; METALLURGY
- C09—DYES; PAINTS; POLISHES; NATURAL RESINS; ADHESIVES; COMPOSITIONS NOT OTHERWISE PROVIDED FOR; APPLICATIONS OF MATERIALS NOT OTHERWISE PROVIDED FOR
- C09K—MATERIALS FOR MISCELLANEOUS APPLICATIONS, NOT PROVIDED FOR ELSEWHERE
- C09K13/00—Etching, surface-brightening or pickling compositions
- C09K13/04—Etching, surface-brightening or pickling compositions containing an inorganic acid
- C09K13/06—Etching, surface-brightening or pickling compositions containing an inorganic acid with organic material
-
- C—CHEMISTRY; METALLURGY
- C09—DYES; PAINTS; POLISHES; NATURAL RESINS; ADHESIVES; COMPOSITIONS NOT OTHERWISE PROVIDED FOR; APPLICATIONS OF MATERIALS NOT OTHERWISE PROVIDED FOR
- C09K—MATERIALS FOR MISCELLANEOUS APPLICATIONS, NOT PROVIDED FOR ELSEWHERE
- C09K3/00—Materials not provided for elsewhere
- C09K3/14—Anti-slip materials; Abrasives
- C09K3/1454—Abrasive powders, suspensions and pastes for polishing
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23F—NON-MECHANICAL REMOVAL OF METALLIC MATERIAL FROM SURFACE; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL; MULTI-STEP PROCESSES FOR SURFACE TREATMENT OF METALLIC MATERIAL INVOLVING AT LEAST ONE PROCESS PROVIDED FOR IN CLASS C23 AND AT LEAST ONE PROCESS COVERED BY SUBCLASS C21D OR C22F OR CLASS C25
- C23F3/00—Brightening metals by chemical means
- C23F3/04—Heavy metals
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/04—Manufacture or treatment of semiconductor devices or of parts thereof the devices having at least one potential-jump barrier or surface barrier, e.g. PN junction, depletion layer or carrier concentration layer
- H01L21/18—Manufacture or treatment of semiconductor devices or of parts thereof the devices having at least one potential-jump barrier or surface barrier, e.g. PN junction, depletion layer or carrier concentration layer the devices having semiconductor bodies comprising elements of Group IV of the Periodic System or AIIIBV compounds with or without impurities, e.g. doping materials
- H01L21/30—Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26
- H01L21/302—Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26 to change their surface-physical characteristics or shape, e.g. etching, polishing, cutting
- H01L21/306—Chemical or electrical treatment, e.g. electrolytic etching
- H01L21/30625—With simultaneous mechanical treatment, e.g. mechanico-chemical polishing
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/04—Manufacture or treatment of semiconductor devices or of parts thereof the devices having at least one potential-jump barrier or surface barrier, e.g. PN junction, depletion layer or carrier concentration layer
- H01L21/18—Manufacture or treatment of semiconductor devices or of parts thereof the devices having at least one potential-jump barrier or surface barrier, e.g. PN junction, depletion layer or carrier concentration layer the devices having semiconductor bodies comprising elements of Group IV of the Periodic System or AIIIBV compounds with or without impurities, e.g. doping materials
- H01L21/30—Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26
- H01L21/31—Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26 to form insulating layers thereon, e.g. for masking or by using photolithographic techniques; After treatment of these layers; Selection of materials for these layers
- H01L21/3205—Deposition of non-insulating-, e.g. conductive- or resistive-, layers on insulating layers; After-treatment of these layers
- H01L21/321—After treatment
- H01L21/32115—Planarisation
- H01L21/3212—Planarisation by chemical mechanical polishing [CMP]
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/67005—Apparatus not specifically provided for elsewhere
- H01L21/67011—Apparatus for manufacture or treatment
- H01L21/67092—Apparatus for mechanical treatment
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/70—Manufacture or treatment of devices consisting of a plurality of solid state components formed in or on a common substrate or of parts thereof; Manufacture of integrated circuit devices or of parts thereof
- H01L21/71—Manufacture of specific parts of devices defined in group H01L21/70
- H01L21/768—Applying interconnections to be used for carrying current between separate components within a device comprising conductors and dielectrics
- H01L21/76838—Applying interconnections to be used for carrying current between separate components within a device comprising conductors and dielectrics characterised by the formation and the after-treatment of the conductors
- H01L21/7684—Smoothing; Planarisation
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US201962811874P | 2019-02-28 | 2019-02-28 | |
US16/752,116 US20200277514A1 (en) | 2019-02-28 | 2020-01-24 | Chemical Mechanical Polishing For Copper And Through Silicon Via Applications |
Publications (1)
Publication Number | Publication Date |
---|---|
SG10202001386VA true SG10202001386VA (en) | 2020-09-29 |
Family
ID=69742787
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
SG10202001386VA SG10202001386VA (en) | 2019-02-28 | 2020-02-14 | Chemical mechanical polishing for copper and through silicon via applications |
Country Status (8)
Country | Link |
---|---|
US (1) | US20200277514A1 (en) |
EP (1) | EP3702425A1 (en) |
JP (1) | JP7240346B2 (en) |
KR (1) | KR20200105431A (en) |
CN (1) | CN111732897A (en) |
IL (1) | IL272585B1 (en) |
SG (1) | SG10202001386VA (en) |
TW (1) | TW202039775A (en) |
Families Citing this family (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
EP4259736A1 (en) * | 2020-12-14 | 2023-10-18 | Versum Materials US, LLC | Chemical mechanical planarization (cmp) for copper and through-silicon via (tsv) |
EP4314179A1 (en) * | 2021-03-29 | 2024-02-07 | Entegris, Inc. | Suspension for chemical mechanical planarization (cmp) and method employing the same |
CN113789127B (en) * | 2021-10-20 | 2023-07-28 | 博力思(天津)电子科技有限公司 | Polishing solution for copper film of through silicon via |
Family Cites Families (26)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
SG144688A1 (en) | 2001-07-23 | 2008-08-28 | Fujimi Inc | Polishing composition and polishing method employing it |
US7300601B2 (en) | 2002-12-10 | 2007-11-27 | Advanced Technology Materials, Inc. | Passivative chemical mechanical polishing composition for copper film planarization |
US20040175942A1 (en) | 2003-01-03 | 2004-09-09 | Chang Song Y. | Composition and method used for chemical mechanical planarization of metals |
CN1842577A (en) * | 2003-06-06 | 2006-10-04 | 应用材料公司 | Polishing composition and method for polishing a conductive material |
CN101356628B (en) | 2005-08-05 | 2012-01-04 | 高级技术材料公司 | High throughput chemical mechanical polishing composition for metal film planarization |
TWI385226B (en) | 2005-09-08 | 2013-02-11 | 羅門哈斯電子材料Cmp控股公司 | Polymeric barrier removal polishing slurry |
TWI343945B (en) | 2005-12-27 | 2011-06-21 | Hitachi Chemical Co Ltd | Slurry for metal polishing and polishing method of polished film |
US20100015807A1 (en) | 2006-12-22 | 2010-01-21 | Techno Semichem Co., Ltd. | Chemical Mechanical Polishing Composition for Copper Comprising Zeolite |
WO2009020625A1 (en) | 2007-08-09 | 2009-02-12 | Planar Solutions, Llc | Copper polishing slurry |
JPWO2009031389A1 (en) | 2007-09-03 | 2010-12-09 | Jsr株式会社 | Chemical mechanical polishing aqueous dispersion and preparation method thereof, kit for preparing chemical mechanical polishing aqueous dispersion, and chemical mechanical polishing method of semiconductor device |
US7955520B2 (en) | 2007-11-27 | 2011-06-07 | Cabot Microelectronics Corporation | Copper-passivating CMP compositions and methods |
US8435421B2 (en) | 2007-11-27 | 2013-05-07 | Cabot Microelectronics Corporation | Metal-passivating CMP compositions and methods |
WO2010123300A2 (en) | 2009-04-22 | 2010-10-28 | Lg Chem, Ltd. | Slurry for chemical mechanical polishing |
EP2427523B1 (en) | 2009-05-06 | 2015-10-28 | Basf Se | An aqueous metal polishing agent comprising a polymeric abrasive containing pendant functional groups and its use in a cmp process |
JP5646862B2 (en) | 2009-09-18 | 2014-12-24 | 長興開発科技股▲ふん▼有限公司 | Polishing method of semiconductor wafer having through silicon via structure and polishing composition used therefor |
US8586481B2 (en) | 2010-06-01 | 2013-11-19 | Applied Materials, Inc. | Chemical planarization of copper wafer polishing |
US8980122B2 (en) | 2011-07-08 | 2015-03-17 | General Engineering & Research, L.L.C. | Contact release capsule useful for chemical mechanical planarization slurry |
US9057004B2 (en) | 2011-09-23 | 2015-06-16 | International Business Machines Corporation | Slurry for chemical-mechanical polishing of metals and use thereof |
US8734665B2 (en) | 2011-10-12 | 2014-05-27 | International Business Machines Corporation | Slurry for chemical-mechanical polishing of copper and use thereof |
US8974692B2 (en) * | 2013-06-27 | 2015-03-10 | Air Products And Chemicals, Inc. | Chemical mechanical polishing slurry compositions and method using the same for copper and through-silicon via applications |
US10217645B2 (en) * | 2014-07-25 | 2019-02-26 | Versum Materials Us, Llc | Chemical mechanical polishing (CMP) of cobalt-containing substrate |
KR101854499B1 (en) | 2015-04-24 | 2018-05-04 | 삼성에스디아이 주식회사 | Cmp slurry composition for copper wire and polishing method using the same |
US9978609B2 (en) | 2015-04-27 | 2018-05-22 | Versum Materials Us, Llc | Low dishing copper chemical mechanical planarization |
WO2016195997A1 (en) | 2015-05-29 | 2016-12-08 | Weatherby Michael T | Automated helmet gas bladder maintenance system and method |
US10253216B2 (en) | 2016-07-01 | 2019-04-09 | Versum Materials Us, Llc | Additives for barrier chemical mechanical planarization |
CN110099977B (en) | 2016-11-09 | 2021-05-11 | 福吉米株式会社 | Polishing composition and method for polishing silicon wafer |
-
2020
- 2020-01-24 US US16/752,116 patent/US20200277514A1/en not_active Abandoned
- 2020-02-10 IL IL272585A patent/IL272585B1/en unknown
- 2020-02-14 SG SG10202001386VA patent/SG10202001386VA/en unknown
- 2020-02-25 TW TW109105985A patent/TW202039775A/en unknown
- 2020-02-27 JP JP2020032056A patent/JP7240346B2/en active Active
- 2020-02-27 EP EP20159825.7A patent/EP3702425A1/en active Pending
- 2020-02-27 KR KR1020200024405A patent/KR20200105431A/en not_active Application Discontinuation
- 2020-02-27 CN CN202010125856.7A patent/CN111732897A/en active Pending
Also Published As
Publication number | Publication date |
---|---|
JP2020141137A (en) | 2020-09-03 |
EP3702425A1 (en) | 2020-09-02 |
TW202039775A (en) | 2020-11-01 |
JP7240346B2 (en) | 2023-03-15 |
IL272585B1 (en) | 2024-04-01 |
CN111732897A (en) | 2020-10-02 |
KR20200105431A (en) | 2020-09-07 |
IL272585A (en) | 2020-08-31 |
US20200277514A1 (en) | 2020-09-03 |
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