JP2020112501A5 - - Google Patents

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JP2020112501A5
JP2020112501A5 JP2019004953A JP2019004953A JP2020112501A5 JP 2020112501 A5 JP2020112501 A5 JP 2020112501A5 JP 2019004953 A JP2019004953 A JP 2019004953A JP 2019004953 A JP2019004953 A JP 2019004953A JP 2020112501 A5 JP2020112501 A5 JP 2020112501A5
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JP2019004953A
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JP2020112501A (ja
JP7115329B2 (ja
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Priority claimed from JP2019004953A external-priority patent/JP7115329B2/ja
Priority to CN201980089019.9A priority patent/CN113302516B/zh
Priority to PCT/JP2019/049602 priority patent/WO2020149080A1/ja
Publication of JP2020112501A publication Critical patent/JP2020112501A/ja
Publication of JP2020112501A5 publication Critical patent/JP2020112501A5/ja
Priority to US17/375,795 priority patent/US12386046B2/en
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JP2019004953A 2019-01-16 2019-01-16 光学的測距装置および光学的測距装置における異常の発生を検出する方法 Active JP7115329B2 (ja)

Priority Applications (4)

Application Number Priority Date Filing Date Title
JP2019004953A JP7115329B2 (ja) 2019-01-16 2019-01-16 光学的測距装置および光学的測距装置における異常の発生を検出する方法
CN201980089019.9A CN113302516B (zh) 2019-01-16 2019-12-18 光学测距装置及检测光学测距装置中的异常的产生的方法
PCT/JP2019/049602 WO2020149080A1 (ja) 2019-01-16 2019-12-18 光学的測距装置および光学的測距装置における異常の発生を検出する方法
US17/375,795 US12386046B2 (en) 2019-01-16 2021-07-14 Optical ranging device and method for detecting occurrence of abnormality in the same

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2019004953A JP7115329B2 (ja) 2019-01-16 2019-01-16 光学的測距装置および光学的測距装置における異常の発生を検出する方法

Publications (3)

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JP2020112501A JP2020112501A (ja) 2020-07-27
JP2020112501A5 true JP2020112501A5 (enExample) 2021-06-10
JP7115329B2 JP7115329B2 (ja) 2022-08-09

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JP2019004953A Active JP7115329B2 (ja) 2019-01-16 2019-01-16 光学的測距装置および光学的測距装置における異常の発生を検出する方法

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US (1) US12386046B2 (enExample)
JP (1) JP7115329B2 (enExample)
CN (1) CN113302516B (enExample)
WO (1) WO2020149080A1 (enExample)

Families Citing this family (3)

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Publication number Priority date Publication date Assignee Title
CN113544535B (zh) * 2019-03-05 2024-07-05 伟摩有限责任公司 用于检测降低的lidar范围测量准确性的方法和系统
US12117313B2 (en) 2021-02-25 2024-10-15 Sony Semiconductor Solutions Corporation Photodetection device and photodetection system
EP4350283A4 (en) 2021-06-04 2024-09-04 Sony Semiconductor Solutions Corporation Optical detection device and ranging system

Family Cites Families (16)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2613655B2 (ja) * 1989-09-14 1997-05-28 松下電工株式会社 光電スイッチ
JPH10319121A (ja) * 1997-05-19 1998-12-04 Olympus Optical Co Ltd 距離測定装置
WO2005048319A2 (en) * 2003-11-06 2005-05-26 Yale University Large-area detector
JP2005331526A (ja) * 2005-08-24 2005-12-02 Denso Corp 距離測定装置
US8188563B2 (en) * 2006-07-21 2012-05-29 The Regents Of The University Of California Shallow-trench-isolation (STI)-bounded single-photon CMOS photodetector
JP4663743B2 (ja) * 2008-01-31 2011-04-06 北陽電機株式会社 走査式測距装置
DE102009045323A1 (de) * 2009-10-05 2011-04-07 Robert Bosch Gmbh Optisches Entfernungsmessgerät mit Kalibrierungseinrichtung
JP6236758B2 (ja) * 2012-10-09 2017-11-29 株式会社豊田中央研究所 光学的測距装置
JP6225411B2 (ja) * 2012-10-16 2017-11-08 株式会社豊田中央研究所 光学的測距装置
US8836920B2 (en) * 2013-02-05 2014-09-16 Nen-Tsua Li Structure of an optical path for laser range finding
CA2931055C (en) * 2013-11-22 2022-07-12 Ottomotto Llc Lidar scanner calibration
US9176361B2 (en) * 2014-03-11 2015-11-03 Sony Corporation Optical analog to digital converter and method
DE112015001704T5 (de) * 2014-04-07 2016-12-29 Samsung Electronics Co., Ltd. Bildsensor mit hoher Auflösung, Frame-Rate und niedrigem Stromverbrauch
JP6477083B2 (ja) 2015-03-19 2019-03-06 株式会社豊田中央研究所 光学的測距装置
WO2018128655A2 (en) * 2016-09-25 2018-07-12 Okeeffe James Distributed laser range finder with fiber optics and micromirrors
JP7120756B2 (ja) * 2017-12-05 2022-08-17 シャープ株式会社 受光素子、飛行時間測定装置及び光レーダー装置

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