JP7115329B2 - 光学的測距装置および光学的測距装置における異常の発生を検出する方法 - Google Patents

光学的測距装置および光学的測距装置における異常の発生を検出する方法 Download PDF

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JP7115329B2
JP7115329B2 JP2019004953A JP2019004953A JP7115329B2 JP 7115329 B2 JP7115329 B2 JP 7115329B2 JP 2019004953 A JP2019004953 A JP 2019004953A JP 2019004953 A JP2019004953 A JP 2019004953A JP 7115329 B2 JP7115329 B2 JP 7115329B2
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Prior art keywords
light
light receiving
abnormality
unit
spad
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Japanese (ja)
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JP2020112501A5 (enExample
JP2020112501A (ja
Inventor
善英 立野
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Denso Corp
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Denso Corp
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Priority to JP2019004953A priority Critical patent/JP7115329B2/ja
Priority to CN201980089019.9A priority patent/CN113302516B/zh
Priority to PCT/JP2019/049602 priority patent/WO2020149080A1/ja
Publication of JP2020112501A publication Critical patent/JP2020112501A/ja
Publication of JP2020112501A5 publication Critical patent/JP2020112501A5/ja
Priority to US17/375,795 priority patent/US12386046B2/en
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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01S—RADIO DIRECTION-FINDING; RADIO NAVIGATION; DETERMINING DISTANCE OR VELOCITY BY USE OF RADIO WAVES; LOCATING OR PRESENCE-DETECTING BY USE OF THE REFLECTION OR RERADIATION OF RADIO WAVES; ANALOGOUS ARRANGEMENTS USING OTHER WAVES
    • G01S7/00—Details of systems according to groups G01S13/00, G01S15/00, G01S17/00
    • G01S7/48—Details of systems according to groups G01S13/00, G01S15/00, G01S17/00 of systems according to group G01S17/00
    • G01S7/497—Means for monitoring or calibrating
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01S—RADIO DIRECTION-FINDING; RADIO NAVIGATION; DETERMINING DISTANCE OR VELOCITY BY USE OF RADIO WAVES; LOCATING OR PRESENCE-DETECTING BY USE OF THE REFLECTION OR RERADIATION OF RADIO WAVES; ANALOGOUS ARRANGEMENTS USING OTHER WAVES
    • G01S7/00—Details of systems according to groups G01S13/00, G01S15/00, G01S17/00
    • G01S7/48—Details of systems according to groups G01S13/00, G01S15/00, G01S17/00 of systems according to group G01S17/00
    • G01S7/481—Constructional features, e.g. arrangements of optical elements
    • G01S7/4817—Constructional features, e.g. arrangements of optical elements relating to scanning
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01C—MEASURING DISTANCES, LEVELS OR BEARINGS; SURVEYING; NAVIGATION; GYROSCOPIC INSTRUMENTS; PHOTOGRAMMETRY OR VIDEOGRAMMETRY
    • G01C3/00—Measuring distances in line of sight; Optical rangefinders
    • G01C3/02—Details
    • G01C3/06—Use of electric means to obtain final indication
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01S—RADIO DIRECTION-FINDING; RADIO NAVIGATION; DETERMINING DISTANCE OR VELOCITY BY USE OF RADIO WAVES; LOCATING OR PRESENCE-DETECTING BY USE OF THE REFLECTION OR RERADIATION OF RADIO WAVES; ANALOGOUS ARRANGEMENTS USING OTHER WAVES
    • G01S17/00—Systems using the reflection or reradiation of electromagnetic waves other than radio waves, e.g. lidar systems
    • G01S17/88—Lidar systems specially adapted for specific applications
    • G01S17/93—Lidar systems specially adapted for specific applications for anti-collision purposes
    • G01S17/931—Lidar systems specially adapted for specific applications for anti-collision purposes of land vehicles
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01S—RADIO DIRECTION-FINDING; RADIO NAVIGATION; DETERMINING DISTANCE OR VELOCITY BY USE OF RADIO WAVES; LOCATING OR PRESENCE-DETECTING BY USE OF THE REFLECTION OR RERADIATION OF RADIO WAVES; ANALOGOUS ARRANGEMENTS USING OTHER WAVES
    • G01S7/00—Details of systems according to groups G01S13/00, G01S15/00, G01S17/00
    • G01S7/48—Details of systems according to groups G01S13/00, G01S15/00, G01S17/00 of systems according to group G01S17/00
    • G01S7/483—Details of pulse systems
    • G01S7/484—Transmitters
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01S—RADIO DIRECTION-FINDING; RADIO NAVIGATION; DETERMINING DISTANCE OR VELOCITY BY USE OF RADIO WAVES; LOCATING OR PRESENCE-DETECTING BY USE OF THE REFLECTION OR RERADIATION OF RADIO WAVES; ANALOGOUS ARRANGEMENTS USING OTHER WAVES
    • G01S7/00—Details of systems according to groups G01S13/00, G01S15/00, G01S17/00
    • G01S7/48—Details of systems according to groups G01S13/00, G01S15/00, G01S17/00 of systems according to group G01S17/00
    • G01S7/483—Details of pulse systems
    • G01S7/486—Receivers
    • G01S7/4861—Circuits for detection, sampling, integration or read-out
    • G01S7/4863—Detector arrays, e.g. charge-transfer gates
    • H—ELECTRICITY
    • H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10F—INORGANIC SEMICONDUCTOR DEVICES SENSITIVE TO INFRARED RADIATION, LIGHT, ELECTROMAGNETIC RADIATION OF SHORTER WAVELENGTH OR CORPUSCULAR RADIATION
    • H10F30/00—Individual radiation-sensitive semiconductor devices in which radiation controls the flow of current through the devices, e.g. photodetectors
    • H10F30/20—Individual radiation-sensitive semiconductor devices in which radiation controls the flow of current through the devices, e.g. photodetectors the devices having potential barriers, e.g. phototransistors
    • H10F30/21—Individual radiation-sensitive semiconductor devices in which radiation controls the flow of current through the devices, e.g. photodetectors the devices having potential barriers, e.g. phototransistors the devices being sensitive to infrared, visible or ultraviolet radiation
    • H10F30/22—Individual radiation-sensitive semiconductor devices in which radiation controls the flow of current through the devices, e.g. photodetectors the devices having potential barriers, e.g. phototransistors the devices being sensitive to infrared, visible or ultraviolet radiation the devices having only one potential barrier, e.g. photodiodes
    • H10F30/225—Individual radiation-sensitive semiconductor devices in which radiation controls the flow of current through the devices, e.g. photodetectors the devices having potential barriers, e.g. phototransistors the devices being sensitive to infrared, visible or ultraviolet radiation the devices having only one potential barrier, e.g. photodiodes the potential barrier working in avalanche mode, e.g. avalanche photodiodes

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  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Radar, Positioning & Navigation (AREA)
  • Remote Sensing (AREA)
  • Computer Networks & Wireless Communication (AREA)
  • Electromagnetism (AREA)
  • Optical Radar Systems And Details Thereof (AREA)
  • Measurement Of Optical Distance (AREA)
JP2019004953A 2019-01-16 2019-01-16 光学的測距装置および光学的測距装置における異常の発生を検出する方法 Active JP7115329B2 (ja)

Priority Applications (4)

Application Number Priority Date Filing Date Title
JP2019004953A JP7115329B2 (ja) 2019-01-16 2019-01-16 光学的測距装置および光学的測距装置における異常の発生を検出する方法
CN201980089019.9A CN113302516B (zh) 2019-01-16 2019-12-18 光学测距装置及检测光学测距装置中的异常的产生的方法
PCT/JP2019/049602 WO2020149080A1 (ja) 2019-01-16 2019-12-18 光学的測距装置および光学的測距装置における異常の発生を検出する方法
US17/375,795 US12386046B2 (en) 2019-01-16 2021-07-14 Optical ranging device and method for detecting occurrence of abnormality in the same

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2019004953A JP7115329B2 (ja) 2019-01-16 2019-01-16 光学的測距装置および光学的測距装置における異常の発生を検出する方法

Publications (3)

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JP2020112501A JP2020112501A (ja) 2020-07-27
JP2020112501A5 JP2020112501A5 (enExample) 2021-06-10
JP7115329B2 true JP7115329B2 (ja) 2022-08-09

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JP2019004953A Active JP7115329B2 (ja) 2019-01-16 2019-01-16 光学的測距装置および光学的測距装置における異常の発生を検出する方法

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US (1) US12386046B2 (enExample)
JP (1) JP7115329B2 (enExample)
CN (1) CN113302516B (enExample)
WO (1) WO2020149080A1 (enExample)

Families Citing this family (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN113544535B (zh) * 2019-03-05 2024-07-05 伟摩有限责任公司 用于检测降低的lidar范围测量准确性的方法和系统
US12117313B2 (en) 2021-02-25 2024-10-15 Sony Semiconductor Solutions Corporation Photodetection device and photodetection system
EP4350283A4 (en) 2021-06-04 2024-09-04 Sony Semiconductor Solutions Corporation Optical detection device and ranging system

Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20060175529A1 (en) 2003-11-06 2006-08-10 Harmon Eric S Large-area detector
US20150261065A1 (en) 2014-03-11 2015-09-17 Sony Corporation Optical analog to digital converter and method
US20190011541A1 (en) 2016-09-25 2019-01-10 James Thomas O'Keeffe Lidar with malfunction detection

Family Cites Families (13)

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Publication number Priority date Publication date Assignee Title
JP2613655B2 (ja) * 1989-09-14 1997-05-28 松下電工株式会社 光電スイッチ
JPH10319121A (ja) * 1997-05-19 1998-12-04 Olympus Optical Co Ltd 距離測定装置
JP2005331526A (ja) * 2005-08-24 2005-12-02 Denso Corp 距離測定装置
US8188563B2 (en) * 2006-07-21 2012-05-29 The Regents Of The University Of California Shallow-trench-isolation (STI)-bounded single-photon CMOS photodetector
JP4663743B2 (ja) * 2008-01-31 2011-04-06 北陽電機株式会社 走査式測距装置
DE102009045323A1 (de) * 2009-10-05 2011-04-07 Robert Bosch Gmbh Optisches Entfernungsmessgerät mit Kalibrierungseinrichtung
JP6236758B2 (ja) * 2012-10-09 2017-11-29 株式会社豊田中央研究所 光学的測距装置
JP6225411B2 (ja) * 2012-10-16 2017-11-08 株式会社豊田中央研究所 光学的測距装置
US8836920B2 (en) * 2013-02-05 2014-09-16 Nen-Tsua Li Structure of an optical path for laser range finding
CA2931055C (en) * 2013-11-22 2022-07-12 Ottomotto Llc Lidar scanner calibration
DE112015001704T5 (de) * 2014-04-07 2016-12-29 Samsung Electronics Co., Ltd. Bildsensor mit hoher Auflösung, Frame-Rate und niedrigem Stromverbrauch
JP6477083B2 (ja) 2015-03-19 2019-03-06 株式会社豊田中央研究所 光学的測距装置
JP7120756B2 (ja) * 2017-12-05 2022-08-17 シャープ株式会社 受光素子、飛行時間測定装置及び光レーダー装置

Patent Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20060175529A1 (en) 2003-11-06 2006-08-10 Harmon Eric S Large-area detector
US20150261065A1 (en) 2014-03-11 2015-09-17 Sony Corporation Optical analog to digital converter and method
US20190011541A1 (en) 2016-09-25 2019-01-10 James Thomas O'Keeffe Lidar with malfunction detection

Non-Patent Citations (1)

* Cited by examiner, † Cited by third party
Title
ZHANG, Guo Qing, et al.，"Abnormal Phenomena and Mechanisms for Silicon Photomultipliers"，Key Engineering Materials [ISSN:1662-9795]，2013年01月25日，Volume 538，Pages 77-80，< DOI:10.4028/www.scientific.net/kem.538.77 >

Also Published As

Publication number Publication date
JP2020112501A (ja) 2020-07-27
US12386046B2 (en) 2025-08-12
US20210341592A1 (en) 2021-11-04
WO2020149080A1 (ja) 2020-07-23
CN113302516B (zh) 2024-06-18
CN113302516A (zh) 2021-08-24

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