JP2019536997A5 - - Google Patents

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Publication number
JP2019536997A5
JP2019536997A5 JP2019519749A JP2019519749A JP2019536997A5 JP 2019536997 A5 JP2019536997 A5 JP 2019536997A5 JP 2019519749 A JP2019519749 A JP 2019519749A JP 2019519749 A JP2019519749 A JP 2019519749A JP 2019536997 A5 JP2019536997 A5 JP 2019536997A5
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JP
Japan
Prior art keywords
sample
light
detector
lens
particle
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JP2019519749A
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English (en)
Japanese (ja)
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JP7114580B2 (ja
JP2019536997A (ja
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Priority claimed from EP16193377.5A external-priority patent/EP3309536A1/en
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JP2019519749A 2016-10-11 2017-09-22 粒子特性測定装置 Active JP7114580B2 (ja)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
EP16193377.5A EP3309536A1 (en) 2016-10-11 2016-10-11 Particle characterisation instrument
EP16193377.5 2016-10-11
PCT/EP2017/074094 WO2018069024A1 (en) 2016-10-11 2017-09-22 Particle characterisation instrument

Publications (3)

Publication Number Publication Date
JP2019536997A JP2019536997A (ja) 2019-12-19
JP2019536997A5 true JP2019536997A5 (enExample) 2020-11-12
JP7114580B2 JP7114580B2 (ja) 2022-08-08

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ID=57136706

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2019519749A Active JP7114580B2 (ja) 2016-10-11 2017-09-22 粒子特性測定装置

Country Status (5)

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US (1) US11112342B2 (enExample)
EP (2) EP3309536A1 (enExample)
JP (1) JP7114580B2 (enExample)
CN (1) CN109804233B (enExample)
WO (1) WO2018069024A1 (enExample)

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CN108291861B (zh) 2015-09-23 2021-10-12 马尔文帕纳科 颗粒表征
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GB201604460D0 (en) * 2016-03-16 2016-04-27 Malvern Instr Ltd Dynamic light scattering
EP3379232A1 (en) 2017-03-23 2018-09-26 Malvern Panalytical Limited Particle characterisation
JP7308823B2 (ja) * 2018-06-01 2023-07-14 株式会社堀場製作所 粒子径分布測定装置及び粒子径分布測定装置用プログラム
JP7307495B2 (ja) 2019-01-02 2023-07-12 エム アンド ジェイ サイエンティフィック エルエルシー 光散乱検出器及び光散乱検出器のサンプルセル
CA3076069C (en) * 2019-01-02 2024-01-30 M & J Scientific, Llc Light scattering detectors and methods for the same
EP3739321B1 (de) * 2019-05-17 2023-03-08 Xtal Concepts GmbH Qualifizierungsverfahren für kryoelektronenmikroskopie-proben sowie dazugehöriger probenhalter
CN112185833B (zh) * 2019-07-01 2025-10-28 应用材料公司 在沉积腔室制造期间的微粒物的实时检测
CN111060429A (zh) * 2019-12-27 2020-04-24 民政部一零一研究所 一种超低粉尘测量装置
RU204641U1 (ru) * 2020-11-17 2021-06-02 федеральное государственное автономное образовательное учреждение высшего образования "Санкт-Петербургский политехнический университет Петра Великого" (ФГАОУ ВО "СПбПУ") Устройство для определения электрофоретической подвижности частиц в коллоидно-дисперсных системах
JP7498093B2 (ja) 2020-11-17 2024-06-11 大塚電子株式会社 光散乱測定装置及び測定治具
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CN115598024B (zh) * 2022-11-16 2023-03-14 长春光吉科技有限责任公司 细胞分级计数装置及其方法
CN116593378B (zh) * 2023-05-22 2025-10-17 山西大学 一种同步测量活体细胞含水质量和干质量的方法
EP4530603A1 (en) 2023-09-27 2025-04-02 Malvern Panalytical Limited Diffractive particle characterisation
CN221100407U (zh) * 2023-10-23 2024-06-07 丹东百特仪器有限公司 一种多功能的动态光散射微量样品池检测装置

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