JP7114580B2 - 粒子特性測定装置 - Google Patents

粒子特性測定装置 Download PDF

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JP7114580B2
JP7114580B2 JP2019519749A JP2019519749A JP7114580B2 JP 7114580 B2 JP7114580 B2 JP 7114580B2 JP 2019519749 A JP2019519749 A JP 2019519749A JP 2019519749 A JP2019519749 A JP 2019519749A JP 7114580 B2 JP7114580 B2 JP 7114580B2
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light
sample
detector
lens
scattered
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JP2019536997A5 (enExample
JP2019536997A (ja
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リチャード スカリオン
ジェイソン コーベット
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マルバーン パナリティカル リミテッド
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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N15/00—Investigating characteristics of particles; Investigating permeability, pore-volume or surface-area of porous materials
    • G01N15/02—Investigating particle size or size distribution
    • G01N15/0205—Investigating particle size or size distribution by optical means
    • G01N15/0211—Investigating a scatter or diffraction pattern
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N15/00—Investigating characteristics of particles; Investigating permeability, pore-volume or surface-area of porous materials
    • G01N15/10—Investigating individual particles
    • G01N15/14—Optical investigation techniques, e.g. flow cytometry
    • G01N15/1434—Optical arrangements
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N15/00—Investigating characteristics of particles; Investigating permeability, pore-volume or surface-area of porous materials
    • G01N15/10—Investigating individual particles
    • G01N15/14—Optical investigation techniques, e.g. flow cytometry
    • G01N15/1456—Optical investigation techniques, e.g. flow cytometry without spatial resolution of the texture or inner structure of the particle, e.g. processing of pulse signals
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/47—Scattering, i.e. diffuse reflection
    • G01N21/49—Scattering, i.e. diffuse reflection within a body or fluid
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N15/00—Investigating characteristics of particles; Investigating permeability, pore-volume or surface-area of porous materials
    • G01N15/02—Investigating particle size or size distribution
    • G01N15/0205—Investigating particle size or size distribution by optical means
    • G01N15/0211—Investigating a scatter or diffraction pattern
    • G01N2015/0222—Investigating a scatter or diffraction pattern from dynamic light scattering, e.g. photon correlation spectroscopy
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N15/00—Investigating characteristics of particles; Investigating permeability, pore-volume or surface-area of porous materials
    • G01N15/10—Investigating individual particles
    • G01N15/14—Optical investigation techniques, e.g. flow cytometry
    • G01N15/1434—Optical arrangements
    • G01N2015/1454—Optical arrangements using phase shift or interference, e.g. for improving contrast
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/47—Scattering, i.e. diffuse reflection
    • G01N2021/4704—Angular selective
    • G01N2021/4707—Forward scatter; Low angle scatter
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/47—Scattering, i.e. diffuse reflection
    • G01N2021/4704—Angular selective
    • G01N2021/4709—Backscatter
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2201/00—Features of devices classified in G01N21/00
    • G01N2201/06—Illumination; Optics
    • G01N2201/063—Illuminating optical parts
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2201/00—Features of devices classified in G01N21/00
    • G01N2201/06—Illumination; Optics
    • G01N2201/063—Illuminating optical parts
    • G01N2201/0635—Structured illumination, e.g. with grating

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  • Chemical & Material Sciences (AREA)
  • General Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Health & Medical Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Dispersion Chemistry (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)
  • Optical Measuring Cells (AREA)
JP2019519749A 2016-10-11 2017-09-22 粒子特性測定装置 Active JP7114580B2 (ja)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
EP16193377.5A EP3309536A1 (en) 2016-10-11 2016-10-11 Particle characterisation instrument
EP16193377.5 2016-10-11
PCT/EP2017/074094 WO2018069024A1 (en) 2016-10-11 2017-09-22 Particle characterisation instrument

Publications (3)

Publication Number Publication Date
JP2019536997A JP2019536997A (ja) 2019-12-19
JP2019536997A5 JP2019536997A5 (enExample) 2020-11-12
JP7114580B2 true JP7114580B2 (ja) 2022-08-08

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Family Applications (1)

Application Number Title Priority Date Filing Date
JP2019519749A Active JP7114580B2 (ja) 2016-10-11 2017-09-22 粒子特性測定装置

Country Status (5)

Country Link
US (1) US11112342B2 (enExample)
EP (2) EP3309536A1 (enExample)
JP (1) JP7114580B2 (enExample)
CN (1) CN109804233B (enExample)
WO (1) WO2018069024A1 (enExample)

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GB201604460D0 (en) * 2016-03-16 2016-04-27 Malvern Instr Ltd Dynamic light scattering
EP3379232A1 (en) 2017-03-23 2018-09-26 Malvern Panalytical Limited Particle characterisation
US11879822B2 (en) * 2018-06-01 2024-01-23 Horiba, Ltd. Particle size distribution measuring device and program for particle size distribution measuring device
AU2019333836B2 (en) * 2019-01-02 2023-11-09 Tosoh Corporation Light scattering detectors and methods for the same
CA3076064A1 (en) 2019-01-02 2020-07-02 M & J Scientific, Llc Light scattering detectors and sample cells for the same
EP3739321B1 (de) * 2019-05-17 2023-03-08 Xtal Concepts GmbH Qualifizierungsverfahren für kryoelektronenmikroskopie-proben sowie dazugehöriger probenhalter
TW202507260A (zh) * 2019-07-01 2025-02-16 美商應用材料股份有限公司 在沉積腔室製造期間的微粒物的即時檢測
CN111060429A (zh) * 2019-12-27 2020-04-24 民政部一零一研究所 一种超低粉尘测量装置
RU204641U1 (ru) * 2020-11-17 2021-06-02 федеральное государственное автономное образовательное учреждение высшего образования "Санкт-Петербургский политехнический университет Петра Великого" (ФГАОУ ВО "СПбПУ") Устройство для определения электрофоретической подвижности частиц в коллоидно-дисперсных системах
JP7498093B2 (ja) 2020-11-17 2024-06-11 大塚電子株式会社 光散乱測定装置及び測定治具
SE544658C2 (en) * 2021-02-18 2022-10-11 Scienta Omicron Ab An illumination control device for a charged particle analyser
CN115598024B (zh) * 2022-11-16 2023-03-14 长春光吉科技有限责任公司 细胞分级计数装置及其方法
CN116593378B (zh) * 2023-05-22 2025-10-17 山西大学 一种同步测量活体细胞含水质量和干质量的方法
EP4530603A1 (en) 2023-09-27 2025-04-02 Malvern Panalytical Limited Diffractive particle characterisation
CN221100407U (zh) * 2023-10-23 2024-06-07 丹东百特仪器有限公司 一种多功能的动态光散射微量样品池检测装置

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US20050264809A1 (en) 2004-05-28 2005-12-01 Richard Myers Measuring particulate matter in a fluid
JP2010532468A (ja) 2007-07-05 2010-10-07 ホフマン、クルト 低容積で静的錯乱光および動的錯乱光を測定するための装置および方法
WO2012127880A1 (ja) 2011-03-24 2012-09-27 株式会社ニコン 観察装置および観察方法
JP2015500467A (ja) 2011-12-01 2015-01-05 ピー．エム．エル． − パーティクルズ モニタリング テクノロジーズリミテッド 粒径及び濃度測定のための検出スキーム
JP2016026301A (ja) 2004-03-06 2016-02-12 トレイナー， マイケルＴＲＡＩＮＥＲ， Ｍｉｃｈａｅｌ 粒子のサイズおよび形状を決定する方法および装置

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JP2012519839A (ja) 2009-03-04 2012-08-30 マルベルン インスツルメンツ リミテッド 粒子特性の測定
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JP2012047464A (ja) * 2010-08-24 2012-03-08 Sony Corp 微小粒子測定装置及び光軸補正方法
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JP2016026301A (ja) 2004-03-06 2016-02-12 トレイナー， マイケルＴＲＡＩＮＥＲ， Ｍｉｃｈａｅｌ 粒子のサイズおよび形状を決定する方法および装置
US20050264809A1 (en) 2004-05-28 2005-12-01 Richard Myers Measuring particulate matter in a fluid
JP2010532468A (ja) 2007-07-05 2010-10-07 ホフマン、クルト 低容積で静的錯乱光および動的錯乱光を測定するための装置および方法
WO2012127880A1 (ja) 2011-03-24 2012-09-27 株式会社ニコン 観察装置および観察方法
JP2015500467A (ja) 2011-12-01 2015-01-05 ピー．エム．エル． − パーティクルズ モニタリング テクノロジーズリミテッド 粒径及び濃度測定のための検出スキーム

Also Published As

Publication number Publication date
EP3526583B1 (en) 2023-10-25
US11112342B2 (en) 2021-09-07
EP3526583A1 (en) 2019-08-21
US20190234852A1 (en) 2019-08-01
CN109804233A (zh) 2019-05-24
WO2018069024A4 (en) 2018-06-21
EP3309536A1 (en) 2018-04-18
JP2019536997A (ja) 2019-12-19
WO2018069024A1 (en) 2018-04-19
CN109804233B (zh) 2022-11-25

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