JP2019536042A - ターボエンジン部品の非破壊的制御方法 - Google Patents
ターボエンジン部品の非破壊的制御方法 Download PDFInfo
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- 238000002474 experimental method Methods 0.000 claims description 3
- 239000003550 marker Substances 0.000 description 6
- 239000000463 material Substances 0.000 description 5
- 230000035882 stress Effects 0.000 description 4
- 238000001514 detection method Methods 0.000 description 3
- 238000004519 manufacturing process Methods 0.000 description 3
- 230000001066 destructive effect Effects 0.000 description 2
- 238000010586 diagram Methods 0.000 description 2
- 238000005259 measurement Methods 0.000 description 2
- 238000005162 X-ray Laue diffraction Methods 0.000 description 1
- 230000032683 aging Effects 0.000 description 1
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- XQPRBTXUXXVTKB-UHFFFAOYSA-M caesium iodide Chemical compound [I-].[Cs+] XQPRBTXUXXVTKB-UHFFFAOYSA-M 0.000 description 1
- 230000015556 catabolic process Effects 0.000 description 1
- 238000010924 continuous production Methods 0.000 description 1
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- 238000005314 correlation function Methods 0.000 description 1
- 238000005520 cutting process Methods 0.000 description 1
- 238000006731 degradation reaction Methods 0.000 description 1
- 238000010438 heat treatment Methods 0.000 description 1
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- 238000005192 partition Methods 0.000 description 1
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
- G01N23/20—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials
- G01N23/207—Diffractometry using detectors, e.g. using a probe in a central position and one or more displaceable detectors in circumferential positions
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
- G01N23/20—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
- G01N23/20—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials
- G01N23/2055—Analysing diffraction patterns
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N2203/00—Investigating strength properties of solid materials by application of mechanical stress
- G01N2203/0058—Kind of property studied
- G01N2203/006—Crack, flaws, fracture or rupture
- G01N2203/0062—Crack or flaws
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N2223/00—Investigating materials by wave or particle radiation
- G01N2223/05—Investigating materials by wave or particle radiation by diffraction, scatter or reflection
- G01N2223/056—Investigating materials by wave or particle radiation by diffraction, scatter or reflection diffraction
- G01N2223/0566—Investigating materials by wave or particle radiation by diffraction, scatter or reflection diffraction analysing diffraction pattern
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N2223/00—Investigating materials by wave or particle radiation
- G01N2223/40—Imaging
- G01N2223/426—Imaging image comparing, unknown with known substance
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N2223/00—Investigating materials by wave or particle radiation
- G01N2223/60—Specific applications or type of materials
- G01N2223/604—Specific applications or type of materials monocrystal
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N2291/00—Indexing codes associated with group G01N29/00
- G01N2291/02—Indexing codes associated with the analysed material
- G01N2291/028—Material parameters
- G01N2291/0289—Internal structure, e.g. defects, grain size, texture
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Abstract
Description
a)部品の基本体積を通して電磁放射線のビームを放射し、部品を通過する電磁放射線に関する回折情報を記録するステップと、
b)部品の所与の領域に対してステップa)を繰り返すステップと、
c)各前記基本体積の結晶の空間的配向を決定し、その基本体積が同じ結晶配向に従って配向されている少なくとも1つの第1の結晶グレインの存在を推測するステップと、
d)前記第1のグレインの結晶の空間的配向と部品から取られた所定の方向との間の角度差を計算し、それを第1の所定の閾値と比較するステップと、
e)部品の使用状態を決定するステップと、
を含む方法を提案する。
i.回折情報から、所与の領域内に少なくとも第1および第2の別個の結晶グレインが存在することを識別するステップと、
ii.回折情報から部品の前記第2のグレインの空間的配向を決定するステップと、
iii.前記第2のグレインの空間的配向と部品の前記所定の方向との間の角度偏差を計算し、それを第1の所定の閾値と比較するステップと、
iv.前記第1のグレインの空間的配向と前記第2のグレインの空間的配向との間の角度差を計算し、それを第2の所定の閾値と比較するステップと、
v.ステップd)、iii)およびiv)において部品の使用状態を決定するステップと、
をさらに含む。
Claims (11)
- ターボエンジン部品の少なくとも1つの結晶グレインの結晶配向を制御する方法であって、
a)部品の基本体積を通して電磁放射線のビームを放射し、部品を通過する電磁放射線に関する回折情報を記録するステップと、
b)部品の所与の領域に対してステップa)を繰り返すステップと、
c)各前記基本体積の結晶の空間的配向を決定し、その基本体積が同じ結晶配向に従って配向されている少なくとも1つの第1の結晶グレインの存在を推測するステップと、
d)前記第1のグレインの結晶の空間的配向と部品から取られた所定の方向との間の角度差を計算し、それを第1の所定の閾値と比較するステップと、
e)部品の使用状態を決定するステップと、
を含む方法。 - i.回折情報から、所与の領域内に少なくとも第1および第2の別個の結晶グレインが存在することを識別するステップと、
ii.回折情報から部品の前記第2のグレインの空間的配向を決定するステップと、
iii.前記第2のグレインの空間的配向と部品の前記所定の方向との間の角度偏差を計算し、それを第1の所定の閾値と比較するステップと、
iv.前記第1のグレインの空間的配向と前記第2のグレインの空間的配向との間の角度差を計算し、それを第2の所定の閾値と比較するステップと、
v.ステップd)、iii)およびiv)において部品の使用状態を決定するステップと
をさらに含む、請求項1に記載の方法。 - 第1の所定の閾値が、約−15°〜約15°である、請求項1または2に記載の方法。
- 第2の所定の閾値が、約−12°〜約12°である、請求項1〜3のいずれか一項に記載の方法。
- 偏差の中の1つがそれが比較される所定の閾値よりも大きい場合に、使用状態の決定が部品の廃棄をもたらす、請求項1〜4のいずれか一項に記載の方法。
- グレインの存在の識別が、部品を通過した放射線の回折像を、好ましくは分析される部品と同じ種類の部品内の既知のグレイン配向に相当する基準回折像を含むデータベースと比較することによって実行され、または回折像上のピークの位置を、データベースに含まれる既知のピーク基準位置と比較することによって実行される、請求項1〜5のいずれか一項に記載の方法。
- 基準回折像が、実際の部品上または結晶学的観点からデジタル的にシミュレートされた部品上での実験により得られた回折像である、請求項6に記載の方法。
- 回折情報が、部品を通して回折されたビームから得られた回折像からなる、請求項1〜7のいずれか一項に記載の方法。
- 部品がターボエンジンタービンのブレードであり、部品上に取られた所定の方向がブレードの足部と頂部との間に延在する長手方向である、請求項1〜8のいずれか一項に記載の方法。
- 電磁放射線のビームがX線ビームである、請求項1〜9のいずれか一項に記載の方法。
- 部品の所与の領域の全ての結晶グレインの識別が実行され、部品の所与の領域が部品全体に相当する可能性が高い、請求項1〜10のいずれか一項に記載の方法。
Applications Claiming Priority (3)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
FR1661602A FR3059424B1 (fr) | 2016-11-28 | 2016-11-28 | Procede de controle non destructif d'une piece de turbomachine |
FR1661602 | 2016-11-28 | ||
PCT/FR2017/053277 WO2018096302A1 (fr) | 2016-11-28 | 2017-11-28 | Procédé de contrôle non destructif d'une pièce de turbomachine |
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JP2019536042A true JP2019536042A (ja) | 2019-12-12 |
JP7203730B2 JP7203730B2 (ja) | 2023-01-13 |
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US (1) | US10996180B2 (ja) |
EP (1) | EP3545286B1 (ja) |
JP (1) | JP7203730B2 (ja) |
CN (1) | CN110192103A (ja) |
CA (1) | CA3044925A1 (ja) |
FR (1) | FR3059424B1 (ja) |
RU (1) | RU2741744C2 (ja) |
WO (1) | WO2018096302A1 (ja) |
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GB201910587D0 (en) * | 2019-07-24 | 2019-09-04 | Rolls Royce Plc | Defining parameters for scan of single crystal structure |
GB202014235D0 (en) * | 2020-09-10 | 2020-10-28 | Rolls Royce Plc | System and method of measuring grain orientations |
FR3130981A1 (fr) * | 2021-12-17 | 2023-06-23 | Safran | Ensemble d’étalonnage pour un dispositif d’analyse cristallographique |
Citations (8)
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JPS501455B1 (ja) * | 1965-05-27 | 1975-01-18 | ||
US4696024A (en) * | 1984-10-27 | 1987-09-22 | Mtu Motoren- Und Turbinen-Union Muenchen Gmbh | Method and apparatus for detecting flaws in single crystal test samples |
JPH0559473A (ja) * | 1986-03-27 | 1993-03-09 | General Electric Co <Ge> | 単結晶製品を製造するための改善された低角粒界耐性を有するニツケル基―超合金 |
JPH05312736A (ja) * | 1992-05-13 | 1993-11-22 | Rigaku Corp | X線単結晶方位測定装置及び測定方法 |
JP2000507700A (ja) * | 1996-04-01 | 2000-06-20 | ウェスチングハウス・エレクトリック・コーポレイション | X線回折を用いて表面下結晶構造を検知するための装置及び方法 |
US20100239068A1 (en) * | 2009-03-20 | 2010-09-23 | Mohammed Belassel | Non-destructive testing systems and methods |
US20120328079A1 (en) * | 2011-06-27 | 2012-12-27 | Honeywell International Inc. | Methods and systems for inspecting structures for crystallographic imperfections |
US20170089845A1 (en) * | 2015-09-28 | 2017-03-30 | United Technologies Corporation | Detection of crystallographic properties in aerospace components |
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DE3830233A1 (de) * | 1988-09-06 | 1990-03-15 | Mtu Muenchen Gmbh | Vorrichtung zur bestimmung der kristallstruktur |
JPH09210926A (ja) * | 1996-01-31 | 1997-08-15 | Mitsubishi Heavy Ind Ltd | 1方向凝固翼の結晶方位測定方法 |
CA2544464A1 (en) * | 2006-04-21 | 2007-10-21 | United Technologies Corporation | Ultrasonic determination of crystal grain orientation systems and methods for determining the velocity of ultrasonic surface skimming longitudinal waves on various materials |
US7978821B1 (en) * | 2008-02-15 | 2011-07-12 | The United States Of America As Represented By The Secretary Of The Air Force | Laue crystallographic orientation mapping system |
CN101435784B (zh) * | 2008-10-14 | 2012-01-18 | 重庆大学 | 涡轮叶片ct检测装置及其检测方法 |
US8130908B2 (en) * | 2009-02-23 | 2012-03-06 | X-Ray Optical Systems, Inc. | X-ray diffraction apparatus and technique for measuring grain orientation using x-ray focusing optic |
RU2427826C1 (ru) * | 2010-05-11 | 2011-08-27 | Федеральное государственное унитарное предприятие "Всероссийский научно-исследовательский институт авиационных материалов" (ФГУП "ВИАМ") | Способ определения остаточных напряжений в изделиях из монокристаллических материалов рентгеновским методом |
RU2488099C1 (ru) * | 2011-12-29 | 2013-07-20 | Открытое акционерное общество "Научно-производственное объединение "Сатурн" | Способ рентгеноструктурного контроля детали |
US20140270072A1 (en) * | 2013-03-13 | 2014-09-18 | Robert L. McCormick | Grain size inspection of a gas turbine component by x-ray refraction |
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- 2016-11-28 FR FR1661602A patent/FR3059424B1/fr active Active
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- 2017-11-28 RU RU2019116242A patent/RU2741744C2/ru active
- 2017-11-28 CN CN201780073480.6A patent/CN110192103A/zh active Pending
- 2017-11-28 JP JP2019528497A patent/JP7203730B2/ja active Active
- 2017-11-28 CA CA3044925A patent/CA3044925A1/fr active Pending
- 2017-11-28 US US16/463,988 patent/US10996180B2/en active Active
- 2017-11-28 WO PCT/FR2017/053277 patent/WO2018096302A1/fr active Application Filing
- 2017-11-28 EP EP17816929.8A patent/EP3545286B1/fr active Active
Patent Citations (8)
Publication number | Priority date | Publication date | Assignee | Title |
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JPS501455B1 (ja) * | 1965-05-27 | 1975-01-18 | ||
US4696024A (en) * | 1984-10-27 | 1987-09-22 | Mtu Motoren- Und Turbinen-Union Muenchen Gmbh | Method and apparatus for detecting flaws in single crystal test samples |
JPH0559473A (ja) * | 1986-03-27 | 1993-03-09 | General Electric Co <Ge> | 単結晶製品を製造するための改善された低角粒界耐性を有するニツケル基―超合金 |
JPH05312736A (ja) * | 1992-05-13 | 1993-11-22 | Rigaku Corp | X線単結晶方位測定装置及び測定方法 |
JP2000507700A (ja) * | 1996-04-01 | 2000-06-20 | ウェスチングハウス・エレクトリック・コーポレイション | X線回折を用いて表面下結晶構造を検知するための装置及び方法 |
US20100239068A1 (en) * | 2009-03-20 | 2010-09-23 | Mohammed Belassel | Non-destructive testing systems and methods |
US20120328079A1 (en) * | 2011-06-27 | 2012-12-27 | Honeywell International Inc. | Methods and systems for inspecting structures for crystallographic imperfections |
US20170089845A1 (en) * | 2015-09-28 | 2017-03-30 | United Technologies Corporation | Detection of crystallographic properties in aerospace components |
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Publication number | Publication date |
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CN110192103A (zh) | 2019-08-30 |
EP3545286A1 (fr) | 2019-10-02 |
US20200386695A1 (en) | 2020-12-10 |
CA3044925A1 (fr) | 2018-05-31 |
RU2019116242A (ru) | 2020-12-28 |
EP3545286B1 (fr) | 2023-11-08 |
FR3059424B1 (fr) | 2018-11-09 |
US10996180B2 (en) | 2021-05-04 |
RU2019116242A3 (ja) | 2020-12-28 |
FR3059424A1 (fr) | 2018-06-01 |
RU2741744C2 (ru) | 2021-01-28 |
BR112019010824A2 (pt) | 2019-10-01 |
JP7203730B2 (ja) | 2023-01-13 |
WO2018096302A1 (fr) | 2018-05-31 |
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