JP2019531120A5 - - Google Patents
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- JP2019531120A5 JP2019531120A5 JP2019512893A JP2019512893A JP2019531120A5 JP 2019531120 A5 JP2019531120 A5 JP 2019531120A5 JP 2019512893 A JP2019512893 A JP 2019512893A JP 2019512893 A JP2019512893 A JP 2019512893A JP 2019531120 A5 JP2019531120 A5 JP 2019531120A5
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- Prior art keywords
- lattice structure
- proximal
- ray
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- imaging system
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Applications Claiming Priority (3)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| EP16187753 | 2016-09-08 | ||
| EP16187753.5 | 2016-09-08 | ||
| PCT/EP2017/071806 WO2018046377A1 (en) | 2016-09-08 | 2017-08-30 | Source grating for x-ray imaging |
Publications (4)
| Publication Number | Publication Date |
|---|---|
| JP2019531120A JP2019531120A (ja) | 2019-10-31 |
| JP2019531120A5 true JP2019531120A5 (OSRAM) | 2020-10-08 |
| JP7044764B2 JP7044764B2 (ja) | 2022-03-30 |
| JP7044764B6 JP7044764B6 (ja) | 2022-05-31 |
Family
ID=56888983
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2019512893A Expired - Fee Related JP7044764B6 (ja) | 2016-09-08 | 2017-08-30 | Ｘ線撮像のための線源格子 |
Country Status (5)
| Country | Link |
|---|---|
| US (1) | US10835193B2 (OSRAM) |
| EP (1) | EP3509492B1 (OSRAM) |
| JP (1) | JP7044764B6 (OSRAM) |
| CN (1) | CN109688930A (OSRAM) |
| WO (1) | WO2018046377A1 (OSRAM) |
Families Citing this family (26)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US20150117599A1 (en) | 2013-10-31 | 2015-04-30 | Sigray, Inc. | X-ray interferometric imaging system |
| US10295485B2 (en) | 2013-12-05 | 2019-05-21 | Sigray, Inc. | X-ray transmission spectrometer system |
| USRE48612E1 (en) | 2013-10-31 | 2021-06-29 | Sigray, Inc. | X-ray interferometric imaging system |
| CN112424591B (zh) | 2018-06-04 | 2024-05-24 | 斯格瑞公司 | 波长色散x射线光谱仪 |
| DE112019003777B4 (de) | 2018-07-26 | 2025-09-11 | Sigray, Inc. | Röntgenreflexionsquelle mit hoher helligkeit |
| EP3603515A1 (en) * | 2018-08-01 | 2020-02-05 | Koninklijke Philips N.V. | Apparatus for generating x-ray imaging data |
| US10656105B2 (en) | 2018-08-06 | 2020-05-19 | Sigray, Inc. | Talbot-lau x-ray source and interferometric system |
| CN112638261B (zh) | 2018-09-04 | 2025-06-27 | 斯格瑞公司 | 利用滤波的x射线荧光的系统和方法 |
| US11056308B2 (en) | 2018-09-07 | 2021-07-06 | Sigray, Inc. | System and method for depth-selectable x-ray analysis |
| JP7182749B2 (ja) | 2019-09-03 | 2022-12-02 | シグレイ、インコーポレイテッド | コンピュータ断層撮影蛍光ｘ線撮像のためのシステムおよび方法 |
| US11175243B1 (en) | 2020-02-06 | 2021-11-16 | Sigray, Inc. | X-ray dark-field in-line inspection for semiconductor samples |
| US11217357B2 (en) | 2020-02-10 | 2022-01-04 | Sigray, Inc. | X-ray mirror optics with multiple hyperboloidal/hyperbolic surface profiles |
| WO2021237237A1 (en) | 2020-05-18 | 2021-11-25 | Sigray, Inc. | System and method for x-ray absorption spectroscopy using a crystal analyzer and a plurality of detector elements |
| CN111839579B (zh) * | 2020-09-02 | 2025-06-27 | 上海联影医疗科技股份有限公司 | 一种x射线成像设备的限束器及x射线成像设备 |
| WO2022061347A1 (en) | 2020-09-17 | 2022-03-24 | Sigray, Inc. | System and method using x-rays for depth-resolving metrology and analysis |
| KR20260030946A (ko) | 2020-12-07 | 2026-03-06 | 시그레이, 아이엔씨. | 투과 x-선 소스를 이용한 고처리량 3D x-선 이미징 시스템 |
| US12480892B2 (en) | 2020-12-07 | 2025-11-25 | Sigray, Inc. | High throughput 3D x-ray imaging system using a transmission x-ray source |
| WO2023168204A1 (en) | 2022-03-02 | 2023-09-07 | Sigray, Inc. | X-ray fluorescence system and x-ray source with electrically insulative target material |
| US11992350B2 (en) | 2022-03-15 | 2024-05-28 | Sigray, Inc. | System and method for compact laminography utilizing microfocus transmission x-ray source and variable magnification x-ray detector |
| WO2023215204A1 (en) | 2022-05-02 | 2023-11-09 | Sigray, Inc. | X-ray sequential array wavelength dispersive spectrometer |
| DE112024000873T5 (de) | 2023-02-16 | 2026-01-15 | Sigray, Inc. | Röntgen-detektorsystem mit mindestens zwei gestapelten flachen bragg-diffraktoren |
| US12181423B1 (en) | 2023-09-07 | 2024-12-31 | Sigray, Inc. | Secondary image removal using high resolution x-ray transmission sources |
| US12429437B2 (en) | 2023-11-07 | 2025-09-30 | Sigray, Inc. | System and method for x-ray absorption spectroscopy using spectral information from two orthogonal planes |
| WO2025151383A1 (en) | 2024-01-08 | 2025-07-17 | Sigray, Inc. | X-ray analysis system with focused x-ray beam and non-x-ray microscope |
| WO2025155719A1 (en) | 2024-01-18 | 2025-07-24 | Sigray, Inc. | Sequential array of x-ray imaging detectors |
| WO2025174966A1 (en) | 2024-02-15 | 2025-08-21 | Sigray, Inc. | System and method for generating a focused x‑ray beam |
Family Cites Families (25)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| SE347859B (OSRAM) * | 1970-11-30 | 1972-08-14 | Medinova Ab | |
| US4672648A (en) * | 1985-10-25 | 1987-06-09 | Picker International, Inc. | Apparatus and method for radiation attenuation |
| US5812629A (en) * | 1997-04-30 | 1998-09-22 | Clauser; John F. | Ultrahigh resolution interferometric x-ray imaging |
| US7965444B2 (en) | 2006-08-31 | 2011-06-21 | Micron Technology, Inc. | Method and apparatus to improve filter characteristics of optical filters |
| US8031840B2 (en) * | 2006-12-04 | 2011-10-04 | Koninklijke Philips Electronics N.V. | Beam filter, particularly for x-rays |
| JP4911373B2 (ja) * | 2009-11-26 | 2012-04-04 | 横河電機株式会社 | Ｘ線測定装置 |
| JP5536426B2 (ja) | 2009-11-27 | 2014-07-02 | ジーイー・メディカル・システムズ・グローバル・テクノロジー・カンパニー・エルエルシー | ビーム形成ｘ線フィルタおよびこれを使ったｘ線ｃｔ装置 |
| WO2011136759A1 (en) * | 2010-04-26 | 2011-11-03 | Hewlett-Packard Development Company, L.P. | Non-uniform grating |
| JP2012024339A (ja) * | 2010-07-23 | 2012-02-09 | Fujifilm Corp | 放射線画像撮影システム及びコリメータユニット |
| JP6126535B2 (ja) | 2011-02-01 | 2017-05-10 | コーニンクレッカ フィリップス エヌ ヴェＫｏｎｉｎｋｌｉｊｋｅ Ｐｈｉｌｉｐｓ Ｎ．Ｖ． | 集束偏向構造板を用いた微分位相コントラスト撮像法 |
| CN103348415B (zh) | 2011-02-07 | 2016-05-25 | 皇家飞利浦有限公司 | 具有增大的动态范围的微分相衬成像 |
| US9066704B2 (en) | 2011-03-14 | 2015-06-30 | Canon Kabushiki Kaisha | X-ray imaging apparatus |
| WO2013001386A1 (en) * | 2011-06-30 | 2013-01-03 | Koninklijke Philips Electronics N.V. | X-ray beam transmission profile shaper |
| US20140314374A1 (en) * | 2011-10-21 | 2014-10-23 | David A. Fattal | Grating couplers with deep-groove non-uniform gratings |
| US20130164457A1 (en) | 2011-12-27 | 2013-06-27 | Rigaku Innovative Technologies, Inc. | Method of manufacturing patterned x-ray optical elements |
| US9761021B2 (en) | 2012-05-14 | 2017-09-12 | Koninklijke Philips N.V. | Dark field computed tomography imaging |
| EP2854645B1 (en) | 2012-06-05 | 2021-10-06 | Koninklijke Philips N.V. | Motion layer decomposition calibration of x-ray ct imagers |
| EP2925230B1 (en) * | 2012-12-03 | 2020-05-20 | Koninklijke Philips N.V. | Translating x-ray beam transmission profile shaper |
| EP3025365B1 (en) * | 2013-07-23 | 2017-01-11 | Koninklijke Philips N.V. | Anode for an x-ray tube of a differential phase contrast imaging apparatus |
| JP2015078976A (ja) | 2013-09-11 | 2015-04-23 | キヤノン株式会社 | Ｘ線撮像システム |
| WO2015106983A1 (en) * | 2014-01-14 | 2015-07-23 | Koninklijke Philips N.V. | X-ray emitting device with an attenuating element for an x-ray imaging apparatus |
| US9726794B2 (en) | 2014-06-13 | 2017-08-08 | The Regents Of The University Of California | High index contrast grating structure for light manipulation and related method |
| JP7171190B2 (ja) | 2014-11-11 | 2022-11-15 | コーニンクレッカ フィリップス エヌ ヴェ | 線源－検出器装置 |
| KR20160089647A (ko) | 2015-01-20 | 2016-07-28 | 삼성전자주식회사 | 엑스선 영상장치 및 그 제어방법 |
| US11051772B2 (en) * | 2016-04-08 | 2021-07-06 | Rensselaer Polytechnic Institute | Filtration methods for dual-energy X-ray CT |
-
2017
- 2017-08-30 CN CN201780055442.8A patent/CN109688930A/zh active Pending
- 2017-08-30 EP EP17758190.7A patent/EP3509492B1/en not_active Not-in-force
- 2017-08-30 WO PCT/EP2017/071806 patent/WO2018046377A1/en not_active Ceased
- 2017-08-30 US US16/329,807 patent/US10835193B2/en not_active Expired - Fee Related
- 2017-08-30 JP JP2019512893A patent/JP7044764B6/ja not_active Expired - Fee Related
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