JP7044764B6 - Ｘ線撮像のための線源格子 - Google Patents

Ｘ線撮像のための線源格子 Download PDF

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Publication number
JP7044764B6
JP7044764B6 JP2019512893A JP2019512893A JP7044764B6 JP 7044764 B6 JP7044764 B6 JP 7044764B6 JP 2019512893 A JP2019512893 A JP 2019512893A JP 2019512893 A JP2019512893 A JP 2019512893A JP 7044764 B6 JP7044764 B6 JP 7044764B6
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ray
source
grid
grid structure
source grid
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Japanese (ja)
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JP2019531120A5 (OSRAM
JP2019531120A (ja
JP7044764B2 (ja
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トーマス コエラー
ローランド プロクサ
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Koninklijke Philips NV
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    • A—HUMAN NECESSITIES
    • A61—MEDICAL OR VETERINARY SCIENCE; HYGIENE
    • A61B—DIAGNOSIS; SURGERY; IDENTIFICATION
    • A61B6/00—Apparatus or devices for radiation diagnosis; Apparatus or devices for radiation diagnosis combined with radiation therapy equipment
    • A61B6/42—Arrangements for detecting radiation specially adapted for radiation diagnosis
    • A61B6/4291—Arrangements for detecting radiation specially adapted for radiation diagnosis the detector being combined with a grid or grating
    • A—HUMAN NECESSITIES
    • A61—MEDICAL OR VETERINARY SCIENCE; HYGIENE
    • A61B—DIAGNOSIS; SURGERY; IDENTIFICATION
    • A61B6/00—Apparatus or devices for radiation diagnosis; Apparatus or devices for radiation diagnosis combined with radiation therapy equipment
    • A61B6/48—Diagnostic techniques
    • A61B6/484—Diagnostic techniques involving phase contrast X-ray imaging
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B5/00—Optical elements other than lenses
    • G02B5/18—Diffraction gratings
    • G02B5/1838—Diffraction gratings for use with ultraviolet radiation or X-rays
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B5/00—Optical elements other than lenses
    • G02B5/18—Diffraction gratings
    • G02B5/1866—Transmission gratings characterised by their structure, e.g. step profile, contours of substrate or grooves, pitch variations, materials
    • G02B5/1871—Transmissive phase gratings
    • G—PHYSICS
    • G21—NUCLEAR PHYSICS; NUCLEAR ENGINEERING
    • G21K—HANDLING OF PARTICLES OR IONISING RADIATION NOT OTHERWISE PROVIDED FOR; IRRADIATION DEVICES; GAMMA RAY OR X-RAY MICROSCOPES
    • G21K1/00—Arrangements for handling particles or ionising radiation, e.g. focusing or moderating
    • G21K1/02—Arrangements for handling particles or ionising radiation, e.g. focusing or moderating using diaphragms, collimators
    • G21K1/025—Arrangements for handling particles or ionising radiation, e.g. focusing or moderating using diaphragms, collimators using multiple collimators, e.g. Bucky screens; other devices for eliminating undesired or dispersed radiation
    • G—PHYSICS
    • G21—NUCLEAR PHYSICS; NUCLEAR ENGINEERING
    • G21K—HANDLING OF PARTICLES OR IONISING RADIATION NOT OTHERWISE PROVIDED FOR; IRRADIATION DEVICES; GAMMA RAY OR X-RAY MICROSCOPES
    • G21K1/00—Arrangements for handling particles or ionising radiation, e.g. focusing or moderating
    • G21K1/06—Arrangements for handling particles or ionising radiation, e.g. focusing or moderating using diffraction, refraction or reflection, e.g. monochromators
    • G—PHYSICS
    • G21—NUCLEAR PHYSICS; NUCLEAR ENGINEERING
    • G21K—HANDLING OF PARTICLES OR IONISING RADIATION NOT OTHERWISE PROVIDED FOR; IRRADIATION DEVICES; GAMMA RAY OR X-RAY MICROSCOPES
    • G21K1/00—Arrangements for handling particles or ionising radiation, e.g. focusing or moderating
    • G21K1/10—Scattering devices; Absorbing devices; Ionising radiation filters
    • A—HUMAN NECESSITIES
    • A61—MEDICAL OR VETERINARY SCIENCE; HYGIENE
    • A61B—DIAGNOSIS; SURGERY; IDENTIFICATION
    • A61B6/00—Apparatus or devices for radiation diagnosis; Apparatus or devices for radiation diagnosis combined with radiation therapy equipment
    • A61B6/40—Arrangements for generating radiation specially adapted for radiation diagnosis
    • A61B6/4064—Arrangements for generating radiation specially adapted for radiation diagnosis specially adapted for producing a particular type of beam
    • A61B6/4092—Arrangements for generating radiation specially adapted for radiation diagnosis specially adapted for producing a particular type of beam for producing synchrotron radiation
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/02—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material
    • G01N23/04—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and forming images of the material
    • G01N23/041—Phase-contrast imaging, e.g. using grating interferometers
    • G—PHYSICS
    • G21—NUCLEAR PHYSICS; NUCLEAR ENGINEERING
    • G21K—HANDLING OF PARTICLES OR IONISING RADIATION NOT OTHERWISE PROVIDED FOR; IRRADIATION DEVICES; GAMMA RAY OR X-RAY MICROSCOPES
    • G21K2207/00—Particular details of imaging devices or methods using ionizing electromagnetic radiation such as X-rays or gamma rays
    • G21K2207/005—Methods and devices obtaining contrast from non-absorbing interaction of the radiation with matter, e.g. phase contrast

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  • Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • High Energy & Nuclear Physics (AREA)
  • Medical Informatics (AREA)
  • Optics & Photonics (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • General Engineering & Computer Science (AREA)
  • Pathology (AREA)
  • Molecular Biology (AREA)
  • Nuclear Medicine, Radiotherapy & Molecular Imaging (AREA)
  • General Physics & Mathematics (AREA)
  • Radiology & Medical Imaging (AREA)
  • Biomedical Technology (AREA)
  • Heart & Thoracic Surgery (AREA)
  • Biophysics (AREA)
  • Surgery (AREA)
  • Animal Behavior & Ethology (AREA)
  • General Health & Medical Sciences (AREA)
  • Public Health (AREA)
  • Veterinary Medicine (AREA)
  • Toxicology (AREA)
  • Apparatus For Radiation Diagnosis (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
JP2019512893A 2016-09-08 2017-08-30 Ｘ線撮像のための線源格子 Expired - Fee Related JP7044764B6 (ja)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
EP16187753 2016-09-08
EP16187753.5 2016-09-08
PCT/EP2017/071806 WO2018046377A1 (en) 2016-09-08 2017-08-30 Source grating for x-ray imaging

Publications (4)

Publication Number Publication Date
JP2019531120A JP2019531120A (ja) 2019-10-31
JP2019531120A5 JP2019531120A5 (OSRAM) 2020-10-08
JP7044764B2 JP7044764B2 (ja) 2022-03-30
JP7044764B6 true JP7044764B6 (ja) 2022-05-31

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JP2019512893A Expired - Fee Related JP7044764B6 (ja) 2016-09-08 2017-08-30 Ｘ線撮像のための線源格子

Country Status (5)

Country Link
US (1) US10835193B2 (OSRAM)
EP (1) EP3509492B1 (OSRAM)
JP (1) JP7044764B6 (OSRAM)
CN (1) CN109688930A (OSRAM)
WO (1) WO2018046377A1 (OSRAM)

Families Citing this family (26)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20150117599A1 (en) 2013-10-31 2015-04-30 Sigray, Inc. X-ray interferometric imaging system
US10295485B2 (en) 2013-12-05 2019-05-21 Sigray, Inc. X-ray transmission spectrometer system
USRE48612E1 (en) 2013-10-31 2021-06-29 Sigray, Inc. X-ray interferometric imaging system
CN112424591B (zh) 2018-06-04 2024-05-24 斯格瑞公司 波长色散x射线光谱仪
DE112019003777B4 (de) 2018-07-26 2025-09-11 Sigray, Inc. Röntgenreflexionsquelle mit hoher helligkeit
EP3603515A1 (en) * 2018-08-01 2020-02-05 Koninklijke Philips N.V. Apparatus for generating x-ray imaging data
US10656105B2 (en) 2018-08-06 2020-05-19 Sigray, Inc. Talbot-lau x-ray source and interferometric system
CN112638261B (zh) 2018-09-04 2025-06-27 斯格瑞公司 利用滤波的x射线荧光的系统和方法
US11056308B2 (en) 2018-09-07 2021-07-06 Sigray, Inc. System and method for depth-selectable x-ray analysis
JP7182749B2 (ja) 2019-09-03 2022-12-02 シグレイ、インコーポレイテッド コンピュータ断層撮影蛍光ｘ線撮像のためのシステムおよび方法
US11175243B1 (en) 2020-02-06 2021-11-16 Sigray, Inc. X-ray dark-field in-line inspection for semiconductor samples
US11217357B2 (en) 2020-02-10 2022-01-04 Sigray, Inc. X-ray mirror optics with multiple hyperboloidal/hyperbolic surface profiles
WO2021237237A1 (en) 2020-05-18 2021-11-25 Sigray, Inc. System and method for x-ray absorption spectroscopy using a crystal analyzer and a plurality of detector elements
CN111839579B (zh) * 2020-09-02 2025-06-27 上海联影医疗科技股份有限公司 一种x射线成像设备的限束器及x射线成像设备
WO2022061347A1 (en) 2020-09-17 2022-03-24 Sigray, Inc. System and method using x-rays for depth-resolving metrology and analysis
KR20260030946A (ko) 2020-12-07 2026-03-06 시그레이, 아이엔씨. 투과 x-선 소스를 이용한 고처리량 3D x-선 이미징 시스템
US12480892B2 (en) 2020-12-07 2025-11-25 Sigray, Inc. High throughput 3D x-ray imaging system using a transmission x-ray source
WO2023168204A1 (en) 2022-03-02 2023-09-07 Sigray, Inc. X-ray fluorescence system and x-ray source with electrically insulative target material
US11992350B2 (en) 2022-03-15 2024-05-28 Sigray, Inc. System and method for compact laminography utilizing microfocus transmission x-ray source and variable magnification x-ray detector
WO2023215204A1 (en) 2022-05-02 2023-11-09 Sigray, Inc. X-ray sequential array wavelength dispersive spectrometer
DE112024000873T5 (de) 2023-02-16 2026-01-15 Sigray, Inc. Röntgen-detektorsystem mit mindestens zwei gestapelten flachen bragg-diffraktoren
US12181423B1 (en) 2023-09-07 2024-12-31 Sigray, Inc. Secondary image removal using high resolution x-ray transmission sources
US12429437B2 (en) 2023-11-07 2025-09-30 Sigray, Inc. System and method for x-ray absorption spectroscopy using spectral information from two orthogonal planes
WO2025151383A1 (en) 2024-01-08 2025-07-17 Sigray, Inc. X-ray analysis system with focused x-ray beam and non-x-ray microscope
WO2025155719A1 (en) 2024-01-18 2025-07-24 Sigray, Inc. Sequential array of x-ray imaging detectors
WO2025174966A1 (en) 2024-02-15 2025-08-21 Sigray, Inc. System and method for generating a focused x‑ray beam

Citations (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2011110223A (ja) 2009-11-27 2011-06-09 Ge Medical Systems Global Technology Co Llc ビーム形成ｘ線フィルタおよびこれを使ったｘ線ｃｔ装置
JP2012024339A (ja) 2010-07-23 2012-02-09 Fujifilm Corp 放射線画像撮影システム及びコリメータユニット
US20130032734A1 (en) 2010-04-26 2013-02-07 Santori Charles M Non-uniform grating
JP2014510263A (ja) 2011-02-07 2014-04-24 コーニンクレッカ フィリップス エヌ ヴェ ダイナミックレンジを増大する微分位相コントラスト撮像
US20140314374A1 (en) 2011-10-21 2014-10-23 David A. Fattal Grating couplers with deep-groove non-uniform gratings
JP2015078976A (ja) 2013-09-11 2015-04-23 キヤノン株式会社 Ｘ線撮像システム
JP2015518765A (ja) 2012-06-05 2015-07-06 コーニンクレッカ フィリップス エヌ ヴェ Ｘ線ｃｔイメージの動き層分解較正
WO2016075140A1 (en) 2014-11-11 2016-05-19 Koninklijke Philips N.V. Source-detector arrangement
US20160211045A1 (en) 2015-01-20 2016-07-21 Samsung Electronics Co., Ltd. X-ray imaging apparatus and method of controlling the same

Family Cites Families (16)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
SE347859B (OSRAM) * 1970-11-30 1972-08-14 Medinova Ab
US4672648A (en) * 1985-10-25 1987-06-09 Picker International, Inc. Apparatus and method for radiation attenuation
US5812629A (en) * 1997-04-30 1998-09-22 Clauser; John F. Ultrahigh resolution interferometric x-ray imaging
US7965444B2 (en) 2006-08-31 2011-06-21 Micron Technology, Inc. Method and apparatus to improve filter characteristics of optical filters
US8031840B2 (en) * 2006-12-04 2011-10-04 Koninklijke Philips Electronics N.V. Beam filter, particularly for x-rays
JP4911373B2 (ja) * 2009-11-26 2012-04-04 横河電機株式会社 Ｘ線測定装置
JP6126535B2 (ja) 2011-02-01 2017-05-10 コーニンクレッカ フィリップス エヌ ヴェＫｏｎｉｎｋｌｉｊｋｅ Ｐｈｉｌｉｐｓ Ｎ．Ｖ． 集束偏向構造板を用いた微分位相コントラスト撮像法
US9066704B2 (en) 2011-03-14 2015-06-30 Canon Kabushiki Kaisha X-ray imaging apparatus
WO2013001386A1 (en) * 2011-06-30 2013-01-03 Koninklijke Philips Electronics N.V. X-ray beam transmission profile shaper
US20130164457A1 (en) 2011-12-27 2013-06-27 Rigaku Innovative Technologies, Inc. Method of manufacturing patterned x-ray optical elements
US9761021B2 (en) 2012-05-14 2017-09-12 Koninklijke Philips N.V. Dark field computed tomography imaging
EP2925230B1 (en) * 2012-12-03 2020-05-20 Koninklijke Philips N.V. Translating x-ray beam transmission profile shaper
EP3025365B1 (en) * 2013-07-23 2017-01-11 Koninklijke Philips N.V. Anode for an x-ray tube of a differential phase contrast imaging apparatus
WO2015106983A1 (en) * 2014-01-14 2015-07-23 Koninklijke Philips N.V. X-ray emitting device with an attenuating element for an x-ray imaging apparatus
US9726794B2 (en) 2014-06-13 2017-08-08 The Regents Of The University Of California High index contrast grating structure for light manipulation and related method
US11051772B2 (en) * 2016-04-08 2021-07-06 Rensselaer Polytechnic Institute Filtration methods for dual-energy X-ray CT

Patent Citations (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2011110223A (ja) 2009-11-27 2011-06-09 Ge Medical Systems Global Technology Co Llc ビーム形成ｘ線フィルタおよびこれを使ったｘ線ｃｔ装置
US20130032734A1 (en) 2010-04-26 2013-02-07 Santori Charles M Non-uniform grating
JP2012024339A (ja) 2010-07-23 2012-02-09 Fujifilm Corp 放射線画像撮影システム及びコリメータユニット
JP2014510263A (ja) 2011-02-07 2014-04-24 コーニンクレッカ フィリップス エヌ ヴェ ダイナミックレンジを増大する微分位相コントラスト撮像
US20140314374A1 (en) 2011-10-21 2014-10-23 David A. Fattal Grating couplers with deep-groove non-uniform gratings
JP2015518765A (ja) 2012-06-05 2015-07-06 コーニンクレッカ フィリップス エヌ ヴェ Ｘ線ｃｔイメージの動き層分解較正
JP2015078976A (ja) 2013-09-11 2015-04-23 キヤノン株式会社 Ｘ線撮像システム
WO2016075140A1 (en) 2014-11-11 2016-05-19 Koninklijke Philips N.V. Source-detector arrangement
US20160211045A1 (en) 2015-01-20 2016-07-21 Samsung Electronics Co., Ltd. X-ray imaging apparatus and method of controlling the same

Also Published As

Publication number Publication date
JP2019531120A (ja) 2019-10-31
CN109688930A (zh) 2019-04-26
US10835193B2 (en) 2020-11-17
EP3509492B1 (en) 2021-12-15
EP3509492A1 (en) 2019-07-17
WO2018046377A1 (en) 2018-03-15
US20190216416A1 (en) 2019-07-18
JP7044764B2 (ja) 2022-03-30

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